| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 11/05/1992 | DE4113842A1 Verfahren und einrichtung zur messung und bestimmung einer wegdifferenz in interferometern nach michelson Method and device for the measurement and determination of a path difference in interferometers by michelson |
| 11/03/1992 | US5160112 Moving mirror carriage |
| 10/27/1992 | US5159408 Optical thickness profiler using synthetic wavelengths |
| 10/27/1992 | US5159405 Multibeam interferometer for use in a fourier transform spectrometer and a driving device for moving the mirrors used therein |
| 10/22/1992 | DE4208622A1 Light section microscope forming image corresp. to cross=section enabling surface to be examined - has distortion correction system on optical axis of each projection and observation systems |
| 10/21/1992 | EP0509716A1 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
| 10/20/1992 | US5157621 Circuit and method for forming pulse train output in response to carry/borrow output of count pulse train |
| 10/20/1992 | US5157458 Polarization interferometer spectrometer |
| 10/14/1992 | EP0508583A2 Absolute gas refractometer |
| 10/13/1992 | US5155556 Hand-held drill bit tester |
| 10/13/1992 | US5155553 Multiple-color null lens employing refractive and diffractive optical elements |
| 10/13/1992 | US5155551 Laser referencing system for refractively scanning interferometer |
| 10/13/1992 | US5155550 Accurate correlator of rotational and translational motions and control method and apparatus |
| 10/13/1992 | US5155363 Method for direct phase measurement of radiation, particularly light radiation, and apparatus for performing the method |
| 10/06/1992 | US5153669 Three wavelength optical measurement apparatus and method |
| 10/01/1992 | WO1992016863A1 Refractively scanned interferometer |
| 09/30/1992 | EP0506297A2 Three wavelength optical measurement apparatus |
| 09/30/1992 | EP0506296A2 Optical thickness profiler |
| 09/30/1992 | EP0505366A1 Interferometer arrangement. |
| 09/29/1992 | US5151749 Method of and apparatus for measuring coordinate position and positioning an object |
| 09/24/1992 | DE4108944A1 Contactless measurement of surface shape of diffusely scattering objects e.g. semiconductor wafers - using interferometric arrangement for three=dimensional measurement with minimal coherence length and illumination aperture angle less than observation aperture angle |
| 09/24/1992 | DE4108729A1 Pitch, roll or twist angle measurement for ship - using laser interferometry and polarisation measurement via devices mounted on ship |
| 09/17/1992 | WO1992015837A1 A holographic method for obtaining a quantitative likeness measure |
| 09/17/1992 | DE4108062A1 Interferometric measurement arrangement for objects - contains optical system with beam divider cube and spherical mirror superimposing light scattered by object onto reference beam |
| 09/16/1992 | CN2116190U Miniature three dimensions measuring stand |
| 09/15/1992 | US5148235 Michelson interferometer for producing optical path differences by rotating corner cube retroreflectors |
| 09/10/1992 | DE4107549A1 Triggering digitisation of interferograms for Michelson interferometers - involves triggering digitiser with pulses satisfying sampling theorem, seeking spectral lines of known wave number for wave number calibration |
| 09/08/1992 | US5146284 Interferometer gas flow system |
| 09/02/1992 | EP0501833A2 Three-dimensional refractively scanning interferometer structure having removable optical cartridge |
| 08/25/1992 | US5141319 Displacement detection device with adjacent semiconductor diode lasers |
| 08/25/1992 | US5141318 Laser interferometer type length measuring apparatus and positioning method using the same |
| 08/25/1992 | US5141302 Intraocular length measuring instrument |
| 08/20/1992 | WO1992014176A1 Rare-earth-doped lithium niobate waveguide structures |
| 08/20/1992 | WO1992014115A1 A method and apparatus for determining direction of displacement of an object surface |
| 08/20/1992 | DE4204857A1 Interferometer for measuring shape of object - analyses wavefronts with spatial carrier then subtracts carrier from result |
| 08/19/1992 | EP0499559A1 Procedure and apparatus for the non-destructive control of composite material containers by holographic interferometry |
| 08/19/1992 | EP0499074A2 Polarization interferometer with narrow band filter |
| 08/19/1992 | CN2113464U Measuring microscope |
| 08/18/1992 | US5140242 Servo guided stage system |
| 08/18/1992 | US5139336 Optical measuring apparatus using amplitude modulation of slipt beams |
| 08/14/1992 | CA2061097A1 Non destructive control device and process using holographic interferometry on enclosures made of composite material winded on a metal liner |
| 08/12/1992 | EP0498575A2 Stabilized two color laser diode interferometer |
| 08/12/1992 | EP0498541A1 Interferometric laser profilometer |
| 08/11/1992 | US5137361 Optical detection of a surface motion of an object using a stabilized interferometric cavity |
| 08/06/1992 | DE4102881A1 Detecting surface deformations using speckle interferometry - by illumination from different directions with light of different characteristics and selection of reflected light for separate evaluation |
| 08/05/1992 | EP0497696A1 Device to measure the phase shift in an interferometer |
| 08/02/1992 | CA2060238A1 Device for measuring phase differences in an interferometer |
| 07/29/1992 | EP0244470B1 Ruggedized compact interferometer requiring minimum isolation from mechanical vibrations |
| 07/28/1992 | US5133599 High accuracy linear displacement interferometer with probe |
| 07/21/1992 | US5132849 Illuminated cursor magnifying glass |
| 07/21/1992 | US5131748 Broadband optical detection of transient motion from a scattering surface by two-wave mixing in a photorefractive crystal |
| 07/16/1992 | DE4100773A1 Interferometric range finder and distance measurer - uses two interferometers with measuring and reference reflectors and common laser light source |
| 07/08/1992 | EP0478716A4 Semiconductor microactuator |
| 07/07/1992 | US5127735 System for measuring the position in space of an object using a light beam |
| 07/07/1992 | US5127734 Laser interferometer for inspecting the surface of a specimen |
| 07/07/1992 | US5127731 Stabilized two-color laser diode interferometer |
| 07/07/1992 | US5127726 Method and apparatus for low angle, high resolution surface inspection |
| 07/01/1992 | EP0493169A1 Analysis device for interferometric microdisplacement sensors |
| 06/25/1992 | WO1992010719A1 Apparatus for the measurement of surface shape |
| 06/24/1992 | EP0490956A1 Optical measuring instruments. |
| 06/23/1992 | US5124994 Light generating device |
| 06/23/1992 | US5123742 Laser length measuring instrument |
| 06/21/1992 | WO1992011506A1 Structural examination using holographic interferometry |
| 06/21/1992 | CA2098852A1 Structural examination using holographic interferometry |
| 06/19/1992 | CA2057943A1 Interferometric microdisplacement sensor analysis device |
| 06/17/1992 | EP0489847A1 Interferometer utilizing superfluorescent optical source. |
| 06/17/1992 | DE4039972A1 Detecting surface deformations by electronic speckle interferometry - coping with two or more deformation directions simultaneously using single light source and symmetrical detection beams |
| 06/11/1992 | DE4105435C1 Interference microscope with image converter connected to evaluating computer - automatically providing contour height differences on sample surface from strip pattern |
| 06/10/1992 | EP0489525A2 Improvements relating to optical sensing systems |
| 06/09/1992 | US5120133 Interferometer with two phase-conjugate mirrors |
| 06/07/1992 | CA2056643A1 Optical sensing systems |
| 06/04/1992 | DE4031291A1 Heterodyne double interferometer with signal detector - passes reference and measuring beams over common paths and compensates for systematic errors |
| 06/03/1992 | CN1016895B Contactless integrated measuring unit for mechanical vibration |
| 06/02/1992 | CA1302076C Method and apparatus for two-wavelength interferometry withoptical heterodyne processes and use for position or range finding |
| 05/26/1992 | US5116126 Interferometer requiring no critical component alignment |
| 05/20/1992 | EP0485803A1 Optical scanning device with confocal beam path using a light source array and a detector array |
| 05/20/1992 | EP0333783B1 Straightness interferometer system |
| 05/19/1992 | US5114226 3-Dimensional vision system utilizing coherent optical detection |
| 05/14/1992 | DE4035799A1 Confocal scanning microscope with computer control - has illumination raster corresponding to raster of CCD sensor receiving image of scanned object |
| 05/13/1992 | EP0484913A2 Polarization independent optical coherence-domain reflectometry |
| 05/12/1992 | US5113079 Non-destructive testing of aircraft for structural integrity using holographic moire patterns |
| 05/12/1992 | US5112129 Method of image enhancement for the coherence probe microscope with applications to integrated circuit metrology |
| 05/11/1992 | CA2054928A1 Optical device with confocal beam path |
| 05/05/1992 | US5110211 Optical interference signal extractor with device for reduced noise from optical light power variation |
| 04/29/1992 | EP0482461A1 Mach-Zehnder interferometer for multi/demultiplexing |
| 04/28/1992 | US5108183 Interferometer utilizing superfluorescent optical source |
| 04/23/1992 | DE4033253A1 Optical interferometer with DC laser diode - has current supply varied to maintain constant output strip frequency |
| 04/23/1992 | CA2053710A1 Mach-zehnder interferometer |
| 04/22/1992 | EP0481918A1 Optical device for white light interferometry |
| 04/22/1992 | EP0481356A2 Optical system utilizing polarization |
| 04/21/1992 | US5106194 Method and apparatus for absolute interferometric testing of plane surfaces |
| 04/21/1992 | US5106193 Optical waveguide amplifier source gyroscope |
| 04/21/1992 | US5106192 Polarization insensitive absolute interferometeric method and apparatus for measuring position angular bearing and optical paths |
| 04/21/1992 | US5106191 Two-frequency distance and displacement measuring interferometer |
| 04/21/1992 | US5105595 Mold panel unit and spring-water processing structure using mold panel units |
| 04/21/1992 | US5105545 Apparatus for measuring a width dimension of a helical surface |
| 04/16/1992 | WO1992006354A1 Full surface interferometric testing instrument |
| 04/16/1992 | WO1992006353A1 Interferometer |
| 04/15/1992 | CN1016274B Zaser contourgraph of contactless high resolution scanning type |
| 04/15/1992 | CN1016273B Microcomputerized 4-coordinate measuring system of universal tool microscope |