| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 07/18/2000 | US6089085 Method for analyzing a separation in a deformable structure |
| 07/12/2000 | EP1018631A2 Device to measure dimensions of objects and procedure to use same device |
| 07/12/2000 | EP1018044A1 Stable nonlinear mach-zehnder fiber switch |
| 07/12/2000 | EP1007944A4 Surface analysis using gaussian beam profiles |
| 07/11/2000 | US6088103 Optical interference alignment and gapping apparatus |
| 07/11/2000 | US6088101 Method for analyzing a separation in a deformable structure |
| 07/11/2000 | US6088099 Method for interferometer based spectral imaging of moving objects |
| 07/06/2000 | DE19858428A1 Verfahrbarer x/y-Koordinaten-Meßtisch Movable x / y coordinate measurement table |
| 07/05/2000 | EP1016849A1 Length measuring instrument |
| 07/05/2000 | EP1015844A1 Spectral bio-imaging methods for cell classification |
| 07/05/2000 | CN2386421Y Gradient index fibre spheric wave interferometer |
| 07/04/2000 | US6084672 Device for optically measuring an object using a laser interferometer |
| 07/04/2000 | US6084671 Surface analysis using Gaussian beam profiles |
| 06/29/2000 | DE19962631A1 Twin-beam interference objective comprizes light path-dividing prism and reference mirror in first path and adjusted by tilter to set width and direction of interference bands. |
| 06/29/2000 | DE19859781A1 Method for out-of-plane deformation or vibration analysis measurement using electronic speckle pattern interferometry based on use of microstructured refracting optical elements |
| 06/29/2000 | DE19859679A1 Meßeinrichtung zur Erfassung von Dimensionen von Prüflingen sowie Verfahren unter Verwendung der Meßeinrichtung Measuring device for the detection of dimensions of specimens, as well as methods using the measuring device |
| 06/28/2000 | EP1014071A2 Coma aberration automatic measuring mark and measuring method |
| 06/28/2000 | EP1014030A1 Movable x/y stage for coordinate measurement |
| 06/28/2000 | EP1012535A1 Background compensation for confocal interference microscopy |
| 06/28/2000 | EP1012533A1 Laser measurement system for rapid calibration of machine tools |
| 06/27/2000 | US6081379 Multiple coupled Gires-Tournois interferometers for group-delay-dispersion control |
| 06/21/2000 | DE19857929A1 Method and equipment for optical distance measurement between two planes employing transmission or reflection type etalons |
| 06/20/2000 | US6078706 Quasi-static fiber pressure sensor |
| 06/20/2000 | US6078393 Phase shift mask inspection apparatus |
| 06/15/2000 | WO2000034735A1 Speckle shearing-interferometer for strain measurement |
| 06/14/2000 | EP1008845A1 Apparatus and method for standing wave microscopy, also for DNA sequencing, and calibration procedure |
| 06/14/2000 | EP1007944A1 Surface analysis using gaussian beam profiles |
| 06/14/2000 | EP1007907A1 Open loop signal processing circuit and method for a fiber optic interferometric sensor |
| 06/14/2000 | EP1007901A1 Doppler flow imaging using optical coherence tomography |
| 06/14/2000 | CN1256396A Offset measuring system and method for image sensing chip |
| 06/13/2000 | US6075600 Signal formation apparatus for use in interference measurement |
| 06/13/2000 | US6075598 Interferometer |
| 06/08/2000 | WO2000033021A1 Method for improving measurements by laser interferometer |
| 06/08/2000 | DE19856398A1 Method and appliance for determining strain and/or stress of tyre use Shearing interferometer with time or phase shift |
| 06/07/2000 | EP0755530B1 Device for determining the position of a surgical microscope |
| 06/06/2000 | US6072765 Optical disk readout method using optical coherence tomography and spectral interferometry |
| 06/06/2000 | US6072582 Displacement measuring method and apparatus using interference of two beams |
| 06/06/2000 | US6072581 Geometrically-desensitized interferometer incorporating an optical assembly with high stray-beam management capability |
| 06/06/2000 | US6072579 Optical pickup apparatus having improved holographic optical element and photodetector |
| 06/06/2000 | US6072570 Image quality mapper for progressive eyeglasses |
| 06/06/2000 | US6071426 Micro benchtop optics by bulk silicon micromachining |
| 05/31/2000 | DE19956707A1 Optisches Interferometer Optical Interferometer |
| 05/30/2000 | US6069698 Optical imaging apparatus which radiates a low coherence light beam onto a test object, receives optical information from light scattered by the object, and constructs therefrom a cross-sectional image of the object |
| 05/25/2000 | DE19963161A1 Interstitial fiber-optic coherence tomography method involves inserting thin optical fiber with measurement window into tissue as optical probe so light exits laterally through window |
| 05/24/2000 | EP1003010A2 Interferometer and measuring method using interferometer |
| 05/24/2000 | CN1254088A Interferometer and measurement method adopting said interferometer |
| 05/23/2000 | US6067161 Apparatus for measuring material thickness profiles |
| 05/17/2000 | EP1000315A1 Pulse measurement using frequency shifting techniques |
| 05/16/2000 | US6064630 Sensor with an optical interferometric pick-off |
| 05/16/2000 | US6064482 Interferometric measuring device for form measurement on rough surfaces |
| 05/16/2000 | US6064481 Method and apparatus for positioning object in space using a low-coherence laser beam which is reflected by two references to sharpen the interference fringe lines |
| 05/11/2000 | WO2000026622A1 Phase determination of a radiation wave field |
| 05/10/2000 | EP0998665A1 Image quality mapper for progressive eyeglasses |
| 05/10/2000 | EP0998656A1 Method and apparatus for surface profiling of materials and calibration of ablation lasers |
| 05/09/2000 | US6061136 Method for measuring shape of object and apparatus for carrying out the same |
| 05/09/2000 | US6061134 Modulated Fourier Transform Raman fiber-optic spectroscopy |
| 05/09/2000 | US6061133 Interferometer light source |
| 05/04/2000 | WO2000025154A1 Multilayer mirrors dispersion control |
| 05/04/2000 | WO2000025086A1 Apparatus and method for producing a spectrally variable radiation source and systems including same |
| 05/04/2000 | DE19950778A1 Geometrically desensitized interferometer with high scattered radiation management capability has image generator receiving light reflected back from test surface via optical system |
| 05/03/2000 | EP0997826A2 Method for processing interferometric measurement data |
| 05/03/2000 | EP0997703A1 Interferometric thickness profiles with a flatness maintaining channel for the moving material |
| 05/03/2000 | EP0997702A1 Interferometric thickness profiles with maintenance of a flatness of the moving material |
| 05/03/2000 | EP0996854A1 Wave field microscope, method for a wave field microscope, including for dna sequencing, and calibration method for wave field microscopy |
| 05/03/2000 | CN1251906A Optical fiber mach-zehnder Interferometers manufactured from asymetrical couplers |
| 05/02/2000 | US6057921 Two piece mirror arrangement for interferometrically controlled stage |
| 05/02/2000 | US6057920 Optical coherence tomography with dynamic coherent focus |
| 04/25/2000 | US6055329 High speed opto-electronic gage and method for gaging |
| 04/25/2000 | US6055325 Color display of chromosomes or portions of chromosomes |
| 04/25/2000 | US6053613 Optical coherence tomography with new interferometer |
| 04/20/2000 | WO2000022376A1 Shape measuring method and shape measuring device, position control method, stage device, exposure apparatus and method for producing exposure apparatus, and device and method for manufacturing device |
| 04/18/2000 | US6052186 Dual laser system for extended heterodyne interferometry |
| 04/18/2000 | US6052185 Method and apparatus for measuring the concentration of ions implanted in semiconductor materials |
| 04/18/2000 | US6052179 Method and system for determining the wavelength of light transmitted through an optical fiber |
| 04/13/2000 | DE19845413A1 Reflection interference microscope with structure corresponding to top illumination microscope, has ring aperture and illuminates specimen over defined region of aperture |
| 04/12/2000 | EP0991925A1 Fiber-optic frequency shifter, optical interferometer and method of generating two complementary optical interference signals using the same |
| 04/12/2000 | CN2373803Y 读数显微镜 Reading microscope |
| 04/05/2000 | EP0760085B1 Method for surface topography measurement using a phase shifting interferometer |
| 04/05/2000 | CN1249810A Background compensation for confocal interference microscopy |
| 04/04/2000 | US6046792 Differential interferometer system and lithographic step-and-scan apparatus provided with such a system |
| 03/30/2000 | WO2000017613A1 Optical phase detector |
| 03/30/2000 | WO2000017605A1 Dynamic beam steering interferometer |
| 03/30/2000 | WO2000017604A1 Quasi-static fiber pressure sensor |
| 03/30/2000 | DE19935845A1 Sensor und Verfahren zum Messen von Umgebungszustandsänderungen Sensor and method for measuring environmental condition changes |
| 03/30/2000 | DE19844256A1 Device for projection of patterns used in measurement techniques, quality assurance and object digitalizing; uses ultrasonic piezo motor to displace diapositive patterns |
| 03/29/2000 | EP0989423A2 Optical fiber mach-zehnder interferometer fabricated with asymmetric couplers |
| 03/28/2000 | US6043890 Arrangement for determining the position of a surgical microscope |
| 03/28/2000 | US6043886 Interferometric method of measuring toric surfaces at grazing incidence with phase shifting |
| 03/23/2000 | WO2000016034A1 Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements |
| 03/21/2000 | US6040900 Compact fiber-optic electronic laser speckle pattern shearography |
| 03/15/2000 | EP0985902A1 Interferometric device for picking up optical subsurface reflexion and/or transmission characteristics of an object |
| 03/15/2000 | EP0850397A4 Methods for detecting striae |
| 03/15/2000 | CN2369213Y Self recording calliper |
| 03/14/2000 | US6038027 Method for measuring material thickness profiles |
| 03/09/2000 | WO2000012959A1 Interferometric apparatus and method for measuring motion along multiple axes |
| 03/09/2000 | WO1999063304A9 Apparatus and methods for surface contour measurement |
| 03/08/2000 | EP0983483A1 Interferometric measuring device |
| 03/08/2000 | EP0983481A2 Two piece mirror arrangement for interferometrically controlled stage |
| 03/08/2000 | CN1050203C Inclination angle sensing apparatus for projector |
| 03/07/2000 | US6034774 Method for determining the retardation of a material using non-coherent light interferometery |