| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 12/05/1995 | US5473433 Method of high yield manufacture of VLSI type integrated circuit devices by determining critical surface characteristics of mounting films |
| 12/05/1995 | US5473432 Apparatus for measuring the thickness of a moving film utilizing an adjustable numerical aperture lens |
| 12/05/1995 | US5473431 Interferometric flying height measuring device including an addition of a spacer layer |
| 12/05/1995 | US5473429 Method and apparatus for controlling the reciprocating translation of an interferometer reflector or other body |
| 11/30/1995 | DE4418213A1 Apparatus for measuring changes in optical pathlength and its direction |
| 11/28/1995 | US5471305 Alignment verification system for use with interferometer and having a line sensor |
| 11/28/1995 | US5471302 Interferometric probe for distance measurement utilizing a diffraction reflecting element as a reference surface |
| 11/28/1995 | US5471300 Apparatus and method for providing a feedback measurement in a laser system |
| 11/23/1995 | WO1995031694A1 Improved phase shifting interferometer and method for surface topography measurement |
| 11/22/1995 | EP0682771A1 Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
| 11/21/1995 | US5469261 Measurement of lens characteristics |
| 11/21/1995 | US5469260 Stage-position measuring apparatus |
| 11/21/1995 | US5469259 Inspection interferometer with scanning autofocus, and phase angle control features |
| 11/16/1995 | DE4416786A1 Calibration of interferometer for testing surface profile of cylindrical sample |
| 11/14/1995 | US5467184 Method of large deformation measurement using speckle interferometry |
| 11/14/1995 | US5465611 Sensor head for use in atomic force microscopy and method for its production |
| 11/08/1995 | EP0681166A1 Improvements in or relating to optical interferometers |
| 11/07/1995 | US5465148 Apparatus and method for detecting the relative positional deviation between two diffraction gratings |
| 11/07/1995 | US5465147 Method and apparatus for acquiring images using a ccd detector array and no transverse scanner |
| 11/02/1995 | DE4400680C2 Vorrichtung zur Bestimmung von Abstandsänderungen eines Objekts An apparatus for determining changes in the distance of an object |
| 10/24/1995 | US5460627 Method of evaluating a laser used in ophthalmological surgery |
| 10/19/1995 | WO1995027918A2 Method of determining measurement-point position data and device for measuring the magnification of an optical beam path |
| 10/19/1995 | WO1995027917A1 Method of determining the position of a feature on an object relative to a surgical microscope and a device for carrying out the method |
| 10/17/1995 | US5459578 Method and apparatus for measuring two dimensional plane displacement by moire fringes of concentric circle gratings |
| 10/17/1995 | US5459572 Mirror arrangement in a focusing interferometer |
| 10/17/1995 | US5459571 Multiple control frequency phase modulator in phase modulated interferometer precision distance measuring system |
| 10/17/1995 | US5459570 Method and apparatus for performing optical measurements |
| 10/17/1995 | US5459564 Apparatus and method for inspecting end faces of optical fibers and optical fiber connectors |
| 10/11/1995 | EP0676629A2 Refractive index measurement of spectacle lenses |
| 10/11/1995 | EP0676616A1 Retardation line for an interferometer |
| 10/10/1995 | US5457571 Metallographic microscope useful for the characterization of conductors drawing dies |
| 10/10/1995 | US5457570 Ultraviolet resistive antireflective coating of Ta2 O5 doped with Al2 O3 and method of fabrication |
| 10/10/1995 | US5457534 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
| 10/10/1995 | US5457533 Point-diffraction interferometer utilizing separate reference and signal beam paths |
| 10/10/1995 | US5457531 Movable mirror mounting mechanism in a scanning interferometer |
| 10/10/1995 | US5457529 Rotating mirror interferometer |
| 10/05/1995 | DE19509598A1 Light wavelength measurement appts. |
| 09/28/1995 | WO1995025979A1 Operating microscope |
| 09/27/1995 | EP0673500A1 Interferometric measurement device. |
| 09/26/1995 | US5453835 Multichannel acousto-optic correlator for time delay computation |
| 09/26/1995 | US5453833 Wavelength stabilizing light source apparatus by maintaining a constant phase difference |
| 09/19/1995 | US5452088 Multimode-laser interferometric apparatus for eliminating background interference fringes from thin-plate measurements |
| 09/19/1995 | US5451772 For sensing physical parameters at several locations |
| 09/14/1995 | WO1995024619A1 Interferometre and fourier transform spectrometer |
| 09/13/1995 | EP0671601A2 System and method for optical interferometric measurement |
| 09/12/1995 | US5450195 Phase-modulated interferometer for evaluating phase displacement resulting from charges in path length |
| 09/12/1995 | US5449901 Fine surface observing apparatus |
| 09/06/1995 | EP0670467A1 Interferometer |
| 09/05/1995 | US5448662 Apparatus for coupling an optical fiber to a structure at a desired angle |
| 09/05/1995 | US5448352 Method and apparatus for the nondestructive testing of vessels made of composite material wound on a metallic liner by means of holographic interferometry |
| 09/05/1995 | US5448058 Optical signal detection apparatus and method for preventing polarization signal fading in optical fiber interferometric sensor systems |
| 08/31/1995 | WO1995023324A1 Motion-transfer mechanism, beam-splitter assembly, and interferometer |
| 08/30/1995 | EP0669525A2 Interferometrical system for detecting and localising reflective defects of light guide structures |
| 08/30/1995 | EP0610374B1 Process for measuring the inclination of boundary areas in an optical system |
| 08/30/1995 | CN1107577A Image dissection method and apparatus by photon tunnel scan |
| 08/29/1995 | US5446808 Photomechanical positioning and stabilization method and devices using optical fibers and feedback |
| 08/29/1995 | US5446545 Method of and apparatus for calibrating machines including a measuring probe and a measuring apparatus |
| 08/23/1995 | EP0668490A2 Electrically tunable fabry-perot interferometer produced by surface micromechanical techniques for use in optical material analysis |
| 08/23/1995 | EP0668483A2 Laser interferometer |
| 08/22/1995 | US5444532 Interferometer apparatus for detecting relative movement between reflecting members |
| 08/22/1995 | US5443684 Forming heterostructure device on wafer, etching a crater in wafer with ion beam at low angle, removing material from crater with etchant, measureing with magnifying optical microscope |
| 08/10/1995 | WO1995020920A1 A microkeratome and method and apparatus for calibrating a microkeratome |
| 08/10/1995 | DE4403929A1 Optical interferometer with non-reflecting multiport coupler |
| 08/09/1995 | CN2205029Y Portable barcode quality tester |
| 08/01/1995 | US5438412 Phase conjugate interferometer for testing paraboloidal mirror surfaces |
| 07/25/1995 | US5436724 Apparatus for measuring relative movement using a diffraction grating having an orthogonally polarized input beam |
| 07/20/1995 | WO1995019541A1 An interferometric measuring system |
| 07/13/1995 | WO1995018951A1 Inspection interferometer with scanning feature |
| 07/13/1995 | DE4400680A1 Measurement of positional change using self-mixing interference laser |
| 07/11/1995 | US5432606 Interferometer for the measurement of surface profile which introduces a spatial carrier by tilting the reference mirror |
| 07/11/1995 | US5432595 Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison |
| 07/06/1995 | WO1995018352A1 Scanning force microscopy process and scanning force microscope with detector probe |
| 07/05/1995 | EP0660918A1 Interferometric measurement process and laser interferometer therefor. |
| 06/29/1995 | WO1995017646A1 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
| 06/28/1995 | EP0659383A2 Method and apparatus for optical coherence tomographic fundus imaging |
| 06/27/1995 | US5428444 Real time interferometric comparator |
| 06/21/1995 | EP0658813A1 Radiation-source unit for generating a beam having two directions of polarisation and two frequencies |
| 06/20/1995 | US5426504 Optical depth gauge for optically rough surfaces |
| 06/14/1995 | EP0657713A2 Combined interferometer and refractometer |
| 06/14/1995 | CN2200814Y Detecting instrument for shell bottom and shell bottom groove trace |
| 06/13/1995 | US5424828 Method for measuring and analyzing interference fringes using a halographic optical element having two patterns for diffracting a laser beam |
| 06/13/1995 | US5423128 Cigarette filter rod minimum point gauge |
| 06/08/1995 | DE4103914C2 Interferometer Interferometer |
| 06/08/1995 | DE4006407C2 Interferometrische Längen- oder Winkelmeßeinrichtung Interferometric length or angle |
| 06/06/1995 | US5422713 Bi-refringent waveguide rotational alignment method using white light interferomety |
| 06/06/1995 | US5422703 Reflected light measuring method and reflected light measuring apparatus for a microscopic photometric system |
| 05/30/1995 | US5420717 Adjustable-contrast microscope |
| 05/30/1995 | US5420688 Interferometric fiber optic displacement sensor |
| 05/26/1995 | WO1995014210A1 Laser interferometric measurement |
| 05/24/1995 | EP0654655A1 Optical achromatic interferometer of the trilateral phase shift type |
| 05/24/1995 | DE4228535C2 Dünnschicht-Interferometer Thin-film interferometer |
| 05/23/1995 | US5418612 Method of and apparatus for determining surface contour of diffusely reflecting objects |
| 05/17/1995 | CN1028446C Projective type measuring instrument for measuring clearance of die set and working theory |
| 05/16/1995 | CA2036567C Michelson interferometer for producing optical path differences |
| 05/09/1995 | US5414646 Digital optical micrometer |
| 05/09/1995 | US5414512 Method and apparatus for viewing a shearographic image |
| 05/03/1995 | CN1102288A Nanometer metrology |
| 05/02/1995 | US5412474 System for measuring distance between two points using a variable frequency coherent source |
| 05/02/1995 | CA1335418C Interferometric sensor and its use in an interferometer |
| 04/26/1995 | EP0650070A2 Interferometry with multipath nulling |