Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
09/2001
09/06/2001DE10106565A1 Point diffraction interferometer is used in the manufacture of very high tolerance reflex mirrors and as an aid in projection alignment, with a pinhole mirror for beam bundling and splitting off a reference beam
09/06/2001DE10033189C1 Low-coherence interferometry device has short coherence interferometer with scanning objective and beam splitter moved in synchronism during depth scanning of object
09/04/2001US6285456 Dimension measurement using both coherent and white light interferometers
09/04/2001US6285447 Method for increasing the signal-to-noise ratio in non-destructive testing
08/2001
08/30/2001WO2001063230A1 Double pass double etalon spectrometer
08/30/2001US20010017697 Optical system for oblique incidence interferometer and apparatus using the same
08/29/2001EP1127252A1 Phase determination of a radiation wave field
08/29/2001EP1007901A4 Doppler flow imaging using optical coherence tomography
08/29/2001CN2445287Y Dividing scale of optical coordinate position indicator
08/29/2001CN1310333A Electronic holographic measurement method without direct transmission light and conjugate image
08/28/2001US6282011 Grating based phase control optical delay line
08/28/2001US6279404 Device and method for measuring deformation of a mechanical test specimen
08/23/2001WO2001061323A1 Instrument for measuring physical property of sample
08/23/2001WO2001061322A1 Instrument for measuring physical property of sample
08/23/2001WO2001061321A1 Instrument for measuring physical property of sample
08/22/2001EP1125150A1 Multilayer mirrors for dispersion control
08/22/2001EP1125095A1 Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements
08/22/2001EP1086353A4 Method and apparatus for determining processing chamber cleaning or wafer etching endpoint
08/22/2001EP1022978A4 Confocal scanning microscope with angled objective lenses for improved axial resolution
08/22/2001CN1309759A Method and apparatus for confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation
08/16/2001WO2001059426A1 Superfine indentation tester
08/16/2001WO2001059402A2 Optical systems for measuring form and geometric dimensions of precision engineered parts
08/16/2001WO2001007885A3 Phase-shifting point diffraction interferometer focus-aid enhanced mask
08/16/2001US20010014191 Interference measurement apparatus and probe used for interference measurement apparatus
08/16/2001US20010013933 Double pass double etalon spectrometer
08/08/2001EP0832418B1 Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing
08/08/2001EP0631660B1 Interferometer requiring no critical component alignment
08/08/2001CN1069401C Method and system for measuring surface profile of object using large equivalent wavelength
08/07/2001US6271924 Noncontact acoustic optic scanning laser vibrometer for determining the difference between an object and a reference surface
08/07/2001US6271923 Interferometry system having a dynamic beam steering assembly for measuring angle and distance
08/02/2001WO2000057228A3 Apparatus for producing and guiding a light beam
08/02/2001US20010010591 Differential interference contrast microscope and microscopic image processing system using the same
07/2001
07/31/2001US6268921 Interferometric device for recording the depth optical reflection and/or transmission characteristics of an object
07/26/2001US20010009462 Compensation for measurement uncertainty due to atmospheric effects
07/25/2001EP1078216A4 Method and apparatus for recording three-dimensional distribution of light scattering
07/25/2001CN1305581A Method and system for determining wavelength of light transmitted through optical fiber
07/24/2001US6266183 Self-centering crash protection mechanism for interference microscope objective
07/24/2001US6266147 Phase-shifting point diffraction interferometer phase grating designs
07/18/2001EP1116012A1 Optical phase detector
07/17/2001US6262839 Optical unit for image projection and tool incorporating same
07/12/2001WO2001050201A1 Improvements to acquisition and replay systems for direct-to-digital holography and holovision
07/12/2001US20010007502 Optical system for oblique incidence interferometer and apparatus using the same
07/12/2001DE10064037A1 Interference fringe pattern analyzing procedure involves applying Fourier transformation to polar coordinate converted image data for shape analysis and converting analyzed result to rectangular coordinate
07/10/2001US6259473 Section image obtaining apparatus and method of obtaining section image
07/05/2001WO2001001064A3 Topographer for real time ablation feedback
07/05/2001US20010006422 Stage system in projection exposure apparatus
07/05/2001US20010006420 Laser measuring device and laser measuring method
07/04/2001EP1113243A2 Optical interference apparatus and position detection apparatus
07/04/2001CN1067942C Marking of mold inserts to produce marked contact lenses
07/03/2001US6256102 Dual-beam low-coherence interferometer with improved signal-to-noise ratio
06/2001
06/27/2001EP1111489A1 Two-dimensional positioning apparatus and method for measuring laser light from the apparatus
06/26/2001US6252717 Optical apparatus with an illumination grid and detector grid having an array of anamorphic lenses
06/26/2001US6252669 Interferometric instrument provided with an arrangement for producing a frequency shift between two interfering beam components
06/26/2001US6252668 Systems and methods for quantifying nonlinearities in interferometry systems
06/26/2001US6252667 Interferometer having a dynamic beam steering assembly
06/21/2001WO2001044845A1 Interferometer apparatus and method
06/21/2001CA2394399A1 Interferometer apparatus and method
06/19/2001US6249351 Grazing incidence interferometer and method
06/19/2001US6249350 Interferometer and methods for compensation of dispersion or increase in spectral resolution of such an interferometer
06/19/2001US6248995 Confocal microscopic equipment
06/14/2001WO2001042735A1 Optical mapping apparatus with adjustable depth resolution
06/13/2001EP1076805A4 Method of tuning an optical device
06/13/2001DE10038346A1 Multiwavelength interferometer detects amplitude modulation of electrical signal with difference in frequency of signal by detecting phase difference between difference frequency and modulation frequency signals
06/13/2001CN2434636Y Golf ball mirror
06/12/2001US6246482 Optical translation measurement
06/12/2001US6246481 Systems and methods for quantifying nonlinearities in interferometry systems
06/12/2001US6246477 High resolution scanning microscope
06/05/2001US6243170 Double pass etalon spectrometer
05/2001
05/31/2001WO2001038821A1 Optical interferometer (variants)
05/31/2001WO2001038820A1 Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object
05/31/2001DE19955268A1 Interferometric object analysis method e.g. for medical applications, has interference signals for two central wavelengths shifted relative to one another dependent on expected dispersion
05/31/2001DE10033724A1 Wellenlängenstabilisierte Lichtquelleneinrichtung A wavelength stabilized light source means
05/31/2001CA2396895A1 Optical interferometer (variants)
05/25/2001WO2001036901A2 Systems and methods for quantifying nonlinearities in interferometry systems
05/23/2001DE10050802A1 Movable mirror holder for use in photointerferometer used in measuring instruments, has coupling plate fitted with ends of both springs connected with movable mirror and base respectively at their other ends
05/22/2001US6236507 Apparatus to transform two nonparallel propagating optical beam components into two orthogonally polarized beam components
05/17/2001DE10050749A1 Laser interferometer has reference beam path and mirror which are arranged linearly along movement direction of slider
05/15/2001US6233370 Interference measurement apparatus and probe used for interference measurement apparatus
05/15/2001US6233054 Fourier-transform spectrometer configuration optimized for self emission suppression and simplified radiometric calibration
05/10/2001US20010000978 Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures
05/09/2001CN1294673A Method for tuning optical device
05/08/2001US6229644 Differential interference contrast microscope and microscopic image processing system using the same
05/08/2001US6229619 Compensation for measurement uncertainty due to atmospheric effects
05/08/2001US6229614 Interferometer
05/08/2001US6229600 Spherical-aberration detection system and optical device using the same
05/03/2001WO2001031289A1 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique
05/03/2001WO2001031288A1 Optical fiber infrasound sensor
05/03/2001WO2001031286A2 Method and device for non-destructive inspection of objects by means of optical holographic interferometry
05/02/2001CN1293361A Semiconductor laser interferometric device for real-time measurement of thickness and refractivity
05/01/2001US6226092 Full-field geometrically desensitized interferometer using refractive optics
05/01/2001US6226091 Optical fiber Mach-Zehnder interferometer fabricated with asymmetric couplers
04/2001
04/19/2001WO2001027606A1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
04/19/2001WO2001027558A1 Interferometric measuring device for form measurement
04/19/2001DE19949760A1 Interferometer Interferometer
04/19/2001DE10041878A1 Endoscope apparatus generates video signal based on the photographed image of examined object and tomogram signal
04/18/2001EP1092943A1 Interferometer with rotating Fabry Perot
04/18/2001EP1092124A1 Method and apparatus for ultrasonic laser testing
04/18/2001EP1092123A1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
04/17/2001US6219144 Apparatus and method for measuring the refractive index and optical path length effects of air using multiple-pass interferometry
04/17/2001US6218870 Anti-glitch system and method for laser interferometers using frequency dependent hysteresis