| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 03/03/1994 | DE4228535A1 Laboratory thin-film interferometer - with both measurement and reference optical paths passing through the liquid sample film |
| 03/02/1994 | CN2158073Y Precision two-dimensional wide-range elastic scanning working table |
| 03/02/1994 | CN2158072Y Micro-feeding & positioning mechanism for precision scanning tunnel micro-technique |
| 03/01/1994 | US5291268 Method and apparatus for determining a path difference in a Michelson interferometer |
| 03/01/1994 | US5291267 Optical low-coherence reflectometry using optical amplification |
| 02/22/1994 | US5289256 Integrated-optics expansion interferometer in an extension-metrological neutral environment |
| 02/15/1994 | US5287031 Device for supporting and linearly moving an object |
| 02/10/1994 | DE4226136A1 Heterodyne diffraction optical interferometer - directs beam through input transmission grating on transparent block, and reflects off rear reflection layer to second reflective layer on input surface |
| 02/09/1994 | EP0581871A1 Method and apparatus for optical imaging and measurement |
| 02/08/1994 | US5285424 Wide bandwidth fiber optic hydrophone |
| 02/08/1994 | US5285261 Dual interferometer spectroscopic imaging system |
| 02/08/1994 | US5285252 Optical method and optical device for distance measurement and their application to the relative positioning of parts |
| 02/08/1994 | US5285167 System for producing a digitized analog signal |
| 02/03/1994 | WO1994002990A1 Method and apparatus for signal compression |
| 02/03/1994 | DE4224744A1 Interferometer for detecting electric field generated vibration of metallic particles in gas insulated HV switchgear - feeds laser beam into sensing and reference optical fibre branches of Mach=Zehnder interferometer, has two photodetectors at output of combiner-divider and control loop for zeroing difference between detector voltages |
| 02/02/1994 | EP0581217A1 Near field scanning optical microscope |
| 01/29/1994 | CA2101386A1 Fine surface observing apparatus |
| 01/26/1994 | CN1081250A Method and apparatus for detecting surface roughness |
| 01/25/1994 | US5282151 Submicron diameter particle detection utilizing high density array |
| 01/25/1994 | US5282015 Methods and means for full-surface interferometric testing of grazing incidence mirrors |
| 01/18/1994 | US5280341 Feedback controlled differential fiber interferometer |
| 01/18/1994 | US5280340 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
| 01/12/1994 | EP0578400A2 Optical low coherence reflectometer with delay sequence |
| 01/11/1994 | US5278632 Multi-axis optical projector |
| 01/06/1994 | WO1994000733A1 Method of an apparatus for interferometrically inspecting a surface of an object |
| 01/05/1994 | EP0577514A1 Apparatus for the precision measurement of internal tube diameter over a long distance |
| 01/05/1994 | EP0576886A2 Laser interferometric measurement systems for a plurality of measuring stations |
| 01/05/1994 | EP0576885A1 Multi-arm interferometer |
| 01/04/1994 | US5276743 Langmuir-Blodgett films in a waveguide optical pick-up head using Mach-Zehnder interferometers |
| 01/04/1994 | US5276502 Subject position adjustment apparatus for use with interferometers |
| 01/04/1994 | US5276501 For sensing an environmental parameter |
| 12/29/1993 | CN2151436Y Electronic scattering interferometer |
| 12/28/1993 | US5274436 Laser interferometer for measuring distance using a frequency difference between two laser beams |
| 12/22/1993 | EP0575095A1 Full aperture grazing incidence interferometry |
| 12/22/1993 | EP0574565A1 Bearing for a moving mirror of a michelson interferometer. |
| 12/22/1993 | CN1079820A Fabry-Perot with coated mirrors |
| 12/15/1993 | EP0539571A4 Dynamic shearing interferometer |
| 12/14/1993 | US5270793 Symmetrical carrier frequency interferometer |
| 12/14/1993 | US5270792 Dynamic lateral shearing interferometer |
| 12/14/1993 | US5270789 White light interferometric device adapted to define an absolute reference position |
| 12/07/1993 | US5268742 Optical metrology apparatus for examining a surface |
| 12/07/1993 | US5268741 Method and apparatus for calibrating a polarization independent optical coherence domain reflectometer |
| 12/07/1993 | US5268738 Extended distance range optical low-coherence reflectometer |
| 11/25/1993 | WO1993023780A1 Mechanical mounting |
| 11/25/1993 | WO1993023726A1 Solid-block homodyne interferometer |
| 11/25/1993 | DE4216551A1 Non destructive detection of material and component defects - subjecting object to two different time-displaced load conditions and forming interference patterns using incident coherent radiation and superimposed reference beam on CCD photodetector. |
| 11/24/1993 | EP0571022A1 Fabry-perot with coated mirrors |
| 11/20/1993 | CA2096455A1 Fabry-perot with coated mirrors |
| 11/18/1993 | EP0570243A1 Wavelength measuring device and laser apparatus equipped with the device |
| 11/18/1993 | EP0569353A1 Rare-earth-doped lithium niobate waveguide structures. |
| 11/18/1993 | DE4236993A1 Anordnung zum direkten Vergleich sowie zur Kalibrierung von Laserinterferometern und zur Präzisionsmessung mit einem Laserinterferometer Arrangement for direct comparison and calibration of laser interferometers, and precision measurement with a laser interferometer |
| 11/16/1993 | CA2095472A1 Wavelength measuring device and laser apperatus equipped with the device |
| 11/11/1993 | WO1993022637A1 Interferometer |
| 11/11/1993 | WO1993022614A1 Interferometer requiring no critical component alignment |
| 11/09/1993 | US5260761 Apparatus for the measurement of surface shape |
| 11/09/1993 | US5260567 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit |
| 11/02/1993 | US5258861 Reflection type hologram scale |
| 10/28/1993 | DE4313076A1 Laser interferometer for length and direction of movement measurement |
| 10/26/1993 | US5257091 Optical alignment system for aligning a multiple gap tape head assembly |
| 10/26/1993 | US5257089 Optical head for shearography |
| 10/20/1993 | EP0566218A2 Method for finding a preferred spot for a laser beam of a laser beam interferometer and laser interferometer apparatus |
| 10/20/1993 | EP0566217A2 Method and apparatus for focussing a beam of radiant energy |
| 10/19/1993 | CA1323234C Phase-controlled thin film multilayers for michelson interferometers |
| 10/06/1993 | EP0564431A1 Device for stabilising the wavelength of a light beam emitted by a laser-diode and laser-interferometer |
| 10/06/1993 | EP0563196A1 Structural examination using holographic interferometry |
| 09/30/1993 | DE4209701A1 Guoy-effect optical distance and displacement sensor - has laser for providing beam to dual-mode optical fibre and detects phase difference change between modes due to transition from near to far field using interference pattern |
| 09/28/1993 | US5249030 Method and apparatus for determining the position of a moving body and the time of the position measurement |
| 09/28/1993 | US5248876 Tandem linear scanning confocal imaging system with focal volumes at different heights |
| 09/23/1993 | DE4209260A1 Length measurement using laser diode source - contains modulation signal amplitude controller for controlling phase modulators in response to interferometer path length change |
| 09/23/1993 | DE4207630A1 Stereo microscope for light section microscopy - has light source and eyepiece in one path, and CCD camera in other |
| 09/22/1993 | EP0561015A1 Interferometric phase-measuring |
| 09/21/1993 | US5247186 Integrated optical displacement sensor |
| 09/15/1993 | EP0418344B1 Light-generation device |
| 09/09/1993 | DE4305294A1 Photogrammetric measurement appts. - contains individually positionable sensors and laser reference beam generator for diffracting out virtual reference pattern stored in hologram |
| 09/07/1993 | CA1321894C Apparatus and method for electronic analysis of test objects |
| 09/03/1993 | CA2074567A1 Optical gauging system |
| 09/01/1993 | EP0557743A1 Feedback controlled differential fiber interferometer |
| 09/01/1993 | EP0557648A1 Metallographic microscope for the characterization of conductors drawing dies |
| 08/26/1993 | DE4205067A1 Laser interferometer for surface investigation - has beam splitter, mirror and detector element built into basic unit, with one element movable w.r.t. unit and has fibre=optic coupling |
| 08/24/1993 | US5239366 Compact laser probe for profilometry |
| 08/24/1993 | US5239178 Optical device with an illuminating grid and detector grid arranged confocally to an object |
| 08/24/1993 | CA1321503C Optical feedback isolator |
| 08/19/1993 | DE4204601A1 System for determining positional information with optical operation microscope - determines, from displacement and angle detectors, spatial coordinates of selected point seen in vision field. |
| 08/18/1993 | EP0556041A2 Compact laser probe for profilometry |
| 08/12/1993 | DE4203856A1 Refractometer for interferometric integral measuring of refraction index of air - provides beam path of refractometer with parallel vacuum section of known length |
| 08/12/1993 | DE4203855A1 Interferometric distance measurement appts. - has variable wavelength and reference sources with common spectral region and forms optically isolated measurement and reference interferometers and detects difference frequency w.r.t. reference frequency |
| 08/11/1993 | CN1075202A Optical measuring instruments |
| 08/10/1993 | US5235404 Interferometric technique for measurement of nonreciprocal optical effects in a sample |
| 08/04/1993 | EP0546071A4 Interference microscope |
| 07/27/1993 | US5231468 Beam shuttering interferometer and method |
| 07/22/1993 | WO1993014374A1 Interferometer structure |
| 07/22/1993 | WO1993014373A1 Bearing for a moving mirror of a michelson interferometer |
| 07/20/1993 | US5229844 Device for the analysis of interferometrical sensors of micromovements |
| 07/20/1993 | US5229832 Optical ultrasonic material characterization apparatus and method |
| 07/13/1993 | US5227862 Projection exposure apparatus and projection exposure method |
| 07/13/1993 | US5227857 System for cancelling phase noise in an interferometric fiber optic sensor arrangement |
| 07/13/1993 | US5227624 Optical sensing systems with plural wavelengths and wavelength sensitive sensors |
| 06/30/1993 | EP0549456A1 Method and apparatus for optical distance measurement and application to relative workpiece positioning |
| 06/29/1993 | CA2003945C Apparatus and method for processing fiber optic rotation sensor signals |
| 06/16/1993 | EP0546071A1 Interference microscope. |