| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 10/05/1994 | EP0618425A1 Sensor head and method for its manufacture |
| 10/04/1994 | US5353116 Defect inspection system for phase shift masks |
| 10/04/1994 | US5353115 System and method for generating a displacement with ultra-high accuracy using a fabry-perot interferometer |
| 09/29/1994 | DE4410134A1 Interferometric strain sensor |
| 09/28/1994 | EP0489847B1 Interferometer utilizing superfluorescent optical source |
| 09/27/1994 | US5351125 Gaging finger for precision measuring instruments |
| 09/27/1994 | US5351124 Birefringent component axis alignment detector |
| 09/22/1994 | DE4322687C1 Interferometer, after Michelson |
| 09/22/1994 | DE4309056A1 Method for determining the distance and intensity of scattering of the scattering points |
| 09/20/1994 | US5349442 Hand held phase-shifting diffraction moire interferometer |
| 09/20/1994 | US5349440 Interferometric laser profilometer including a multimode laser diode emitting a range of stable wavelengths |
| 09/20/1994 | US5349439 Opto-electronic measuring device with optical air wedge spectral analysis arrangement |
| 09/20/1994 | US5349438 Structure for the dynamic support of a reflective element and interferometer comprising the same |
| 09/15/1994 | DE4308411A1 Interferometer of integrated-optical construction |
| 09/14/1994 | EP0427797B1 Polarization interferometer |
| 09/13/1994 | US5347356 Substrate aligning device using interference light generated by two beams irradiating diffraction grating |
| 09/13/1994 | US5347328 Apparatus for measuring an intraocular length between anterior and posterior portions of an eye |
| 09/08/1994 | DE4306653A1 Measuring head for a combined speckle and speckle/shear interferometer |
| 09/07/1994 | EP0614067A1 Phase modulation interferometer |
| 09/01/1994 | DE4306090A1 Device for length-modulation of a laser beam |
| 08/31/1994 | EP0612976A2 Phase modulated interferometer |
| 08/31/1994 | EP0493169B1 Analysis device for interferometric microdisplacement sensors |
| 08/30/1994 | US5343290 Surface particle detection using heterodyne interferometer |
| 08/25/1994 | DE4305458A1 Phase modulated interferometer, e.g. for length measurement |
| 08/24/1994 | EP0611946A1 Minute step height measuring method and apparatus therefor |
| 08/24/1994 | EP0611438A1 Measuring instruments. |
| 08/23/1994 | US5341212 Wave front interferometer |
| 08/23/1994 | US5341211 Apparatus for making absolute two-demensional position measurements |
| 08/23/1994 | US5341205 Method for characterization of optical waveguide devices using partial coherence interferometry |
| 08/18/1994 | WO1994018523A1 Method and apparatus for the rapid acquisition of data in coherence scanning interferometry |
| 08/18/1994 | WO1994018521A1 Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
| 08/10/1994 | EP0609419A1 Interferometric probe for distance measurement |
| 08/09/1994 | US5337145 Two component straightness interferometer apparatus for measuring movements of parts of a machine |
| 08/02/1994 | EP0619032A4 Optical interferometer with squeezed vacuum and reduced guided-acoustic-wave brillouin scattering noise. |
| 07/27/1994 | CN1090037A Holographic focus-tracing optical contact-tag micrometer |
| 07/26/1994 | US5333048 Polarizing interferometric displacement measuring arrangement |
| 07/21/1994 | WO1994016294A1 Nanometer metrology |
| 07/20/1994 | EP0606677A2 Laser interferometer |
| 07/20/1994 | EP0505366B1 Interferometer arrangement |
| 07/19/1994 | US5331400 Heterodyne interferometer arrangement |
| 07/19/1994 | CA1330716C Device and method for measuring in a wide band the non-reciprocal phase-shift generated in a ring interferometer |
| 07/13/1994 | EP0574565A4 Bearing for a moving mirror of a michelson interferometer |
| 07/13/1994 | EP0448751B1 Integrated acoustooptic heterodyne interferometer |
| 07/12/1994 | US5329356 Interferometer head and interferometer arrangement with rigid support structure |
| 07/07/1994 | WO1994015195A1 Dispersion interferometer |
| 07/06/1994 | EP0605391A2 Polarisation interferometer |
| 07/06/1994 | EP0468019B1 Interferometer |
| 07/06/1994 | CN2171105Y Precision wide range scanning tunnel microtechnic air tyre shockproof device |
| 07/05/1994 | US5327219 Method and apparatus for removing unwanted reflections from an interferometer |
| 07/05/1994 | US5327216 Apparatus for remote seismic sensing of array signals using side-by-side retroreflectors |
| 06/28/1994 | US5325177 Gauge for measuring an internal dimension of a work piece hole |
| 06/28/1994 | US5325175 Solid-block homodyne interferometer |
| 06/23/1994 | WO1994014028A1 Interferometric measurement device |
| 06/21/1994 | US5323229 Measurement system using optical coherence shifting interferometry |
| 06/21/1994 | CA1330366C 3-dimensional vision system utilizing coherent optical detection |
| 06/14/1994 | US5321502 Measuring method and measuring apparatus |
| 06/14/1994 | US5321501 Method and apparatus for optical imaging with means for controlling the longitudinal range of the sample |
| 06/14/1994 | US5321497 Interferometric integration technique and apparatus to confine 2π discontinuity |
| 06/01/1994 | EP0491749B1 Device for absolute two-dimensional position measurement |
| 05/31/1994 | US5317389 Method and apparatus for white-light dispersed-fringe interferometric measurement of corneal topography |
| 05/31/1994 | US5317383 Array retroreflector apparatus for remote seismic sensing |
| 05/24/1994 | US5315373 Method of measuring a minute displacement |
| 05/18/1994 | CN1024593C Measurement method for phase and integer of phase of heterodyne interferometer signal processing and its apparatus |
| 05/17/1994 | US5313271 Absolute gas refractometer wherein the optical path difference of said refractometer is fixed |
| 05/17/1994 | US5313269 Three-dimensional refractively scanning interferometer having removable optical cartridge |
| 05/17/1994 | US5313266 Demodulators for optical fiber interferometers with [3×3] outputs |
| 05/17/1994 | US5313265 Non-contact non-destructive latent image scanner |
| 05/11/1994 | EP0595835A1 Step scanning technique for interferometer |
| 05/11/1994 | CN1024476C Locater for measuring leangth by microscope |
| 05/03/1994 | US5309277 High intensity illuminator |
| 04/26/1994 | US5307098 Projection inspecting machine |
| 04/19/1994 | US5305330 System comprising a laser diode and means for stabilizing the wavelength of light emitted by said laser diode, and laser interferometer |
| 04/19/1994 | US5305089 Laser interferometer including an optical unit having a corner cube prism, a parallelogram prism, a triangle prism, and a polarizing plate intergrated to form one body |
| 04/19/1994 | US5305088 Laser interferometric measuring machine |
| 04/19/1994 | US5305084 Heterodyne interferometer |
| 04/19/1994 | US5305074 Achromatic self-referencing interferometer |
| 04/15/1994 | CA2080557A1 Sensitive interferometric parallel thermal-wave imager |
| 04/13/1994 | EP0591912A2 Interferometer, comprising an intergrated arrangement and a mirror, which are seperated from each other by a measurement zone |
| 04/13/1994 | EP0591911A2 Interferometer comprising an integrated arrangement and a reflecting part which are separated from each other by a measurement zone |
| 04/13/1994 | CN1085315A Heterodyne frequency-shifting-type twin laser interferometer with common-mode suppressed frequency shift interference |
| 04/12/1994 | US5303031 All optical phase sensitive detector and image demultiplexer |
| 04/07/1994 | DE4233336A1 Focussing error detection using Michelson interferometer - evaluating periodic frequency or phase of interference pattern formed at detector by two reflected sub-beams |
| 04/05/1994 | US5301010 Interferometer having a short coherence length light source and means for identifying interference fringes |
| 03/31/1994 | WO1994007109A1 Interferometric measurement process and laser interferometer therefor |
| 03/30/1994 | EP0357695B1 Optical apparatus for use with interferometric measuring devices |
| 03/29/1994 | US5299049 Beam shifting device |
| 03/29/1994 | US5298971 Lateral shear interferometer for testing aspheric surfaces |
| 03/23/1994 | CN1084283A Full optical fibre top with polarizing passive automatic stabilizing and its prepn. method |
| 03/22/1994 | US5296700 Fluorescent confocal microscope with chromatic aberration compensation |
| 03/17/1994 | WO1994005967A1 Optical interferometer with squeezed vacuum and reduced guided-acoustic-wave brillouin scattering noise |
| 03/17/1994 | WO1994005966A1 Interferometric probe for distance measurement |
| 03/17/1994 | DE4230748A1 Interferometrisches Meßverfahren sowie für seine Durchführung geeignete Laserinterferometeranordnung Interferometric measurement method and suitable for implementation in laser interferometer |
| 03/16/1994 | EP0586454A1 Positional measurement. |
| 03/15/1994 | US5294790 Probe unit for near-field optical scanning microscope |
| 03/09/1994 | EP0586054A1 Spectroscopic imaging system using a pulsed electromagnetic radiation source and an interferometer |
| 03/09/1994 | EP0586053A1 Dual interferometer spectroscopic imaging system |
| 03/09/1994 | EP0585333A1 Interferometric measuring device in integrated optics. |
| 03/08/1994 | US5293272 High finesse holographic fabry-perot etalon and method of fabricating |
| 03/08/1994 | US5293215 Device for interferometric detection of surface structures |
| 03/08/1994 | US5293213 Utilization of a modulated laser beam in heterodyne interferometry |