| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 04/25/1995 | US5410406 Method and apparatus for nondestructive inspection utilizing phase integration and recording of induced vibrating nodal patterns |
| 04/25/1995 | US5410404 Fiber grating-based detection system for wavelength encoded fiber sensors |
| 04/22/1995 | CA2108961A1 Spectrocopic imaging system with ultrasonic detection of absorption of modulated electromagnetic radiation |
| 04/18/1995 | US5408318 Wide range straightness measuring stem using a polarized multiplexed interferometer and centered shift measurement of beam polarization components |
| 04/15/1995 | CA2108422A1 Dual interferometer spectroscopic imaging system |
| 04/12/1995 | EP0647310A1 Method of an apparatus for interferometrically inspecting a surface of an object. |
| 04/11/1995 | US5406377 Spectroscopic imaging system using a pulsed electromagnetic radiation source and an interferometer |
| 04/06/1995 | WO1995009343A1 Interferometric method and apparatus to measure surface topography |
| 04/06/1995 | DE4209260C2 Einrichtung zur Längenmessung Means for measuring length |
| 04/05/1995 | EP0646768A2 Confocal optical microscope and length measuring device using this microscope |
| 04/05/1995 | EP0646767A2 Interferometric distance measuring apparatus |
| 04/05/1995 | EP0646766A2 Procedure and device for absolute interferometry with a laser-diode beam |
| 04/05/1995 | CN2193993Y Feedback laser interferometer |
| 04/04/1995 | US5404222 Interferametric measuring system with air turbulence compensation |
| 04/04/1995 | US5404221 Extended-range two-color interferometer |
| 04/04/1995 | US5404220 Measuring method and measuring apparatus for determining the relative displacement of a diffraction grating with respect to a plurality of beams |
| 03/29/1995 | EP0645616A1 Dispersion interferometer |
| 03/29/1995 | EP0444526B1 Optical device |
| 03/28/1995 | US5402236 Fiberoptic displacement sensor using interferometric techniques |
| 03/28/1995 | US5402234 Method of profiling a surface of an object |
| 03/28/1995 | US5402230 Heterodyne interferometric optical fiber displacement sensor for measuring displacement of an object |
| 03/28/1995 | US5402193 Method and means for projecting images in a contour projector |
| 03/28/1995 | US5402192 Simplified mirror system for contour projector |
| 03/21/1995 | US5400143 Compact laser interferometer system |
| 03/16/1995 | WO1995007054A1 Optical designating device, especially for use in microsurgery |
| 03/16/1995 | DE4429748A1 Interferometer and method for measuring and stabilising the wavelength of light emitted by a laser diode |
| 03/15/1995 | EP0643282A1 Optical device for measuring transversal offset |
| 03/15/1995 | EP0585333B1 Interferometric measuring device in integrated optics |
| 03/14/1995 | US5398113 Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
| 03/14/1995 | US5398112 Method for testing an optical window with a small wedge angle |
| 03/07/1995 | US5396328 Waveguide type displacement interferometer having two reference paths |
| 03/01/1995 | EP0640224A1 Mechanical mounting |
| 02/28/1995 | US5394240 High-accuracy air refractometer utilizing two nonlinear optical crystal producing 1st and 2nd second-harmonic-waves |
| 02/22/1995 | EP0639264A1 Solid-block homodyne interferometer. |
| 02/22/1995 | EP0433008B1 Laser interferometric measuring apparatus |
| 02/22/1995 | CN1099128A External difference interference measuring absolute distance system using dual-wavelength laser |
| 02/21/1995 | US5392121 Speckle interferometry spatial filters or the like to achieve using phase selection |
| 02/21/1995 | US5392120 Dual interferometer measuring system including a wavelength correction resulting from a variation in the refractive index |
| 02/21/1995 | US5392117 Fabry-Perot optical sensing device for measuring a physical parameter |
| 02/21/1995 | US5392116 Interferometric phase measurement |
| 02/14/1995 | US5390023 Interferometric method and apparatus to measure surface topography |
| 02/07/1995 | US5388115 Absolute measuring apparatus using laser and scanning mirrors |
| 02/07/1995 | US5387975 Interferometer for measuring a surface configuration of a test object by an interference pattern using gratings to generate wave fronts |
| 02/07/1995 | US5387974 Laser apparatus including Fabry-perot wavelength detector with temperature and wavelength compensation |
| 02/02/1995 | DE4325758A1 Phase-modulated interferometer III |
| 02/01/1995 | EP0636858A1 Phase-modulated interferometer |
| 02/01/1995 | EP0564431B1 Device for stabilising the wavelength of a light beam emitted by a laser-diode and laser-interferometer |
| 02/01/1995 | EP0439534B1 Photon scanning tunneling microscopy |
| 01/26/1995 | WO1995002802A1 Sensor system |
| 01/26/1995 | CA2167066A1 Sensor system |
| 01/25/1995 | EP0635705A2 Angular michelson interferometer and optical wavemeter based on a rotating periscope |
| 01/25/1995 | EP0635697A2 Measuring arrangement |
| 01/18/1995 | EP0634636A1 Michelson-type interferometer |
| 01/12/1995 | DE4322682A1 Michelson interferometer |
| 01/12/1995 | DE4107549C2 Verfahren zum Betrieb und zur Wellenzahlkalibrierung eines Interferometers nach Michelson Method of operation and wavenumber calibration of a Michelson interferometer |
| 01/10/1995 | US5381232 Fabry-perot with device mirrors including a dielectric coating outside the resonant cavity |
| 01/04/1995 | EP0631660A1 Interferometer requiring no critical component alignment |
| 01/03/1995 | US5379115 Differential interferometer |
| 12/28/1994 | EP0631156A2 Polarization rotator with frequency shifting phase conjugate mirror and simplified interferometric output coupler |
| 12/28/1994 | EP0631106A2 Apparatus and method for measuring thickness of thin semiconductor multi-layer film |
| 12/28/1994 | EP0631105A2 Reflected light measuring method and reflected light measuring apparatus for a microscopic photometric system |
| 12/28/1994 | EP0630467A1 Nanometer metrology |
| 12/28/1994 | CN1096873A High-precision large aperture phase-shifting digital planar interferometer |
| 12/27/1994 | US5377007 Interferometric surface inspection machine designed to support an element on the side to be inspected |
| 12/22/1994 | WO1994029680A1 Jewellery gauge |
| 12/20/1994 | US5374991 Compact distance measuring interferometer |
| 12/14/1994 | EP0517781B1 Interferometer to determine the position of or distance travelled by a movable measuring mirror or the like |
| 12/13/1994 | US5373487 Distributed acoustic sensor |
| 12/13/1994 | US5372900 Method of reproducing reflecting type hologram and apparatus therefor |
| 12/08/1994 | DE4413758A1 Method and device for examining the topography of surfaces |
| 12/06/1994 | US5371588 Surface profile and material mapper using a driver to displace the sample in X-Y-Z directions |
| 12/06/1994 | US5371587 Chirped synthetic wavelength laser radar |
| 11/30/1994 | EP0626596A1 Ultraviolet resistive antireflective coating and method of fabrication |
| 11/29/1994 | US5369489 Time division multiplexed microscopy |
| 11/24/1994 | WO1994027414A1 Distributed acoustic sensor |
| 11/24/1994 | CA2160360A1 Distributed acoustic sensor |
| 11/23/1994 | EP0625690A1 Optoelectric position measuring device |
| 11/17/1994 | EP0490956B1 Optical measuring instruments |
| 11/17/1994 | EP0399004B1 Interferometry |
| 11/17/1994 | EP0364556B1 Comb filter pressure/temperature sensing system |
| 11/15/1994 | US5365335 Optical low-coherence reflectometer using optical attenuation |
| 11/15/1994 | US5365065 Sensitive interferometric parallel thermal-wave imager |
| 11/10/1994 | WO1994025822A1 Interferometric flying height measuring device |
| 11/09/1994 | EP0623802A2 Procedure and device for absolute measurements with a laser-interferometer |
| 11/09/1994 | EP0623801A2 Procedure and device for absolute measurements with a laser-interferometer |
| 11/03/1994 | DE4306884A1 Phase-modulated interferometer II |
| 11/02/1994 | EP0622619A2 Optical signal detection apparatus and method for preventing polarization signal fading in optical fiber interferometric sensor systems |
| 11/01/1994 | USH1370 Interferometric vibration and thermal expansion compensator |
| 11/01/1994 | US5361383 Optical fiber having internal partial mirrors and interferometer using same |
| 10/26/1994 | EP0620912A1 Interferometer structure |
| 10/26/1994 | CN2180969Y Wheat cutin testing Instrument |
| 10/25/1994 | US5359417 Surgical microscope for conducting computer-supported stereotactic microsurgery and a method for operating the same |
| 10/25/1994 | US5359415 Interferometer for determining the position of displacement travel of a movable measuring mirror or the like |
| 10/18/1994 | US5357341 Method for evaluating interferograms and interferometer therefor |
| 10/18/1994 | CA2016302C Fiber optic gyro |
| 10/13/1994 | DE4322683C1 Michelson-type interferometer |
| 10/12/1994 | EP0619032A1 Optical interferometer with squeezed vacuum and reduced guided-acoustic-wave brillouin scattering noise |
| 10/12/1994 | CN1026192C Laser measuring device and method for precision measurement of linearity |
| 10/11/1994 | US5355223 Apparatus for detecting a surface position |
| 10/11/1994 | US5355218 Shearing interferometer for measuring lens lateral aberration |