| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 12/05/2000 | US6157458 Achromatic quarter wave plate for an air turbulence compensating inteferometer |
| 11/30/2000 | WO2000071968A1 Device and method for optical path length measurement |
| 11/29/2000 | EP1055982A1 Phase modulation in an interferometer |
| 11/28/2000 | US6154310 Ultrashort-pulse source with controllable multiple-wavelength output |
| 11/28/2000 | US6152870 Endoscope |
| 11/23/2000 | WO2000070302A1 Device for detecting or generating optical signals |
| 11/23/2000 | WO2000069333A1 Optical detection of dental disease using polarized light |
| 11/23/2000 | WO2000069330A1 Dental optical coherence domain reflectometry explorer |
| 11/23/2000 | DE19922782A1 Apparatus for detecting optical signals or generating optical signals by modulation of optical carriers |
| 11/21/2000 | US6151127 Confocal microscopy |
| 11/21/2000 | US6151115 Phase-shifting point diffraction interferometer focus-aid enhanced mask |
| 11/15/2000 | EP1052475A2 Interferometer, displacement measuring apparatus, and information recording or/and reproducing apparatus using it |
| 11/14/2000 | US6147930 Optical hydrophone with digital signal demodulation |
| 11/14/2000 | US6147763 Circuitry for processing signals occurring in a heterodyne interferometer |
| 11/14/2000 | US6147762 Method of spectroscopic investigation of electromagnetic radiation by means of a fourier spectrometer |
| 11/14/2000 | US6147758 Projection measuring instrument |
| 11/09/2000 | WO2000066969A2 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance |
| 11/07/2000 | US6144456 Apparatus having a multiple angle transparent rotating element for measuring the thickness of transparent objects |
| 11/07/2000 | US6144449 Low coherence interferometric device |
| 11/07/2000 | US6142989 Apparatus and method for customized laser correction of refractive error |
| 11/02/2000 | WO2000065304A1 Monolithic optical assembly |
| 11/02/2000 | WO2000065303A1 Gas insensitive interferometric apparatus and methods |
| 11/02/2000 | WO2000065302A1 Interferometric apparatus and method that compensate refractive index fluctuations |
| 11/02/2000 | WO2000065301A1 Helium-neon laser light source generating two harmonically related, single-frequency wavelengths for use in displacement and dispersion measuring interferometry |
| 10/31/2000 | US6141577 Three dimensional optical imaging colposcopy |
| 10/31/2000 | US6141147 Optical unit for image projection and tool incorporating same |
| 10/31/2000 | US6141138 Apparatus and method for measuring characteristics of light |
| 10/31/2000 | US6141101 Monolithic optical assembly |
| 10/31/2000 | US6141099 Compact, variable length interferometer delay stage |
| 10/31/2000 | US6141098 Fiber optic temperature sensor |
| 10/25/2000 | EP1046881A1 Alignment and handover calibration with hole shadows and ion implanter with e-chuck and gripper |
| 10/24/2000 | US6137585 Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures |
| 10/24/2000 | US6137574 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry |
| 10/17/2000 | US6134003 Method and apparatus for performing optical measurements using a fiber optic imaging guidewire, catheter or endoscope |
| 10/12/2000 | DE10015243A1 Positionssensor für beweglichen Körper sowie optische Interferometer Position sensor for moving body and optical interferometer |
| 10/05/2000 | WO2000058690A1 Coordinate transforming method in position setting means of observation device and observation device equipped with coordinate transforming means |
| 10/05/2000 | DE10015242A1 Optikteil-Antriebsgerät und optisches Interferometer Optics member driving device and optical interferometer |
| 10/05/2000 | DE10005696A1 Periodically operating optical path length modulator for periodic change of optical path length of a light beam e.g. in optical interferometry |
| 10/04/2000 | EP1019795A4 Extended resolution phase measurement |
| 10/04/2000 | EP0682771B1 Method for surface topography measurement by spatial-frequency analysis of interferograms |
| 10/03/2000 | US6128127 Differential interference contrast microscope and microscopic image processing system using the same |
| 10/03/2000 | US6128083 Displacement measuring apparatus |
| 10/03/2000 | US6128082 Technique and apparatus for performing electronic speckle pattern interferometry |
| 09/28/2000 | WO2000057228A2 Apparatus for producing and guiding a light beam |
| 09/27/2000 | EP0998656A4 Method and apparatus for surface profiling of materials and calibration of ablation lasers |
| 09/27/2000 | CN1268221A Image quality mapper for progressive eyeglasses |
| 09/26/2000 | US6124931 Apparatus and methods for measuring intrinsic optical properties of a gas |
| 09/26/2000 | US6124930 Method and arrangement for transverse optical coherence tomography |
| 09/26/2000 | US6124929 Michelson interferometer with orbiting retroreflector |
| 09/21/2000 | WO2000055573A1 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry |
| 09/21/2000 | WO2000055572A1 Multiple layer confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation |
| 09/21/2000 | DE10009217A1 Methods for optical determination of characteristic values of lens systems such as radius, thickness air gaps etc. by determining number of strip cycles that occur with changing wavelengths |
| 09/20/2000 | EP1037019A2 Interference measuring apparatus |
| 09/20/2000 | EP1036307A1 Interferometric sensing apparatus |
| 09/19/2000 | US6122060 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
| 09/19/2000 | US6122058 Interferometer system with two wavelengths, and lithographic apparatus provided with such a system |
| 09/19/2000 | US6121604 Optical probe, method of manufacturing an optical probe, and scanning probe microscope |
| 09/13/2000 | EP0801760B1 Method of determining the distance between a feature on an object and a surgical microscope and a device for carrying out the method |
| 09/13/2000 | CN1266486A fiber-optic frequency shifter, optical insterferometer and method of generating two complementary optical interference signals using the same |
| 09/12/2000 | US6118580 Confocal scanning microscope with angled objective lenses for improved axial resolution |
| 09/12/2000 | US6118534 Sensor and method for measuring changes in environmental conditions |
| 09/12/2000 | US6118533 Method and apparatus for measuring the concentration of ions implanted in semiconductor materials |
| 09/12/2000 | US6118518 Assembly comprising a pocket 3-D scanner |
| 09/06/2000 | CN1265752A Extended resdution phase measurement |
| 09/05/2000 | US6115127 Non-contact measurements of ultrasonic waves on paper webs using a photorefractive interferometer |
| 09/05/2000 | US6115122 Fabry-perot fiber bragg grating multi-wavelength reference |
| 09/05/2000 | US6115121 Single and double superimposing interferometer systems |
| 08/31/2000 | DE19958555A1 Strahlteilerbaugruppe sowie Interferometer mit einer Strahlteilerbaugruppe Beam splitter assembly and interferometer with a beam splitter assembly |
| 08/30/2000 | EP1031868A1 Compensated parallel beam splitter with two plates and interferometer |
| 08/30/2000 | EP1031010A1 Monolithic optical assembly and associated retroreflector with beamsplitter assembly |
| 08/29/2000 | US6111646 Null test fourier domain alignment technique for phase-shifting point diffraction interferometer |
| 08/29/2000 | US6111645 Grating based phase control optical delay line |
| 08/29/2000 | US6111634 Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing |
| 08/24/2000 | WO2000049364A1 Combining interference fringe patterns to a moire fringe pattern |
| 08/23/2000 | EP1030205A2 Apparatus for reflecting light and changing the length of optical path |
| 08/17/2000 | WO2000042380A8 Coupled etalon interferometers |
| 08/17/2000 | WO2000017605A9 Dynamic beam steering interferometer |
| 08/16/2000 | EP0902895A4 Interferometric signal processing apparatus |
| 08/10/2000 | DE19944018A1 Architektur für ein Luftturbulenz-kompensiertes Zwei-Wellenlängen-Heterodyninterferometer Architecture for an air turbulence-compensated two-wavelength heterodyne |
| 08/10/2000 | DE19902781A1 Meßkopfhalterung Measuring head |
| 08/09/2000 | EP1026487A2 Double pass etalon spectrometer |
| 08/09/2000 | EP1025417A1 Method and device for measuring the optical properties of transparent and/or diffusive objects |
| 08/09/2000 | CN2391169Y Micro-displacement semi-conductor laser interferometering instrument |
| 08/03/2000 | WO2000045153A1 Optical coherence microscope and methods of use for rapid in vivo three-dimensional visualization of biological function |
| 08/03/2000 | DE10003088A1 Projection-type instrument for enlarging and projecting image of small workpiece for comparative measurement, has liquid crystal display projection screen that has monitoring display to indicate workpiece profile measuring line graph |
| 08/03/2000 | CA2361195A1 Optical coherence microscope and methods of use for rapid in vivo three-dimensional visualization of biological function |
| 08/02/2000 | EP1022978A1 Confocal scanning microscope with angled objective lenses for improved axial resolution |
| 07/27/2000 | WO2000043730A1 Methods and apparatus for high-speed longitudinal scanning in imaging systems |
| 07/27/2000 | WO2000042906A2 Fiber optic needle probes for optical coherence tomography imaging |
| 07/26/2000 | EP1022546A1 Support for a measuring head |
| 07/26/2000 | EP1021699A1 Method for analyzing a separation in a deformable structure |
| 07/25/2000 | US6094411 Confocal microscope with optical recording and reproducing apparatus |
| 07/25/2000 | US6094260 Holographic interferometry for monitoring and controlling laser shock peening |
| 07/25/2000 | US6092414 Method for analyzing a separation in a deformable structure |
| 07/20/2000 | WO2000042380A1 Coupled etalon interferometers |
| 07/19/2000 | EP1019795A1 Extended resolution phase measurement |
| 07/19/2000 | EP1019703A1 Interferometric method and apparatus |
| 07/19/2000 | EP1019688A1 Orrichtung z |
| 07/19/2000 | CN1260474A Structure of double wavelength heterodyne interferometer for compensating air disturbance |
| 07/18/2000 | US6091496 Multiple layer, multiple track optical disk access by confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation |