Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/2002
12/31/2002US6499355 Elongation and cracking testing and optical characterization of small-size coatings and materials
12/27/2002WO2002103649A2 Method and apparatus for detecting objects
12/27/2002WO2002103433A2 Compact linear scanner system
12/27/2002WO2002103385A1 Method for preparing image information
12/27/2002WO2002103328A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
12/27/2002WO2002103287A1 Method for differential phase profilometry and/or profilography and device for carrying out said method
12/27/2002WO2002103286A1 Self-calibrating position determination system
12/27/2002WO2002103285A1 Interferometer system
12/27/2002WO2002102544A1 Method and apparatus for checking the working position of a tool
12/26/2002US20020198515 Methods and systems for laser calibration and eye tracker camera alignment
12/26/2002US20020196994 Optical measurement device in a pressed-in conductor bar in an electrical machine
12/26/2002US20020196450 Scanning interferometry with reference signal
12/26/2002US20020196449 Configuration measuring apparatus and method
12/26/2002US20020196429 Wetcell device for inspection
12/26/2002US20020196422 Distance measuring method and image input device with distance measuring function
12/26/2002US20020196415 Three-dimensional information acquisition apparatus, projection pattern in three-dimensional information acquisition, and three-dimensional information acquisition method
12/26/2002US20020196331 Method for reading out a detection chip of an electronic camera
12/26/2002US20020195576 Optical sensor device, signal processor therefor, and branching connector therefor
12/26/2002US20020195539 Focus monitoring method, focus monitoring apparatus, and method of manufacturing semiconductor device
12/26/2002US20020194751 Track maintenance machine and method for monitoring a track position
12/25/2002CN2527961Y Planar array petroleum pipeline thread parameter intelligent test device
12/25/2002CN2527960Y Thread end face high precision locator
12/25/2002CN2527959Y Fibre-optical strain sensor for embedded concrete structure
12/25/2002CN1387022A Measurer for thickness of float polished liquid film
12/25/2002CN1387021A Bench with 2D displacement
12/25/2002CN1387020A System and method for reducing add up system error in picture related system
12/24/2002US6498959 Apparatus and method for controlling a mechanism for positioning video cameras for use in measuring vehicle wheel alignment
12/24/2002US6498654 Optical proximity detector
12/24/2002US6498653 Tool path measurement
12/24/2002US6498648 Procedure for taking a reference measurement
12/24/2002US6498647 Device for measuring visual range
12/24/2002US6498338 Device and method for automatically milking cows
12/24/2002US6497047 Flatness measuring equipment
12/19/2002WO2002102128A1 Optical sensor device
12/19/2002WO2002101602A1 Apparatus and methods for modeling process effects and imaging effects in scanning electron microscopy
12/19/2002WO2002101328A1 Method for recording the surface of a roadway
12/19/2002WO2002082011B1 Illumination device and method for illuminating an object
12/19/2002WO2001088464A3 Adjusting device with an optical regulating device having a reflector
12/19/2002US20020192579 Gas purge method and exposure apparatus
12/19/2002US20020192577 Forming first separated features on a surface, forming second separated features on surface interleaved between first separated features, and illuminating first and second separated features and detecting an interference pattern
12/19/2002US20020192359 System for automatic control of the wall bombardment to control wall deposition
12/19/2002US20020191836 Repetitive inspection system with intelligent tools
12/19/2002US20020191834 High speed optical image acquisition system with extended dynamic range
12/19/2002US20020191742 Image pickup device
12/19/2002US20020191740 Stage rotation system to improve edge measurements
12/19/2002US20020191503 Focusing servo device and focusing servo method
12/19/2002US20020191198 Upper stem diameter measurement and basal area determination device and method for utilization in timber cruising applications
12/19/2002US20020191197 Method and apparatus for optical multi-angle endpoint detection during chemical mechanical planarization
12/19/2002US20020191196 Optical element
12/19/2002US20020191195 Interferometer system and method of manufactruing projection optical system using same
12/19/2002US20020191192 Method and arrangement for contactless determination of product characteristics
12/19/2002US20020191187 Method of measuring surface form of semiconductor thin film
12/19/2002US20020191186 Broadband spectroscopic rotating compensator ellipsometer
12/19/2002US20020191179 Measurement of surface defects
12/19/2002US20020191074 Image processing measuring apparatus and measuring endoscope apparatus
12/19/2002US20020190190 Method and apparatus for three-dimensional color scanning
12/19/2002US20020189378 Methods and apparatus for determining the location of a shaft within a vessel
12/19/2002US20020189115 Self-calibrating position determination system
12/19/2002DE10225006A1 Measuring method for a road surface using a laser pulse scanning system mounted on a motor vehicle, in which the actual scanner position is continuously determined to improve accuracy of surface measurements
12/19/2002DE10212337A1 Photogrammetric method, for measurement of motor vehicle deformation following a road accident, in which markers are attached to the deformed section of the vehicle and digital images recorded that can then be evaluated
12/19/2002DE10129651A1 Compensation of dispersion in high resolution short coherence or optical coherence tomography interferometers without compensation optics in the reference beam path for altering its path length
12/19/2002DE10127304A1 Determination of the 3-dimensional shape of the reflective surface of an object by imaging a pattern of known dimensions reflected in the object surface at two different separations from the object surface
12/18/2002EP1267302A2 Media width detecting system for an imaging apparatus
12/18/2002EP1267178A1 Method for processing a high definition picture
12/18/2002EP1267177A1 Method and device for objects location finding in space
12/18/2002EP1267144A1 Method of planning measurement trajectories for the measurement of an object or a part of it,as well as method and device for the measurement of an object or a part of it
12/18/2002EP1267143A1 Method and apparatus for optical position measurement
12/18/2002EP1266444A1 Safety interlock for mechanically actuated closure device
12/18/2002EP1266263A1 Panoramic image acquisition device
12/18/2002EP1266260A1 Sighting device with four fixed reflecting surfaces
12/18/2002EP1266188A2 Self-calibrating multi-camera machine vision measuring system
12/18/2002EP1266187A1 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
12/18/2002EP1192597B1 Method of detecting objects within a wide range of a road vehicle
12/18/2002EP0951696B1 Method and arrangement for determining the position of an object
12/18/2002CN1385981A Mobile ratio terminal and network business system using same
12/18/2002CN1096657C Three dimentional shaped data processing method
12/17/2002US6496754 Mobile robot and course adjusting method thereof
12/17/2002US6496273 Position determining apparatus for coordinate positioning machine
12/17/2002US6496271 Wire and seal profile analyzer
12/17/2002US6496270 Method and system for automatically generating reference height data for use in a three-dimensional inspection system
12/17/2002US6496269 Shape measuring apparatus
12/17/2002US6496259 Optical device providing relative alignment
12/17/2002US6496254 Method and device for inspecting objects
12/17/2002US6496253 Method and system for automatic non-contact measurements of optical properties of optical objects
12/17/2002US6495848 Evaluation of projection pattern for transitions in pattern to determine spatial structure of 3D surfaces
12/17/2002US6495819 Dual-interferometer method for measuring bending of materials
12/17/2002US6495234 Optical information recording medium and method of manufacturing same
12/17/2002US6494766 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
12/17/2002US6493957 Ball step gauge
12/12/2002WO2002099403A1 System and method for multiple image analysis
12/12/2002WO2002099373A2 Determining large deformations and stresses of layered and graded structures to include effects of body forces
12/12/2002WO2002099359A1 Method and device for determining the angle between two facets of a transparent object
12/12/2002WO2002099358A1 Sample positioning method for surface optical diagnostics using video imaging
12/12/2002WO2002079719A3 Microinterferometers with performance optimization
12/12/2002WO2002050509A3 Improved system for measuring periodic structures
12/12/2002WO2002049882A3 Method and device for detecting an object in a vehicle in particular for occupant protection systems
12/12/2002US20020188418 Method of determining storage charge of storage rack
12/12/2002US20020188388 Vehicle traveling control system and vehicle control device
12/12/2002US20020186878 System and method for multiple image analysis
12/12/2002US20020186381 Method and apparatus for detecting the thickness of copper oxide