| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 11/19/2002 | US6483536 Distance measuring apparatus and method employing two image taking devices having different measurement accuracy |
| 11/19/2002 | US6483121 Distance measuring apparatus and distance measuring method |
| 11/19/2002 | US6483104 Rotational angle sensor using a CCD line with enhanced measuring precision |
| 11/19/2002 | US6482148 Optical scope with measuring system |
| 11/19/2002 | US6481289 Method and system for processing measurement signals to obtain a value for physical parameter |
| 11/19/2002 | US6481272 Device for measuring angular rotation by producing a pivotal movement of a sensor unit |
| 11/14/2002 | WO2002091057A1 Systems and methods for scanning a beam of light across a specimen |
| 11/14/2002 | WO2002090952A1 Method and device for examining an object in a contactless manner, especially for examining the surface form of the same |
| 11/14/2002 | WO2002090893A1 Sensor system and method incorporating fibre bragg gratings |
| 11/14/2002 | WO2002090883A1 Position detector |
| 11/14/2002 | WO2002090876A2 Method and apparatus for determining the coordinates of an object |
| 11/14/2002 | WO2002089661A1 Optical imaging device and optical imaging detecting method |
| 11/14/2002 | WO2002073126B1 Apparatus and method for isolating and measuring movement in metrology apparatus |
| 11/14/2002 | US20020168961 Mobile radio terminal and network commerce system using the same |
| 11/14/2002 | US20020168092 Information extraction apparatus and method |
| 11/14/2002 | US20020167726 Method and apparatus for multi-nodal, three-dimensional imaging |
| 11/14/2002 | US20020167677 Optical displacement sensor |
| 11/14/2002 | US20020167675 Interferometer system |
| 11/14/2002 | US20020167674 Apparatus and method for measuring flatness of thin plate |
| 11/14/2002 | US20020167672 Holographic particle-measuring apparatus |
| 11/14/2002 | US20020167668 System for analysing sample liquids containing a position control unit |
| 11/14/2002 | US20020167659 Method and device for producing height images of technical surfaces with microscopic resolution |
| 11/14/2002 | US20020167658 Process for identifying a specific light signal used in a linear optical sensor of goniometer from among other potentially disturbing light signals |
| 11/14/2002 | US20020166982 Exposure method, plane alignment method, exposure apparatus, and device manufacturing method |
| 11/14/2002 | US20020166946 Optical scanning probe device using low coherence light |
| 11/14/2002 | US20020166386 Method of and apparatus for measuring elongation of a test specimen |
| 11/14/2002 | US20020166371 Method and system for monitoring the deformations of a tyre in motion |
| 11/14/2002 | US20020166248 Method and apparatus for track geometry measurement |
| 11/14/2002 | DE10122068A1 Method for determining object surface structure whereby the object is simultaneously irradiated with light of at least two different wavelengths with the back-scattered radiation processed separately according to its wavelength |
| 11/14/2002 | CA2442972A1 Sensor system and method incorporating fibre bragg gratings |
| 11/13/2002 | EP1256780A2 A process for identifying a specific light signal in a goniometer from among other potentially disturbing light signals |
| 11/13/2002 | EP1256779A2 A device and method for detecting shapes, in particular models of footwear |
| 11/13/2002 | EP1255965A1 Coded disc for an optoelectronic displacement or angle measuring device |
| 11/13/2002 | EP1005626B1 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers |
| 11/13/2002 | EP0988232B1 Label sensor |
| 11/13/2002 | EP0977982B1 Sensor unit, process and device for inspecting the surface of an object |
| 11/13/2002 | EP0892929B1 Device for measuring the co-ordinates of several retroreflectors applied on an object |
| 11/13/2002 | EP0876584B1 System for measuring surface flatness using shadow moire technology |
| 11/13/2002 | EP0718594B1 Method and device for illumination in terminated cable part inspection device for stripped terminal crimping machine |
| 11/13/2002 | CN1379367A Method and equipment for estimating light source and producing mutual luminosity effect in public supporting space |
| 11/13/2002 | CN1379226A Optical reflective type sensor |
| 11/13/2002 | CN1379225A Frequency-dividing self-mixing feedback-type non-contact He-Ne laser micrometer |
| 11/13/2002 | CN1379224A Phase-conjugated interferometer for measuring surface shape of transparent plate |
| 11/13/2002 | CN1094191C 金属基体表面非金属涂层厚度非接触测量方法及其装置 Non-metallic coating the metal surface of the substrate thickness of the non-contact measuring method and device |
| 11/12/2002 | US6480807 Micropattern measuring method and apparatus, and recording medium that records micropattern measuring program |
| 11/12/2002 | US6480802 Method for determining the flatness of a material strip |
| 11/12/2002 | US6480678 Light transmitting member driving device for a contour measuring apparatus |
| 11/12/2002 | US6480655 Apparatus for the measurement of paperboard strain in a confined area |
| 11/12/2002 | US6480620 Method of and an apparatus for 3-dimensional structure estimation |
| 11/12/2002 | US6480616 Status-of-use decision device for a seat |
| 11/12/2002 | US6480290 Method and apparatus to measure the cross-sectional area of an object |
| 11/12/2002 | US6480289 Position measuring apparatus and optical deflection angle measuring apparatus for underground excavators |
| 11/12/2002 | US6480288 Measuring system with improved method of reading image data of an object |
| 11/12/2002 | US6480287 Three dimensional scanning system |
| 11/12/2002 | US6480286 Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus |
| 11/12/2002 | US6480271 Traversing laser locating system |
| 11/12/2002 | US6480269 Angle detection method for bending machine, angle detection apparatus and angle sensor |
| 11/12/2002 | US6480268 Method for temporary suppression of reflection for optical measurement |
| 11/12/2002 | US6479832 Surface height detecting apparatus and exposure apparatus using the same |
| 11/12/2002 | US6478743 Transesophageal ultrasound probe with imaging element position sensor in scanhead |
| 11/12/2002 | US6478425 System and method for automatically adjusting a lens power through gaze tracking |
| 11/12/2002 | US6477784 Coordinate measuring machine having a non-sensing probe |
| 11/07/2002 | WO2002088630A1 Method and device for the verification and identification of a measuring device |
| 11/07/2002 | WO2002087825A1 Integrated endpoint detection system with optical and eddy current monitoring |
| 11/07/2002 | WO2002023291A3 Digital imaging system having distribution controlled over a distributed network |
| 11/07/2002 | WO2001055669A9 Caching of intra-layer calculations for rapid rigorous coupled-wave analyses |
| 11/07/2002 | US20020165294 Containing pigment additive for detecting the paint's quality, damage or deterioration by illuminating with ultraviolet light, viewing the luminescent image; for use on ships' ballast tanks or tall structures such as bridges |
| 11/07/2002 | US20020164925 Integrated endpoint detection system with optical and eddy current monitoring |
| 11/07/2002 | US20020164829 Measuring apparatus and film formation method |
| 11/07/2002 | US20020164086 Method of quantitative determination of an image drift in digital imaging microscope |
| 11/07/2002 | US20020163652 Film thickness measuring method and step measuring method |
| 11/07/2002 | US20020163651 Surface shape measurement apparatus |
| 11/07/2002 | US20020163649 Film thickness measuring method and apparatus, and thin film device manufacturing method and manufacturing apparatus using same |
| 11/07/2002 | US20020163648 Microinterferometer for distance measurements |
| 11/07/2002 | US20020163647 Optical interference apparatus and position detection apparatus |
| 11/07/2002 | US20020163634 Multiple spot size optical profilometer, ellipsometer, reflectometer and scatterometer |
| 11/07/2002 | US20020163573 Imaging system |
| 11/07/2002 | US20020163491 Image processor and imaging device |
| 11/07/2002 | US20020162979 Optically scanning apparatus and defect inspection system |
| 11/07/2002 | US20020162954 System for detecting rotation angles of a diffracting portion using a absorption cell sealed with a plurality kinds of gases |
| 11/07/2002 | US20020162952 Optical deformation sensor with operational testing by different wavelenghts, for side crashes |
| 11/07/2002 | US20020162886 Portable apparatus for 3-dimensional scanning |
| 11/07/2002 | DE10217950A1 Contactless method for determining the coating thickness of a dry lubricant, e.g. for use in motor vehicle aluminum bodywork production control, based on excitation of a fluorescing agent contained in the lubricant |
| 11/07/2002 | DE10213861A1 Optical reflection sensor has display control unit that causes repeatability of measured values obtained by multiple measurements to be displayed on display device |
| 11/07/2002 | DE10212916A1 Optischer Versetzungssensor An optical displacement sensor |
| 11/07/2002 | DE10120730A1 Verfahren und Vorrichtung zur Messung der Phasengrenze Method and apparatus for measuring the phase boundary |
| 11/07/2002 | DE10120580A1 Sensor for measuring the torque applied the shaft of a motor vehicle gear box comprises two outer sleeve type pipe elements attached to the shaft so that their adjacent ends rotate relative to each other |
| 11/07/2002 | DE10118392A1 System und Verfahren zum Bestimmen einer Position oder/und Orientierung zweier Objekte relativ zueinander sowie Strahlführungsanordnung, Interferometeranordnung und Vorrichtung zum Ändern einer optischen Weglänge zum Einsatz in einem solchen System und Verfahren System and method for determining a position and / or orientation of two objects relative to each other as well as beam guidance arrangement, and the interferometer apparatus for changing an optical path length for use in such a system and method |
| 11/06/2002 | EP1255286A1 Monitor, method of monitoring, polishing device, and method of manufacturing semiconductor wafer |
| 11/06/2002 | EP1255177A2 Image recognizing apparatus and method |
| 11/06/2002 | EP1255090A1 Method of, and apparatus for measuring elongation of a test specimen |
| 11/06/2002 | EP1254431A2 Method and system for detecting defects on a printed circuit board |
| 11/06/2002 | EP1254389A2 Optical element |
| 11/06/2002 | EP0713593B1 Method and apparatus for ball bond inspection system |
| 11/06/2002 | CN1378642A Method and apparatus for determining characteristic of laser beam spot |
| 11/06/2002 | CN1378639A Method and device for evaluating tolerance in bearings or joints consisting of coupled components |
| 11/06/2002 | CN1093935C Three dimension contour phase measuring method and device for quick projection structure light |
| 11/05/2002 | US6477260 Position measuring apparatus using a pair of electronic cameras |
| 11/05/2002 | US6476922 Apparatus for measuring variations in size on bodies subjected to temperature variations |
| 11/05/2002 | US6476920 Method and apparatus for measurements of patterned structures |