Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/2002
11/05/2002US6476914 Process and device for ascertaining whether two successive shafts are in alignment
11/05/2002US6476912 Method of measuring surface form of semiconductor thin film
11/05/2002US6476405 Measurement apparatus having a diffraction grating structure
11/05/2002US6476393 Surface state monitoring method and apparatus
11/05/2002US6476380 Compact optical measuring module utilizing three dimensional construction
11/05/2002US6475062 Film thickness measuring method, polishing method, fabrication method of thin film magnetic head and substrate for forming the thin film magnetic head
11/05/2002US6474379 Automatic flitch planer
11/05/2002US6474182 Methods and apparatus for determining the location of a shaft within a vessel
10/2002
10/31/2002WO2002086420A1 Calibration apparatus, system and method
10/31/2002WO2002086419A1 Method and device for determining the radius, the sharpness or the shape of edges
10/31/2002WO2002086418A1 Method for indicating a point in a measurement space
10/31/2002WO2001051886A9 Apparatus and methods for surface contour measurement
10/31/2002US20020160100 Method for regulating a coating process utilizing the intensity of a light bundle
10/31/2002US20020159077 Apparatus for measuring distortion of cylindrical body
10/31/2002US20020159075 Method and apparatus for surface configuration measurement
10/31/2002US20020159074 Displacement sensor
10/31/2002US20020159073 Range-image-based method and system for automatic sensor planning
10/31/2002US20020159072 Measuring system with improved method of reading image data of an object
10/31/2002US20020159071 Method for producing time marks at any points on moving components
10/31/2002US20020159070 Method and apparatus for measuring diameter, distribution and so forth of micro gas bubbles and micro liquid droplets and optical system for measuring diameter, distribution and so forth of micro bubbles and micro liquid drop
10/31/2002US20020159063 Spectroscopic ellipsometer with adjustable detection area
10/31/2002US20020159060 Device for determining the values of at least one parameter of particles, in particular water droplets
10/31/2002US20020158966 Method and arrangement for imaging and measuring microscopic three-dimensional structures
10/31/2002US20020158870 Integrated system for quickly and accurately imaging and modeling three-dimensional objects
10/31/2002US20020157599 Method and apparatus for measuring the position of a phase interface during crystal growth
10/31/2002US20020157271 Systems and methods for mapping and marking bioprosthetic sheet to form heart valve leaflets
10/31/2002DE10163027A1 Objektlageermittlungsverfahren und eine dieses Verfahren verwendende Vorrichtung Property location investigation and apparatus used this method
10/31/2002DE10162279A1 Verfahren und Vorrichtung zur Bestimmung der Höhe eines Grates Method and apparatus for determining the height of a ridge
10/31/2002DE10121239A1 Etching depth controlling method in DRAM fabricating process, involves etching two reflecting regions subsequently until etching depth of both regions are made equal
10/31/2002DE10120937A1 Optical sensor comprises a light source with an electrode for producing a light beam, a detector for determining the intensity of the light beam, and an evaluation switch for producing an electrical signal
10/30/2002EP1253440A1 A device for determining the position of a teat of an animal
10/30/2002EP1253418A2 Spectroscopic ellipsometer
10/30/2002EP1253105A1 Boom positioning device for high-position working
10/30/2002EP1252554A1 Nonlinear image distortion correction in printed circuit board manufacturing
10/30/2002EP1252498A1 Method and apparatus for measuring surface configuration
10/30/2002EP1252497A2 Method for investigating or structuring a surface layer
10/30/2002EP1252480A1 Image metrology methods and apparatus
10/30/2002EP0759815B1 System and method for automatically feeding, inspecting and diverting tablets for continuous filling of tablet containers
10/30/2002CN1377479A Method and device for detecting position of vehicle in given area
10/30/2002CN1377461A Method of measuring the geometry of grooves in an elongated element
10/30/2002CN1377457A Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source
10/30/2002CN1376948A Method for nondestructively measuring lateral etched width in etching procedure
10/30/2002CN1376895A Optical metering installation
10/30/2002CN1376894A 位移传感器 Displacement sensors
10/30/2002CN1093631C Method and instrument for determining trolley wheel location calibration of rotary kiln
10/29/2002US6473716 Three-dimensions measuring method and surveying equipment using the same
10/29/2002US6473715 Luffing angle measurement system
10/29/2002US6473537 Process and system for detecting bend angle
10/29/2002US6473190 Optical volume sensor
10/29/2002US6473189 Apparatus and method for determining a distance to a reflective surface
10/29/2002US6473188 Apparatus and method for aligning components
10/29/2002US6473186 Scanning wide-area surface shape analyzer
10/29/2002US6473184 Interferometer which divides light beams into a plurality of beams with different optical paths
10/29/2002US6473181 Measurement of waveplate retardation using a photoelastic modulator
10/29/2002US6473079 Integrated system for quickly and accurately imaging and modeling three-dimensional objects
10/29/2002US6472676 Micropositioning system
10/29/2002US6472652 Distance measuring apparatus
10/29/2002US6472112 Method for measuring reticle leveling in stepper
10/29/2002US6471710 Probe position sensing system and method of employment of same
10/24/2002WO2002084660A1 Sensing disk centering
10/24/2002WO2002084215A1 Method for automatic adjustment of focus and lighting and for objectivated scanning of edge site in optical precision measuring technique
10/24/2002WO2002084214A1 Optical apparatus for measuring objects having a rectilinear profile
10/24/2002WO2002084213A1 Periodic patterns and technique to control misalignment
10/24/2002WO2002084212A1 Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs
10/24/2002WO2002084208A1 Length sensor
10/24/2002US20020155896 Launch monitor system and a method for use thereof
10/24/2002US20020155355 Charging using corona discharges; forming latent electrostatic images; calibration; process control
10/24/2002US20020154319 Film thickness measuring apparatus
10/24/2002US20020154318 Visual displacement sensor
10/24/2002US20020154302 Apparatus for analyzing multi-layer thin film stacks on semiconductors
10/24/2002US20020154296 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool
10/24/2002US20020154295 Method and apparatus for classifying defects occurring at or near a surface of a smooth substrate
10/24/2002US20020154283 Position measuring method and apparatus
10/24/2002US20020154282 Correction apparatus that corrects optical shift in two optical units, and exposure apparatus having the same
10/24/2002US20020153477 Work piece feeding machine and abrasive system
10/24/2002US20020153473 Optical sensor
10/24/2002US20020152963 Device for determining the position of a teat of an animal
10/24/2002US20020152813 Method and system for processing measurement signals to obtain a value for a physical parameter
10/24/2002US20020152622 Measuring method for determining the position and the orientation of a moving assembly, and apparatus for implementing said method
10/24/2002DE10215135A1 Automatic regulation of focus and lighting and optical sensing of edge position for precision optical measurement involves determining weighted sum of individual auxiliary parameters
10/24/2002DE10212382A1 Versetzungssensor Displacement sensor
10/24/2002DE10119900A1 Thickness measuring method for thin metal layers deposited on a substrate involves cutting calotte in layer-substrate and analyzing using high resolution color CCD row-matrix using artificial intelligence algorithms
10/24/2002DE10118668A1 Three dimensional coordinate measurement of surface of a measurement piece or object using an automated measurement device in which commands for moving the feeler are input through a voice recognition system
10/24/2002DE10118514A1 Verfahren zur Arbeitspunktstabilisierung bei berührungsloser 3D- Positionserkennung eines Objektes mittels Digitalkameras Method for operating point stabilization in non-contact 3D position detection of an object by means of digital cameras
10/24/2002DE10117953A1 Positionierhilfe für Handwerkzeuggerät Positioning for hand tool
10/23/2002EP1251330A1 Procedure and device to determine the height of a fin
10/23/2002EP1251329A2 Procedure to stabilise the viewed point by 3D-positiondetermination of an object with a digital camera
10/23/2002EP1251328A2 System and method for determining the position or/and the orientation of two objects relative to each other, as well as beam guidance device, interferometer system and device for modifying the optical pathlength for use in such a system and method
10/23/2002EP1251327A2 Three-dimensional shape measuring method
10/23/2002EP1127329A4 System and method for arithmetic operations for electronic package inspection
10/23/2002EP0923704B1 Optical imaging method and device
10/23/2002EP0853752B1 Device for ascertaining misalignments of two shafts arranged one behind the other
10/23/2002EP0765468B1 Apparatus for mapping optical elements
10/23/2002CN2518076Y Combined three-coordinate measuring probe
10/23/2002CN1376259A System and method for measuring stress in an otpical fiber
10/23/2002CN1376258A Method and apparatus for measuring vehicle wheel roll radius
10/23/2002CN1375693A Testing device for spherome surface
10/23/2002CN1375690A Method and apparatus for measuring light transmissivity
10/23/2002CN1375683A Microdisplacement measuring charge coupling method
10/23/2002CN1093254C System for measuring surface flatness using shadow moire technology