| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 07/13/2004 | US6762821 Gas purge method and exposure apparatus |
| 07/13/2004 | US6762694 Centerline identification in a docking guidance system |
| 07/13/2004 | US6762427 Object surface characterization using optical triangulaton and a single camera |
| 07/13/2004 | US6762409 Method and device for determining the thickness and growth rate of an ice layer |
| 07/13/2004 | US6762399 Shape measurement device |
| 07/13/2004 | US6762111 Method of manufacturing a semiconductor device |
| 07/08/2004 | WO2004057267A1 System and method for inspection using white light interferometry |
| 07/08/2004 | WO2004057266A2 Interferometer system and measuring device |
| 07/08/2004 | WO2004046644A3 Wheel profile inspection apparatus and method |
| 07/08/2004 | WO2004019459A3 Multi-dimensional measuring system |
| 07/08/2004 | US20040133382 Three-dimensional measuring device |
| 07/08/2004 | US20040133379 Information processing method and information processing apparatus |
| 07/08/2004 | US20040132297 Worked product appearance inspection method and system therefore |
| 07/08/2004 | US20040131257 Pattern measurement method, manufacturing method of semiconductor device, pattern measurement apparatus, and program |
| 07/08/2004 | US20040131245 Method and apparatus for quantitatively evaluating scintillation, antiglare film and method of producing the same |
| 07/08/2004 | US20040131244 Method of optimizing target quantities for optical precision measurement and apparatus therefor |
| 07/08/2004 | US20040131241 Method of converting rare cell scanner image coordinates to microscope coordinates using reticle marks on a sample media |
| 07/08/2004 | US20040130983 Displacement detection method, displacement detection device and recording apparatus for performing recording on master of information recording medium |
| 07/08/2004 | US20040130731 Range finder and method |
| 07/08/2004 | US20040130730 Fast 3D height measurement method and system |
| 07/08/2004 | US20040130729 Optical probe for scanning the features of an object and methods therefor |
| 07/08/2004 | US20040130728 Highly-sensitive displacement-measuring optical device |
| 07/08/2004 | US20040130727 Surface inspection method and apparatus |
| 07/08/2004 | US20040130726 Method for determining layer thickness ranges |
| 07/08/2004 | US20040130718 Concurrent measurement and cleaning of thin films on silicon-on-insulator (SOI) |
| 07/08/2004 | US20040130711 Method of detecting mask defects, a computer program and reference substrate |
| 07/08/2004 | US20040130710 System and method for coherent optical inspection |
| 07/08/2004 | US20040130707 Determination of the angular position of a laser beam |
| 07/08/2004 | US20040130690 Alignment system and methods for lithographic systems using at least two wavelengths |
| 07/08/2004 | US20040129902 Opto-electronic transmissive edge location sensor |
| 07/08/2004 | US20040129901 Optical object identification apparatus, and printing apparatus and object classification apparatus using same |
| 07/08/2004 | US20040129900 Device inspection |
| 07/08/2004 | US20040129868 Deflection sensor |
| 07/08/2004 | US20040129867 Force measurement system using polarization-state modulated optical polarimetry |
| 07/08/2004 | DE10349128A1 Verschiebungsgeber Displacement transducer |
| 07/08/2004 | DE10300482B3 Verfahren und Vorrichtung zur Erkennung von Oberflächenfehlern an Werkstücken mit glänzenden Oberflächen Method and apparatus for detection of surface defects on workpieces with shiny surfaces |
| 07/08/2004 | DE10258579A1 Measuring device for pointwise measurement of workpiece surface dimensions by mechanical probing, has contactless measuring device for determining spatial position of probe body |
| 07/08/2004 | DE10258493A1 Radius of curvature determination method for a curve or contour, for use in manufacturing, whereby a contour is divided into sections of equal predefined length |
| 07/08/2004 | DE10257422A1 Verfahren zum Positionieren einer Messvorrichtung, die optische Strahlung emittiert und empfängt, zum Messen von Verschleiß der Auskleidung eines Behälters A method for positioning a measuring device which emits and receives optical radiation for measuring wear of the lining of a container |
| 07/08/2004 | DE10257323A1 Verfahren und Mikroskop zum Detektieren von Bildern eines Objekts A method and microscope for detecting images of an object |
| 07/08/2004 | DE10241072B4 Vorrichtung zur Bestimmung der geometrischen Daten einer kugeligen Ausnehmung Device for determining the geometrical data of a spherical recess |
| 07/08/2004 | DE10111301B4 Prüfeinrichtung und Prüfverfahren für verformbare Prüflinge, insbesondere für Reifen Test equipment and test methods for deformable samples, especially for tires |
| 07/07/2004 | EP1435517A1 Method for analyzing thin-film layer structure using spectroscopic ellipsometer |
| 07/07/2004 | EP1435506A1 Optically triggered probe |
| 07/07/2004 | EP1434981A1 Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces |
| 07/07/2004 | CN2624178Y Pattern displacement tester analog signal output control device |
| 07/07/2004 | CN1511248A Confocal microscope, optical height measuring method, and automatic focusing method |
| 07/07/2004 | CN1511247A Determining large deformations and stresses of layered and graded structures to include effects of body forces |
| 07/07/2004 | CN1510732A Chip plainness assessment method, apparatus therefor and application thereof |
| 07/07/2004 | CN1510519A Photoetching device with aligning subsystem, manufacturng method for device with alignment and aligning structure |
| 07/07/2004 | CN1510416A Surface checking method and checker |
| 07/07/2004 | CN1510393A Measuring devices |
| 07/07/2004 | CN1510392A Parallel astigmatic three-dimensional focusing detecting method and apparatus thereof |
| 07/07/2004 | CN1510391A Image measuring system and method |
| 07/07/2004 | CN1510390A Laser interfere length measuring system with real time compensation for Abbe error |
| 07/07/2004 | CN1156789C Vision recongnizing apparatus and elements recognizing method |
| 07/07/2004 | CN1156673C Inspection result output device and base plate inspection system |
| 07/07/2004 | CN1156672C Analysing method and device for automatically sorting products such as fruits |
| 07/06/2004 | US6760117 Measurement apparatus |
| 07/06/2004 | US6760116 Three-dimensional shape and color detecting apparatus |
| 07/06/2004 | US6760115 Carrier shape measurement device |
| 07/06/2004 | US6760114 Support apparatus for optical wave interferometer reference plate |
| 07/06/2004 | US6760113 Crystal based fringe generator system |
| 07/06/2004 | US6760100 Method and apparatus for classifying defects occurring at or near a surface of a smooth substrate |
| 07/06/2004 | US6759671 Method of measuring the movement of a material sheet and optical sensor for performing the method |
| 07/06/2004 | US6759649 Optoelectronic detection device |
| 07/06/2004 | US6758759 Launch monitor system and a method for use thereof |
| 07/06/2004 | US6758723 Substrate polishing apparatus |
| 07/01/2004 | WO2004055564A2 Efficient coupling of light into light guides |
| 07/01/2004 | WO2004055498A1 Method and apparatus for measuring thickness of thin films via transient thermoreflectance |
| 07/01/2004 | WO2004055476A1 Method of determining properties of patterned thin film metal structures using transient thermal response |
| 07/01/2004 | WO2004055475A2 Method for measuring a contour of a workpiece by scanning |
| 07/01/2004 | WO2004055474A1 Sensing device for measuring work pieces |
| 07/01/2004 | WO2004040235A3 Device for the contact-free, three-dimensional digitising of an object |
| 07/01/2004 | US20040126073 Method of manufacturing light-propagating probe for near-field microscope |
| 07/01/2004 | US20040126006 Apparatus and method for measuring the shape of a three dimensional object using projected multi-stripe patterns |
| 07/01/2004 | US20040126003 Pattern inspection apparatus |
| 07/01/2004 | US20040125986 Method and system for detecting and evaluating surface irregularities |
| 07/01/2004 | US20040125985 Chassis alignment system |
| 07/01/2004 | US20040125383 Approaching apparatus using spectral shift for sample-probe distance regulation |
| 07/01/2004 | US20040125382 Optically triggered probe |
| 07/01/2004 | US20040125381 Miniature three-dimensional contour scanner |
| 07/01/2004 | US20040125365 Working position measuring system |
| 07/01/2004 | US20040125364 Angle detecting apparatus and projector having the same |
| 07/01/2004 | US20040125205 System and a method for high speed three-dimensional imaging |
| 07/01/2004 | US20040124375 Method of aligning a substrate, computer program, device manufacturing method and device manufactured thereby |
| 07/01/2004 | US20040123712 Carriage coupling device |
| 07/01/2004 | US20040123677 Displacement sensor |
| 07/01/2004 | US20040123473 Laser line generating device |
| 07/01/2004 | DE10327479A1 Einrichtung zur Bestimmung der Position eines Werkstücks und Verfahren dafür unter Verwendung von mindestens einer elektronischen Kamera Means for determining the position of a workpiece and methods thereof using at least one electronic camera |
| 07/01/2004 | DE10260201A1 Verfahren und Vorrichtung zur Erfassung von auf einem Fördermittel bewegten Objekten mittels eines optoelektronischen Sensors Method and apparatus for detection of moving objects on a conveyor by means of an optoelectronic sensor |
| 07/01/2004 | DE10260099A1 Vorrichtung und Verfahren zur quantitativen Beurteilung der Orientierung zweier Maschinen relativ zueinander Apparatus and method for the quantitative assessment of the orientation of two machines relative to each other |
| 07/01/2004 | DE10259954A1 Vorrichtung zur Bestimmung der Rad- und/oder Achsgeometrie von Kraftfahrzeugen Apparatus for determining the wheel and / or axle geometry of motor vehicles |
| 07/01/2004 | DE10205207B4 Anordnung und Verfahren zur Messung an einem resonanten Schwinger und zu seiner Steuerung Arrangement and method for testing of a resonant oscillator and its control |
| 07/01/2004 | DE10115264B4 Verfahren und Vorrichtung zur Evaluierung der Qualität eines Halbleitersubstrats Method and apparatus for evaluation the quality of a semiconductor substrate |
| 06/30/2004 | EP1434169A2 Calibration apparatus, calibration method, program for calibration, and calibration jig |
| 06/30/2004 | EP1434029A2 Position measuring system comprising a rotary laser |
| 06/30/2004 | EP1432961A1 Method and arrangement in a measuring system |
| 06/30/2004 | EP1432526A2 Method and apparatus for detecting a liquid spray pattern |
| 06/30/2004 | EP1101187B1 Assembly for detecting the superficial structures of fingers and/or palms |