Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
01/2003
01/23/2003US20030016047 Method and apparatus for measuring parameters of an electronic device
01/23/2003US20030015805 Organic semiconductor diode and organic electroluminescence element display device
01/23/2003US20030015794 Semiconductor device with an ohmic contact and method of manufacturing the same
01/23/2003US20030015771 High-voltage semiconductor device used as switching element or the like
01/23/2003US20030015766 Integrated circuitry
01/23/2003US20030015765 Semiconductor device
01/23/2003US20030015763 Semiconductor device and method for manufacturing the same
01/23/2003US20030015762 All-in-one disposable/permanent spacer elevated source/drain, self-aligned silicide CMOS
01/23/2003US20030015758 Semiconductor device and method therefor
01/23/2003US20030015757 Semiconductor memory device
01/23/2003US20030015755 Vertical transistor, memory arrangement and method for fabricating a vertical transistor
01/23/2003US20030015754 Nonvolatile semiconductor memory device
01/23/2003US20030015752 Memory cell, memory cell configuration and fabrication method
01/23/2003US20030015751 Semiconductor memory device including memory cells and peripheral circuits and method for manufacturing the same
01/23/2003US20030015748 Semiconductor device including memory cells and manufacturing method thereof
01/23/2003US20030015747 Semiconductor device including memory cells and manufacturing method thereof
01/23/2003US20030015746 Semiconductor device including memory cells and manufacturing method thereof
01/23/2003US20030015739 MOS transistor and method for forming the same
01/23/2003US20030015727 Transistor
01/23/2003US20030015708 Gallium nitride based diodes with low forward voltage and low reverse current operation
01/23/2003US20030015706 Semiconductor film, method of forming semiconductor film, and method of manufacturing semiconductor device
01/23/2003US20030015703 Semiconductor device, and electronic apparatus
01/23/2003US20030015701 Cerdip type of solid-state image sensing device, structure and method for gripping cerdip type of solid-state image sensing device
01/23/2003US20030015700 Suitable semiconductor structure for forming multijunction solar cell and method for forming the same
01/23/2003US20030015040 Capacitive type of pressure sensor
01/23/2003CA2453318A1 Aluminum gallium nitride/gallium nitride high electron mobility transistors having a gate contact on a gallium nitride based cap segment and methods of fabricating same
01/22/2003EP1278247A2 A method to form an air-gap under the edges of a gate electrode by using disposable spacer/liner
01/22/2003EP1278236A1 Method of dicing a compound semiconductor wafer and compound semiconductor substrate thereby formed
01/22/2003EP1278235A1 Manufacturing method of compound semiconductor device
01/22/2003EP1278234A2 MOS transistor and method of manufacturing
01/22/2003EP1278060A1 CCD sensor
01/22/2003EP1277231A1 A method and apparatus for selectively oxidizing a silicon/metal composite film stack
01/22/2003EP1277033A2 Micromechanical component and balancing method
01/22/2003EP0818046B1 Method for forming a capacitive absolute pressure sensor
01/22/2003CN1393032A Method for manufacturing thin-film semiconductor device
01/22/2003CN1392614A Gate without dopant permeated to its insulating layer and its manufacture
01/22/2003CN1392597A Method for producing compound semiconductor device
01/22/2003CN1392435A Laser radiation table, device, method and method for producing semiconductor device
01/22/2003CN1392399A Pressure sensor and pressure detector
01/22/2003CN1099715C Surface voltage-resistant layer of semiconductor device for floating voltage end
01/22/2003CN1099713C MOS unit, multiple cell transistor and IC chip using N-sided polygonal cell lay-out
01/22/2003CN1099712C Semiconductor device having protection circuit
01/22/2003CN1099706C Method for producing isolation shed field effect transistor
01/22/2003CN1099699C Method for production of SOI (silicon on insulator) substrate by pasting and SOI substrate
01/22/2003CN1099612C Method for producing active matrix liquid crystal displayer
01/21/2003US6510193 Charge transfer device and a semiconductor circuit including the device
01/21/2003US6510086 Nonvolatile semiconductor memory
01/21/2003US6510081 Electrically-eraseable programmable read-only memory having reduced-page-size program and erase
01/21/2003US6509946 High resolution TFT liquid crystal display device having a wide TFT channel
01/21/2003US6509645 Spherical semiconductor device and method for fabricating the same
01/21/2003US6509627 Flowable germanium doped silicate glass for use as a spacer oxide
01/21/2003US6509625 Guard structure for bipolar semiconductor device
01/21/2003US6509619 Detectors
01/21/2003US6509618 Device having thin first spacers and partially recessed thick second spacers for improved salicide resistance on polysilicon gates
01/21/2003US6509617 Semiconductor device and fabrication method thereof
01/21/2003US6509616 Semiconductor device and its manufacturing method
01/21/2003US6509615 Semiconductor device having dynamic threshold transistors and element isolation region and fabrication method thereof
01/21/2003US6509613 Self-aligned floating body control for SOI device through leakage enhanced buried oxide
01/21/2003US6509612 High dielectric constant materials as gate dielectrics (insulators)
01/21/2003US6509611 Method for wrapped-gate MOSFET
01/21/2003US6509610 Insulated gate semiconductor device with high minority carrier injection and low on-voltage by enlarged pn-junction area
01/21/2003US6509609 Grooved channel schottky MOSFET
01/21/2003US6509608 Trench-gate field-effect transistors and their manufacture
01/21/2003US6509607 Semiconductor device with reduced source diffusion distance and method of making same
01/21/2003US6509606 EPROM cell that does not incorporate oxide isolation and thereby avoids problems with leakage along the field oxide edge that can lead to degraded data retention.
01/21/2003US6509605 Flash memory cell having a flexible element
01/21/2003US6509604 Nitridation barriers for nitridated tunnel oxide for circuitry for flash technology and for LOCOS/STI isolation
01/21/2003US6509603 P-channel EEPROM and flash EEPROM devices
01/21/2003US6509602 Nonvolatile memory and manufacturing method thereof
01/21/2003US6509600 Flash memory cell
01/21/2003US6509594 Semiconductor memory device having MFMIS transistor and increased data storage time
01/21/2003US6509591 Thin film transistor with photoconductive material
01/21/2003US6509587 Semiconductor device
01/21/2003US6509586 Semiconductor device, method for fabricating the semiconductor device and semiconductor integrated circuit
01/21/2003US6509585 Electrostatic discharge protective device incorporating silicon controlled rectifier devices
01/21/2003US6509583 Semiconductor device formed on insulating layer and method of manufacturing the same
01/21/2003US6509282 Silicon-starved PECVD method for metal gate electrode dielectric spacer
01/21/2003US6509278 Method of forming a semiconductor contact that includes selectively removing a Ti-containing layer from the surface
01/21/2003US6509255 Fuse area structure having guard ring surrounding fuse opening in semiconductor device and method of forming the same
01/21/2003US6509254 Method of forming electrode structure and method of fabricating semiconductor device
01/21/2003US6509252 Method of manufacturing semiconductor device
01/21/2003US6509242 Heterojunction bipolar transistor
01/21/2003US6509241 Process for fabricating an MOS device having highly-localized halo regions
01/21/2003US6509240 Angle implant process for cellular deep trench sidewall doping
01/21/2003US6509239 Method of fabricating a field effect transistor
01/21/2003US6509237 Flash memory cell fabrication sequence
01/21/2003US6509236 Laser fuseblow protection method for silicon on insulator (SOI) transistors
01/21/2003US6509234 Method of fabricating an ultra-thin fully depleted SOI device with T-shaped gate
01/21/2003US6509233 Method of making trench-gated MOSFET having cesium gate oxide layer
01/21/2003US6509230 Non-volatile memory semiconductor device including a graded, grown, high quality oxide layer and associated methods
01/21/2003US6509221 Method for forming high performance CMOS devices with elevated sidewall spacers
01/21/2003US6509220 Method of fabricating a high-voltage transistor
01/21/2003US6509219 Fabrication of notched gates by passivating partially etched gate sidewalls and then using an isotropic etch
01/21/2003US6509217 Inexpensive, reliable, planar RFID tag structure and method for making same
01/21/2003US6509215 TFT substrate with low contact resistance and damage resistant terminals
01/21/2003US6509212 Method for laser-processing semiconductor device
01/21/2003US6509211 Semiconductor device having SOI structure and method of fabricating the same
01/21/2003US6508693 Part of the semiconductor body is removed by means of powder blasting
01/21/2003US6508686 Method of manufacturing pixel electrode for reflection type display device
01/21/2003US6508125 Electrostatic capacitance type acceleration sensor, electrostatic capacitance type angular acceleration sensor and electrostatic actuator