Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2013
01/31/2013US20130027113 Power Semiconductor Chip Having Two Metal Layers on One Face
01/31/2013US20130027079 Field programmable gate array utilizing two-terminal non-volatile memory
01/31/2013US20130026720 Electrostatic chuck
01/31/2013US20130026693 Substrate supporting edge ring with coating for improved soak performance
01/31/2013US20130026690 Wet-etching jig
01/31/2013US20130026663 Method for curing defects in a semiconductor layer
01/31/2013US20130026659 Microelectronic component
01/31/2013US20130026658 Wafer level chip scale package for wire-bonding connection
01/31/2013US20130026657 Semiconductor package and method of fabricating the same
01/31/2013US20130026655 Chip package structure and method of manufacturing the same
01/31/2013US20130026653 Method for manufacturing semiconductor device
01/31/2013US20130026650 Semiconductor device, semiconductor module structure configured by vertically stacking semiconductor devices, and manufacturing method thereof
01/31/2013US20130026649 Semiconductor device and manufacturing method therefor
01/31/2013US20130026646 Passivated through wafer vias in low-doped semiconductor substrates
01/31/2013US20130026645 Low stress vias
01/31/2013US20130026644 Photoactive Compound Gradient Photoresist
01/31/2013US20130026643 Semiconductor die assemblies, semiconductor devices including same, and methods of fabrication
01/31/2013US20130026642 Integrated circuit package including a direct connect pad, a blind via, and a bond pad electrically coupled to the direct connect pad
01/31/2013US20130026641 Conductor contact structure and forming method, and photomask pattern generating method for defining such conductor contact structure
01/31/2013US20130026639 Method of fabricating dual damascene structures using a multilevel multiple exposure patterning scheme
01/31/2013US20130026638 Wafer-Level Chip Scale Package
01/31/2013US20130026637 Metal gate electrode of a field effect transistor
01/31/2013US20130026635 Hybrid Copper Interconnect Structure and Method of Fabricating Same
01/31/2013US20130026634 Hybrid Interconnect Technology
01/31/2013US20130026633 Multilayer Metallization with Stress-Reducing Interlayer
01/31/2013US20130026631 Semiconductor apparatus and manufacturing method thereof
01/31/2013US20130026630 Flip chips having multiple solder bump geometries
01/31/2013US20130026629 Semiconductor device, semiconductor device unit, and semiconductor device production method
01/31/2013US20130026628 Flip Chip Interconnection having Narrow Interconnection Sites on the Substrate
01/31/2013US20130026627 Electronic chip comprising connection pillars and manufacturing method
01/31/2013US20130026626 Method for forming bumps and substrate including the bumps
01/31/2013US20130026624 Coaxial solder bump support structure
01/31/2013US20130026623 Semiconductor Devices, Packaging Methods and Structures
01/31/2013US20130026620 Self-aligning conductive bump structure and method of making the same
01/31/2013US20130026618 Method and device for circuit routing by way of under-bump metallization
01/31/2013US20130026617 Methods of forming a metal silicide region in an integrated circuit
01/31/2013US20130026616 Power device package module and manufacturing method thereof
01/31/2013US20130026615 Double-side exposed semiconductor device and its manufacturing method
01/31/2013US20130026614 Structure and method for bump to landing trace ratio
01/31/2013US20130026612 Method of shielding through silicon vias in a passive interposer
01/31/2013US20130026610 Lithography method and device
01/31/2013US20130026609 Package assembly including a semiconductor substrate with stress relief structure
01/31/2013US20130026608 Process for manufacturing a semiconductor structure comprising a functionalized layer on a support substrate
01/31/2013US20130026607 Integrated circuit devices having features with reduced edge curvature and methods for manufacturing the same
01/31/2013US20130026606 Tsv pillar as an interconnecting structure
01/31/2013US20130026605 WLCSP for Small, High Volume Die
01/31/2013US20130026601 Semiconductor Device and Method for Manufacturing a Semiconductor
01/31/2013US20130026600 Forming air gaps in memory arrays and memory arrays with air gaps thus formed
01/31/2013US20130026590 Sloped structure, method for manufacturing sloped structure, and spectrum sensor
01/31/2013US20130026582 Partial poly amorphization for channeling prevention
01/31/2013US20130026579 Techniques Providing High-K Dielectric Metal Gate CMOS
01/31/2013US20130026578 Semiconductor device and method of manufacturing the same
01/31/2013US20130026576 Combined Output Buffer and ESD Diode Device
01/31/2013US20130026575 Threshold adjustment of transistors by controlled s/d underlap
01/31/2013US20130026574 Semiconductor device, method for manufacturing same, and display device
01/31/2013US20130026573 Body contact soi transistor structure and method of making
01/31/2013US20130026572 N-channel and p-channel finfet cell architecture
01/31/2013US20130026571 N-channel and p-channel finfet cell architecture with inter-block insulator
01/31/2013US20130026570 Borderless contact for ultra-thin body devices
01/31/2013US20130026569 Methods and apparatus related to hot carrier injection reliability improvement
01/31/2013US20130026568 Planar srfet using no additional masks and layout method
01/31/2013US20130026567 Finfet drive strength modification
01/31/2013US20130026565 Low rdson resistance ldmos
01/31/2013US20130026562 Vertical memory cell
01/31/2013US20130026559 Silicon-carbide mosfet cell structure and method for forming same
01/31/2013US20130026558 Semiconductor devices including variable resistance material and methods of fabricating the same
01/31/2013US20130026557 Sonos non-volatile memory cell and fabricating method thereof
01/31/2013US20130026553 NVM Bitcell with a Replacement Control Gate and Additional Floating Gate
01/31/2013US20130026552 Split-gate flash memory exhibiting reduced interference
01/31/2013US20130026549 Semiconductor integrated circuit having capacitor for providing stable power and method of manufacturing the same
01/31/2013US20130026546 Integrated circuit comprising an isolating trench and corresponding method
01/31/2013US20130026545 Multiple well drain engineering for hv mos devices
01/31/2013US20130026543 Semiconductor device and manufacturing method thereof
01/31/2013US20130026540 Methods and apparatus for forming semiconductor structures
01/31/2013US20130026539 Replacement source/drain finfet fabrication
01/31/2013US20130026536 Insulated gate semiconductor device with optimized breakdown voltage, and manufacturing method thereof
01/31/2013US20130026499 Wafer-level packaging for solid-state transducers and associated systems and methods
01/31/2013US20130026497 Silicon carbide substrate manufacturing method and silicon carbide substrate
01/31/2013US20130026496 Semiconductor Device and Manufacturing Method Thereof
01/31/2013US20130026495 III-Nitride Metal Insulator Semiconductor Field effect Transistor
01/31/2013US20130026492 Diamond Semiconductor System and Method
01/31/2013US20130026490 Glass/ceramics replacement of epoxy for high temperature hermetically sealed non-axial electronic packages
01/31/2013US20130026489 AlN BUFFER N-POLAR GaN HEMT PROFILE
01/31/2013US20130026488 Epitaxial substrate and method for manufacturing epitaxial substrate
01/31/2013US20130026486 Epitaxial substrate and method for manufacturing epitaxial substrate
01/31/2013US20130026482 Boron-Containing Buffer Layer for Growing Gallium Nitride on Silicon
01/31/2013US20130026480 Nucleation of Aluminum Nitride on a Silicon Substrate Using an Ammonia Preflow
01/31/2013US20130026479 Semiconductor thin-film forming method, semiconductor device, semiconductor device manufacturing method, substrate, and thin-film substrate
01/31/2013US20130026471 Circuit Structures, Memory Circuitry, And Methods
01/31/2013US20130026466 Testing architecture of circuits integrated on a wafer
01/31/2013US20130026465 Semiconductor device including an asymmetric feature, and method of making the same
01/31/2013US20130026463 Electronic device and manufacturing method for same
01/31/2013US20130026462 Method for manufacturing thin film transistor and thin film transistor manufactured by the same, and active matrix substrate
01/31/2013US20130026450 Nitride-based heterojuction semiconductor device and method for the same
01/31/2013US20130026449 Hybrid CMOS Technology with Nanowire Devices and Double Gated Planar Devices
01/31/2013US20130026444 Synthesizing graphene from metal-carbon solutions using ion implantation
01/31/2013US20130026443 Silicon nanowire comprising high density metal nanoclusters and method of preparing the same
01/31/2013US20130026437 Resistance variable memory device and method for fabricating the same
01/31/2013US20130026436 Phase change memory electrode with sheath for reduced programming current
01/31/2013US20130026152 Pressurizing-type lamp annealing device, method for producing thin film, and method for using pressurizing-type lamp annealing device