| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 07/25/1995 | US5435058 Hybrid/microwave enclosures and method of making same |
| 07/20/1995 | WO1995019692A1 Process for forming solid conductive vias in substrates |
| 07/20/1995 | WO1995019657A1 Electrostatic discharge circuit for high speed, high voltage circuitry |
| 07/20/1995 | WO1995019649A1 High value gate leakage resistor |
| 07/20/1995 | WO1995019647A1 Diode and production method thereof |
| 07/20/1995 | WO1995019646A1 Input/output transistors with optimized esd protection |
| 07/20/1995 | WO1995019645A1 Methods and apparatus for producing integrated circuit devices |
| 07/20/1995 | WO1995019642A1 Process for producing a three-dimensional circuit |
| 07/20/1995 | WO1995019641A1 Fabrication of optically reflecting ohmic contacts for semiconductor devices |
| 07/20/1995 | WO1995019640A1 Charged particle projector system |
| 07/20/1995 | WO1995019637A1 Particle beam, in particular ionic optic reproduction system |
| 07/20/1995 | WO1995019627A1 Magnetoresistive structure with alloy layer |
| 07/20/1995 | WO1995019625A1 Semiconductor device |
| 07/20/1995 | WO1995019251A1 Method of resin-sealing semiconductor devices |
| 07/20/1995 | WO1995019211A1 Recycling of wafer cleaning substances |
| 07/20/1995 | DE4446992A1 Appts. for depositing layers in gas phase on substrate |
| 07/20/1995 | DE4415137C1 Semiconductor device esp. MOSFET |
| 07/20/1995 | DE4410505A1 Prodn. of resist pattern for semiconductor components |
| 07/20/1995 | DE4400842A1 MOS transistor having high degree of integration |
| 07/20/1995 | DE3051200C2 Monolithic integrated semiconductor unit |
| 07/20/1995 | DE19501549A1 Semiconductor device with buried element insulating film |
| 07/20/1995 | CA2181339A1 Methods and apparatus for producing integrated circuit devices |
| 07/19/1995 | EP0663727A1 Output buffer circuit, input buffer circuit and bi-directional buffer circuit for plural voltage systems |
| 07/19/1995 | EP0663698A1 Semiconductor device and its manufacture |
| 07/19/1995 | EP0663697A1 Thin film semiconductor device, its manufacture, and display system |
| 07/19/1995 | EP0663695A2 Electrically erasable programmable non-volatile semiconductor memory device having select gates and small number of contact holes, and method of manufacturing the device |
| 07/19/1995 | EP0663694A1 Semiconductor device having a protective circuit against electrostatic discharge |
| 07/19/1995 | EP0663693A1 Low thermal impedance integrated circuit |
| 07/19/1995 | EP0663692A2 Process for fabricating a layer having reduced strain |
| 07/19/1995 | EP0663690A2 An ashing method for removing an organic film on a substance of a semiconductor device under fabrication |
| 07/19/1995 | EP0663689A2 Diffusion process for integrated circuits |
| 07/19/1995 | EP0663688A2 Semiconductor substrate and process for producing same |
| 07/19/1995 | EP0663687A1 Instrument for production of semiconductor and process for production thereof |
| 07/19/1995 | EP0663686A1 Automatic assembler/disassembler apparatus adapted to pressurized sealable transportable container |
| 07/19/1995 | EP0663685A1 Wafer holder |
| 07/19/1995 | EP0663683A2 Magnetron plasma processing apparatus and processing method |
| 07/19/1995 | EP0663682A1 Method and apparatus for tuning field for plasma processing using corrected electrode |
| 07/19/1995 | EP0663669A2 Improvements in or relating to fuse and antifuse link structures for integrated circuits |
| 07/19/1995 | EP0663665A2 Memory cell with programmable antifuse technology |
| 07/19/1995 | EP0663618A1 Illumination unit having a facility for preventing contamination of optical components, and photolithographic apparatus including such an illumination unit |
| 07/19/1995 | EP0663457A1 System for depositing material on a substrate |
| 07/19/1995 | EP0663265A1 In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
| 07/19/1995 | EP0663264A1 Semiconductor wafer edge polishing system and method |
| 07/19/1995 | EP0663140A1 Fabrication of dense parallel solder bump connections |
| 07/19/1995 | EP0663099A1 Magnetoresistive memory structure large fraction utilization |
| 07/19/1995 | EP0662990A1 Novolak resin mixtures. |
| 07/19/1995 | EP0637402A4 Method of making a dual-poly non-volatile memory device using a third polysilicon layer. |
| 07/19/1995 | EP0497982B1 Semiconductor device and its manufacturing method |
| 07/19/1995 | CN1105457A Photon colloid-removing machine |
| 07/19/1995 | CA2140395A1 Instrument for production of semiconductor and process for production thereof |
| 07/18/1995 | US5434825 Flash EEPROM system cell array with more than two storage states per memory cell |
| 07/18/1995 | US5434819 Semiconductor memory device having an automatically activated verify function capability |
| 07/18/1995 | US5434813 Semiconductor memory device and manufacturing method of the same |
| 07/18/1995 | US5434751 Reworkable high density interconnect structure incorporating a release layer |
| 07/18/1995 | US5434742 Capacitor for semiconductor integrated circuit and method of manufacturing the same |
| 07/18/1995 | US5434648 Proximity exposure method and machine therefor |
| 07/18/1995 | US5434647 Projector for exposing photosensitive substrate |
| 07/18/1995 | US5434589 TFT LCD display control system for displaying data upon detection of VRAM write access |
| 07/18/1995 | US5434526 Output circuit and semiconductor integrated circuit device |
| 07/18/1995 | US5434514 Programmable logic devices with spare circuits for replacement of defects |
| 07/18/1995 | US5434513 Semiconductor wafer testing apparatus using intermediate semiconductor wafer |
| 07/18/1995 | US5434512 Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| 07/18/1995 | US5434505 Method and apparatus for low temperature HEMT-like material testing |
| 07/18/1995 | US5434502 Calibration device for hyper-frequency adjustment of the reference planes of an apparatus for measuring the dispersion parameters of elements of integrated circuits |
| 07/18/1995 | US5434451 Tungsten liner process for simultaneous formation of integral contact studs and interconnect lines |
| 07/18/1995 | US5434450 PGA package type semiconductor device having leads to be supplied with power source potential |
| 07/18/1995 | US5434448 Programmable contact structure |
| 07/18/1995 | US5434447 Semiconductor device having a trench for device isolation and method of fabricating the same |
| 07/18/1995 | US5434444 High breakdown voltage semiconductor device |
| 07/18/1995 | US5434443 Semiconductor switch including a power transistor integrated with a temperature sensor therefor |
| 07/18/1995 | US5434440 Semiconductor device and method of manufacturing the same |
| 07/18/1995 | US5434439 Dynamic random access memory having stacked type capacitor and manufacturing method therefor |
| 07/18/1995 | US5434438 Random access memory cell with a capacitor |
| 07/18/1995 | US5434436 Master-slice type semiconductor integrated circuit device having multi-power supply voltage |
| 07/18/1995 | US5434435 Trench gate lateral MOSFET |
| 07/18/1995 | US5434433 Semiconductor device for a light wave |
| 07/18/1995 | US5434432 Hydrogenated silicon carbide between conductors |
| 07/18/1995 | US5434424 Spinning reticle scanning projection lithography exposure system and method |
| 07/18/1995 | US5434423 System and method for optimizing placement of dopant upon semiconductor surface |
| 07/18/1995 | US5434409 Critical dimension measuring method |
| 07/18/1995 | US5434385 Dual channel D.C. low noise measurement system and test methodology |
| 07/18/1995 | US5434363 Multilayer printed circuits with protective layers and tantalum wires |
| 07/18/1995 | US5434357 Reduced semiconductor size package |
| 07/18/1995 | US5434110 Methods of chemical vapor deposition (CVD) of tungsten films on patterned wafer substrates |
| 07/18/1995 | US5434109 Oxidation of silicon nitride in semiconductor devices |
| 07/18/1995 | US5434108 Grounding method to eliminate the antenna effect in VLSI process |
| 07/18/1995 | US5434107 Method for planarization |
| 07/18/1995 | US5434104 Method of using corrosion prohibiters in aluminum alloy films |
| 07/18/1995 | US5434103 Method of forming an electrical connection |
| 07/18/1995 | US5434102 Process for fabricating layered superlattice materials and making electronic devices including same |
| 07/18/1995 | US5434100 Substrate for epitaxy and epitaxy using the substrate |
| 07/18/1995 | US5434099 Method of manufacturing field isolation for complimentary type devices |
| 07/18/1995 | US5434098 Double poly process with independently adjustable interpoly dielectric thickness |
| 07/18/1995 | US5434097 Method for manufacturing an image sensor |
| 07/18/1995 | US5434096 Method to prevent silicide bubble in the VLSI process |
| 07/18/1995 | US5434094 Method of producing a field effect transistor |
| 07/18/1995 | US5434093 Inverted spacer transistor |
| 07/18/1995 | US5434092 Method for fabricating a triple self-aligned bipolar junction transistor |
| 07/18/1995 | US5434091 Method for making collector up bipolar transistors having reducing junction capacitance and increasing current gain |
| 07/18/1995 | US5434089 Method for testing the sheet resistivity of diffused layers |