| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 09/16/1998 | EP0865074A2 Process of making doped polysilicon layers and structures and process of patterning layers and layer structures which contain polysilicon |
| 09/16/1998 | EP0865073A2 Substrate processing apparatus and method |
| 09/16/1998 | EP0865070A1 Method and apparatus for sputter etch conditioning a ceramic body |
| 09/16/1998 | EP0864992A2 Method, apparatus and computer program product for simulating diffusion of impurities in a semiconductor |
| 09/16/1998 | EP0864991A2 Method and apparatus of establishing a region to be made amorphous |
| 09/16/1998 | EP0864929A2 Determining method of movement sequence and alignment apparatus for executing the same |
| 09/16/1998 | EP0864872A2 Dual-laser voltage probing of IC's |
| 09/16/1998 | EP0864870A2 Method of making an integrated circuit testing device |
| 09/16/1998 | EP0864672A2 Molecular beam epitaxy method |
| 09/16/1998 | EP0864537A1 Ferroelectric material, method of manufacturing the same, semiconductor memory, and method of manufacturing the same |
| 09/16/1998 | EP0864533A2 Method of purifying alkaline solution and method of etching semiconductor wafers |
| 09/16/1998 | EP0864184A1 Device with circuit element and transmission line |
| 09/16/1998 | EP0864180A1 Low resistance contact semiconductor diode |
| 09/16/1998 | EP0864177A2 Read-only memory cell array and method for the fabrication thereof |
| 09/16/1998 | EP0864176A1 Structure for esd protection in semiconductor chips |
| 09/16/1998 | EP0864175A1 Novel metallization sidewall passivation technology for deep sub-half micrometer ic applications |
| 09/16/1998 | EP0864172A2 Process for producing an integrated circuit device with at least one mos transistor |
| 09/16/1998 | EP0864171A1 Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
| 09/16/1998 | EP0864170A1 Thermal processing apparatus and process |
| 09/16/1998 | EP0864158A1 Power supply independent current source for flash eprom erasure |
| 09/16/1998 | EP0864119A1 Photosensitive composition |
| 09/16/1998 | EP0787224B1 Process for separating metal coatings |
| 09/16/1998 | EP0758487A4 Tape application platform and processes therefor |
| 09/16/1998 | EP0618309B1 Metal powder composition for metallization and metallized substrate |
| 09/16/1998 | CN1193414A Floating gate non-volatile memory device, and method of manufacturing same |
| 09/16/1998 | CN1193193A Silicon/germanium-silicon verticle noded type field effect transistor |
| 09/16/1998 | CN1193192A Semiconductor device and mfg. method thereof |
| 09/16/1998 | CN1193191A Layout structure of semiconductor storage device |
| 09/16/1998 | CN1193190A Static semiconductor storage device whose data wire parallel to power wire |
| 09/16/1998 | CN1193189A Interconnection system in semiconductor device |
| 09/16/1998 | CN1193188A Semiconductor device, assembling method, and circuit baseboard and soft baseboard and mfg. method therefor |
| 09/16/1998 | CN1193187A Device for processing lead-wire frame and processing method thereof |
| 09/16/1998 | CN1193186A Carrier sheet and integrated circuit device using same |
| 09/16/1998 | CN1193185A Method for mfg. of complementary MOS semiconductor device |
| 09/16/1998 | CN1193184A Wafer comprising optoelectronic circuits and method of verifying this wafer |
| 09/16/1998 | CN1193183A Mask for exposure of part of primary electron beam and method thereof |
| 09/16/1998 | CN1193182A Semiconductor heterogeneous structure and mfg. method thereof. and semiconductor device |
| 09/16/1998 | CN1193129A Electron beam exposure system and using method thereof |
| 09/16/1998 | CN1193128A Chemically-reinforced photoetching glue |
| 09/16/1998 | CN1193127A Mask including transmission-rate-variable shade layer |
| 09/16/1998 | CN1193054A Method for making silicon single crystal and used seed crystal |
| 09/16/1998 | CN1039859C Semiconductor device and method of fabricating same |
| 09/15/1998 | US5809211 Ramping susceptor-wafer temperature using a single temperature input |
| 09/15/1998 | US5809102 CCD having charge-injected potential barrier regions protected from overvoltages |
| 09/15/1998 | US5808943 Semiconductor memory and method of manufacturing the same |
| 09/15/1998 | US5808941 SRAM cell employing substantially vertically elongated pull-up resistors |
| 09/15/1998 | US5808939 Non-volatile semiconductor memory device and data programming method |
| 09/15/1998 | US5808934 Integrated logic circuit and EEPROM |
| 09/15/1998 | US5808930 Semiconductor memory device having improved wiring architecture |
| 09/15/1998 | US5808874 Microelectronic connections with liquid conductive elements |
| 09/15/1998 | US5808872 Semiconductor package and method of mounting the same on circuit board |
| 09/15/1998 | US5808870 Plastic pin grid array package |
| 09/15/1998 | US5808855 Stacked container capacitor using chemical mechanical polishing |
| 09/15/1998 | US5808854 Capacitor construction with oxidation barrier blocks |
| 09/15/1998 | US5808853 Capacitor with multi-level interconnection technology |
| 09/15/1998 | US5808814 Short wavelength projection optical system |
| 09/15/1998 | US5808796 Projection method and projection system and mask therefor |
| 09/15/1998 | US5808744 Apparatus for inspecting repetitive patterns |
| 09/15/1998 | US5808733 Device for measuring feeble light and method thereof |
| 09/15/1998 | US5808724 Illumination method and system having a first optical element at a position optically conjugate with an object and a second optical element closer to the object and on a pupil plane of the system |
| 09/15/1998 | US5808483 Logic circuit utilizing pass transistors and logic gate |
| 09/15/1998 | US5808459 Design technique for converting a floating band-gap reference voltage to a fixed and buffered reference voltage |
| 09/15/1998 | US5808366 Integrated circuits, and methods of fabricating same, which take into account capacitive loading by the integrated circuit potting material |
| 09/15/1998 | US5808365 Semiconductor device and method of manufacturing the same |
| 09/15/1998 | US5808364 Semiconductor device |
| 09/15/1998 | US5808363 Semiconductor device and method of fabricating the same |
| 09/15/1998 | US5808362 Interconnect structure and method of forming |
| 09/15/1998 | US5808360 Microbump interconnect for bore semiconductor dice |
| 09/15/1998 | US5808359 Semiconductor device having a heat sink with bumpers for protecting outer leads |
| 09/15/1998 | US5808358 Packaging electrical circuits |
| 09/15/1998 | US5808353 Radiation hardened dielectric for EEPROM |
| 09/15/1998 | US5808352 Semiconductor apparatus having crystal defects |
| 09/15/1998 | US5808351 Programmable/reprogramable structure using fuses and antifuses |
| 09/15/1998 | US5808348 A semiconductor which includes a polysilicon gate separated from substrate by a re-oxidized nitrided oxide film in which concentration of re-oxidized nitride in film underlying gate is non-uniform |
| 09/15/1998 | US5808347 MIS transistor with gate sidewall insulating layer |
| 09/15/1998 | US5808346 Semiconductor device structure which provides individually controllable body-terminal voltage of MOS transistors |
| 09/15/1998 | US5808341 Semiconductor device having an SOI structure |
| 09/15/1998 | US5808340 Short channel self aligned VMOS field effect transistor |
| 09/15/1998 | US5808339 Two-layered gate structure for a semiconductor device and method for producing the same |
| 09/15/1998 | US5808336 Storage device |
| 09/15/1998 | US5808335 Reduced mask DRAM process |
| 09/15/1998 | US5808334 Semiconductor memory device having reduced parasitic capacities between bit lines |
| 09/15/1998 | US5808332 Field-effect semiconductor device |
| 09/15/1998 | US5808329 Low light level imager with extended wavelength response employing atomic bonded (fused) semiconductor materials |
| 09/15/1998 | US5808326 Delta protection component |
| 09/15/1998 | US5808321 Amorphous silicon crystallized by heating |
| 09/15/1998 | US5808320 Contact openings and an electronic component formed from the same |
| 09/15/1998 | US5808319 Localized semiconductor substrate for multilevel transistors |
| 09/15/1998 | US5808318 Polycrystalline semiconductor thin film for semiconductor TFT on a substrate having a mobility in a longitudinal direction greater than in a width direction |
| 09/15/1998 | US5808317 Split-gate, horizontally redundant, and self-aligned thin film transistors |
| 09/15/1998 | US5808316 Microcrystal silicon thin film transistor |
| 09/15/1998 | US5808315 Thin film transistor having transparent conductive film |
| 09/15/1998 | US5808313 Charged particle beam exposure method and charged particle beam exposure apparatus |
| 09/15/1998 | US5808312 System and process for inspecting and repairing an original |
| 09/15/1998 | US5808310 Electron beam cell projection lithography method for correcting coulomb interaction effects |
| 09/15/1998 | US5808274 Method of cutting masking sheet to be used to process silicon wafer |
| 09/15/1998 | US5808204 Solving production downtime with parallel low pressure sensors |
| 09/15/1998 | US5808176 For adjusting/replacing defective sensor used in semiconductor chambers |
| 09/15/1998 | US5807959 For semiconductors |
| 09/15/1998 | US5807792 Rotation; alternating supplying segments |