Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2004
06/29/2004US6756640 Nonvolatile memory and manufacturing method thereof
06/29/2004US6756639 Control of buried oxide quality in low dose SIMOX
06/29/2004US6756638 MOSFET structure with reduced junction capacitance
06/29/2004US6756637 Method of controlling floating body effects in an asymmetrical SOI device
06/29/2004US6756635 Semiconductor substrate including multiple nitrided gate insulating films
06/29/2004US6756634 Gated semiconductor assemblies
06/29/2004US6756633 Semiconductor memory array of floating gate memory cells with horizontally oriented floating gate edges
06/29/2004US6756631 Stacked-gate cell structure and its NAND-type flash memory array
06/29/2004US6756630 Nonvolatile semiconductor memory device
06/29/2004US6756629 Semiconductor devices including a multi-well and split-gate non-volatile memory transistor structure
06/29/2004US6756628 Capacitor sheet with built in capacitors
06/29/2004US6756627 Container capacitor
06/29/2004US6756626 Trench capacitor having an insulation collar
06/29/2004US6756625 Memory cell and method for forming the same
06/29/2004US6756624 Encapsulated metal structures for semiconductor devices and MIM capacitors including the same
06/29/2004US6756622 Vertical gain cell and array for a dynamic random access memory and method for forming the same
06/29/2004US6756621 Ferroelectric capacitor device
06/29/2004US6756620 Low-voltage and interface damage-free polymer memory device
06/29/2004US6756619 Channel regions doped with indium and surrounded by boron; transistor with insulative spacers
06/29/2004US6756615 Heterojunction bipolar transistor and its manufacturing method
06/29/2004US6756614 Thin film semiconductor device, polycrystalline semiconductor thin film production process and production apparatus
06/29/2004US6756612 Carrier coupler for thyristor-based semiconductor device
06/29/2004US6756611 Nitride semiconductor growth method, nitride semiconductor substrate, and nitride semiconductor device
06/29/2004US6756608 Semiconductor device and method of manufacturing the same
06/29/2004US6756607 Method and device for determining backgate characteristics
06/29/2004US6756606 Apparatus and method for marking defective sections of laminate substrates
06/29/2004US6756604 Si-Ge base heterojunction bipolar device
06/29/2004US6756599 Particle-optical apparatus, illumination apparatus and projection system as well as a method employing the same
06/29/2004US6756590 Shape measurement method and apparatus
06/29/2004US6756589 Method for observing specimen and device therefor
06/29/2004US6756568 Hot plate unit
06/29/2004US6756565 Heat exchanger; reuse
06/29/2004US6756562 Semiconductor wafer dividing apparatus and semiconductor device manufacturing method
06/29/2004US6756559 Plasma etching apparatus
06/29/2004US6756540 Self-adhering chip
06/29/2004US6756325 Method for producing a long wavelength indium gallium arsenide nitride(InGaAsN) active region
06/29/2004US6756324 Low temperature processes for making electronic device structures
06/29/2004US6756323 Method for fabricating an ultralow dielectric constant material as an intralevel or interlevel dielectric in a semiconductor device
06/29/2004US6756322 Method for evenly coating semiconductor laser end faces and frame used in the method
06/29/2004US6756321 Method for forming a capping layer over a low-k dielectric with improved adhesion and reduced dielectric constant
06/29/2004US6756320 Gallium/gadolinium/arsenic oxides having low defect and current leakage; field effect transistors
06/29/2004US6756319 Silica microstructure and fabrication method thereof
06/29/2004US6756317 Method for making a microstructure by surface micromachining
06/29/2004US6756315 Method of forming contact openings
06/29/2004US6756314 Method for etching a hard mask layer and a metal layer
06/29/2004US6756313 Method of etching silicon nitride spacers with high selectivity relative to oxide in a high density plasma chamber
06/29/2004US6756312 Method of fabricating a semiconductor device including time-selective etching process
06/29/2004US6756311 Using gas excited by electromagnetic waves; process control
06/29/2004US6756309 Feed forward process control method for adjusting metal line Rs
06/29/2004US6756308 Polishing uisng ozone and abrasives
06/29/2004US6756307 Apparatus for electrically planarizing semiconductor wafers
06/29/2004US6756306 Low temperature dielectric deposition to improve copper electromigration performance
06/29/2004US6756305 Stacked dice bonded with aluminum posts
06/29/2004US6756304 Method for producing via-connections in a substrate and substrate equipped with same
06/29/2004US6756303 Diffusion barrier and method for its production
06/29/2004US6756302 Low temperature metallization process
06/29/2004US6756301 Method of forming a metal seed layer for subsequent plating
06/29/2004US6756300 Method for forming dual damascene interconnect structure
06/29/2004US6756299 Process for fabricating a semiconductor device
06/29/2004US6756298 Methods and apparatus for making integrated-circuit wiring from copper, silver, gold, and other metals
06/29/2004US6756297 Overcoating dielectric with dielectric; electrodeposition copper and barrier metal
06/29/2004US6756295 Chip structure and process for forming the same
06/29/2004US6756294 Method for improving bump reliability for flip chip devices
06/29/2004US6756293 Combined gate cap or digit line and spacer deposition using HDP
06/29/2004US6756292 Method of forming a quantum dot and a gate electrode using the same
06/29/2004US6756291 Method for hardening gate oxides using gate etch process
06/29/2004US6756290 Method for the production of a semiconductor device
06/29/2004US6756289 Method of producing semiconductor member and method of producing solar cell
06/29/2004US6756288 Method of subdividing a wafer
06/29/2004US6756286 Method for transferring a thin film comprising a step of generating inclusions
06/29/2004US6756285 Multilayer structure with controlled internal stresses and making same
06/29/2004US6756284 Method for forming a sublithographic opening in a semiconductor process
06/29/2004US6756283 Method of fabricating a high surface area capacitor electrode
06/29/2004US6756282 Semiconductor device and method of fabricating the same
06/29/2004US6756281 Self aligned symmetric intrinsic process and device
06/29/2004US6756280 Semiconductor device and a process for producing same
06/29/2004US6756279 Method for manufacturing a bipolar transistor in a CMOS integrated circuit
06/29/2004US6756278 Lateral heterojunction bipolar transistor and method of fabricating the same
06/29/2004US6756277 Replacement gate process for transistors having elevated source and drain regions
06/29/2004US6756276 Strained silicon MOSFET having improved source/drain extension dopant diffusion resistance and method for its fabrication
06/29/2004US6756275 Method for minimizing product turn-around time for making semiconductor permanent store ROM cell
06/29/2004US6756274 Fabrication process for a super-self-aligned trench-gated DMOS with reduced on-resistance
06/29/2004US6756273 Semiconductor component and method of manufacturing
06/29/2004US6756272 Method of manufacturing non-volatile semiconductor memory device
06/29/2004US6756271 Simplified twin monos fabrication method with three extra masks to standard CMOS
06/29/2004US6756270 Semiconductor device and fabrication method thereof
06/29/2004US6756269 Method for manufacturing nonvolatile semiconductor memory device
06/29/2004US6756268 Modified source/drain re-oxidation method and system
06/29/2004US6756267 Method of manufacturing a semiconductor device including a capacitor with a roughened-surface electrode
06/29/2004US6756266 Capacitor array structure for semiconductor devices
06/29/2004US6756265 Designed for relatively tight packing between adjacent structures in dynamic random access memory cells
06/29/2004US6756264 Applying epitaxial silicon in disposable spacer flow
06/29/2004US6756263 Method of manufacturing semiconductor device
06/29/2004US6756262 Semiconductor integrated circuit device having spaced-apart electrodes and the method thereof
06/29/2004US6756261 Method for fabricating capacitors in semiconductor devices
06/29/2004US6756260 Method for manufacturing semiconductor device using seed conductive layers
06/29/2004US6756259 Gate insulating structure for power devices, and related manufacturing process
06/29/2004US6756258 Method of manufacturing a semiconductor device
06/29/2004US6756257 Patterned SOI regions on semiconductor chips
06/29/2004US6756256 Method for preventing burnt fuse pad from further electrical connection