| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 07/27/2004 | US6768967 Database interpolation method for optical measurement of diffractive microstructures |
| 07/27/2004 | US6768964 Method and apparatus for determining dot-mark-forming position of semiconductor wafer |
| 07/27/2004 | US6768961 System and method for analyzing error information from a semiconductor fabrication process |
| 07/27/2004 | US6768958 Automatic calibration of a masking process simulator |
| 07/27/2004 | US6768681 Non-volatile memory device |
| 07/27/2004 | US6768670 Writing method for magnetic random access memory using a bipolar junction transistor |
| 07/27/2004 | US6768663 Semiconductor device array having dense memory cell array and hierarchical bit line scheme |
| 07/27/2004 | US6768662 Semiconductor memory device including an SOI substrate |
| 07/27/2004 | US6768627 Electrostatic chuck and processing apparatus for insulative substrate |
| 07/27/2004 | US6768616 Electrostatic discharge protection structures for high speed technologies with mixed and ultra-low voltage supplies |
| 07/27/2004 | US6768600 Temperature compensation apparatus for thermally loaded bodies of low thermal conductivity |
| 07/27/2004 | US6768552 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them |
| 07/27/2004 | US6768546 Projection exposure apparatus and device manufacturing method using the same |
| 07/27/2004 | US6768542 Defect inspecting device for substrate to be processed and method of manufacturing semiconductor device |
| 07/27/2004 | US6768539 Lithographic apparatus |
| 07/27/2004 | US6768537 Projection optical system, exposure apparatus, and exposure method |
| 07/27/2004 | US6768521 Method for manufacturing a thin film transistor array panel |
| 07/27/2004 | US6768400 Microstrip line having a linear conductor layer with wider and narrower portions |
| 07/27/2004 | US6768324 Semiconductor device tester which measures information related to a structure of a sample in a depth direction |
| 07/27/2004 | US6768269 Plasma process chamber monitoring method and system used therefor |
| 07/27/2004 | US6768260 Cathode over electroluminescent layer over anode over reflective film; brightness, accuracy |
| 07/27/2004 | US6768259 Flattening insulation layer embeds recesses and projections with coating; electroluminescence; |
| 07/27/2004 | US6768257 Display apparatus with ribs having conductive material |
| 07/27/2004 | US6768212 Semiconductor packages and methods for manufacturing such semiconductor packages |
| 07/27/2004 | US6768209 Underfill compounds including electrically charged filler elements, microelectronic devices having underfill compounds including electrically charged filler elements, and methods of underfilling microelectronic devices |
| 07/27/2004 | US6768207 Multichip wafer-level package and method for manufacturing the same |
| 07/27/2004 | US6768206 Organic substrate for flip chip bonding |
| 07/27/2004 | US6768205 Thin-film circuit substrate |
| 07/27/2004 | US6768203 Open-bottomed via liner structure and method for fabricating same |
| 07/27/2004 | US6768202 Semiconductor device and method of manufacturing the same |
| 07/27/2004 | US6768201 Interlevel insulating film covers gate electrode |
| 07/27/2004 | US6768200 Ultralow dielectric constant material as an intralevel or interlevel dielectric in a semiconductor device |
| 07/27/2004 | US6768199 Flip chip type semiconductor device and method of fabricating the same |
| 07/27/2004 | US6768198 Method and system for removing conductive lines during deprocessing |
| 07/27/2004 | US6768197 Hardening flux, soldering resist, semiconductor package reinforced by hardening flux, semiconductor device and method of producing semiconductor package and semiconductor device |
| 07/27/2004 | US6768196 Packaged microchip with isolation |
| 07/27/2004 | US6768192 Pin layout of dual band receiver with two input pads/pins restricted to a single side of a four sided package |
| 07/27/2004 | US6768190 Stack type flip-chip package |
| 07/27/2004 | US6768189 High power chip scale package |
| 07/27/2004 | US6768188 Semiconductor device |
| 07/27/2004 | US6768182 Semiconductor device |
| 07/27/2004 | US6768179 CMOS of semiconductor device and method for manufacturing the same |
| 07/27/2004 | US6768178 Semiconductor device |
| 07/27/2004 | US6768175 Semiconductor substrate and its production method, semiconductor device comprising the same and its production method |
| 07/27/2004 | US6768174 Complementary MOS transistors having p-type gate electrodes |
| 07/27/2004 | US6768173 Implanting and diffusing n-type dopant into p-type semiconductor; growing epitaxial layer; |
| 07/27/2004 | US6768172 High-voltage transistor with multi-layer conduction region |
| 07/27/2004 | US6768171 High-voltage transistor with JFET conduction channels |
| 07/27/2004 | US6768168 Insulated gate semiconductor device with low on voltage and manufacturing method thereof |
| 07/27/2004 | US6768166 Vertical transistor, memory arrangement and method for fabricating a vertical transistor |
| 07/27/2004 | US6768165 Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping |
| 07/27/2004 | US6768164 Stacked gate flash memory device and method of fabricating the same |
| 07/27/2004 | US6768163 Nonvolatile semiconductor memory device and nonvolatile semiconductor memory system |
| 07/27/2004 | US6768162 Split gate flash memory cell and manufacturing method thereof |
| 07/27/2004 | US6768161 Semiconductor device having floating gate and method of producing the same |
| 07/27/2004 | US6768160 Non-volatile memory cell and method of programming for improved data retention |
| 07/27/2004 | US6768159 Semiconductor device using a polysilicon layer |
| 07/27/2004 | US6768158 Flash memory element and manufacturing method thereof |
| 07/27/2004 | US6768156 Non-volatile random access memory cells associated with thin film constructions |
| 07/27/2004 | US6768155 Circuit with buried strap including liner |
| 07/27/2004 | US6768154 Semiconductor device |
| 07/27/2004 | US6768153 Semiconductor device |
| 07/27/2004 | US6768152 Magnetoresistive effect element and magnetic memory device |
| 07/27/2004 | US6768151 Semiconductor memory device with memory cells having same characteristics and manufacturing method for the same |
| 07/27/2004 | US6768148 Devices with active areas having increased ion concentrations adjacent to isolation structures |
| 07/27/2004 | US6768147 Semiconductor device and method of fabricating the same |
| 07/27/2004 | US6768146 III-V nitride semiconductor device, and protection element and power conversion apparatus using the same |
| 07/27/2004 | US6768145 Semiconductor integrated circuit device |
| 07/27/2004 | US6768141 Heterojunction bipolar transistor (HBT) having improved emitter-base grading structure |
| 07/27/2004 | US6768140 Structure and method in an HBT for an emitter ballast resistor with improved characteristics |
| 07/27/2004 | US6768138 Diode element |
| 07/27/2004 | US6768135 Dual process semiconductor heterostructures |
| 07/27/2004 | US6768134 Semiconductor device and a method for forming patterns |
| 07/27/2004 | US6768133 Semiconductor device, test method for semiconductor device, and tester for semiconductor device |
| 07/27/2004 | US6768130 Integration of semiconductor on implanted insulator |
| 07/27/2004 | US6768125 Maskless particle-beam system for exposing a pattern on a substrate |
| 07/27/2004 | US6768121 Ion source having replaceable and sputterable solid source material |
| 07/27/2004 | US6768118 Electron beam monitoring sensor and electron beam monitoring method |
| 07/27/2004 | US6768117 Immersion lens with magnetic shield for charged particle beam system |
| 07/27/2004 | US6768112 Substrate inspection system and method for controlling same |
| 07/27/2004 | US6768097 Optoelectronic device with wavelength filtering by cavity coupling |
| 07/27/2004 | US6768084 Improves process control, reduces temperature variations over substrate, facilitates powerful, flexible temperature control, variable gas ambient pressure, quick process gas ambient switching, vibration-free pyrometric temperature sensing |
| 07/27/2004 | US6768079 Susceptor with built-in plasma generation electrode and manufacturing method therefor |
| 07/27/2004 | US6768062 Connection method and connection structure of pad electrodes, and inspecting methods for connection state thereof |
| 07/27/2004 | US6767983 Silicone resin and photosensitive resin composition containing the same |
| 07/27/2004 | US6767877 Method and system for chemical injection in silicon wafer processing |
| 07/27/2004 | US6767848 Silicon semiconductor substrate and method for production thereof |
| 07/27/2004 | US6767847 Method of forming a silicon nitride-silicon dioxide gate stack |
| 07/27/2004 | US6767846 Method of securing a substrate in a semiconductor processing machine |
| 07/27/2004 | US6767845 Method of manufacturing semiconductor device |
| 07/27/2004 | US6767844 Plasma chamber equipped with temperature-controlled focus ring and method of operating |
| 07/27/2004 | US6767843 Oxidizing silicon carbide in nitrous oxide using a temperature profile of about 1200 degrees c |
| 07/27/2004 | US6767842 Implementation of Si-Ge HBT with CMOS process |
| 07/27/2004 | US6767841 Process for producing a semiconductor wafer |
| 07/27/2004 | US6767840 Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method |
| 07/27/2004 | US6767839 Method for forming multi-layer wiring structure |
| 07/27/2004 | US6767838 Method and apparatus for treating surface of semiconductor |
| 07/27/2004 | US6767837 Etch-back method for dielectric layer |
| 07/27/2004 | US6767836 Method of cleaning a CVD reaction chamber using an active oxygen species |
| 07/27/2004 | US6767835 Method of making a shaped gate electrode structure, and device comprising same |