Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2004
08/18/2004CN1521538A Light interference type color display panel
08/18/2004CN1521534A Transmission line having photonic band gap coplanar waveguide structure and method for fabricating power divider using the same
08/18/2004CN1521517A Active-matrix substrate and electromagnetic wave detector
08/18/2004CN1521513A Error portion detecting method ,layout method and programme for semiconductor integrated circuit
08/18/2004CN1521498A Inspecting an array of electronic components
08/18/2004CN1521226A Slurry for cmp, and method of manufacturing semiconductor device
08/18/2004CN1521172A Organic metal compound and its manufacturing method ,solution materials and thin films containing the same compound
08/18/2004CN1521074A Manual convey truck
08/18/2004CN1520938A Apparatus and method for cleaning electronic packages
08/18/2004CN1162919C Gan group crystal base member having low dislocation density, use thereof and manufacturing methods thereof
08/18/2004CN1162917C Field effect transistor
08/18/2004CN1162916C Light detector with built-in circuit and its prodn. method
08/18/2004CN1162913C Semiconductor memory and manufacture and drive method thereof
08/18/2004CN1162912C Semiconductor device and method for mfg. same
08/18/2004CN1162910C Power semiconductor device
08/18/2004CN1162909C Semiconductor IC
08/18/2004CN1162908C 半导体装置 Semiconductor device
08/18/2004CN1162906C Stacking type video image sensor and making method thereof
08/18/2004CN1162905C Plastic molded type semiconductor device and method of manufacturing same
08/18/2004CN1162904C 半导体器件 Semiconductor devices
08/18/2004CN1162903C Method for producing strain silicon CMOS structure with selective epitaxial precipitation
08/18/2004CN1162902C Method for manufacturing conductive connecting wire
08/18/2004CN1162901C Semiconductor device manufacturing process
08/18/2004CN1162900C Method for manufacturing microelectronic device and microelectronic device
08/18/2004CN1162899C Monocrystalline silicon wafer crystal orientation calibrating method
08/18/2004CN1162898C Heat sink mfg. device and mfg. method
08/18/2004CN1162897C Processaable isolation layer grid inlay technology used in sub 0.05 micrometer MOS device
08/18/2004CN1162896C Method for making semiconductor device
08/18/2004CN1162895C Wet type processing device
08/18/2004CN1162894C Device for irradiating ultraviolet ray
08/18/2004CN1162893C Particle preventing method for pre-cleaning chamber
08/18/2004CN1162863C Device for weighting cell resistances in magnetoresistive memory
08/18/2004CN1162862C Method for stopping electriomigration in magnetic random access storage
08/18/2004CN1162794C Method for extracting threshold voltage model parameters in BSIM3V3 model
08/18/2004CN1162754C Pattern forming material, pattern forming method, and manufacture method of mask for exposure
08/18/2004CN1162753C Polymer for chemically amplified resist and resist composition using the same
08/18/2004CN1162744C Electro-optical device
08/18/2004CN1162712C Electron density measurement and control system using plasma-induced changes in the frequency of a microwave oscillator
08/18/2004CN1162707C Detecting head for high-frequency measurement
08/18/2004CN1162490C Composition and method for flatting surfaces
08/18/2004CN1162253C Grinding method and appts. and grinding carrier used by grinding method and appts.
08/17/2004USRE38565 Thin film ferroelectric capacitors having improved memory retention through the use of essentially smooth bottom electrode structures
08/17/2004US6779167 Automated wiring pattern layout method
08/17/2004US6779164 LSI design method having dummy pattern generation process and LCR extraction process and computer program therefor
08/17/2004US6779160 Apparatus, method and pattern for evaluating semiconductor device characteristics
08/17/2004US6779158 Digital logic optimization using selection operators
08/17/2004US6779156 Digital circuits using universal logic gates
08/17/2004US6779143 Asynchronous testing of reset operation in an integrated circuit
08/17/2004US6778911 Real time analysis of periodic structures on semiconductors
08/17/2004US6778879 Automated material handling system and method of use
08/17/2004US6778876 Methods of processing substrates based upon substrate orientation
08/17/2004US6778874 Cassette and workpiece handler characterization tool
08/17/2004US6778762 Sloped chamber top for substrate processing
08/17/2004US6778572 Electrode structure, process for fabricating electrode structure and semiconductor light-emitting device
08/17/2004US6778568 Semiconductor module and method of mounting semiconductor laser element on the same
08/17/2004US6778441 Low tunnel barrier intergate insulator includes insulator comprising oxide of nickel, aluminum, tantalum, titantium, zirconium, niobium, yttrium, gadolinium; strontium orlead titanate; lead zirconate; or strontium-bismuth tantalate
08/17/2004US6778434 Magnetic random access memory device with a reduced number of interconnections for selection of address
08/17/2004US6778432 Thin film magnetic memory device capable of stably writing/reading data and method of fabricating the same
08/17/2004US6778430 Magnetic thin-film memory device for quick and stable reading data
08/17/2004US6778427 Magnetoresistive memory with a wiring for suppressing crosstalk
08/17/2004US6778426 Magnetic random access memory including memory cell unit and reference cell unit
08/17/2004US6778424 Semiconductor memory device and method of manufacturing the same
08/17/2004US6778422 Ferroelectric memory
08/17/2004US6778421 Memory device array having a pair of magnetic bits sharing a common conductor line
08/17/2004US6778406 Resilient contact structures for interconnecting electronic devices
08/17/2004US6778377 Electrostatic chucking system, and apparatus and method of manufacturing a semiconductor device using the electrostatic chucking system
08/17/2004US6778282 Measuring positions of coplanarity of contract elements of an electronic component with a flat illumination and two cameras
08/17/2004US6778280 Interferometry system and method employing an angular difference in propagation between orthogonally polarized input beam components
08/17/2004US6778274 Die attach process using cornercube offset tool
08/17/2004US6778268 System and method for process monitoring of polysilicon etch
08/17/2004US6778260 Coordinate measuring stage and coordinate measuring instrument
08/17/2004US6778258 Wafer handling system for use in lithography patterning
08/17/2004US6778257 Imaging apparatus
08/17/2004US6778255 Exposure apparatus
08/17/2004US6778233 Method for darkening pixel
08/17/2004US6778232 Method for manufacturing active matrix substrate
08/17/2004US6778007 Internal power voltage generating circuit
08/17/2004US6778002 Semiconductor integrated circuit device including a substrate bias controller and a current limiting circuit
08/17/2004US6777997 Semiconductor integrated circuit and a burn-in method thereof
08/17/2004US6777979 FIFO memory architecture
08/17/2004US6777978 Structures and methods for selectively applying a well bias to portions of a programmable device
08/17/2004US6777972 Method and apparatus for detecting breakdown in ultra thin dielectric layers
08/17/2004US6777968 Probing method and probing apparatus in which steady load is applied to main chuck
08/17/2004US6777967 Inspection method and inspection apparatus
08/17/2004US6777965 Interposer for electrically coupling a semiconductive device to an electrical apparatus
08/17/2004US6777964 Probe station
08/17/2004US6777963 Chip-mounted contact springs
08/17/2004US6777961 Thermopile infrared sensor and method for inspecting the same
08/17/2004US6777957 Test structure to measure interlayer dielectric effects and breakdown and detect metal defects in flash memories
08/17/2004US6777880 Particles are exposed in location-selective manner to external adjustment forces and/or plasma conditions are subjected to location-selective change to apply particles onto a substrate surface mask-free and/ or subject it to plasma treatment
08/17/2004US6777821 Ball grid array x-ray orientation mark
08/17/2004US6777820 Semiconductor wafer
08/17/2004US6777819 Semiconductor package with flash-proof device
08/17/2004US6777817 Reworkable and thermally conductive adhesive and use thereof
08/17/2004US6777814 Semiconductor device
08/17/2004US6777813 Fill pattern generation for spin-on-glass and related self-planarization deposition
08/17/2004US6777812 Semiconductor devices having protected plug contacts and upper interconnections
08/17/2004US6777811 Semiconductor device and its fabrication method
08/17/2004US6777810 Interconnection alloy for integrated circuits
08/17/2004US6777809 BEOL decoupling capacitor