Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2004
09/08/2004CN1165991C Semi-conductor and its producing method
09/08/2004CN1165990C Metal material for electronic unit, electronic unit, electronic equipment and treating method for metal material
09/08/2004CN1165989C Semiconductor and method for producing same
09/08/2004CN1165988C Semiconductor device
09/08/2004CN1165987C Method for mfg. semiconductor device with element separating insulation film
09/08/2004CN1165986C Fabrication method for sell aligned Cu diffusion barrier in integrated circuit
09/08/2004CN1165985C Formation of controllable slot top isolated layer for vertical transistor
09/08/2004CN1165984C Device and method for forming controllable isolating layer on top of deep channel
09/08/2004CN1165983C Laminated capacitor storage unit and its manufacturing method
09/08/2004CN1165982C Reinforced semiconductor chip container
09/08/2004CN1165981C Method and apparatus for monitoring charge neutralization operation
09/08/2004CN1165980C Semiconductor device and testing method for mfg. same
09/08/2004CN1165979C Integrated circuit package method
09/08/2004CN1165978C Mounting structure, method of manufacturing the same
09/08/2004CN1165977C Bipolar transistors with indenpendent impurity distribution on the same chiop and its manufacture
09/08/2004CN1165976C 半导体薄膜以及半导体器件 Semiconductor thin film and semiconductor devices
09/08/2004CN1165975C Method of planarizing upper surface of semiconductor wafer
09/08/2004CN1165974C Microelectronic structure, production method thereof and use in the storage cell
09/08/2004CN1165973C Method for forming dielectric films on sabstrate
09/08/2004CN1165972C Wet treatment nozzle with ultrasonic washer
09/08/2004CN1165971C Washing method and device
09/08/2004CN1165970C Thin film transistor array panel for liquid crystal display and making method thereof
09/08/2004CN1165969C Plasma processing device
09/08/2004CN1165968C Method for mfg. semiconductor crystal plate by making several zone masks having various scatter abilites
09/08/2004CN1165966C Gas distribution apparatus for semiconductor processing
09/08/2004CN1165965C System for manufacturing semiconductor products
09/08/2004CN1165964C Device and method for thermally treating substrates
09/08/2004CN1165963C Wafer carrier with minimal contact
09/08/2004CN1165962C Semiconductor thin film and method of manufacturing the same and semiconductor device and method of manufacturing the same
09/08/2004CN1165925C Thin film capacitor and method of forming the same
09/08/2004CN1165874C Reinforced integrated circuit
09/08/2004CN1165637C Equipment for making semiconductor device using vacuum system
09/08/2004CN1165592C Curable epoxy-based compositions
09/08/2004CN1165591C Electrically conducting adhesive, structural body for installation, LCD, electronic device and making emthod
09/08/2004CN1165408C Fluid dispensing fixed abrasive polishing pad
09/08/2004CN1165385C Semiconductor wafer carrier washing appts. and method
09/07/2004US6789250 Pattern data generation system, method and program for pattern data generation, reticle fabricating method, and semiconductor device manufacturing method using the pattern data
09/07/2004US6789240 Method of controlling bond process quality by measuring wire bond features
09/07/2004US6789238 System and method to improve IC fabrication through selective fusing
09/07/2004US6789235 Bond program verification system
09/07/2004US6789034 Data collection methods and apparatus with parasitic correction
09/07/2004US6789033 Apparatus and method for characterizing features at small dimensions
09/07/2004US6788996 Fabrication method of semiconductor integrated circuit device
09/07/2004US6788992 Control device for emergency stop in semiconductor manufacturing system
09/07/2004US6788991 Devices and methods for detecting orientation and shape of an object
09/07/2004US6788990 Process control device and process control method
09/07/2004US6788988 Method and apparatus using integrated metrology data for pre-process and post-process control
09/07/2004US6788605 Shared volatile and non-volatile memory
09/07/2004US6788598 Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereof
09/07/2004US6788576 Complementary non-volatile memory cell
09/07/2004US6788574 Electrically-alterable non-volatile memory cell
09/07/2004US6788573 Non-volatile semiconductor memory and method of operating the same
09/07/2004US6788571 Thin film magnetic memory device having an access element shared by a plurality of memory cells
09/07/2004US6788570 Magnetic random access memory
09/07/2004US6788569 Thin film magnetic memory device reducing a charging time of a data line in a data read operation
09/07/2004US6788568 Thin film magnetic memory device capable of conducting stable data read and write operations
09/07/2004US6788565 Semiconductor memory device
09/07/2004US6788564 Ferroelectric storage apparatus, driving method therefor, and driving circuit therefor
09/07/2004US6788562 Semiconductor memory device and write/readout controlling method error correction code decoding device
09/07/2004US6788561 Semiconductor integrated circuit device with reduced coupling noise
09/07/2004US6788552 Method and apparatus for reducing substrate bias voltage drop
09/07/2004US6788545 Composite electronic component and method of producing same
09/07/2004US6788522 Multi-layered unit including electrode and dielectric layer
09/07/2004US6788521 Capacitor and method for fabricating the same
09/07/2004US6788471 Projection exposure apparatus for microlithography
09/07/2004US6788465 Littrow grating and use of a littrow grating
09/07/2004US6788400 Method and apparatus for detecting aberrations in an optical system
09/07/2004US6788393 Stage unit and exposure apparatus
09/07/2004US6788392 Exposure apparatus, device manufacturing method, gas substituting apparatus, and gas substituting method
09/07/2004US6788391 Illumination device, exposure apparatus and exposure method
09/07/2004US6788390 Light receiving apparatus, mark detecting apparatus using light receiving apparatus, exposing apparatus, maintenance method of exposing apparatus, manufacturing method of semiconductor device using exposing apparatus and semiconductor manufacturing plant
09/07/2004US6788387 Lithographic objective having a first lens group including only lenses having a positive refractive power
09/07/2004US6788386 Lithographic apparatus and device manufacturing method
09/07/2004US6788385 Stage device, exposure apparatus and method
09/07/2004US6788376 Active matrix substrate, method for fabricating the substrate and liquid crystal display device
09/07/2004US6788357 Array substrate for a liquid crystal display and method for fabricating thereof
09/07/2004US6788355 Active matrix LCD panel
09/07/2004US6788130 Efficient charge pump capable of high voltage operation
09/07/2004US6788108 Semiconductor device
09/07/2004US6788107 Variable voltage tolerant input/output circuit
09/07/2004US6788105 Semiconductor integrated circuit
09/07/2004US6788090 Method and apparatus for inspecting semiconductor device
09/07/2004US6788085 Self-aligning wafer burn-in probe
09/07/2004US6788082 Probe card
09/07/2004US6788076 Apparatus for determining doping concentration of a semiconductor wafer
09/07/2004US6788074 System and method for using a capacitance measurement to monitor the manufacture of a semiconductor
09/07/2004US6788070 Fault tolerant semiconductor system
09/07/2004US6787930 Alignment marks and manufacturing method for the same
09/07/2004US6787929 Semiconductor device having a flat protective adhesive sheet
09/07/2004US6787928 Integrated circuit device having pads structure formed thereon and method for forming the same
09/07/2004US6787927 Plurality of bonding wires electrically connecting the bonding pads and the corresponding inner leads, each bonding wire has a plurality of bends electrically isolated from conductive parts on the chip
09/07/2004US6787926 Wire stitch bond on an integrated circuit bond pad and method of making the same
09/07/2004US6787925 Even if the volume of adhesive between the semiconductor device and the board is varied by the variation of temperature, an increase of the electrical contact resistance of the semiconductor device to the board can be prevented
09/07/2004US6787924 Semiconductor device capable of preventing solder balls from being removed in reinforcing pad
09/07/2004US6787923 Solder masks for use on carrier substrates, carrier substrates and semiconductor device assemblies including such solder masks
09/07/2004US6787922 Semiconductor chip—mounting board
09/07/2004US6787921 During the reflowing process, the carrier is supported by the solder balls having high-melting-temperature cores, so that the collapse level is controlled
09/07/2004US6787918 Substrate structure of flip chip package
09/07/2004US6787915 Rearrangement sheet, semiconductor device and method of manufacturing thereof
09/07/2004US6787914 Tungsten-based interconnect that utilizes thin titanium nitride layer