Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2005
03/03/2005US20050048707 Processing method for improving structure of a high voltage device
03/03/2005US20050048706 Method of manufacturing semiconductor device
03/03/2005US20050048705 Method for fabricating a nitrided silicon-oxide gate dielectric
03/03/2005US20050048704 Laser irradiation method and laser irradiation apparatus, and method for fabricating semiconductor device
03/03/2005US20050048703 Method to control device threshold of SOI MOSFET's
03/03/2005US20050048702 Local SONOS-type structure having two-piece gate and self-aligned ONO and method for manufacturing the same
03/03/2005US20050048701 Semiconductor device and manufacturing method for the same
03/03/2005US20050048700 No-flow underfill material having low coefficient of thermal expansion and good solder ball fluxing performance
03/03/2005US20050048699 Method and system for integrated circuit packaging
03/03/2005US20050048698 Semiconductor device, method for manufacturing the same, circuit board, and electronic apparatus
03/03/2005US20050048697 Self-assembled nanometer conductive bumps and method for fabricating
03/03/2005US20050048696 Microbeam assembly and associated method for integrated circuit interconnection to substrates
03/03/2005US20050048694 Dual gauge lead frame
03/03/2005US20050048693 Method of manufacturing wafer-level chip-size package and molding apparatus used in the method
03/03/2005US20050048692 Manufacturing method of solid-state image sensing device
03/03/2005US20050048691 High temperature attachment of organic molecules to substrates
03/03/2005US20050048690 Image sensor having micro-lens array separated with trench structures and method of making
03/03/2005US20050048686 Method of manufacturing GaN crystals and GaN crystal substrate, GaN crystals and GaN crystal susbstrate obtained by the method, and semiconductor device including the same
03/03/2005US20050048685 III-V nitride semiconductor substrate and its production method
03/03/2005US20050048684 Method of manufacturing semiconductor device
03/03/2005US20050048681 Light-emitting diode encapsulation material and manufacturing process
03/03/2005US20050048680 Printing one or more electrically conductive bonding lines to provide electrical conductivity in a circuit
03/03/2005US20050048678 Radiation damage reduction
03/03/2005US20050048677 The use of a layout-optimization tool to increase the yield and reliability of vlsi designs
03/03/2005US20050048676 Method for producing an electronic component, especially a memory chip
03/03/2005US20050048675 Method of etching magnetic material, magnetoresistive film and magnetic random access memory
03/03/2005US20050048674 Method and system for providing a magnetic element including passivation structures
03/03/2005US20050048659 Method of preparing analytical sample, method of analyzing substance on surface of semiconductor substrate, and apparatus for preparing analytical sample
03/03/2005US20050048421 Method and system for coating and developing
03/03/2005US20050048417 determining an optical characteristic of an antireflective coating;forming a resist feature above the coating by photolithography; andreducing a size of the feature by etching that is controlled on the basis of initial feature size, desired feature critical dimension, and the optical characteristic
03/03/2005US20050048414 Forming a photolithographic patterned nanoparticle film into integrated electronic circuits, chemical or gas sensor device, light emitting device; using water-soluble CaO mask
03/03/2005US20050048413 Pattern forming method, semiconductor device and method for manufacturing the same
03/03/2005US20050048410 Method of manufacturing a semiconductor device
03/03/2005US20050048407 Gate electrode wiring, transparent conducting electrode, and the first electrode of the storage capacity are formed while the first mask is processing. selective deposition of the first metal wiring, photo-resist lift-off
03/03/2005US20050048402 Positive resist composition and pattern formation method using the same
03/03/2005US20050048397 Composition and method for removing copper-compatible resist
03/03/2005US20050048395 Homopolymer or copolymer of polyhydroxystyrene changes its solubility in an alkali developer by action of an acid; generating an acid by exposure to radiation; bis((4-(1,3-dioxolan-2-yl)cyclohexyl)methylsulfonyl)diazomethane
03/03/2005US20050048383 Crystallization apparatus and crystallization method
03/03/2005US20050048382 Sequential lateral solidification (SLS) crystallization of amorphous silicon using a mask having striped light transmitting portions
03/03/2005US20050048381 Semiconductor device and method of forming the same as well as a photo-mask used therein
03/03/2005US20050048380 Dustproof protection film; low cost; uniformity; high light transmission; manufacturing liquid crystal display panels; pellicle film of multi-layer structure of fluorine-doped silica and fluorocarbon resin; high transmittance and high light stability against light of short wavelength
03/03/2005US20050048378 Reticle, apparatus for monitoring optical system, method for monitoring optical system, and method for manufacturing reticle
03/03/2005US20050048247 Process for making silicon wafers with stabilized oxygen precipitate nucleation centers
03/03/2005US20050048222 forming an amorphous carbon layers on substrates and depositing silicon dioxide from tetraethyl silicate by plasma enhanced chemical vapor deposition; antireflective layers
03/03/2005US20050048220 Lithographic apparatus and device manufacturing method
03/03/2005US20050048205 Method of producing thin film or powder array using liquid source misted chemical deposition process
03/03/2005US20050048204 Reacting tetrakis(ethylamino)silane, tris(ethylamino)silane, tris(isopropylamino)silane, ammonia, hydrazine, alkylhydrazine, azide, nitric oxide, nitrogen dioxide, nitrous oxide, oxygen, ozone, hydrogen peroxide, and/or water; oxidation, nitriding
03/03/2005US20050048153 Self-alignment stage for compression-forming machines
03/03/2005US20050047927 Process modules for transport polymerization of low epsilon thin films
03/03/2005US20050047767 Heat treatment apparatus of light-emission type and method of cleaning same
03/03/2005US20050047645 Method for interaction with status and control apparatus
03/03/2005US20050047543 Method and apparatus for personalization of semiconductor
03/03/2005US20050047495 Semiconductor integrated circuit device and method of testing the same
03/03/2005US20050047262 Magnetic film, multilayer magnetic film, method and mechanism of magnetization inversion of magnetic film, and magnetic random access memory
03/03/2005US20050047261 Nonvolatile semiconductor memory device having trench-type isolation region, and method of fabricating the same
03/03/2005US20050047252 Rare earth metal oxide memory element based on charge storage and method for manufacturing same
03/03/2005US20050047251 Methods of forming devices, constructions and systems comprising thyristors
03/03/2005US20050047248 Memory module
03/03/2005US20050047247 Semiconductor integrated circuit
03/03/2005US20050047240 Semiconductor memory device
03/03/2005US20050047227 Semiconductor device and ID generator configured as semiconductor device
03/03/2005US20050047223 Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states
03/03/2005US20050047210 Non-volatile semiconductor memory device
03/03/2005US20050047208 Non-volatile semiconductor memory device and method of actuating the same
03/03/2005US20050047206 Magnetic memory with write inhibit selection and the writing method for same
03/03/2005US20050047201 Method and system reading magnetic memory
03/03/2005US20050047199 Method and apparatus of coupling conductors in magnetic memory
03/03/2005US20050047197 Semiconductor memory device including 4TSRAMs
03/03/2005US20050047196 Loadless NMOS four transistor dynamic dual Vt SRAM cell
03/03/2005US20050047194 Non-volatile dynamic random access memory
03/03/2005US20050047190 FeRAM having test circuit and method for testing the same
03/03/2005US20050047101 Electronic part mounting substrate and method for producing same
03/03/2005US20050047057 Electrostatic chuck of semiconductor fabrication equipment and method for chucking wafer using the same
03/03/2005US20050047047 Protection circuit for semiconductor device and semiconductor device including the same
03/03/2005US20050047042 Semiconductor integrated circuit device having an ESD protection unit
03/03/2005US20050047029 Magnetoresistance effect film, magnetoresistance effect head and solid state memory
03/03/2005US20050046945 Diffractive optical element, illumination system comprising the same, and method of manufacturing semiconductor device using illumination system
03/03/2005US20050046846 Lithography alignment
03/03/2005US20050046845 System and method of measurement, system and method of alignment, lithographic apparatus and method
03/03/2005US20050046820 Bearing arrangement for reaction mass in a controlled environment
03/03/2005US20050046819 Maskless lithography systems and methods utilizing spatial light modulator arrays
03/03/2005US20050046815 Supporting structure of optical element, exposure apparatus having the same, and manufacturing method of semiconductor device
03/03/2005US20050046813 Lithographic apparatus and device manufacturing method
03/03/2005US20050046773 Device with upper conductive element, lower conductive element, and insulating element
03/03/2005US20050046762 Thin film transistor array substrate and manufacturing method thereof
03/03/2005US20050046664 Direct writeTM system
03/03/2005US20050046524 Substrate having microstrip line structure, semiconductor device having microstrip line structure, and manufacturing method of substrate having microstrip line structure
03/03/2005US20050046473 Semiconductor integrated circuit
03/03/2005US20050046463 On-chip temperature detection device
03/03/2005US20050046437 Apparatus for calibrating a probe station
03/03/2005US20050046435 Method and apparatus for evaluating and adjusting microwave integrated circuit
03/03/2005US20050046433 Integrated printed circuit board and test contactor for high speed semiconductor testing
03/03/2005US20050046326 Cathode with improved work function and method for making the same
03/03/2005US20050046123 Valve seal assembly
03/03/2005US20050046079 Method and system for integrated circuit packaging
03/03/2005US20050046048 Self-aligned buried contact pair and method of forming the same
03/03/2005US20050046046 Semiconductor package structure and method for manufacturing the same
03/03/2005US20050046043 Semiconductor device with staggered electrodes and increased wiring width
03/03/2005US20050046042 Dicing/die-bonding film, method of fixing chipped work and semiconductor device
03/03/2005US20050046038 Multi-dice chip scale semiconductor components
1 ... 3952 3953 3954 3955 3956 3957 3958 3959 3960 3961 3962 3963 3964 3965 3966 3967 3968 3969 3970 3971 3972 ... 6590