Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2006
06/14/2006CN2788509Y Ion source discharge current self-stabilization controller
06/14/2006CN2788450Y 偏转扫描放大器 Scanning deflection amplifiers
06/14/2006CN2788356Y MOS field effect transistor
06/14/2006CN2788352Y Wafer positioning device
06/14/2006CN2788351Y Target room warehouse nitrogen-inflating device
06/14/2006CN2788350Y 扩散器框架 Diffuser frame
06/14/2006CN2788348Y Scan deflexion device
06/14/2006CN2788346Y Parallel bundle measurement and parallel degree rectification control system
06/14/2006CN2788345Y Ion source outlet device capable of being adjusted in X direction
06/14/2006CN2788204Y Full-automatic capacitor tester dynamic electricity-transmitting device
06/14/2006CN2788197Y Needle grid array packaging test and aging examination socket
06/14/2006CN2787093Y Semi-conductor energy wafer bolster
06/14/2006CN1788356A Trench storage capacitor and method for fabricating it
06/14/2006CN1788355A Field effect transistor and display using same
06/14/2006CN1788354A Semiconductor device and its manufacturing method
06/14/2006CN1788352A Bit line structure and production method thereof
06/14/2006CN1788351A Integrated circuit arrangement comprising isolating trenches and a field effect transistor, and associated production method
06/14/2006CN1788350A Semiconductor device and method for manufacturing same
06/14/2006CN1788349A ESD protection device for semiconductor products
06/14/2006CN1788348A Via and trench structures for semiconductor substrates bonded to metallic substrates
06/14/2006CN1788347A Porous low-K dielectric interconnect structures
06/14/2006CN1788344A Method for fabrication of SiGe layer having small poly grains and related structure
06/14/2006CN1788343A Bit line structure and method for the production thereof
06/14/2006CN1788342A Stencil and method for depositing material onto a substrate
06/14/2006CN1788341A Method for recognizing work in die bonder and die bonder
06/14/2006CN1788340A System, method and apparatus for improved global dual-damascene planarization
06/14/2006CN1788339A Ultraviolet ray cleaning device and cleaning method
06/14/2006CN1788338A Method of processing substrate and substrate processing apparatus
06/14/2006CN1788337A Plating apparatus and plating method
06/14/2006CN1788336A Method of forming barrier film and method of forming electrode film
06/14/2006CN1788335A Silicon carbide semiconductor device and process for producing the same
06/14/2006CN1788334A Film forming apparatus
06/14/2006CN1788333A Exposure apparatus and device manufacturing method
06/14/2006CN1788332A Method and system to compensate for scanner system timing variability in a semiconductor wafer fabrication system
06/14/2006CN1788331A High power AlInGaN based multi-chip light emitting diode
06/14/2006CN1788330A Barrier layers for microelectromechanical systems
06/14/2006CN1788322A Aluminum alloy wiring material having high resistance to heat and target material
06/14/2006CN1788297A Active matrix panel inspection device, inspection method, and active matrix OLED panel manufacturing method
06/14/2006CN1788195A External view inspection method, master pattern used for the same, and external view inspection device having the master pattern
06/14/2006CN1788175A Methods and apparatus for sealing an opening of a processing chamber
06/14/2006CN1788108A Method for curing low dielectric constant film using direct current bias
06/14/2006CN1788106A Treating device using raw material gas and reactive gas
06/14/2006CN1788104A Thin film forming device and thin film forming method
06/14/2006CN1788070A Polishing fluid for metal and polishing Method
06/14/2006CN1788065A Adhesive resin composition and adhesive agent in film form, and semiconductor device using the same
06/14/2006CN1788062A Conductive adhesive compositions with electrical stability and good impact resistance for use in electronics devices
06/14/2006CN1787969A Filter cartridge for fluid for treating surface of electronic device substrate
06/14/2006CN1787966A Silica and silica-based slurry
06/14/2006CN1787954A Thin plate-supporting body
06/14/2006CN1787895A Improved chemical mechanical polishing compositions for copper and associated materials and method of using same
06/14/2006CN1787881A Ultra low k (ulk) SiCOH film and method
06/14/2006CN1787242A Method for packing inverted mounting LED chip
06/14/2006CN1787238A Laser grinding, capable tech. for GaN base LED chip of reducing GaN layer burn
06/14/2006CN1787236A Method for cutting of inverted mounting LED
06/14/2006CN1787235A Method for improving ohmic contact alloy of gallium nitrate based semiconductor LED
06/14/2006CN1787233A Method for preparing integrated solar energy battery
06/14/2006CN1787230A Semiconductor device including field-effect transistor
06/14/2006CN1787229A Crystal tube structure with high electronic shifting ratio of gallium nitrate base of double heterogenous structure and mfg. method thereof
06/14/2006CN1787226A Organic light emitting display with color filter layer
06/14/2006CN1787225A Improved parallel all colour organic electroluminescence display apparatus and mfg. method thereof
06/14/2006CN1787224A Memory cell mfg.method,memory cell and phase-change memory cell
06/14/2006CN1787223A Local interconnect structure and method for a cmos image sensor
06/14/2006CN1787222A Semiconductor structure and method for reducing and eliminating electric leakge
06/14/2006CN1787221A Solid-state imaging device and method for making the same
06/14/2006CN1787218A Nonvolatile memory device and method of manufacturing the same
06/14/2006CN1787217A Array substrate, display apparatus having the same and method for repairing the same
06/14/2006CN1787213A Image pickup module
06/14/2006CN1787212A Multi-level semiconductor module and method for fabricating the same
06/14/2006CN1787211A 半导体装置及其制造方法 Semiconductor device and manufacturing method thereof
06/14/2006CN1787207A Method for mfg. memory of one time coding program
06/14/2006CN1787206A Method for mfg. flash memory
06/14/2006CN1787205A Mfg. method capable of using automatic aligncing matellic silicate mask type read-only memory
06/14/2006CN1787204A Tech. for improving currect leakage and broken shallow slot isolation structure
06/14/2006CN1787203A Method for forming shallow slot isolation assembly with composite type lining
06/14/2006CN1787202A Method for determining chemical mechanical milling tech. window in shallow slot isolation tech.
06/14/2006CN1787201A Apparatus for automatically distinguishing and aligning wafer of wafer cutter and method thereof
06/14/2006CN1787200A Method for controlling pre-aligning of silicon wafer
06/14/2006CN1787199A Transfer device of handler for testing semiconductor device
06/14/2006CN1787198A Chip flame storage box
06/14/2006CN1787197A Substrate processing apparatus and substrate transfer method therefor
06/14/2006CN1787196A Method for real-time measuring of milling eliminating rate
06/14/2006CN1787195A Photocurable-resin application method and bonding method
06/14/2006CN1787194A Method for mfg. large power MOS tube with small wire wide slot type structure
06/14/2006CN1787193A Method for mfg. electrostatic preventing structure of deep slot type power MOS tube
06/14/2006CN1787192A Method for reducing injecting hot carrier of I/O NMOS device
06/14/2006CN1787191A Method for improving doped profile of light doped sourse/drain electrode
06/14/2006CN1787190A Method for exactly controlling width of aluminium wire
06/14/2006CN1787189A Method for precessing metallic surface in double inserting tech.
06/14/2006CN1787188A Method for mfg. metal silicified layer
06/14/2006CN1787187A Semiconductor device fabrication method
06/14/2006CN1787186A Semiconductor device fabrication method
06/14/2006CN1787185A Semiconductor making process and inner layer dielectric layer mfg. method
06/14/2006CN1787184A Method for optimizing integration of automatic aligning silicifying alloy barrier
06/14/2006CN1787183A Plasma etching method
06/14/2006CN1787182A Method for reducing sediment of reacting chamber
06/14/2006CN1787181A Method for processing chip capable of improving semiconductor chip geometric parameter
06/14/2006CN1787180A Method for increasing grid micro image ability by multi crystal silicon chemical mechanical milling method
06/14/2006CN1787179A Method for enhancing using efficiency of CMP equipment
06/14/2006CN1787178A Method for cleaning gallium arsenide crystal chip
06/14/2006CN1787177A Semiconductor device and method for fabricating the same