Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/2008
11/05/2008CN100431125C Ic芯片安装方法 Ic chip mounting method
11/05/2008CN100431124C Wire bond pads and its producing method
11/05/2008CN100431123C Method for restoring integrated circuit chip and printed steel plate private for the same
11/05/2008CN100431122C Method for producing connection member
11/05/2008CN100431121C Silicone adhesive agent
11/05/2008CN100431120C Interconnect substrate, semiconductor device, methods of manufacturing the same, circuit board, and electronic equipment
11/05/2008CN100431119C Manufacturing method of lead frame
11/05/2008CN100431118C Three-mask method of constructing the final hard mask used for etching the silicon fins for FINFET
11/05/2008CN100431117C Semiconductor device comprising extensions produced from material with a low melting point
11/05/2008CN100431116C Method for fabricating metal-oxide-semiconductor transistors
11/05/2008CN100431115C Method for making high voltage MOS transistor by ion implantation
11/05/2008CN100431114C Method for fabricating a self-aligned bipolar transistor having increased manufacturabily and related structure
11/05/2008CN100431113C Etching liquid recovering system and method
11/05/2008CN100431112C Method for fabricating silicate metal
11/05/2008CN100431111C Method for fabricating ultra-high tensile-stressed film and strained-silicon transistors thereof
11/05/2008CN100431110C Low-dielectric silicon nitride film and method of making the same, seimiconductor device and fabrication process thereof
11/05/2008CN100431109C Method for producing grid oxide layer
11/05/2008CN100431108C Marking method and marking apparatus
11/05/2008CN100431107C Wafer processing method
11/05/2008CN100431106C Method for forming interconnected electroplating lead wire of nano-carbon tube and metal composite material
11/05/2008CN100431105C Self-aligning metal silicide technology
11/05/2008CN100431104C Method for forming floating gate electrode in flush memory device
11/05/2008CN100431103C High-K dielectric film, method for forming it, and related semiconductor device
11/05/2008CN100431102C Vacuum deposition apparatus and method and solar cell material
11/05/2008CN100431101C Light auxiliary MBE system, and method for developing ZnO monocrystal film
11/05/2008CN100431100C Method for forming polycrystalline silicon film
11/05/2008CN100431099C Method for directly preparing Cr-Si silicide resistance film on surface of monocrystalline silicon substrate
11/05/2008CN100431098C Metal-insulator-metal capacitor and interconnecting structure
11/05/2008CN100431097C Top electrode, plasma processing device and method
11/05/2008CN100431096C Method for processing semiconductor chip
11/05/2008CN100431095C Manufacturing method for semiconductor device
11/05/2008CN100431094C Manufacturing method for semiconductor device
11/05/2008CN100431093C Space-efficient package for laterally conducting device
11/05/2008CN100431092C Apparatus and method for depositing and planarizing thin films of semiconductor wafers
11/05/2008CN100431087C Plasma implantation system and method with target movement
11/05/2008CN100431086C Capacitively coupled plasma reactor with magnetic plasma control
11/05/2008CN100431066C Thin film capacity element-use composition, high-permittivity insulation film, thin film capacity element and thin film multilayer capacitor
11/05/2008CN100431051C Method for configuring parameter in NOR FLASH
11/05/2008CN100431050C Erasable and programmable non-volatile cell
11/05/2008CN100431049C Semiconductor memory device
11/05/2008CN100431046C Memory device
11/05/2008CN100431043C Magnetic memory with write inhibit selection and the writing method for same
11/05/2008CN100431042C Semiconductor device and data writing method therefor
11/05/2008CN100431041C Film magnetic storage of storage unit containing tunnel magnetoresistive element
11/05/2008CN100431040C Memory circuit with memory elements overlying driver cells
11/05/2008CN100430829C Method of forming optical images
11/05/2008CN100430828C Composition having permitivity being radiation-sensitively changeable and method for forming permitivity pattern
11/05/2008CN100430809C Liquid crystal display device and its manufacturing method
11/05/2008CN100430805C Thin-film transistor array panel
11/05/2008CN100430745C Delay time measuring device and method
11/05/2008CN100430735C Test probe alignment apparatus
11/05/2008CN100430734C Combined probe for integrated circuit test
11/05/2008CN100430716C Method and apparatus for characterization of microelectronic feature quality
11/05/2008CN100430531C Czochralski pullers
11/05/2008CN100430526C Electropolishing and/or electroplating apparatus and methods
11/05/2008CN100430451C Sprayable adhesive material for laser marking semiconductor wafers, dies and devices
11/05/2008CN100430432C Silicon-containing polymer, process for rpoducing the same, heat-resistant resin composition, and heat-resistant film
11/05/2008CN100430152C Processing apparatus for basal plate transmission
11/04/2008US7447959 Semiconductor integrated circuit and a method of testing the same
11/04/2008US7447559 Apparatus and method of forming a photoresist pattern, and repair nozzle
11/04/2008US7447289 Signal timing adjustment device, signal timing adjustment system, signal timing adjustment amount setting program, and storage medium storing the program
11/04/2008US7447273 Redundancy structure and method for high-speed serial link
11/04/2008US7447091 Sense amplifier for semiconductor memory device
11/04/2008US7446889 Method of evaluating film thickness, method of detecting polishing terminal, and device-manufacturing apparatus
11/04/2008US7446873 Reflective alignment grating
11/04/2008US7446872 Positioning apparatus and positioning method using the same
11/04/2008US7446868 Micro defects in semi-conductors
11/04/2008US7446866 Apparatus and method for inspecting pattern
11/04/2008US7446857 Image forming method and apparatus
11/04/2008US7446852 Projection exposure mask acceptance decision system, projection exposure mask acceptance decision method, method for manufacturing semiconductor device, and computer program project
11/04/2008US7446843 Display device and method of fabricating the same
11/04/2008US7446833 In-plane switching mode active matrix type liquid crystal display device and method of fabricating the same
11/04/2008US7446742 Light emitting device
11/04/2008US7446639 Micro power converter and method of manufacturing same
11/04/2008US7446575 Capacitor charging methods and apparatuses that use a secure parallel monitoring circuit
11/04/2008US7446562 Programmable semiconductor device
11/04/2008US7446556 Multiple testing bars for testing liquid crystal display and method thereof
11/04/2008US7446546 Method and system of trace pull test
11/04/2008US7446544 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
11/04/2008US7446423 Semiconductor device and method for assembling the same
11/04/2008US7446421 Bonding structure with buffer layer and method of forming the same
11/04/2008US7446418 Semiconductor device for preventing defective filling of interconnection and cracking of insulating film
11/04/2008US7446417 Semiconductor integrated circuit device and fabrication method thereof
11/04/2008US7446416 Barrier material formation in integrated circuit structures
11/04/2008US7446410 Circuit module with thermal casing systems
11/04/2008US7446407 Chip package structure
11/04/2008US7446399 Pad structures to improve board-level reliability of solder-on-pad BGA structures
11/04/2008US7446396 Stacked integrated circuit leadframe package system
11/04/2008US7446394 Semiconductor device fabricated by selective epitaxial growth method
11/04/2008US7446392 Electronic device and method for manufacturing the same
11/04/2008US7446391 Electro-resistance element and method of manufacturing the same
11/04/2008US7446390 Semiconductor device
11/04/2008US7446389 Semiconductor die package with internal bypass capacitors
11/04/2008US7446388 Integrated thin film capacitor/inductor/interconnect system and method
11/04/2008US7446379 Transistor with dopant-bearing metal in source and drain
11/04/2008US7446377 Transistors and manufacturing methods thereof
11/04/2008US7446376 IGBT cathode design with improved safe operating area capability
11/04/2008US7446368 Deposition of metal oxide and/or low asymmetrical tunnel barrier interpoly insulators
11/04/2008US7446364 Semiconductor memory device including multi-layer gate structure
11/04/2008US7446363 Capacitor including a percentage of amorphous dielectric material and a percentage of crystalline dielectric material
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