Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2010
02/02/2010US7655504 Semiconductor device and method of manufacturing the same
02/02/2010US7655503 Method for fabricating semiconductor package with stacked chips
02/02/2010US7655502 Method of packaging a semiconductor device and a prefabricated connector
02/02/2010US7655501 Wafer level package with good CTE performance
02/02/2010US7655500 Packaged microelectronic devices and methods for packaging microelectronic devices
02/02/2010US7655499 Forming method of contact hole and manufacturing method of semiconductor device, liquid crystal display device and EL display device
02/02/2010US7655497 Use of group VI-based alloys, including mixtures of tellurium, selenium and sulfur with indium, germanium, antimony, gallium and/or tin, for growth of high-purity alloy nanostructures such as nanodots, nanowires and nanorods, in large quantity
02/02/2010US7655496 Metal lift-off systems and methods using liquid solvent and frozen gas
02/02/2010US7655495 Damascene copper wiring optical image sensor
02/02/2010US7655494 Trench photosensor for a CMOS imager
02/02/2010US7655493 Multi spectral sensor
02/02/2010US7655491 P-type Group III nitride semiconductor and production method thereof
02/02/2010US7655490 Manufacturing method for semiconductor device, semiconductor device and semiconductor wafer
02/02/2010US7655489 Monolithically-pumped erbium-doped waveguide amplifiers and lasers
02/02/2010US7655488 Method for fabricating a plurality of electromagnetic radiation emitting semiconductor chips
02/02/2010US7655487 White light emitting diode (WLED) and packing method thereof
02/02/2010US7655486 Method of making light emitting device with multilayer silicon-containing encapsulant
02/02/2010US7655485 Semiconductor layer formed by selective deposition and method for depositing semiconductor layer
02/02/2010US7655484 Nitride-based semiconductor device and method of fabricating the same
02/02/2010US7655483 Electronic device and manufacturing method thereof
02/02/2010US7655482 Chemical mechanical polishing test structures and methods for inspecting the same
02/02/2010US7655481 Method for manufacturing industrial products and combination of masks for manufacturing the same
02/02/2010US7655390 Has interface structure between negative dielectrics and dielectric; is provided with configuration in which plasmon intensity with respect to microstructure in surface or in vicinity thereof is detected by interface structure and positional relationship between interface and microstructure is detected
02/02/2010US7655389 Includes 0.5-5 percent by weight acid-labile thermal cross-linking agent that is decomposed by an epoxy group and photo-acid generator,10-22 percent by weight copolymer resin that includes acrylate or methacrylate monomer containing anthracene, 0.1-1 percent photo-acid generator
02/02/2010US7655385 Pattern formation method
02/02/2010US7655377 Antireflection film and exposure method
02/02/2010US7655369 Reticle set, method for designing a reticle set, exposure monitoring method, inspection method for reticle set and manufacturing method for a semiconductor device
02/02/2010US7655368 Method for exposing a substrate and lithographic projection apparatus
02/02/2010US7655362 Masks of semiconductor devices and methods of forming mask patterns
02/02/2010US7655315 SOI substrate, silicon substrate therefor and it's manufacturing method
02/02/2010US7655282 Method of forming patterned film
02/02/2010US7655197 III-V nitride substrate boule and method of making and using the same
02/02/2010US7655170 Adjustable shims and washers
02/02/2010US7655152 Etching
02/02/2010US7655118 Electrolytic processing apparatus and method
02/02/2010US7655111 Plasma processing apparatus and plasma processing method
02/02/2010US7655110 Plasma processing apparatus
02/02/2010US7655107 Method for establishing anisotropic conductive connection and anisotropic conductive adhesive film
02/02/2010US7655099 Metal silicon oxynitride multilayer; concurrent sputtering
02/02/2010US7655095 Method of cleaning semiconductor surfaces
02/02/2010US7655093 Wafer support system
02/02/2010US7655092 Tandem process chamber
02/02/2010US7655090 Method of controlling stress in gallium nitride films deposited on substrates
02/02/2010US7654887 Vacuum chuck and suction board
02/02/2010US7654885 Multi-layer polishing pad
02/02/2010US7654883 Polishing apparatus, polishing head and polishing method
02/02/2010US7654596 Endeffectors for handling semiconductor wafers
02/02/2010US7654392 Carrier tape containing good therein, and container using the carrier tape
02/02/2010US7654291 Purging apparatus and purging method
02/02/2010US7654224 Method and apparatus for cleaning a CVD chamber
02/02/2010US7654221 Apparatus for electroless deposition of metals onto semiconductor substrates
02/02/2010US7654207 XY stage
02/02/2010US7654035 Device for the creation of containment barriers for cold air in atmospheric conditions corresponding to radiation frosts
02/02/2010CA2545928C Composition for thermal insulating layer
02/02/2010CA2505315C Multi-layer circuit assembly and process for preparing the same
02/02/2010CA2407364C Bipolar transistor
02/02/2010CA2302794C Automatic calibration system for wafer transfer robot
01/2010
01/28/2010WO2010011842A2 Bonded intermediate substrate and method of making same
01/28/2010WO2010011713A1 Reinforced composite stamp for dry transfer printing of semiconductor elements
01/28/2010WO2010011711A2 Ion implantation with heavy halogenide compounds
01/28/2010WO2010011578A2 Computer-implemented methods for inspecting and/or classifying a wafer
01/28/2010WO2010011560A2 Improved metrology through use of feed forward feed sideways and measurement cell re-use
01/28/2010WO2010011521A2 Workpiece support for a plasma reactor with controlled apportionment of rf power to a process kit ring
01/28/2010WO2010011487A2 Junction field effect transistor using a silicon on insulator architecture
01/28/2010WO2010011476A2 Deposition methods and releasing stress buildup
01/28/2010WO2010011387A1 Test design optimizer for configurable scan architectures
01/28/2010WO2010011293A1 Metal oxide semiconductor devices having implanted carbon diffusion retardation layers and methods for fabricating the same
01/28/2010WO2010011287A1 Method of forming finned semiconductor devices with trench isolation
01/28/2010WO2010011183A1 Method and system for removing contaminants
01/28/2010WO2010011177A1 A substrate arrangement and a method of manufacturing a substrate arrangement
01/28/2010WO2010011167A1 Transport packag
01/28/2010WO2010011114A2 Apparatus for forming ceramic coating film
01/28/2010WO2010011036A2 Photonic crystal device produced by a wet process, and a production method thereof
01/28/2010WO2010011013A1 Multi-workpiece processing chamber and workpiece processing system including the same
01/28/2010WO2010010972A1 A method of growing a thin film, a method of forming a structure and a device.
01/28/2010WO2010010944A1 Complementary logical gate device
01/28/2010WO2010010928A1 Coating composition and pattern-forming method
01/28/2010WO2010010907A1 Chip quality determination method and marking mechanism using same
01/28/2010WO2010010899A1 Positive-type photosensitive resin composition and cured film production method using the same
01/28/2010WO2010010865A1 Semiconductor device
01/28/2010WO2010010851A1 Base, method for forming conductive pattern, and organic thin film transistor
01/28/2010WO2010010847A1 Active matrix substrate, display panel, display device, and active matrix substrate manufacturing method
01/28/2010WO2010010802A1 P-CHANNEL THIN-FILM TRANSISTOR AND PROCESS FOR PRODUCING THE p-CHANNEL THIN-FILM TRANSISTOR
01/28/2010WO2010010792A1 Method for forming conductive pattern and organic thin film transistor
01/28/2010WO2010010791A1 Organic transistor and method for manufacturing the same
01/28/2010WO2010010766A1 Field effect transistor and circuit device
01/28/2010WO2010010743A1 Electronic circuit device, method for manufacturing the same, and display device
01/28/2010WO2010010706A1 Resist trimming method and trimming apparatus
01/28/2010WO2010010688A1 Action monitoring system for treating device
01/28/2010WO2010010668A1 Semiconductor device and manufacturing method therefor
01/28/2010WO2010010656A1 Work cutting method and wire saw
01/28/2010WO2010010638A1 Method of regenerating phosphoric acid-containing treatment liquid
01/28/2010WO2010010609A1 Method for forming contact hole, and circuit board
01/28/2010WO2010010482A2 Integrated circuit
01/28/2010WO2010010224A1 System for aligning patterns on a substrate using stencil lithography
01/28/2010WO2010010195A2 Stressed semiconductor substrate and related production method
01/28/2010WO2010010176A1 Process for microstructuring a diamond film
01/28/2010WO2010009948A1 Laser interferometer systems and methods with suppressed error and pattern generators having the same
01/28/2010WO2010009865A1 Device and method for processing and handling process products
01/28/2010WO2010009553A1 Under bump metallization for on-die capacitor