Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2010
04/08/2010DE102008047337A1 Verfahren zur Prüfung eines Testsubstrats in einem Prober unter definierten thermischen Bedingungen A method for testing of a test substrate in a Prober under defined thermal conditions
04/08/2010DE102008037419A1 Vorrichtung und Verfahren zur Bestimmung der Position eines scheibenförmigen Objekts Apparatus and method for determining the position of a disc-shaped object
04/08/2010DE102008035811B3 Feldeffekt-Transistor mit einem verformten Kanalgebiet, das durch eine Wasserstoff induzierte Gitterdeformation hervorgerufen wird und Verfahren zum Einbringen des Wasserstoffes Field effect transistor having a strained channel region, which is caused by hydrogen-induced lattice deformation and methods of incorporation of the hydrogen
04/08/2010DE102007056590B4 Halbleiterbauelement mit einer nichtflüchtigen Speicherfunktion und Verfahren zu seiner Herstellung A semiconductor device having a nonvolatile memory function, and process for its preparation
04/08/2010DE102007052167B4 Halbleiterbauelement und Verfahren zum Einstellen der Höhe einer Gateelektrode in dem Halbleiterbauelement A semiconductor device and method for adjusting the height of a gate electrode in the semiconductor device
04/08/2010DE102007052050B4 Halbleiterbauelement und Verfahren zum Erhöhen der Ätzselektivität während der Strukturierung einer Kontaktstruktur des Halbleiterbauelements A semiconductor device and method for increasing the etch selectivity during the patterning of a contact structure of the semiconductor component
04/08/2010DE102007020260B4 Verfahren zum Verbessern der Transistoreigenschaften von Feldeffekttransistoren durch eine späte tiefe Implantation in Verbindung mit einem diffusionsfreien Ausheizprozess A method for improving the transistor characteristics of field-effect transistors by a late deep implantation in combination with a diffusion anneal free
04/08/2010DE102006062029B4 Verfahren zum Herstellen einer Halbleitervorrichtung A method of manufacturing a semiconductor device
04/08/2010DE102006058814B4 Bearbeitungsvorrichtungen Processing devices
04/08/2010DE102006056620B4 Halbleiterstruktur und Verfahren zu ihrer Herstellung Semiconductor structure and process for their preparation
04/08/2010DE102006042617B4 Verfahren zur Erzeugung von lokalen Kontakten A process for the production of local contacts
04/08/2010DE102006030257B4 Teststruktur zum Bestimmen der Eigenschaften von Halbleiterlegierungen in SOI-Transistoren mittels Röntgenbeugung Test structure for determining the properties of semiconductor alloys in SOI-transistors by means of X-ray diffraction
04/08/2010DE102006022093B4 Verfahren und Vorrichtung zur Behandlung einer Halbleiterscheibe durch Ätzen Method and apparatus for treating a semiconductor wafer by etching,
04/08/2010DE102005017642B4 Verfahren zur Inspektion eines Wafers Method for inspecting a wafer
04/08/2010DE102005017632B4 Verfahren zur Modifikation der Oberfläche einer Probe mittels eines gepulsten Ionenstrahls oder mittels eines ionenstrahlgenerierten Teilchenstrahls mit homogen oder gaußförmig verteilter Stromdichte A method of modifying the surface of a sample by means of a pulsed ion beam or ion beam generated by a particle beam with homogeneously distributed, or Gaussian current density
04/08/2010DE102004059453B4 Halbleitervorrichtung Semiconductor device
04/08/2010DE102004040484B4 Auswählen eines Schreibstroms einer magnetischen Speicherzelle Selecting a write current to a magnetic memory cell
04/08/2010DE102004035788B4 Verfahren zum Herstellen eines Isolierschicht-Bipolartransistors mit eingebauter Freilaufdiode A method of manufacturing an insulated gate bipolar transistor with a built-freewheeling diode
04/08/2010DE102004022355B4 Halbleiterbaustein mit bidirektionalem Eingabe-/Ausgabeanschluss und zugehöriges Verfahren zum Ein- und Ausgeben von Daten Semiconductor device with bidirectional input / output port and associated method for inputting and outputting data
04/08/2010DE10162074B4 BiCMOS-Struktur, Verfahren zu ihrer Herstellung und Bipolartransistor für eine BiCMOS-Struktur BiCMOS structure, processes for their preparation and bipolar transistor for a BiCMOS structure
04/08/2010DE10103061B4 Verfahren zur Inspektion der Tiefe einer Öffnung in einer dielektrischen Materialschicht A method for inspection of the depth of an opening in a dielectric material layer
04/08/2010DE10065454B4 Verfahren zur Herstellung eines Aluminiumoxidfilms zur Verwendung in einem Halbleitergerät A process for producing an aluminum oxide film for use in a semiconductor device
04/08/2010CA2739410A1 Silicon carbide semiconductor device
04/08/2010CA2739239A1 Wafer bonding device and wafer bonding method
04/07/2010WO2011040012A1 Tunnel field effect transistor and method for manufacturing same
04/07/2010EP2172977A1 Display device
04/07/2010EP2172968A1 Testing apparatus
04/07/2010EP2172967A1 Method for manufacturing silicon carbide
04/07/2010EP2172966A1 Optical characteristic measuring method, optical characteristic adjusting method, exposing device, exposing method, and exposing device manufacturing method
04/07/2010EP2172965A1 Optical characteristic measurement method, optical characteristic adjusting method, exposure device, exposure method, and exposure device manufacturing method
04/07/2010EP2172964A2 Capacitor, semiconductor memory device, and method for manufacturing the same
04/07/2010EP2172963A1 Method for measuring rotation angle of bonded wafer
04/07/2010EP2172757A1 Method and device for recording physical parameters
04/07/2010EP2172304A1 Polishing apparatus
04/07/2010EP2171845A2 Method for forming an acoustic mirror with reduced metal layer roughness and related structure
04/07/2010EP2171757A2 Normally-off integrated jfet power switches in wide bandgap semiconductors and methods of making
04/07/2010EP2171753A1 Inhibition of copper dissolution for lead-free soldering
04/07/2010EP2171752A2 Method for coating two elements hybridized by means of a soldering material
04/07/2010EP2171750A1 Method for etching a layer of a silicon semiconductor substrate
04/07/2010EP2171749A1 Transistor with differently doped strained current electrode region
04/07/2010EP2171748A1 Epitaxial methods and templates grown by the methods
04/07/2010EP2171747A1 Methods for producing improved epitaxial materials
04/07/2010EP2171746A2 Method of manufacturing crystalline semiconductor thin film
04/07/2010EP2171745A2 Structures of and methods for forming vertically aligned si wire arrays
04/07/2010EP2171744A1 Apparatus and method for wet treatment of disc-like articles
04/07/2010EP2171538A1 A method of making a secondary imprint on an imprinted polymer
04/07/2010EP2170778A1 Method for removing foreign matter from glass substrate surface and method for processing glass substrate surface
04/07/2010EP2170764A2 Methods of making hierarchical articles
04/07/2010EP1897130B1 Transistor with improved tip profile and method of manufacture thereof
04/07/2010EP1865090B1 Deep-pot-shaped copper sputtering target
04/07/2010EP1774571B1 In-line heater for use in semiconductor wet chemical processing and method of manufacturing the same
04/07/2010EP1438753B1 Thin film transistor device and method of manufacturing same
04/07/2010CN201436682U Chip package with inductance element
04/07/2010CN201436680U Detachable electrostatic chuck with seal assembly
04/07/2010CN201436147U Wafer grinding and cutting protection structure
04/07/2010CN1977368B Soldering method, solder pellet for die bonding, method for manufacturing solder pellet for die bonding and electronic component
04/07/2010CN1956221B Transistor with medium stress generation region and manufacturing method thereof
04/07/2010CN1937217B Packaging structure and its packaging method
04/07/2010CN1918698B Cleaning liquid for substrate for semiconductor device and cleaning method
04/07/2010CN1848365B Method of manufacturing polysilicon thin film and method of manufacturing thin film transistor having the same
04/07/2010CN1835242B Liquid crystal display device using thin-film transistor and method for manufacturing the same
04/07/2010CN1825593B Semiconductor device
04/07/2010CN1794089B Lithographic apparatus with two-dimensional alignment measurement arrangement and two-dimensional alignment measurement method
04/07/2010CN1793999B 半导体集成电路 The semiconductor integrated circuit
04/07/2010CN1706566B Ultraviolet cleaner
04/07/2010CN1617034B 液晶显示器 LCD Monitor
04/07/2010CN1573453B Display device and manufacturing method of the same
04/07/2010CN1557024B Insulting gate Al Ga nitride/GaN HEMT
04/07/2010CN1514306B Manufacturing method of photoetching equipment and device, and device obtained therefrom
04/07/2010CN101692475A Combined encapsulating method for non-square LED chip
04/07/2010CN101692463A Capacitor structure of mixed nano-crystal memory and preparation method thereof
04/07/2010CN101692461A Nanometer electronic device based on semiconductor nano materials and preparation method thereof
04/07/2010CN101692460A High dielectric constant membrane material with continuously adjustable forbidden bandwidth and preparation method thereof
04/07/2010CN101692459A Novel perovskite manganese-based oxide film material and preparation method thereof
04/07/2010CN101692455A SOI-based capacitor
04/07/2010CN101692454A High pressure P-shaped metal oxide semiconductor tube of silicon-on-insulator
04/07/2010CN101692450A HIMOS FLASH memory unit structure and manufacturing method thereof
04/07/2010CN101692449A Method for parallel measurement of hot carrier injection effect
04/07/2010CN101692448A Multi-chip LED centralized-encapsulated radiating structure and encapsulation technology thereof
04/07/2010CN101692446A Organic electro-stimulation luminous element encapsulation and encapsulating method thereof
04/07/2010CN101692442A Multilayer ceramic substrate, electronic component, and method of manufacturing multilayer ceramic substrate
04/07/2010CN101692441A Packaging structure of printed circuit board
04/07/2010CN101692440A Mixed crystal orientation strain silicon substrate and method for preparing same
04/07/2010CN101692439A Manufacturing method for a plurality of groups of substrates of thin-film transistor
04/07/2010CN101692438A Monolithic integrated manufacturing method for indium phosphide-based resonant tunneling diodes and high-electron-mobility transistors
04/07/2010CN101692437A Method for selectively depositing diffusion barrier for copper interconnection
04/07/2010CN101692436A Method for preparing mixed crystal orientation strain silicon substrate with insulated buried layer
04/07/2010CN101692435A Etching and filling method of deep groove isolation structure of silicon-on-insulator
04/07/2010CN101692434A Filling method of deep groove isolation structure of silicon-on-insulator
04/07/2010CN101692433A Plasma etching machine and ejector pin thereof
04/07/2010CN101692432A Combined push rod mechanism
04/07/2010CN101692431A 翻转装置 Flip device
04/07/2010CN101692430A Method for detecting random defects of silicon gate of CMOS process
04/07/2010CN101692429A Solder precoating method
04/07/2010CN101692428A Integrating method of hybrid integrated circuit with controllable working temperature
04/07/2010CN101692427A Method of producing large gate width silicon carbide metal semiconductor filed-effect transistor (SiC MESFET) with intercellular balance resistors
04/07/2010CN101692426A Method for preparing vertical double-diffusion MOS transistor
04/07/2010CN101692425A Novel design method for ESD protection
04/07/2010CN101692424A Vertical bipolar transistor and method for manufacturing same
04/07/2010CN101692423A 等离子体蚀刻方法 The plasma etching method