| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/25/2009 | CN201199261Y Circular cone connection experiment fixture for single-bearing generator |
| 02/25/2009 | CN201199260Y Test-bed for generator |
| 02/25/2009 | CN201199259Y Automatic tester for solar panel |
| 02/25/2009 | CN201199258Y LED lamp decoration tester |
| 02/25/2009 | CN201199257Y High-voltage impulse tester |
| 02/25/2009 | CN201199256Y Electrolytic capacitor high-frequency great current tester |
| 02/25/2009 | CN201199255Y System for monitoring power utilization status of equipment within machine cabinet |
| 02/25/2009 | CN201199254Y High voltage safe measuring system capable of preventing counterpunch voltage |
| 02/25/2009 | CN201199247Y Density changeover mechanism for PCB tester |
| 02/25/2009 | CN201199246Y Density changeover mechanism for PCB tester |
| 02/25/2009 | CN101375172A Test tray for test sorter |
| 02/25/2009 | CN101375171A System and method for multihop packet forwarding |
| 02/25/2009 | CN101373727A Method and apparatus for adjusting pitch of buffer tray in test sorter |
| 02/25/2009 | CN101373726A Method and apparatus for transferring semiconductor devices in test sorter |
| 02/25/2009 | CN101373508A Test device and method suitable for electronic label |
| 02/25/2009 | CN101373435A Processing system capable of downloading firmware and being tested and processing method thereof |
| 02/25/2009 | CN101373208A Fuel cell tester |
| 02/25/2009 | CN101373207A Method for detecting off-line type three-phase ac motor malfunction |
| 02/25/2009 | CN101373206A Test component |
| 02/25/2009 | CN101373205A Returning ring test structure of IC chip interface module |
| 02/25/2009 | CN101373204A A contact insert for a microcircuit test socket |
| 02/25/2009 | CN101373203A Speed testing structure of ring-shaped oscillator |
| 02/25/2009 | CN101373202A Optical checking system |
| 02/25/2009 | CN101373201A Method for determining radiation safety margin examining frequency point |
| 02/25/2009 | CN101373200A Method for determining conduction safety margin examining frequency point |
| 02/25/2009 | CN101373199A Method of forming an ESD detector and structure thereof |
| 02/25/2009 | CN101373198A Cable test bus and switch matrix circuit |
| 02/25/2009 | CN101373196A Method and apparatus for measuring MgO exoelectron emission current |
| 02/25/2009 | CN101373194A Probe set |
| 02/25/2009 | CN101373193A Battery emulation apparatus |
| 02/25/2009 | CN100464464C 电池管理系统及其驱动方法 Battery management system and driving method |
| 02/25/2009 | CN100464384C Low voltage heavy current tank loop with arc-striking branch |
| 02/25/2009 | CN100464196C Single-phase plug type power supply detector |
| 02/25/2009 | CN100464195C Safety and precise fuel cell voltage monitoring apparatus |
| 02/25/2009 | CN100464194C Method for recognizing electrical system non-invasive induction motor dynamic parameter |
| 02/25/2009 | CN100464193C Chip testing system and method |
| 02/25/2009 | CN100464192C Method for detecting resetting chip for air conditioner |
| 02/24/2009 | US7496819 Custom logic BIST for memory controller |
| 02/24/2009 | US7496818 Apparatus and method for testing and debugging an integrated circuit |
| 02/24/2009 | US7496817 Method for determining integrity of memory |
| 02/24/2009 | US7496816 Isolating the location of defects in scan chains |
| 02/24/2009 | US7496815 Method and apparatus for automatic generation of system test libraries |
| 02/24/2009 | US7496814 Load testing of a telecommunication network |
| 02/24/2009 | US7496813 Communicating simultaneously a functional signal and a diagnostic signal for an integrated circuit using a shared pin |
| 02/24/2009 | US7496812 Apparatus and method for testing and debugging an integrated circuit |
| 02/24/2009 | US7496810 Semiconductor memory device and its data writing method |
| 02/24/2009 | US7496807 Data transmission apparatus and method |
| 02/24/2009 | US7496805 Write once type recording medium, recording device and recording method for write once type recording medium, and reproduction device and reproduction method for write once type recording medium |
| 02/24/2009 | US7496804 Communications system, receiver, and method of estimating received signal quality by using bit error rate |
| 02/24/2009 | US7496701 Managing virtual server control of computer support systems with heartbeat message |
| 02/24/2009 | US7496650 Identifying and suppressing transient routing updates |
| 02/24/2009 | US7496467 Automatic test equipment operating architecture |
| 02/24/2009 | US7496466 System for fault determinations for high frequency electronic circuits |
| 02/24/2009 | US7496459 Intelligent, self-propelled automatic grid crawler high impedance fault detector and high impedance fault detecting system |
| 02/24/2009 | US7496102 Broadband telecommunication service with personalized service capability for mobile terminals |
| 02/24/2009 | US7496051 Network topology configuring method and node |
| 02/24/2009 | US7496040 Roundtrip delay time measurement apparatus and method for variable bit rate multimedia data |
| 02/24/2009 | US7496033 Method for dynamically computing a switching schedule |
| 02/24/2009 | US7496030 Managing loops between network devices by monitoring MAC moves |
| 02/24/2009 | US7496029 System and method for reacting to miscabling defects in resilient packet ring networks |
| 02/24/2009 | US7495980 Electrical test circuit with active-load and output sampling capability |
| 02/24/2009 | US7495465 PVT variation detection and compensation circuit |
| 02/24/2009 | US7495464 Inspection device of a semiconductor device |
| 02/24/2009 | US7495463 System and method for transferring trays within a test handler |
| 02/24/2009 | US7495462 Method of wafer-level packaging using low-aspect ratio through-wafer holes |
| 02/24/2009 | US7495461 Wafer probe |
| 02/24/2009 | US7495460 Body for keeping a wafer, heater unit and wafer prober |
| 02/24/2009 | US7495459 Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probes |
| 02/24/2009 | US7495458 Probe card and temperature stabilizer for testing semiconductor devices |
| 02/24/2009 | US7495457 Semiconductor device evaluation method and apparatus using the same |
| 02/24/2009 | US7495453 Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit |
| 02/24/2009 | US7495452 Wire harness checker and wire harness checking method |
| 02/24/2009 | US7495451 Terminal leakage monitoring for field devices |
| 02/24/2009 | US7495450 Device and method for detecting anomolies in a wire and related sensing methods |
| 02/24/2009 | US7495449 Non-destructive testing apparatus and non-destructive testing method |
| 02/24/2009 | US7495448 Electro-chemical deterioration test method and apparatus |
| 02/24/2009 | US7494829 Identification of outlier semiconductor devices using data-driven statistical characterization |
| 02/24/2009 | US7494598 Miniature optically transparent window |
| 02/19/2009 | WO2009023727A2 Automated contact alignment tool |
| 02/19/2009 | WO2009023124A1 Methods and apparatus for ex situ seasoning of electronic device manufacturing process components |
| 02/19/2009 | WO2009022870A2 Apparatus for performing an electrical inspection |
| 02/19/2009 | WO2009022691A1 Test device |
| 02/19/2009 | WO2009022427A1 Acquisition device, test device, and manufacturing method |
| 02/19/2009 | WO2009022398A1 Multipole coaxial connector, performance board, and testing device |
| 02/19/2009 | WO2009022313A2 Integrated circuit with rf module, electronic device having such an ic and method for testing such a module |
| 02/19/2009 | WO2009022305A1 An integrated circuit having an analog circuit portion and a method for testing such an integrated circuit |
| 02/19/2009 | WO2009022276A2 Software-based verification of system-on-chip direct interconnect through additional registers |
| 02/19/2009 | WO2009022241A1 Battery short circuit monitoring |
| 02/19/2009 | WO2009022038A1 Apparatus for measuring chip leakage current and temperature |
| 02/19/2009 | WO2009006186A3 Multi-offset die head |
| 02/19/2009 | WO2008115298A3 System capability discovery for software defined radio |
| 02/19/2009 | US20090049353 Scheme to optimize scan chain ordering in designs |
| 02/19/2009 | US20090049352 Control apparatus and method for controlling measuring devices to test electronic apparatuses |
| 02/19/2009 | US20090048801 Method and apparatus for generating thermal test vectors |
| 02/19/2009 | US20090048796 Test apparatus |
| 02/19/2009 | US20090048793 State and parameter estimator having integral and differential components for electrical energy accumulators |
| 02/19/2009 | US20090046638 Wireless network system and method |
| 02/19/2009 | US20090046579 Lesser disruptive open shortest path first handling of bidirectional forwarding detection state changes |
| 02/19/2009 | US20090046577 Resuming an interrupted flow of data packets |
| 02/19/2009 | US20090046576 Forwarding data in a data communications network |