| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/04/2009 | CN100465649C A semiconductor device, a manufacturing method, a device forming substrate and a wiring connection testing method |
| 03/04/2009 | CN100465648C A debugging device of circuit boards and a method for debugging the circuit boards |
| 03/04/2009 | CN100465627C A scanning probe inspection apparatus |
| 03/03/2009 | US7500208 Non-destructive evaluation of microstructure and interface roughness of electrically conducting lines in semiconductor integrated circuits in deep sub-micron regime |
| 03/03/2009 | US7500165 Systems and methods for controlling clock signals during scan testing integrated circuits |
| 03/03/2009 | US7500164 Method for testing an integrated circuit device having elements with asynchronous clocks or dissimilar design methodologies |
| 03/03/2009 | US7500163 Method and apparatus for selectively compacting test responses |
| 03/03/2009 | US7500162 Sourcing internal signals to output pins of an integrated circuit through sequential multiplexing |
| 03/03/2009 | US7500161 Correcting test system calibration and transforming device measurements when using multiple test fixtures |
| 03/03/2009 | US7500160 System and method for testing a data storage device without revealing memory content |
| 03/03/2009 | US7500159 Data transmission apparatus and method |
| 03/03/2009 | US7500010 Adaptive file delivery system and method |
| 03/03/2009 | US7499831 Timing closure monitoring circuit and method |
| 03/03/2009 | US7499517 Shift register and shift register set using the same |
| 03/03/2009 | US7499398 Method and system for oversubscribing bandwidth in a communications network |
| 03/03/2009 | US7498831 Conduction-cooled accelerated test fixture |
| 03/03/2009 | US7498830 Burn-in apparatus |
| 03/03/2009 | US7498829 Shielded probe for testing a device under test |
| 03/03/2009 | US7498828 Probe station with low inductance path |
| 03/03/2009 | US7498827 Probe card |
| 03/03/2009 | US7498826 Probe array wafer |
| 03/03/2009 | US7498825 Probe card assembly with an interchangeable probe insert |
| 03/03/2009 | US7498821 Non-linear observers in electric power networks |
| 03/03/2009 | US7498820 Method, apparatus and computer-readable code for detecting an incipient ground fault in an electrical propulsion system |
| 03/03/2009 | US7498819 Method, apparatus and computer-readable code for detecting an incipient ground fault in an electrical propulsion system |
| 03/03/2009 | US7498818 Apparatus and method for detecting a brush liftoff in a synchronous generator rotor circuit |
| 03/03/2009 | US7498801 Apparatus, method, and computer program product for monitoring and controlling a microcomputer using a single existing pin |
| 03/03/2009 | US7498800 Methods and apparatus for rotationally accessed tester interface |
| 03/03/2009 | US7498773 Information terminal and battery remaining capacity calculating method |
| 03/03/2009 | US7498181 Method of preparing an integrated circuit die for imaging |
| 02/26/2009 | WO2009026038A1 Instrument transformer test equipment and method |
| 02/26/2009 | WO2009025528A1 Apparatus for estimating open circuit voltage of battery, apparatus for estimating state of charge of battery, and method for controlling the same |
| 02/26/2009 | WO2009025512A2 System and method for estimating long term characteristics of battery |
| 02/26/2009 | WO2009025227A1 Test device, test method, and manufacturing method |
| 02/26/2009 | WO2009025070A1 Test system and daughter unit |
| 02/26/2009 | WO2009025020A1 Tester, test method, and manufacturing method |
| 02/26/2009 | WO2009024717A2 Analog circuit test device |
| 02/26/2009 | WO2009024706A2 Method and device for controlling an engine stop/restart system to be mounted on an automobile |
| 02/26/2009 | WO2009024173A1 Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under test |
| 02/26/2009 | WO2009024172A1 Chip tester, chip test system, chip test setup, method for identifying an open-line failure and computer program |
| 02/26/2009 | WO2009006073A3 Reverse enum based routing for communication networks |
| 02/26/2009 | WO2009003629A3 Registering unit for recording input signals caused by mechanical action on said unit, and method for recording measured values and processing signals |
| 02/26/2009 | WO2009001001A3 Method for driving a micro-hybrid system for vehicle and an energy storage unit, and hybrid system for implementing same |
| 02/26/2009 | WO2007149472A3 Element controller for a resilient integrated circuit architecture |
| 02/26/2009 | WO2007146583A3 Method of designing an application specific probe card test system |
| 02/26/2009 | WO2006050288A3 Low cost test for ic's or electrical modules using standard reconfigurable logic devices |
| 02/26/2009 | US20090055699 Semiconductor test apparatus |
| 02/26/2009 | US20090055698 System, apparatus, and method for memory built-in self testing using microcode sequencers |
| 02/26/2009 | US20090055696 Microcontroller for logic built-in self test (lbist) |
| 02/26/2009 | US20090055122 On-Chip Frequency Response Measurement |
| 02/26/2009 | US20090055110 Lithium sulfur rechargeable battery fuel gauge systems and methods |
| 02/26/2009 | US20090055001 Controlled Terminal in Centralized Control System and Centralized Control System |
| 02/26/2009 | US20090053923 Network Connection Sensing Assembly |
| 02/26/2009 | US20090053837 Wafer boat for semiconductor testing |
| 02/26/2009 | US20090052679 Apparatus for fault detection for parallelly transmitted audio signals and apparatus for delay difference detection and adjustment for parallelly transmitted audio signals |
| 02/26/2009 | US20090052509 Phy control module for a multi-pair gigabit transceiver |
| 02/26/2009 | US20090052320 Estimator for end-to-end throughput of wireless networks |
| 02/26/2009 | US20090051385 Cell with Fixed Output Voltage for Integrated Circuit |
| 02/26/2009 | US20090051383 Test Method and Production Method for a Semiconductor Circuit Composed of Subcircuits |
| 02/26/2009 | US20090051381 Electronic Device Testing Apparatus and Temperature Control Method in an Electronic Device Testing Apparatus |
| 02/26/2009 | US20090051379 Method of treating and probing a via |
| 02/26/2009 | US20090051377 Probe card and method for assembling the same |
| 02/26/2009 | US20090051368 Load testing circuit |
| 02/26/2009 | US20090051367 Method of detecting disconnection and power discontinuity of i/o unit connected to numerical controller |
| 02/26/2009 | US20090051366 Test system and daughter unit |
| 02/26/2009 | US20090051365 Method and apparatus for measuring a parameter of a vehicle electrical system |
| 02/26/2009 | US20090051364 Onboard Battery Management Device |
| 02/26/2009 | US20090051347 High frequency delay circuit and test apparatus |
| 02/26/2009 | US20090050887 Chip on film (cof) package having test pad for testing electrical function of chip and method for manufacturing same |
| 02/26/2009 | US20090050886 Test device, SRAM test device, semiconductor integrated circuit device and methods of fabricating the same |
| 02/26/2009 | DE112007000756T5 Hybridfahrzeugbatterieinformationen-Anzeigevorrichtung Hybrid vehicle battery information display device |
| 02/26/2009 | DE102008044420A1 Energieversorgungssystem für Kraftfahrzeuge Energy supply system for motor vehicles |
| 02/26/2009 | DE102008039070A1 Halbleiterprüfvorrichtung Semiconductor testing |
| 02/26/2009 | DE102008034536A1 Digitales Multimeter mit abgedichteter Eingangsanschlusserfassungseinrichtung Digital Multimeter with sealed input terminal detector |
| 02/26/2009 | DE102008006429A1 Identifizierbares Kabel Identifiable cable |
| 02/26/2009 | DE102007039727A1 Contacting device for e.g. electrical contact of ROM to be tested on wafer, has adapter element including lower side electrical connection for electrically contacting semiconductor components to be tested or intermediate element |
| 02/26/2009 | DE102007038376A1 Supercharger with function for determining battery capacity, has charging unit provided with control unit for charging battery and discharging unit is provided to discharge battery |
| 02/26/2009 | DE102007036680A1 Circuit device for operating e.g. water pump, in motor vehicle, has detection device causing stabilization circuit and diagnostic connection to be high-resistant to positive supply voltage during contact interruption of ground line |
| 02/26/2009 | DE102007036667A1 Einrichtung und Verfahren zum Betreiben eines elektrischen Verbrauchers Means and method for operating an electrical load |
| 02/26/2009 | DE102005025216B4 Hub eines Speichermoduls und Verfahren zum Testen eines Speichermoduls unter Verwendung des Hubs Hub of a memory module and method for testing a memory module using the stroke |
| 02/26/2009 | CA2698428A1 Instrument transformer test equipment and method |
| 02/26/2009 | CA2697011A1 Apparatus for estimating open circuit voltage of battery, apparatus for estimating state of charge of battery, and method for controlling the same |
| 02/25/2009 | EP2028676A2 Automatically configuring vacuum contactor |
| 02/25/2009 | EP2028503A1 Method for judging deterioration state of battery, deterioration judgment device and power supply system |
| 02/25/2009 | EP2028502A1 Semiconductor defect analysis device, defect analysis method, and defect analysis program |
| 02/25/2009 | EP2028501A1 Semiconductor defect analysis device, defect analysis method, and defect analysis program |
| 02/25/2009 | EP2028500A1 Semiconductor defect analysis device, defect analysis method, and defect analysis program |
| 02/25/2009 | EP2028499A1 Insulation control for interconnectable power grids with insulated neutral |
| 02/25/2009 | EP2027637A2 Method and device for determining the electrical loadability of overhead lines by means of temperature measurement |
| 02/25/2009 | EP2027480A1 Method and apparatus for measuring the duty cycle or relative duty cycle of a digital signal |
| 02/25/2009 | EP2027478A2 Instrument and method for measuring partial electrical discharges in an electrical system |
| 02/25/2009 | EP2027477A2 Ac coupled parametric test probe |
| 02/25/2009 | EP1769409A4 Hardware/software design tool and language specification mechanism enabling efficient technology retargeting and optimization |
| 02/25/2009 | EP1751567B1 Method for determining the available energy of a lithium ion battery |
| 02/25/2009 | EP1649299B1 System and method for optimized test and configuration throughput of electronic circuits |
| 02/25/2009 | EP1540828B1 Coding of information in integrated circuits |
| 02/25/2009 | EP1206826B1 Energy management system for automotive vehicle |
| 02/25/2009 | EP0805977B1 Composite film moisture barrier for on-cell tester |
| 02/25/2009 | CN201199359Y Apparatus for monitoring state of mainboard power supply and sequence signal |
| 02/25/2009 | CN201199264Y Multi purpose meter for checking process |