Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2009
03/11/2009CN101382574A Method for measuring carrier mobility of organic semiconductor by using evanescent wave as excitation source
03/11/2009CN101382573A Induction voltage testing method
03/11/2009CN101382572A Novel detection device for protector for surge
03/11/2009CN101382571A Adjustable non-contact type touch pad detecting method
03/11/2009CN101382570A Auto powering on/off apparatus and method
03/11/2009CN101382569A Circuit breaking test device
03/11/2009CN101382567A Portable terminal machine for detecting battery voltage for vehicle and method for measuring battery voltage
03/11/2009CN101382566A Lead wire for LCD array testing and detecting circuit
03/11/2009CN101382565A Extra-high voltage corona cage for researching corona characteristic of conductor
03/11/2009CN101381046A 电梯 Elevator
03/11/2009CN100469218C Circuit board checker and circuit board checking method
03/11/2009CN100469066C Break and shortbreak detection circuit
03/11/2009CN100469020C Multiple function pattern generator and comparator having self-seeding test function
03/11/2009CN100468906C Over current detector of motor driving circuit
03/11/2009CN100468905C Condition diagnosing
03/11/2009CN100468721C Test circuit built-in semiconductor chip
03/11/2009CN100468578C Semiconductor device and method for testing semiconductor device
03/11/2009CN100468356C Test case inheritance controlled via attributes
03/11/2009CN100468077C Battery state of charge detection
03/11/2009CN100468076C Fuel cell test system with self-supporting and electric power output function
03/11/2009CN100468075C System and method for testing chip
03/11/2009CN100468074C Chip testing method and related devices
03/11/2009CN100468073C Highly reliable vehicle system start controller
03/11/2009CN100468072C High-voltage transmission line lightning stroke flashover path detection method
03/11/2009CN100468071C Electronic product detecting system
03/11/2009CN100468070C Techniques for controlling movement of a circuit board module along card cage slot
03/11/2009CN100468069C Display device testing system and method
03/11/2009CN100468065C Sheet probe, manufacturing method and application therefor
03/10/2009US7503071 Network traffic identification by waveform analysis
03/10/2009US7503022 Test method for unit re-modification
03/10/2009US7503021 Integrated circuit diagnosing method, system, and program product
03/10/2009US7502992 Method and apparatus for detecting presence of errors in data transmitted between components in a data storage system using an I2C protocol
03/10/2009US7502980 Signal generator, test apparatus, and circuit device
03/10/2009US7502979 Pipelined scan structures for testing embedded cores
03/10/2009US7502978 Systems and methods for reconfiguring scan chains
03/10/2009US7502975 Data transmission apparatus and method
03/10/2009US7502860 Method and apparatus for client-side flow control in a transport protocol
03/10/2009US7502857 Method and system for optimally allocating a network service
03/10/2009US7502849 System for transferring data over a network
03/10/2009US7502706 Module-testing device
03/10/2009US7502700 Secondary battery control circuit
03/10/2009US7502659 Sorting a group of integrated circuit devices for those devices requiring special testing
03/10/2009US7502333 Pre-configured topology with connection management
03/10/2009US7502326 Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices
03/10/2009US7502324 TCP retransmission and exception processing in high speed, low memory hardware devices
03/10/2009US7502319 Ethernet packet transmission apparatus and method
03/10/2009US7502314 Label-switched path network with alternate routing control
03/10/2009US7502313 Virtual path restoration scheme using fast dynamic mesh restoration in an optical network
03/10/2009US7502006 Method for adjusting electro-optical apparatus, adjusting apparatus of electro-optical apparatus, and electronic system
03/10/2009US7501888 Gain control methods and systems in an amplifier assembly
03/10/2009US7501848 Method and apparatus for measuring leakage current
03/10/2009US7501847 Increased yield manufacturing for integrated circuits
03/10/2009US7501846 Measurement apparatus and measurement method
03/10/2009US7501845 On-chip frequency degradation compensation
03/10/2009US7501844 Liquid cooled DUT card interface for wafer sort probing
03/10/2009US7501843 Movement amount operation correction method for prober, movement amount operation correction processing program, and prober
03/10/2009US7501842 Shielded probe for testing a device under test
03/10/2009US7501841 Probe assembly with multi-directional freedom of motion and mounting assembly therefor
03/10/2009US7501840 Probe assembly comprising a parallelogram link vertical probe made of a metal foil attached to the surface of a resin film
03/10/2009US7501839 Interposer and test assembly for testing electronic devices
03/10/2009US7501838 Contact assembly and LSI chip inspecting device using the same
03/10/2009US7501837 Test structure and method for detecting charge effects during semiconductor processing using a delayed inversion point technique
03/10/2009US7501832 Method and circuit for the detection of solder-joint failures in a digital electronic package
03/10/2009US7501831 Process for the detection of a malfunction in a device for wire sawing and device for practicing said process
03/10/2009US7501830 Method, apparatus and computer-readable code for detecting an incipient ground fault in an electrical propulsion system
03/10/2009US7501810 Chuck for holding a device under test
03/10/2009US7501809 Electronic component handling and testing apparatus and method for electronic component handling and testing
03/10/2009US7501701 Rewiring substrate strip having a plurality of semiconductor component positions
03/05/2009WO2009028837A1 Aging status diagnostic apparatus for power conversion system, and method their of
03/05/2009WO2009028382A1 Monitor for charged state of battery, and engine controller
03/05/2009WO2009028051A1 Memory test method and memory tester
03/05/2009WO2009028040A1 Tester and manufacturing method
03/05/2009WO2009028037A1 System, relay device, tester, and manufacturing method for device
03/05/2009WO2009028035A1 Method and device for diagnosing remaining lifetime of switchgear
03/05/2009WO2009028034A1 Electronic device and diagnosing apparatus
03/05/2009WO2008049436A9 Method and device for detection of a loose connection
03/05/2009US20090063921 Staggered LBIST Clock Sequence for Noise (di/dt) Amelioration
03/05/2009US20090063920 Parallel scan distributors and collectors and process of testing integrated circuits
03/05/2009US20090063919 Parallel scan distributors and collectors and process of testing integrated circuits
03/05/2009US20090063913 Semiconductor integrated circuit
03/05/2009US20090063805 Data acquisition messaging using special purpose registers
03/05/2009US20090063086 Apparatus for testing semiconductor integrated circuit and method for testing semiconductor integrated circuit
03/05/2009US20090063085 Pmu testing via a pe stage
03/05/2009US20090063072 Logic analyzer using a digital filter
03/05/2009US20090063067 Voltage measuring device
03/05/2009US20090063064 Residual current device having voltage dependent and voltage independent modes of operation
03/05/2009US20090063063 Preventive Maintenance Tapping and Duty Cycle Monitor for Voltage Regulator
03/05/2009US20090063062 Fault test apparatus and method for testing semiconductor device under test using fault excitation function
03/05/2009US20090063061 Monitoring degradation of circiut speed
03/05/2009US20090061540 Plasma process detecting sensor
03/05/2009US20090061367 Appliance having a safety string
03/05/2009US20090060703 Method for sorting integrated circuit devices
03/05/2009US20090059803 High resiliency network intrastructure
03/05/2009US20090059801 Managing storage of HARQ packets
03/05/2009US20090059797 Ensuring physical locality of entities sharing data
03/05/2009US20090059789 Method and system for providing user configurable differentiated service
03/05/2009US20090059786 Method and apparatus for dynamic assignment of quality of service parameters in a communication network
03/05/2009US20090058456 Manufacturing system, manufacturing method, managing apparatus, managing method and computer readable medium
03/05/2009US20090058455 Test structure and test method
03/05/2009US20090058454 Device power supply extension circuit, test system including the same and method of testing semiconductor devices