Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2009
03/12/2009WO2009010920A3 Semi-adaptive voltage scaling for low-energy digital vlsi-design
03/12/2009WO2009006175A3 Test structure, test structure formation and mask reuse in semiconductor processing
03/12/2009WO2009002120A3 Measuring instrument for a resistive electric leakage current
03/12/2009WO2008120143A3 Method for determining a status and/or condition of a led/oled device and diagnotic device
03/12/2009WO2008004209A3 Methods and systems for semiconductor testing using reference dice
03/12/2009US20090070646 Multiple-Capture DFT system for scan-based integrated circuits
03/12/2009US20090070645 Integrated circuit testing method and related circuit thereof
03/12/2009US20090070061 Semiconductor memory device including test mode circuit
03/12/2009US20090070052 Secondary-battery life estimation apparatus and method
03/12/2009US20090067559 System and method for high-speed decoding and isi compensation in a multi-pair transceiver system
03/12/2009US20090067337 Testing a circuit using a shared bandwidth test bus
03/12/2009US20090067322 Forwarding data in a data communications network
03/12/2009US20090067319 Systems and method for orthogonal frequency divisional multiplexing
03/12/2009US20090067250 Memory devices with page buffer having dual registers and method of using the same
03/12/2009US20090066414 Gain control methods and systems in an amplifier assembly
03/12/2009US20090066360 Method for determining an inductance of a motor
03/12/2009US20090066359 Semiconductor device test system having reduced current leakage
03/12/2009US20090066358 Methods and apparatus for detecting defects in interconnect structures
03/12/2009US20090066357 Method and apparatus for detecting impairment of a solar array
03/12/2009US20090066356 Method and apparatus for interrogating an electronic component
03/12/2009US20090066355 Circuit Arrangement with Switchable Functionality and Electronic Component
03/12/2009US20090066354 Electrostatic Discharge Test System And Electrostatic Discharge Test Method
03/12/2009US20090066353 Probe assemblies and methods for housing and providing electrical contact to planar or chip-type sensors and heaters
03/12/2009US20090066352 Making And Using Carbon Nanotube Probes
03/12/2009US20090066351 Electrochemically fabricated microprobes
03/12/2009US20090066341 Medical device and test method for medical device
03/12/2009US20090066338 Battery Voltage Detecting Circuit
03/12/2009US20090066303 Voltage regulator with testable thresholds
03/12/2009US20090066257 Dielectric barrier discharge lamp lighting apparatus and method of detecting the number of normally lighting dielectric barrier discharge lamps
03/12/2009US20090065955 Method and structures for accelerated soft-error testing
03/12/2009US20090065772 Apparatus for detecting pattern alignment error
03/12/2009DE202008014686U1 Prüfgerät Laminator Tester Laminator
03/12/2009DE202006020618U1 Mikroskopsystem zum Testen von Halbleitern Microscope system for testing semiconductors
03/12/2009DE102007054879A1 Verfahren und Anordnung zur Positionierung einer Probecard Method and apparatus for positioning a probe card
03/12/2009DE102007043068A1 Vorrichtung zur Bordnetzdiagnose Apparatus for vehicle electrical system diagnosis
03/12/2009DE102007042266A1 Method for rejection of ambient interference signal during measurement of interference emissions of electric and electronic devices, involves digitalizing signal of antenna through analog to digital converter
03/11/2009EP2034323A2 Method and apparatus for detecting impairment of a solar array
03/11/2009EP2033420A2 Call quality monitoring
03/11/2009EP2033316A2 Fault tolerant integrated circuit architecture
03/11/2009EP2033315A2 Element controller for a resilient integrated circuit architecture
03/11/2009EP2033288A1 A method of detecting faults on an electrical power line
03/11/2009EP2033258A1 Method and apparatus for controlling battery
03/11/2009EP2033003A1 Determination of battery predictive power limits
03/11/2009EP2033002A1 Contacting device for testing electronic components under specific temperature conditions
03/11/2009EP2033000A1 A method and a device for diagnosing an on-line high voltage component
03/11/2009EP2032999A2 Contactor having a global spring structure and methods of making and using the contactor
03/11/2009EP2032998A2 Method of designing an application specific probe card test system
03/11/2009EP1820040A4 Systems and methods for detecting and indicating fault conditions in electrochemical cells
03/11/2009EP1611449B1 System and method for measuring fuel cell voltage and high frequency resistance
03/11/2009EP1212627A4 Method and system for transporting generic data in a pstn
03/11/2009CN201207369Y Experimental test screen for plasma display
03/11/2009CN201207368Y Test panel used for detecting defect of flat panel display panel electrode wire
03/11/2009CN201207367Y Gaseous discharging cavity used for detecting defect of flat panel display panel electrode wire
03/11/2009CN201207078Y Permanent magnet synchronous motor test system
03/11/2009CN201207077Y Analogue load circuit
03/11/2009CN201207076Y Chip test seat with replaceable test spring
03/11/2009CN201207075Y Over-current test monitoring and protecting device for thyristor valve
03/11/2009CN201207074Y Communication electric cable fault tester capable of controlling gain of control pulse signal
03/11/2009CN201207073Y Fast measuring electroprobe
03/11/2009CN201207072Y Fast detection apparatus for electric cable and electric wire joint
03/11/2009CN201207071Y Bus malfunction detection apparatus
03/11/2009CN201207070Y Electrode wire defect detection device of flat-plate display panel
03/11/2009CN201207069Y Electronic parts aging test system used on automobile
03/11/2009CN201207068Y Extra-high voltage power transmission and transformation experiment hall
03/11/2009CN201207067Y Hand-hold device for electricity grid safe operation patrol
03/11/2009CN201207066Y Experiment test system for plasma display
03/11/2009CN201207065Y Intelligent detector for charger
03/11/2009CN201207063Y Integrated test tool
03/11/2009CN201207062Y Probe system for electromagnetic radiation
03/11/2009CN201207060Y General resistance detecting clamp for cylinder battery
03/11/2009CN201207056Y Current test device
03/11/2009CN201207041Y X-ray detection equipment
03/11/2009CN201207028Y Flexibility tester for flexible circuit board
03/11/2009CN201207027Y Pressure testing and temperature testing device for high voltage bushing and low pressure terminal plate of transformer
03/11/2009CN101384917A Multi-stage data processor having signal repeater
03/11/2009CN101384916A Test instrument, program and recording medium
03/11/2009CN101384915A Sampling a device bus
03/11/2009CN101384914A Semiconductor integrated circuit and method for inspecting same
03/11/2009CN101384913A Electronic part test apparatus and electronic part test method
03/11/2009CN101384912A Apparatus for checking an electrical printed circuit board having a conductor track
03/11/2009CN101384448A Battery life evaluation device for hybrid vehicle
03/11/2009CN101383519A Electronic device
03/11/2009CN101383438A Internal information testing method of secondary battery and apparatus
03/11/2009CN101383436A Battery charging method and apparatus
03/11/2009CN101383306A Method for measuring mercury cadmium telluride material pn junction depth
03/11/2009CN101383140A Distance response type display device and method
03/11/2009CN101383117A Display panel driver
03/11/2009CN101382670A Liquid crystal display device signal lead repairing structure and repairing method thereof
03/11/2009CN101382593A Method for detecting weak low frequency signal form unknown strong frequency conversion signal
03/11/2009CN101382585A Test method, apparatus and generator for inverter in generator
03/11/2009CN101382584A Battery overmeasure computation method
03/11/2009CN101382583A Multi-core microprocessor JTAG debug method
03/11/2009CN101382582A Frontend amplifying circuit passage consistency detecting method for ultrasonic imaging apparatus
03/11/2009CN101382581A Semiconductor integrated circuit device, method for testing the semiconductor integrated circuit device, semiconductor wafer and burn-in test apparatus
03/11/2009CN101382580A Detector device and detection method
03/11/2009CN101382579A Detection device for quality of rubber stress cone of high-pressure cross-linking cable
03/11/2009CN101382578A Detection device for quality of rubber stress cone with different cable sectional
03/11/2009CN101382577A Single-phase earth fault positioning device for electrical power distribution network
03/11/2009CN101382576A Self-recognising checking out method for detecting quality of reversal photoelectric and optical fiber
03/11/2009CN101382575A Auto testing system for electronic transformer