| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/25/2009 | CN100472221C System and method for defect localization |
| 03/25/2009 | CN100472220C TCP handling device and positional deviation correcting method for the same |
| 03/25/2009 | CN100472219C Inspection method of array board and inspection equipment thereof |
| 03/25/2009 | CN100472215C Electric connector |
| 03/25/2009 | CN100472214C Dual channel source measurement unit for semiconductor device testing |
| 03/25/2009 | CN100472205C Printed circuit board inspecting method and apparatus, inspection logic setting method and apparatus |
| 03/24/2009 | US7509600 Generating test patterns having enhanced coverage of untargeted defects |
| 03/24/2009 | US7509553 Inter-network and inter-protocol video conference privacy method, apparatus, and computer program product |
| 03/24/2009 | US7509552 Multi-thread parallel segment scan simulation of chip element performance |
| 03/24/2009 | US7509551 Direct logic diagnostics with signature-based fault dictionaries |
| 03/24/2009 | US7509550 Fault diagnosis of compressed test responses |
| 03/24/2009 | US7509549 Dynamic frequency scaling for JTAG communication |
| 03/24/2009 | US7509548 Method and apparatus for integrated circuit self-description |
| 03/24/2009 | US7509547 System and method for testing of interconnects in a programmable logic device |
| 03/24/2009 | US7509546 Test pattern compression for an integrated circuit test environment |
| 03/24/2009 | US7509532 Robotic memory-module tester using adapter cards for vertically mounting PC motherboards |
| 03/24/2009 | US7509517 Clock transferring apparatus for synchronizing input data with internal clock and test apparatus having the same |
| 03/24/2009 | US7509227 High-speed digital multiplexer |
| 03/24/2009 | US7509226 Apparatus and method for testing non-deterministic device data |
| 03/24/2009 | US7509051 Transceiver module with voltage regulation and filtering |
| 03/24/2009 | US7508813 Local area network contention avoidance |
| 03/24/2009 | US7508766 Packet routing |
| 03/24/2009 | US7508760 Data distribution server and terminal apparatus |
| 03/24/2009 | US7508754 Method and system to support internal calling upon loss of connection with IP Centrex server |
| 03/24/2009 | US7508234 Optically reconfigurable gate array write state inspection method, write state inspection device, and optically reconfigurable gate array |
| 03/24/2009 | US7508229 Method and device for testing array substrate |
| 03/24/2009 | US7508228 Method and system for monitoring test signals for semiconductor devices |
| 03/24/2009 | US7508227 Closed-grid bus architecture for wafer interconnect structure |
| 03/24/2009 | US7508226 Versatile materials probe |
| 03/24/2009 | US7508219 Apparatus and method for measuring loop insertion loss single-endedly |
| 03/24/2009 | US7508218 Apparatus and method for measuring loop insertion loss single-endedly |
| 03/24/2009 | US7508217 Test apparatus and test module |
| 03/24/2009 | US7508216 Method for measuring work function |
| 03/24/2009 | US7508192 Circuit with a capacitive element with method for testing the same |
| 03/24/2009 | US7508191 Pin electronics implemented system and method for reduced index time |
| 03/24/2009 | US7508189 Micro-electromechanical system (MEMS) based current and magnetic field sensor having improved sensitivities |
| 03/24/2009 | US7508187 Device and system for the measurement of an external electrostatic field, and system and method for the detection of storms |
| 03/24/2009 | US7508186 Registration of lightning strike in a wind turbine |
| 03/24/2009 | US7508065 Device package and methods for the fabrication and testing thereof |
| 03/24/2009 | US7507591 Methods of measurement and preparation of measurement structure of integrated circuit |
| 03/24/2009 | US7506519 Staggered spray nozzle system |
| 03/24/2009 | CA2316187C Location of fault on series-compensated power transmission lines |
| 03/19/2009 | WO2009036320A1 High frequency differential test probe for automated printed wiring board test systems |
| 03/19/2009 | WO2009035808A1 Systems and methods for a self-healing carrier ethernet topology |
| 03/19/2009 | WO2009035636A1 Method and apparatus for dynamically determining tester recipes |
| 03/19/2009 | WO2009035459A1 Advanced thermal control interface |
| 03/19/2009 | WO2009035456A2 A forked probe for testing semiconductor devices |
| 03/19/2009 | WO2009034620A1 Connector, conductive member, its manufacturing method, performance board, and testing device |
| 03/19/2009 | WO2009034496A2 Wafer, method of manufacturing integrated circuits on a wafer, and method of storing data about said circuits |
| 03/19/2009 | WO2009033629A1 Method and apparatus for measuring a lifetime of charge carriers |
| 03/19/2009 | WO2009033426A1 A multi-subunit cable testing device |
| 03/19/2009 | WO2009033409A1 A method and a system for calibrating the parameters of a bus |
| 03/19/2009 | WO2009006152A3 Method and apparatus for a voltage/current probe test arrangements |
| 03/19/2009 | WO2007146582A3 Ac coupled parametric test probe |
| 03/19/2009 | WO2006052354A3 Battery fuel gauge using safety circuit |
| 03/19/2009 | US20090077442 Shift register, data line driving circuit, scanning line driving circuit, electro-optical device, and electronic apparatus |
| 03/19/2009 | US20090077440 Apparatus and method for verifying target cicuit |
| 03/19/2009 | US20090077439 Integrated circuit test method and test apparatus |
| 03/19/2009 | US20090077438 Circuit interconnect testing arrangement and approach therefor |
| 03/19/2009 | US20090077159 Method, apparatus, and computer readable storage medium for controlling communication |
| 03/19/2009 | US20090076753 Flexible on chip testing circuit for i/o's characterization |
| 03/19/2009 | US20090076747 Test board and test system |
| 03/19/2009 | US20090075514 Test socket |
| 03/19/2009 | US20090073885 Method, system and apparatus for tracking user behavior in a wireless communication network |
| 03/19/2009 | US20090073871 Communication apparatus and network search method thereof |
| 03/19/2009 | US20090072862 Semiconductor Device and Display Device |
| 03/19/2009 | US20090072854 Liquid crystal display panel and testing and manufacturing methods thereof |
| 03/19/2009 | US20090072853 Method for pre-treating epitaxial layer, method for evaluating epitaxial layer, and apparatus for evaluating epitaxial layer |
| 03/19/2009 | US20090072852 System that detects damage in adjacent dice |
| 03/19/2009 | US20090072849 Flexible Test Fixture |
| 03/19/2009 | US20090072848 Electrical Contactor, Especially Wafer Level Contactor, Using Fluid Pressure |
| 03/19/2009 | US20090072847 Apparatus for testing a semiconductor device and a method of fabricating and using the same |
| 03/19/2009 | US20090072845 Link analysis compliance and calibration verification for automated printed wiring board test systems |
| 03/19/2009 | US20090072843 Method and apparatus for interrogating an electronic component |
| 03/19/2009 | US20090072839 Apparatus and method to detect failure of smoothing electrolytic capacitor |
| 03/19/2009 | US20090072838 Multi-port switching apparatus, device testing system and method of testing therefor |
| 03/19/2009 | US20090072837 Method of testing durability of cis based thin-film solar cell module |
| 03/19/2009 | DE19825274B4 Prüfstation mit innerer und äußerer Abschirmung Test station with inner and outer shield |
| 03/19/2009 | DE10249605B4 Halbleiterspeicherbauelement und Testverfahren The semiconductor memory device and test method |
| 03/19/2009 | DE102007042016A1 Susceptibility-to-interference testing method for electronic unit i.e. electronic control unit, involves generating test signal, and supplying test signal to unit that is to be tested, where test signal is noise signal |
| 03/19/2009 | DE102007021921B4 Vorrichtung zum Überwachen eines Energiespeichers An apparatus for monitoring an energy storage device |
| 03/18/2009 | EP2037289A1 Internal state estimating device of secondary battery |
| 03/18/2009 | EP2037288A1 Volume lifetime measurement |
| 03/18/2009 | EP2037287A1 Method of detecting a failure in a system for supplying an electrical charge |
| 03/18/2009 | EP2036499A1 Medical device and test metod for medical device |
| 03/18/2009 | EP2035979A2 Exhaustive diagnosis of bridging defects in an integrated circuit |
| 03/18/2009 | EP2035849A1 System and method for cleaning a contactor device |
| 03/18/2009 | EP2035848A2 Detecting sub-system |
| 03/18/2009 | EP2035844A1 System for measuring the radiation pattern of a transmission antenna |
| 03/18/2009 | EP2035840A1 Arrangement for determining the operational characteristics of a high-frequency power amplifier |
| 03/18/2009 | EP2035839A1 Arrangement for determining the operational characteristics of a high-frequency power amplifier |
| 03/18/2009 | EP2035698A2 A test bench and a method for testing wind turbine equipment |
| 03/18/2009 | EP1899738B1 Test apparatus with tester channel availability identification |
| 03/18/2009 | CN201210625Y Charging control circuit of charging battery |
| 03/18/2009 | CN201210620Y Using state early warning apparatus for vehicular charging battery |
| 03/18/2009 | CN201210560Y Multifunctional energy saving socket |
| 03/18/2009 | CN201210206Y Detection device for LCD screen |
| 03/18/2009 | CN201210184Y Continuous test or data transmission apparatus |
| 03/18/2009 | CN201210183Y IC test device |
| 03/18/2009 | CN201210182Y Multifunctional LED lamp tester |