Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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10/04/1988 | US4775852 Apparatus for compensating digital to analog converter errors |
10/04/1988 | US4775839 Control apparatus for the electronic detection in a.c. power transmission lines of fault locations causing power losses |
10/04/1988 | US4775832 Conductor tracer transmitter with non-reversing magnetic field tracing signal |
10/04/1988 | US4775831 In-line determination of presence of liquid phase moisture in sealed IC packages |
10/04/1988 | US4775827 Device for indicating the charge status of a battery |
10/04/1988 | US4775640 For light emitting diodes in semiconductor wafer |
10/04/1988 | US4774768 Coplanarity tester for surface mounted device |
10/04/1988 | CA1242817A1 Low-abberation spectrometer objective with high secondary electron acceptance |
10/04/1988 | CA1242814A1 Self diagnostic cyclic analysis testing system (cats) for lsi/vlsi |
10/04/1988 | CA1242813A1 Apparatus for measuring characteristics of electronic devices |
09/29/1988 | DE3722489C1 Circuit arrangement for status indication of thyristors in a high voltage valve |
09/28/1988 | EP0284546A1 Method of testing assemblies |
09/28/1988 | EP0284381A2 Lead sense system for component insertion machine |
09/28/1988 | EP0284067A2 Identifier for phases |
09/28/1988 | EP0283786A1 Digital locator |
09/28/1988 | EP0283778A1 Method for the thermal characterization of semiconductor packaging systems |
09/28/1988 | EP0283545A1 Contact-pins arrangement for the electrical contacting of a test device with circular contact surfaces of a test sample |
09/28/1988 | EP0283515A1 Integrated circuit packaging configuration for rapid customized design and unique test capability |
09/27/1988 | US4774493 Method and apparatus for transferring information into electronic systems |
09/27/1988 | US4774462 For printed circuit board |
09/27/1988 | US4774460 Stroboscopic type potential measurement device |
09/27/1988 | US4774459 Adapter for a printed circuit board testing apparatus |
09/27/1988 | US4774456 Curve tracer accessory device |
09/27/1988 | US4774455 Method for automatic guard selection in automatic test equipment |
09/27/1988 | US4774424 Device for measuring the induction in the air gap of a magnetic bearing |
09/27/1988 | CA1242486A1 Automatic test equipment |
09/22/1988 | WO1988007204A1 Tri-state circuit tester |
09/22/1988 | DE3707862A1 Arrangement for measuring the transition resistance of line terminals in a network of conductors which are connected electrically in parallel |
09/22/1988 | DE3707614A1 Method for determining the rotor resistance of an asynchronous machine |
09/21/1988 | EP0283346A1 Detector of an anomalous function of an electric, electromechanical or electronic apparatus |
09/21/1988 | EP0283219A2 Apparatus for automatically scrubbing a surface |
09/21/1988 | EP0283196A2 In-place diagnosable electronic circuit board |
09/21/1988 | EP0283186A2 Semiconductor integrated circuit with a plurality of circuit blocks having equivalent functions |
09/21/1988 | EP0283015A2 Method for establishing link between vehicle-mounted electronic control unit and testing device |
09/21/1988 | CN88101319A 三态电路测试器 Tri-state circuit tester |
09/20/1988 | US4773071 Memory for storing response patterns in an automatic testing instrument |
09/20/1988 | US4773028 Method and apparatus for improved monitoring and detection of improper device operation |
09/20/1988 | US4772847 Stroboscopic type potential measurement device |
09/20/1988 | US4772846 Wafer alignment and positioning apparatus for chip testing by voltage contrast electron microscopy |
09/20/1988 | US4772845 Cable continuity testor including a sequential state machine |
09/20/1988 | US4772806 In an electrical circuit for an airport lighting system |
09/20/1988 | CA1242246A1 Defect leakage screen system |
09/15/1988 | DE3706632A1 Device for testing free or connected cable conductors, in particular telephone conductors |
09/14/1988 | EP0281740A2 Memories and the testing thereof |
09/14/1988 | EP0281651A1 Testing device for electronic components packed in tapes |
09/14/1988 | EP0281553A1 Method of manufacturing integrated circuits |
09/14/1988 | EP0281552A1 Integrated circuits |
09/14/1988 | EP0136203B1 Apparatus for dynamically controlling the timing of signals in automatic test systems |
09/14/1988 | CN88100816A Electric generator inspection system and motor controller |
09/14/1988 | CN87216216U Circuit for expanding function of multimeter |
09/14/1988 | CN87212607U Acoustooptic combined remote sense electroscope |
09/14/1988 | CN87212559U Megger with commohn marking scale |
09/14/1988 | CN87209980U Liquid crystal screw-driver with voltage tester |
09/13/1988 | US4771428 Circuit testing system |
09/13/1988 | US4771407 Semiconductor integrated circuit having function for switching operational mode of internal circuit |
09/13/1988 | US4771355 System and method for arc detection in dynamoelectric machines |
09/13/1988 | US4771251 Ring oscillator |
09/13/1988 | US4771236 Multilayered printed circuit board type resistor isolated tray for stress testing integrated circuits and method of making same |
09/13/1988 | US4771235 Method and apparatus for detecting and imaging measuring points that have a defined signal progression |
09/13/1988 | US4771234 Vacuum actuated test fixture |
09/13/1988 | US4771230 Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out |
09/13/1988 | US4769883 Method for tuning a microwave integrated circuit |
09/08/1988 | DE3706380A1 Device for testing the wires of a bus of domestic telecommunication installations operating in accordance with the ISDN system |
09/07/1988 | WO1988006737A1 Electro-optic measurement (network analysis) system |
09/07/1988 | EP0281426A2 Electronic circuit device for diagnosing status-holding circuits by scanning |
09/07/1988 | EP0281227A1 Apparatus and method for detecting spot defects in integrated circuits |
09/07/1988 | EP0280916A1 Process and appliance for monitoring the working condition of a battery-driven vehicle |
09/07/1988 | EP0280848A2 On-chip on-line ac and dc clock tree error detection system |
09/06/1988 | US4769817 Concurrent fault simulation for logic designs |
09/06/1988 | US4769596 Printed circuit board tester |
09/06/1988 | US4769591 Testing apparatus for leadless package containing a high-frequency integrated circuit chip |
09/06/1988 | US4769543 Spectrometer lens for particle beam apparatus |
09/06/1988 | US4769527 Thermal image generating device |
09/01/1988 | DE3705714A1 Test assembly for integrated circuits - has test head in form of integrated circuit with test points aligned esp. as mirror image with points on circuit being tested |
09/01/1988 | DE3705558A1 Method for testing electrical connecting cords |
08/31/1988 | CN87216058U Electric circuit metal detector |
08/31/1988 | CN87215736U Movable high-tension acoustooptic electroscope |
08/30/1988 | US4768196 Programmable logic array |
08/30/1988 | US4768195 Chip tester |
08/30/1988 | US4768091 Testing apparatus for displaying scanning beam spot size and line focus on a CRT video screen |
08/30/1988 | US4768073 Testing integrated circuits |
08/30/1988 | US4767996 Fault current detection device for a D.C. network |
08/30/1988 | CA1241396A1 Card holder |
08/30/1988 | CA1241388A1 Dynamically selectable polarity latch |
08/30/1988 | CA1241375A1 Weighted random pattern testing apparatus and method |
08/25/1988 | WO1988006318A1 Dynamic system for testing an equipment |
08/25/1988 | WO1988006294A2 Detector-viewer |
08/25/1988 | WO1988006284A1 Apparatus and method for testing contact interruptions of circuit interconnection devices |
08/24/1988 | EP0279738A1 Electrical circuit testing device, and circuit containing the same |
08/24/1988 | EP0279577A1 Transformer Testing |
08/24/1988 | CN88100490A Measuring method for effective address of mass storage |
08/23/1988 | US4766595 For a unit under test |
08/23/1988 | US4766593 Monolithically integrated testable registers that cannot be directly addressed |
08/23/1988 | US4766569 Programmable logic array |
08/23/1988 | US4766549 Single-ended transmission line fault locator |
08/23/1988 | US4766388 For preventing flashover |
08/23/1988 | US4766387 Motor winding insulation resistance monitoring system |
08/23/1988 | US4766371 Test board for semiconductor packages |
08/23/1988 | CA1241074A1 Digital pattern generator |
08/23/1988 | CA1241060A1 Electronic probe having automatic readout of identification and status |