| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/05/1988 | US4755758 Wave formatter for a logic circuit testing system |
| 07/05/1988 | US4755750 Wafer keys for wafer probe alignment |
| 07/05/1988 | US4755749 Strobo electron beam apparatus |
| 07/05/1988 | US4755748 Method and apparatus for analyzing semiconductor devices using charge-sensitive electron-beam-injected-carrier microscopy |
| 07/05/1988 | US4755747 Wafer prober and a probe card to be used therewith |
| 07/05/1988 | US4755746 Apparatus and methods for semiconductor wafer testing |
| 07/05/1988 | US4755742 Dual channel time domain reflectometer |
| 07/05/1988 | US4755665 Light detector and signal processing circuit |
| 07/05/1988 | US4755049 Method and apparatus for measuring the ion implant dosage in a semiconductor crystal |
| 06/30/1988 | WO1988004865A2 Digital-to-time converter |
| 06/30/1988 | WO1988004781A1 Computer-aided probe with tri-state circuitry test capability |
| 06/30/1988 | WO1988004776A1 Battery monitoring and condition indicator system for multi-battery pack |
| 06/30/1988 | DE3708731C1 Electrical circuit arrangement for detecting noise pulses in high-voltage systems |
| 06/30/1988 | DE3643672A1 Method for testing the vacuum switching chamber of a vacuum switch and device for carrying out the method |
| 06/30/1988 | DE3643579A1 Arrangement for monitoring the loop current |
| 06/30/1988 | DE3642926A1 Arrangement and method for identifying displacement of the internal layers of multilayer printed circuit boards |
| 06/29/1988 | EP0272848A2 Semiconductor device having programmable read only memory cells for specific mode |
| 06/29/1988 | EP0272780A1 Cranking apparatus performance indicator |
| 06/29/1988 | EP0272506A2 Thin film transistor array for liquid crystal displays allowing in-process testing, testing method, and information entry system comprising such an array |
| 06/29/1988 | EP0272450A1 Device for testing printed circuit boards |
| 06/29/1988 | EP0272288A1 Testable multi-mode counter network and method for operating its test. |
| 06/29/1988 | EP0144180B1 Adjustable system for skew comparison of digital signals |
| 06/29/1988 | CN87210210U 电子验电器 Electronic electroscope |
| 06/29/1988 | CN87203928U Combined sound-light electrometric unit |
| 06/29/1988 | CN85104421B Singal generator for indicating fault in an a.c.network |
| 06/28/1988 | US4754215 Self-diagnosable integrated circuit device capable of testing sequential circuit elements |
| 06/28/1988 | CA1238683A1 Device for measuring the electronic characteristics of solid materials |
| 06/27/1988 | EP0145725A4 Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the like. |
| 06/23/1988 | DE3642649A1 Circuit arrangement for determining the distance and direction of faults in a power distribution system |
| 06/22/1988 | EP0271524A1 Cable continuity checker |
| 06/22/1988 | EP0271508A1 Electron-beam probing of photodiodes. |
| 06/22/1988 | CN87208971U Intelligent measurer for multiple electric parameters |
| 06/22/1988 | CN87205678U Detector for operating control box of generator |
| 06/21/1988 | US4752959 Wiring state detecting device for vehicle |
| 06/21/1988 | US4752928 Transaction analyzer |
| 06/21/1988 | US4752907 Integrated circuit scanning apparatus having scanning data lines for connecting selected data locations to an I/O terminal |
| 06/21/1988 | US4752886 For use with a switching device |
| 06/21/1988 | US4752729 Test circuit for VSLI integrated circuits |
| 06/21/1988 | US4752686 Method and apparatus for emphasizing a specimen surface region scanned by a scanning microscope primary beam |
| 06/21/1988 | CA1238363A1 Testing station |
| 06/15/1988 | EP0270617A1 Programmable logic array |
| 06/15/1988 | CN87202774U Dynamic monitor for engine and electric generator |
| 06/14/1988 | US4751721 Apparatus and method for testing contact interruptions of circuit interconnection devices |
| 06/14/1988 | US4751457 Integrated circuit probe parallelism establishing method and apparatus |
| 06/14/1988 | CA1238113A1 Cart and basket arrangement for testing printed circuit boards |
| 06/08/1988 | EP0269676A1 Universal programmable counter/timer and address register module |
| 06/07/1988 | US4749947 Grid-based, "cross-check" test structure for testing integrated circuits |
| 06/07/1988 | US4749944 Load detecting device for generator |
| 06/07/1988 | US4749356 Probe for in-circuit emulator |
| 06/07/1988 | US4749277 Methods of and apparatus for measuring the frequency response of optical detectors |
| 06/07/1988 | US4748843 Diagnostic system for a motor vehicle |
| 06/07/1988 | CA1237775A1 Method and apparatus for testing electronic equipment |
| 06/07/1988 | CA1237772A1 Nondestructive testing of multilayers ceramic capacitors |
| 06/02/1988 | WO1988004097A1 Fully programmable linear feedback shift register |
| 06/02/1988 | WO1988004056A1 Method and apparatus for locating leaks in a multiple layer geomembrane |
| 06/02/1988 | WO1988003291A3 Programmable logic array |
| 06/01/1988 | EP0269309A2 A circuit for determining frequency response |
| 06/01/1988 | EP0268789A2 Modular organized storage tester |
| 06/01/1988 | EP0136205B1 Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
| 06/01/1988 | EP0123586B1 Tri-state driver circuit for automatic test equipment |
| 06/01/1988 | CN87210221U Electricity testing pencil with opening blades on both ends |
| 05/31/1988 | US4748624 In a logic analyzer |
| 05/31/1988 | US4748407 Method and apparatus for measuring time dependent signals with a particle probe |
| 05/31/1988 | US4748403 Apparatus for measuring circuit element characteristics with VHF signal |
| 05/31/1988 | US4748402 Circuit identifier tester for telecommunication pairs |
| 05/31/1988 | US4748401 Method and apparatus for recognizing the polarity of polarized capacitors |
| 05/31/1988 | US4747784 For establishing an electrical connection |
| 05/31/1988 | CA1237534A1 Coplanar and stripline probe card apparatus |
| 05/31/1988 | CA1237476A1 Method and circuit for evaluating an analog voltage |
| 05/26/1988 | DE3738493A1 Fehlerortungseinrichtung Error locating device |
| 05/26/1988 | DE3249367C1 Method and device for checking microcomputer-controlled switching devices of control devices in motor vehicles |
| 05/25/1988 | EP0268506A1 Apparatus and method for generating test vectors, and method of testing an integrated circuit |
| 05/25/1988 | CN87208575U High voltage tester |
| 05/25/1988 | CN87206271U Mini relay joint tester |
| 05/25/1988 | CN86107714A Method of measuring the hysteresis loop of a ferroelectric by computer |
| 05/24/1988 | US4747102 Method of controlling a logical simulation at a high speed |
| 05/24/1988 | US4746991 Recording characteristic evaluation of a recording medium with a time sequence of test signals |
| 05/24/1988 | US4746869 Circuit for testing inductive coils |
| 05/24/1988 | US4746857 Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer |
| 05/24/1988 | US4746856 Semiconductor testing and apparatus therefor |
| 05/24/1988 | US4746855 Relay multiplexing for circuit testers |
| 05/19/1988 | WO1988003653A1 Wire tester |
| 05/19/1988 | DE3639242A1 Device for testing electronic modules |
| 05/19/1988 | DE3638341A1 Device for feeding electrical components into an automatic testing machine |
| 05/18/1988 | EP0267595A1 Power supply magnetic shunt for transmission line sensor module |
| 05/18/1988 | EP0267555A2 Spectrometer objective for a corpuscular beam measuring apparatus and method for examining samples. |
| 05/18/1988 | EP0267500A1 Method and device for the location of an earth fault in a conductor in a three-phase electrical power system |
| 05/18/1988 | EP0267271A1 In-system programmable logic device. |
| 05/18/1988 | EP0267262A1 Automated system and method for testing different equipment |
| 05/18/1988 | CN86106945A Coil winding-direction tester |
| 05/17/1988 | US4745630 Multi-mode counter network |
| 05/17/1988 | US4745362 Method and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring location |
| 05/17/1988 | US4745361 Electro-optic measurement (network analysis) system |
| 05/17/1988 | US4745360 Electron-beam probe system utilizing test device having interdigitated conductive pattern and associated method of using the test device |
| 05/17/1988 | US4745359 Method and apparatus for determining polarity of a capacitor |
| 05/17/1988 | US4745355 Weighted random pattern testing apparatus and method |
| 05/17/1988 | US4745354 Apparatus and methods for effecting a burn-in procedure on semiconductor devices |
| 05/17/1988 | CA1236929A1 Photon assisted tunneling testing of passivated integrated circuits |
| 05/17/1988 | CA1236918A1 Wafer level integration technique |
| 05/11/1988 | EP0266874A2 Programmable logic array |