Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1988
12/14/1988EP0295007A2 Film carrier, method for manufacturing a semiconductor device utilizing the same and an associated tester
12/14/1988EP0294939A2 Multiple lead probe for integrated circuits in wafer form
12/14/1988EP0294925A2 Coplanarity testing device for surface mounted components
12/14/1988EP0294817A2 Voltage detecting device
12/14/1988EP0294815A2 Voltage detecting device
12/14/1988EP0294759A2 Timing generator for producing a multiplicity of timing signals
12/14/1988EP0294593A1 Mechanical probe for the optical measurement of electrical signals
12/14/1988EP0294449A1 Computer-aided probe with tri-state circuitry test capability
12/14/1988CN88212404U Logic-signal finding testing pen
12/14/1988CN88212299U Metering device for parameter of constant voltage source type quartz crystal
12/14/1988CN87103973A Dc insulation monitoring method
12/13/1988US4791375 Apparatus for detecting degradation of an arrester
12/13/1988US4791364 Thermal fixture for testing integrated circuits
12/13/1988US4791359 Method of detecting possibly electrically-open connections between circuit nodes and pins connected to those nodes
12/13/1988US4791358 Integrated circuits, carriers therefor and testing apparatus and method for the foregoing
12/13/1988US4791357 Electronic Circuit board testing system and method
12/13/1988US4791356 In-circuit testing system
12/13/1988US4791351 Method and apparatus for rapidly testing passive components by reflectometry in the VHF range
12/13/1988US4791312 Programmable level shifting interface device
12/13/1988US4791288 Scanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrents
12/13/1988US4790438 Electrical component sequential testing apparatus
12/13/1988CA1246713A1 Fail-safe apparatus and method for reading switches
12/08/1988DE3814645A1 Verfahren und vorrichtung zum messen von feldstrom Method and device for measuring of field current
12/08/1988DE3718114A1 Verfahren zur feststellung der elektrischen laufzeit von signalstrecken Method for fixed position of the electrical signal term of stretch
12/07/1988EP0294259A2 Screening of gate oxides on semiconductors
12/07/1988EP0294162A2 Digital video probe
12/07/1988EP0294159A1 Branched sensor system
12/07/1988EP0293922A2 Voltage detector
12/07/1988EP0293788A1 Voltage detector
12/07/1988EP0293497A1 Arrangement of probes with a device for accurate positioning
12/07/1988EP0293380A1 Trouble finder
12/07/1988EP0113865B1 Semiconductor integrated circuit
12/06/1988US4789835 For supplying a signal after a time delay
12/06/1988US4789834 Method and apparatus for testing of induction motor overload protection device
12/06/1988US4789825 Integrated circuit with channel length indicator
12/06/1988US4789821 Test device for a combinatorial logic circuit and integrated circuit including such a device
12/06/1988CA1245901A1 Method and means for joining and sealing of material parts and use of such means in containers
12/01/1988WO1988009511A1 Process for determining the electrical duration of signal paths
12/01/1988WO1988009510A1 Process for determining the electrical duration of signal sections
12/01/1988WO1988009489A1 Test meters
12/01/1988DE3815041A1 Test adaptor device
11/1988
11/30/1988EP0293304A1 High-speed side access edge connector testing assembly
11/30/1988EP0293261A2 Digital in-circuit tester having channel-memory erase-preventer
11/30/1988EP0293260A2 Digital in-circuit tester having a channel-driver inhibitor
11/30/1988EP0292644A1 Method of programming a digital control device
11/30/1988CN88210176U Leakage current detector
11/30/1988CN87103474A Cable wire-distinguishing equipment
11/29/1988US4788683 Data processing system emulation with microprocessor in place
11/29/1988US4788622 Device for indicating the short-circuiting of a lightning arrester
11/29/1988US4788496 Adapter for a printed circuit board testing device
11/29/1988US4788495 Method for the indirect identification of the intensity distribution of particle beam pulses generated in a particle beam measuring instrument
11/29/1988US4788492 Logic analyzer
11/29/1988US4788446 Monitoring circuit for an electric or electronic module
11/29/1988US4787143 Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
11/29/1988CA1245773A1 Method of detecting a failure in the mounting condition of electronic parts of substrates
11/29/1988CA1245723A1 Acousto-optic system for testing high speed circuits
11/24/1988DE3715671A1 Device for testing and sorting electronic components, particularly chips with integrated circuits (ICs)
11/24/1988DE3714770A1 Method and arrangement for generating test data for a digital circuit
11/23/1988EP0292194A2 Method and apparatus for color identification
11/23/1988EP0292140A2 Photoreceptor
11/23/1988EP0292137A2 Integrated circuit transfer test device system
11/23/1988EP0292136A1 Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same
11/23/1988EP0292119A2 Floating crown for insertion-extraction head
11/23/1988EP0292116A2 Test system for vlsi circuits
11/23/1988EP0292035A1 A method and an apparatus for testing self-limiting electrical heating cables which are out of operation
11/23/1988EP0291581A2 Logic integrated circuit capable of simplifying a test
11/23/1988CN88201085U Super accurate megger with short circuit protector
11/23/1988CN88200639U Spread voltage measuring device for dc transmission line insulator
11/22/1988US4786876 For testing the insulation of a wire
11/22/1988US4786867 Wafer prober
11/22/1988US4786865 Method and apparatus for testing integrated circuit susceptibility to cosmic rays
11/22/1988US4786864 Photon assisted tunneling testing of passivated integrated circuits
11/22/1988CA1245368A1 Test probe for printed circuit boards or the like
11/17/1988WO1988009076A1 Current supply arrangement
11/17/1988WO1988004865A3 Digital-to-time converter
11/17/1988EP0291301A2 A user interface for a logic analyser
11/17/1988EP0291156A1 Earth fault check system
11/17/1988EP0291144A1 Burn-in board loader and unloader
11/17/1988EP0290589A1 Fully programmable linear feedback shift register
11/17/1988EP0290444A1 Apparatus and methods for effecting a burn-in procedure on semiconductor devices
11/17/1988DE3715014A1 Electrical device providing testing of a usable contact gap
11/17/1988DE3715013A1 Electrical device providing testing of the connections to an electrical facility
11/16/1988CN88102717A Nondestructive readout of latent electrostatic image formed on insulating material cross-reference to related applications
11/16/1988CN87205241U Electric leakage detector with digital display
11/15/1988US4785373 Electrostatic discharge simulator
11/15/1988US4785249 Method for measuring distance in digital distance relays
11/15/1988US4785235 Shorts testing technique reducing phantom shorts problems
11/15/1988US4785233 Method and apparatus for testing electrical equipent
11/15/1988US4785232 Contactless hall coefficient measurement apparatus and method for piezoelectric material
11/15/1988US4784213 Mixing valve air source
11/15/1988CA1244965A1 Built-in self-test system for vlsi circuit chips
11/15/1988CA1244963A1 Method of defining guards in operating automatic test equipment
11/15/1988CA1244883A1 Phase difference fault detector
11/10/1988DE3713963A1 Device for checking electrical cartridge-type heaters or the like
11/09/1988EP0290396A1 Power supply arrangement
11/09/1988EP0290276A2 Digital waveforms display
11/09/1988EP0290111A2 Digital data processing system
11/09/1988EP0290110A2 Digital data processing system
11/09/1988EP0290066A1 Test method for LCD elements
11/09/1988EP0289645A1 Infrared signaling system for detecting a predetermined condition of a high tension device
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