Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/1989
08/15/1989US4857830 Method for measuring insulation resistance of electric line
08/15/1989US4857827 Electronic load for testing transformers
08/15/1989US4857826 Tester system for electrical power circuits terminated at an outlet plug receptacle
08/15/1989US4857774 Testing apparatus and diagnostic method for use with programmable interconnect architecture
08/15/1989US4857773 Programming logic device with test-signal enabled output
08/15/1989US4857009 Fixture latching mechanism
08/15/1989CA1258491A1 Terminal test plug
08/10/1989WO1989007297A1 Microcomputer and a method of testing the same
08/10/1989DE3902161A1 Contacting device
08/09/1989EP0327512A1 Power supply gradually developing an output voltage when switched on
08/09/1989EP0327191A2 Resistive fault location means and device for use on electrical cables
08/09/1989EP0326858A1 Method and apparatus for displaying periodical signals using a laser probe
08/08/1989US4856002 Semiconductor integrated circuit apparatus
08/08/1989US4856001 Digital in-circuit tester having channel-memory earse-preventer
08/08/1989US4855969 Dynamic timing reference alignment system
08/08/1989US4855954 In-system programmable logic device with four dedicated terminals
08/08/1989US4855781 Camera with battery check circuit
08/08/1989US4855681 Timing generator for generating a multiplicty of timing signals having selectable pulse positions
08/08/1989US4855673 Electron beam apparatus
08/08/1989US4855672 Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same
08/08/1989US4855670 Method of providing information useful in identifying defects in electronic circuits
08/08/1989US4855669 System for scan testing of logic circuit networks
08/08/1989US4855253 Test method for random defects in electronic microstructures
08/08/1989US4854710 Method and apparatus for evaluating surface and subsurface features in a semiconductor
08/08/1989US4854165 Apparatus for testing electrical components
08/03/1989DE3802841A1 Method for characterising optical properties of semiconductor lasers, and device for carrying out the method
08/03/1989DE3802661A1 Programming and testing device
08/02/1989EP0326098A1 Testing device comprising a contacting device and at least one test specimen
08/02/1989EP0325670A1 Binary signal state change detector circuit
08/02/1989CN2042205U Dual-purpose automatic/manual transistor tester
08/02/1989CN2042202U Inspecting stick for broken rail and electrical connection
08/01/1989US4853929 Electronic circuit device able to diagnose status-holding circuits by scanning
08/01/1989US4853928 Automatic test generator for logic devices
08/01/1989US4853628 Apparatus for measuring circuit parameters of a packaged semiconductor device
08/01/1989US4853622 Method and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring location
08/01/1989US4853605 Load state detecting apparatus of an induction motor for controlling the spin dryer of a washing machine
08/01/1989CA1258098A1 Apparatus for data transmission from multiple sources on a single channel
08/01/1989CA1258094C Apparatus for measuring the potential of a transmission line conductor
07/1989
07/27/1989WO1989006868A1 System and method for depassivating a passivated lithium battery in a battery powered microprocessor control device
07/27/1989WO1989006839A1 Interchangeable diagnostic instrument system
07/27/1989WO1989006805A1 Device for injecting an electromagnetic signal into an electric lead
07/27/1989DE3801220A1 Multi-stage binary counter equipped for test runs
07/27/1989DE3800851A1 Arrangement for testing devices
07/27/1989DE3800774A1 Verfahren und einrichtung zur erzeugung eines signals fuer die umschaltung eines schalt- oder logikelements einer elektronischen schaltung Method and device for the generation of a signal for the changeover of a switchable or logic elements of an electronic circuit
07/27/1989DE3800553A1 Short-circuit protection for current-source inverters
07/26/1989EP0325514A2 Lead detection for cut and clinch process
07/26/1989EP0325453A2 Noninvasive method for characterization of semiconductors
07/26/1989EP0325355A1 Inspection of multipattern circuit boards
07/26/1989EP0325269A1 Conductive pattern for electric test of semiconductor chips
07/26/1989EP0324746A1 Process and device for automatically detecting the response voltage of an electromagnetic component, in particular an electrovalve
07/26/1989CN2041820U Multifanction relay check table
07/26/1989CN1034275A Analysing and testing system for transistors' noise components
07/25/1989US4852174 System and method for the identification of phase conductors
07/25/1989US4852096 CN2 test pattern generator
07/25/1989US4852094 Dual path switch gate array
07/25/1989US4851902 Auatomatic inspection system for IC lead frames and visual inspection method thereof
07/25/1989US4851782 High impedance fault analyzer in electric power distribution
07/25/1989US4851769 Non-destructive tester for transistors
07/25/1989US4851768 Characteristic test apparatus for electronic device and method for using the same
07/25/1989US4851767 Detachable high-speed opto-electronic sampling probe
07/25/1989US4851766 Fault diagnosis system for rotor winding of rotary electric machine
07/25/1989US4851765 Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid
07/25/1989US4851764 High temperature environmental testing apparatus for a semiconductor device having an improved holding device and operation method of the same
07/25/1989US4851761 Method for measuring insulation resistance of electric line
07/25/1989US4850882 Rotatably mounted printed circuit board test support and connector
07/25/1989US4850104 System for configuring, automating and controlling operations performed on PCBS and other products
07/25/1989CA1257907A1 Electrical apparatus
07/25/1989CA1257906A1 Electrical continuity testing
07/20/1989DE3800544A1 A digital meter and test device having temporally variable input and output of digital signals
07/20/1989DE3800273A1 Battery cell voltage measuring system
07/20/1989DE3800147A1 Fast procedure to determine the most probable hypothesis on the basis of given features
07/20/1989DE3744524A1 Verfahren und einrichtung zur ueberpruefung einer kapazitaet Method and apparatus for checking a capacity
07/19/1989EP0324600A1 Method and apparatus for guiding a user during setup of a signal measurement system
07/19/1989EP0324318A1 Device to verify that an apparatus or a circuit is connected to an electric distribution network
07/19/1989EP0324146A1 Method and apparatus for the determination of the armature resistance of an induction machine
07/19/1989EP0324134A2 Method and apparatus for measuring jitter in a periodic signal
07/19/1989EP0324110A2 Electrical signal sampling probe apparatus
07/19/1989EP0324012A1 Shorted-coaxial-cable detector for local-area networks.
07/19/1989CN2041429U Combined meter for electrician in automobile maintenance
07/18/1989US4849973 Test system for random access memory
07/18/1989US4849702 Test period generator for automatic test equipment
07/18/1989US4849701 Method of testing the function of load resistors connected in parallel
07/18/1989US4849700 Device for detecting residual capacity of battery
07/18/1989US4849691 Apparatus and method for isolating and connecting two electrical circuits
07/18/1989US4849690 Detection of transposition group short circuits in machine windings
07/18/1989US4849686 Method of and arrangement for accurately measuring low capacitances
07/18/1989US4849681 Battery-powered device
07/18/1989US4848090 Apparatus for controlling the temperature of an integrated circuit package
07/13/1989WO1989006366A1 Process and device for verifying a capacitance
07/13/1989WO1989006351A1 Dc motor operated valve remote monitoring system
07/13/1989DE3744615A1 Method and device for the fault location of short circuits and earth leaks in high- and medium-voltage networks
07/13/1989DE3744564A1 Data format converter, and test device which uses groups of such converters for testing devices
07/12/1989EP0323643A2 Semiconductor integrated circuit with a circuit limiting an input voltage to a predetermined voltage
07/12/1989EP0323539A1 Method for determining the state-of-charge of batteries, particularly lithium batteries
07/12/1989CN2041047U Multifunction electroprobe
07/12/1989CN1033881A Diagnostic face cover
07/12/1989CN1033880A Fault detection
07/11/1989US4847838 Circuit for testing the bus structure of a printed wiring card
07/11/1989US4847800 Input register for test operand generation
07/11/1989US4847795 System for diagnosing defects in electronic assemblies