Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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12/05/1987 | CN86210102U Microcomputerized battery internal resistance tester |
12/05/1987 | CN86209694U Megohm/voltage meter |
12/05/1987 | CN86203004U Led circuit test pen |
12/03/1987 | WO1987007388A1 Process for checking load resistor circuits |
12/03/1987 | DE3618365A1 Device for testing DC electrical connections and the rotating field direction |
12/03/1987 | DE3617741A1 Handling device |
12/02/1987 | EP0247994A2 Method and device for establishing the standstill of an electric motor |
12/02/1987 | EP0247927A1 Apparatus and method for high temperature environmental testing of a semiconductor device |
12/02/1987 | EP0247809A2 Programmable logic device |
12/02/1987 | EP0247651A1 Electron-beam probe system utilizing test device having interdigitated conductive pattern and associated method of using the test device |
12/02/1987 | EP0247544A1 A monitoring device for overhead power transmission system |
12/02/1987 | EP0247502A1 Programmable logic array |
12/02/1987 | EP0247308A2 Method for automated optical inspection of printed circuits |
12/02/1987 | EP0247141A1 System for testing and repairing printed circuit boards. |
12/02/1987 | CN87200862U Indicator lamp for displaying electric source polarity |
12/01/1987 | US4710933 Parallel/serial scan system for testing logic circuits |
12/01/1987 | US4710932 Method of and apparatus for fault detection in digital circuits by comparison of test signals applied to a test circuit and a faultless reference circuit |
12/01/1987 | US4710931 Partitioned scan-testing system |
12/01/1987 | US4710930 Method and apparatus for diagnosing a LSI chip |
12/01/1987 | US4710927 Diagnostic circuit |
12/01/1987 | US4710751 Ground fault monitor circuit |
12/01/1987 | US4710720 Arrangement for testing fuses |
12/01/1987 | US4710707 High voltage electronic component test apparatus |
12/01/1987 | US4710705 Noise removal circuit for use in a partial discharge measuring device of a high voltage apparatus |
12/01/1987 | US4710704 Connected to receive a reference voltage |
11/26/1987 | DE3617452A1 Method for monitoring an asynchronous machine |
11/26/1987 | DE3617271A1 Method and device for testing the correct arrangement of an integrated circuit in a holder |
11/26/1987 | DE3616975A1 Verfahren zur ueberpruefung von lastwiederstandskreisen Process for Review of load again stood circuits |
11/25/1987 | EP0246544A1 Device for the EMI testing of electronic equipments |
11/25/1987 | EP0246433A1 Current attenuator useful in a very low leakage current measuring device |
11/25/1987 | CN87203638U Multifunction equipment for checking electric appliances |
11/25/1987 | CN87103529A Device for indicating charge status of battery |
11/25/1987 | CN87102776A Instrument with electronic brain for mechanical property of asynchronous motor |
11/24/1987 | US4709386 Subscriber line monitoring circuit |
11/24/1987 | US4709366 Computer assisted fault isolation in circuit board testing |
11/24/1987 | US4709341 Self-monitoring system for detecting error at output port during cold start of microprocessor system |
11/24/1987 | US4709202 Battery powered system |
11/24/1987 | US4708484 Projection alignment method and apparatus |
11/19/1987 | WO1987007071A1 In-system programmable logic device |
11/19/1987 | WO1987007055A1 Automated test apparatus for use with multiple equipment |
11/19/1987 | WO1987007054A1 Universal programmable counter/timer and address register module |
11/19/1987 | WO1987007028A2 High speed laser probe |
11/19/1987 | EP0246034A2 Method of testing electronic assemblies while they are being produced |
11/19/1987 | EP0245915A2 Logic signal state and timing display |
11/19/1987 | EP0245591A2 Method and apparatus for transferring information into electronic systems |
11/19/1987 | EP0245563A1 Optico-electronic level detector with double pick-up elements |
11/19/1987 | EP0245463A1 Built-in self-test system for vlsi circuit chips |
11/19/1987 | EP0130982B1 Diagnostic display apparatus |
11/19/1987 | DE3616506A1 Method and device for monitoring electrical loads |
11/17/1987 | US4707834 Computer-based instrument system |
11/17/1987 | US4707795 Battery testing and monitoring system |
11/17/1987 | US4707686 Over temperature sensing system for power cables |
11/17/1987 | US4707657 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine |
11/17/1987 | US4707656 Circuit test fixture |
11/17/1987 | US4707654 Integrated circuit having input and output terminals for testing |
11/17/1987 | US4707620 Adjustable impedance driver network |
11/17/1987 | CA1229425A1 Contact array assembly for a computer-controlled printed circuit board testing apparatus |
11/17/1987 | CA1229384A1 Test circuit for differential cascode voltage switch |
11/12/1987 | DE3249770C2 Device for testing electrical circuit boards |
11/11/1987 | EP0245115A1 Method of and apparatus for testing semiconductor devices |
11/11/1987 | EP0244926A2 Register and stack monitoring logic analyzer |
11/11/1987 | CN86210870U Dc electroscope mounded in screw assemblage |
11/10/1987 | US4706208 Technique for the operational life test of microprocessors |
11/10/1987 | US4706186 Integrated circuit devices |
11/10/1987 | US4706157 Semiconductor intergrated circuit |
11/10/1987 | US4706019 Electron beam test probe system for analyzing integrated circuits |
11/10/1987 | US4706018 Noncontact dynamic tester for integrated circuits |
11/10/1987 | US4706015 Method and circuit for reducing contact resistance of the potential probes of a four-point-probe in contact with a III-V compound semiconductor wafer |
11/10/1987 | US4705954 Method and apparatus for automatically positioning a particle beam |
11/10/1987 | US4705447 Electronic test head positioner for test systems |
11/10/1987 | US4705329 Apparatus for electrical function checking of wiring matrices |
11/10/1987 | US4704906 Dynamic air gap measuring device for use with rotating electrical machinery |
11/10/1987 | US4704872 Thermally controlled T/R module test apparatus |
11/09/1987 | EP0217812A4 Injector driver fault detect and protection device. |
11/04/1987 | EP0244259A1 Method of detecting the presence or absence of defect of transparent circuit board having fine transparent electric conductive circuit |
11/04/1987 | EP0244053A2 Dual channel time domain reflectometer |
11/04/1987 | EP0243812A1 Test circuit |
11/04/1987 | EP0243705A1 A connecting device for easily locating a short circuit between two terminals of a printed circuit |
11/04/1987 | EP0081966B1 Scan-out circuitry |
11/04/1987 | CN87200720U Phase sequence monitor of three-phase supply |
11/04/1987 | CN87200381U Multifunction test pencil |
11/04/1987 | CN86100560A Defect monitor for capacitive storage circuit |
11/03/1987 | US4704599 Auxiliary power connector and communication channel control circuit |
11/03/1987 | US4704576 Microwave measuring and apparatus for contactless non-destructive testing of photosensitive materials |
11/03/1987 | US4704551 Low voltage/high voltage field effect transistor (FET) switching circuit for printed circuit board tester |
10/31/1987 | CN86210921U Withstand voltage testing apparatus for cable shielding layer |
10/31/1987 | CN86210714U Seven-functional test pencil |
10/31/1987 | CN86210125U Colour changing test pencil |
10/31/1987 | CN86207465U Multi-functional portable leak detector |
10/29/1987 | DE3614080A1 Demodulator |
10/29/1987 | DE3613896A1 Device and method for input and output of binary data, particularly test data of digital test items |
10/28/1987 | EP0243045A1 Apparatus for testing semiconductor devices |
10/28/1987 | EP0243021A1 Impedance matching means |
10/28/1987 | EP0242779A1 Device to identify the disconnection of an electric apparatus from the electric mains |
10/28/1987 | EP0242707A1 Test circuit |
10/28/1987 | EP0242700A2 AC level calibration method and apparatus |
10/27/1987 | US4703484 Programmable integrated circuit fault detection apparatus |
10/27/1987 | US4703483 Chip on chip type integrated circuit device |
10/27/1987 | US4703436 Wafer level integration technique |
10/27/1987 | US4703410 Power failure indicator |