Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/1989
09/12/1989US4866471 Battery check device for camera
09/12/1989US4866393 Method of diagnosing the deterioration of a zinc oxide type lightning arrester utilizing vector synthesis
09/12/1989US4866392 Testing device for voltage testing of cables and cable sets
09/12/1989US4866390 Vehicle light testing system for testing a plurality of lights using a scanning sequence
09/12/1989US4866366 Negative feedback power supply apparatus
09/12/1989US4865554 Socket for the use of an electric part
09/12/1989CA1259375A1 Method of checking channel connections and detecting heater circuit and temperature sensor malfunctions in multi-channel closed loop hot melt heating systems
09/08/1989WO1989008297A1 Test programme generation assisting means for digital circuits
09/08/1989WO1989008266A2 Measurement of the variation in time of a periodic signal
09/08/1989WO1989008265A1 Device for testing printed circuit boards
09/07/1989DE3806238A1 Device for the highly accurate technical determination of the radio-frequency properties of microstrip circuit components, and arrangements for calibrating the device
09/07/1989DE3805800A1 Arrangement for measuring the current loading of MIS structures in the production and assembly of components containing MIS structures, and measuring methods
09/07/1989DE3805757A1 Device for testing line networks for continuity
09/07/1989DE3805756A1 Device for testing line networks for continuity
09/07/1989DE3805733A1 Test generator
09/06/1989EP0331614A1 Adapter for a device to test printed circuits
09/06/1989EP0331548A1 Checking method and apparatus for ultrasonic transducers
09/06/1989EP0331282A1 Membrane-based IC test probe with precisely positioned contacts
09/06/1989EP0330841A2 Logic circuit with a test function
09/06/1989CN2044075U Cable matching device
09/05/1989US4864579 Semiconductor integrated circuit device
09/05/1989US4864570 Processing pulse control circuit for use in device performing signature analysis of digital circuits
09/05/1989US4864286 Switch operation monitoring apparatus
09/05/1989US4864285 Method and apparatus for testing contacts to determine if opened or closed
09/05/1989US4864242 Automatic field winding ground detector and locator
09/05/1989US4864229 Method and apparatus for testing chemical and ionic sensors
09/05/1989US4864228 Electron beam test probe for integrated circuit testing
09/05/1989US4864227 Wafer prober
09/05/1989US4864225 Coaxial cable tracer and tester
09/05/1989US4864220 Voltage detector using electro-optic material and interference of light beams
09/05/1989US4864219 Method and apparatus for verifying proper placement of integrated circuits on circuit boards
09/05/1989US4864203 Diagnostic apparatus
09/05/1989US4864160 Timing signal generator
08/1989
08/30/1989EP0329838A2 Method for profiling wafers and for locating dies thereon
08/30/1989EP0329798A1 Formatter circuit
08/30/1989EP0329702A1 Programmable logic array
08/30/1989CN2043763U Microcomputerized measuring apparatus for digital integrated circuit features
08/30/1989CN2043761U Test pencil
08/30/1989CN1035179A Core monitor that uses rotor shaft voltage
08/29/1989US4862510 Lead sense system for component insertion machine
08/29/1989US4862491 Remote disconnection and short-circuiting apparatus and method
08/29/1989US4862460 Test pattern generator
08/29/1989US4862458 Multiplexed built in test equipment
08/29/1989US4862399 Method for generating efficient testsets for a class of digital circuits
08/29/1989US4862371 Fault diagnosis system for electronic devices on automobiles
08/29/1989US4862142 Circuit with memory for detecting intermittent changes in resistance, current, voltage, continuity, power interruption, light, and temperature
08/29/1989US4862094 Stroboscopic light circuit diagnostic system
08/29/1989US4862093 Method and an arrangement for the detection of ionizing current in the ignition system of an internal combustion engine including engine start sequence detection
08/29/1989US4862091 Circuit arrangement for testing the connecting lines of a switch or sensor
08/29/1989US4862088 Remote locating of a structure and remote measurement of conditions therein
08/29/1989US4862075 High frequency test head using electro-optics
08/29/1989US4862072 Distributed access serial port test arrangement for integrated circuits
08/29/1989US4862071 High speed circuit testing apparatus having plural test conditions
08/29/1989US4862070 Apparatus for testing input pin leakage current of a device under test
08/29/1989US4862069 Method of in-circuit testing
08/29/1989US4862068 LSI logic circuit
08/29/1989US4862067 Method and apparatus for in-circuit testing of electronic devices
08/29/1989US4861685 Portable rechargeable battery
08/29/1989CA1258929A1 Method of and system for accumulating verifiable energy demand date from remote electricity meters
08/29/1989CA1258883A1 Probe body for an electrical measurement system
08/24/1989WO1989007852A1 A monitoring system
08/23/1989EP0328869A2 Electron beam testing of electronic components
08/23/1989CN2043363U Microcomputer controlled relay-autodetector
08/23/1989CN1035001A Measuring equipment for time constant of electric motors
08/22/1989US4860325 Counter tester
08/22/1989US4860291 Test vector definition system employing template concept
08/22/1989US4860290 Logic circuit having individually testable logic modules
08/22/1989US4860288 Clock monitor for use with VLSI chips
08/22/1989US4860236 Cellular automaton for generating random data
08/22/1989US4860227 Circuit for measuring characteristics of a device under test
08/22/1989US4860079 Screening of gate oxides on semiconductors
08/22/1989US4859992 Electrostatic system monitor and method therefor
08/22/1989US4859989 Security system and signal carrying member thereof
08/22/1989US4859953 Modular test assembly for wiring harnesses
08/22/1989US4859952 Apparatus and method for testing impedances of interconnect devices
08/22/1989US4859939 Non-destructive testing of SOS wafers using surface photovoltage measurements
08/22/1989US4859938 Novel technique to detect oxydonor generation in IC fabrication
08/22/1989US4859933 Narrowband signal recognition for EMI measurement
08/22/1989US4859932 Multi-function tester
08/22/1989US4859189 Multipurpose socket
08/22/1989US4858479 Methods and means for use in examining the quality of plated-through holes in circuit boards
08/22/1989US4858467 Gauger for cars
08/17/1989DE3803336A1 Method for monitoring the temperature of annealing processes in semiconductor technology
08/16/1989EP0328109A1 High voltage generator
08/16/1989EP0327692A1 Operating indicator for circuit breakers
08/16/1989CN1034812A Measuring instrument for high-voltage switch parameter
08/15/1989US4858208 Apparatus and method for testing semiconductor devices
08/15/1989US4858142 Digitizer effective resolution measurement system using sinewave parameter estimation
08/15/1989US4858072 Interconnection system for integrated circuit chips
08/15/1989US4858057 Multiphase tripping device with short-circuit detection
08/15/1989US4857944 Recalibration system for LED array
08/15/1989US4857857 Electrode catheter testing device
08/15/1989US4857856 Transformer testing
08/15/1989US4857855 Method for compensating for phase of insulation resistance measuring circuit
08/15/1989US4857854 Digital fault locator
08/15/1989US4857839 Method and apparatus for measuring average resistivity and hall-effect of semiconductor wafers
08/15/1989US4857836 Mechanical probe for optical measurement of electrical signals
08/15/1989US4857835 Global event qualification system
08/15/1989US4857834 Semiconductor integrated circuit
08/15/1989US4857833 Diagnosis of faults on circuit board
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