Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1988
11/09/1988CN88211020U Multi functional electricity testing pen with large measurement range
11/09/1988CN88103019A Programmable tester with bubble memory
11/09/1988CN88102316A Test method for lcd elements
11/08/1988US4783785 Method and apparatus for diagnosis of logical circuits
11/08/1988US4783719 Test connector for electrical devices
11/08/1988US4783631 Apparatus for detecting disconnection of a speed sensor and eliminating oxide film from the sensor's connectors
11/08/1988CA1244557A1 Apparatus for electronically testing printed circuit boards and the like
11/03/1988WO1988008542A1 Programmable tester with bubble memory
11/03/1988DE3812654A1 Vorrichtung zum pruefen von schaltungsplatinen Apparatus for testing circuit circuit boards
11/03/1988DE3713593A1 Circuit arrangement and measuring method for determining the behaviour of electronic circuits when the supply voltage is disturbed
11/02/1988EP0289377A1 Real-time measuring appliance for the sensitivity and/or linearity of an optical receiver
11/02/1988EP0289158A2 Diagnostic apparatus for a data processing system
11/02/1988EP0289145A2 Self-learn method for circuit tester
11/02/1988EP0288804A2 A semiconductor defect monitor
11/02/1988EP0288801A2 Probe card apparatus and method of providing same with reconfigurable probe card circuitry
11/02/1988EP0220233A4 Target keys for wafer probe alignment.
11/02/1988CN87216917U Induction-type in situ qualitative break wire detector
11/02/1988CN87205537U Batteries voltage automatic testing instrument by microcomputer
11/01/1988US4782488 Digital signal scrambler
11/01/1988US4782300 Differential transceiver with line integrity detection
11/01/1988US4782299 Methods of arc and corona monitoring for high voltage generators
11/01/1988US4782291 Method and apparatus for the testing of active or passive electrical devices in a sub-zero environment
11/01/1988US4782290 Apparatus for measuring characteristics or electronic devices
11/01/1988US4782283 Apparatus for scan testing CMOS integrated systems
11/01/1988US4781494 Air-assist accumulating and transfer unit for an electronic device test handler
11/01/1988US4780956 Floating crown for insertion-extraction head
11/01/1988CA1244165A1 Subscriber line monitoring circuit
11/01/1988CA1244088A1 Fault simulation for differential cascode voltage switches
11/01/1988CA1244084A1 Portable tester and related method for determining the primary winding to secondary winding current ratio of an in-service current transformer
11/01/1988CA1244080A1 Storage battery control device
10/1988
10/26/1988EP0288333A1 Process and appliance for monitoring a magnetic variable-reluctance sensor, and their use in motor vehicle electronics
10/26/1988EP0287919A1 Monitoring circuitry for the detection of current interruptions in a circuit
10/26/1988CN88102071A Action monitor of switchgears
10/25/1988US4780910 Display for a remote receiver in an electrical utility load management system
10/25/1988US4780874 Diagnostic apparatus for a data processing system
10/25/1988US4780669 Method and arrangement for evaluating a test voltage by means of a bandwidth-limited evaluation circuit
10/25/1988US4780666 Semiconductor integrated circuit device having rest function
10/25/1988US4780628 Testing programmable logic arrays
10/25/1988US4780627 Testing programmable logic arrays
10/25/1988US4779446 Oxygen monitor
10/25/1988CA1243735A1 Circuitry for synchronizing a multiple channel circuit tester
10/20/1988WO1988008138A1 Identity insert for electronic modules
10/20/1988WO1988006294A3 Detector-viewer
10/20/1988DE3810239A1 Multifunction tester for fault diagnosis
10/20/1988DE3711593A1 Burn-out unit for locating cable faults
10/19/1988EP0287369A2 Remote disconnection and shortcircuiting apparatus
10/19/1988EP0287303A2 Scan test apparatus for digital systems having dynamic random access memory
10/19/1988EP0287302A2 Cross-coupled checking circuit
10/19/1988EP0286920A2 Method and apparatus for high accuracy measurement of VLSI components
10/19/1988EP0286879A1 Integrated-circuit arrangement for controlling an integrated oscillator
10/19/1988EP0286814A2 Addressing device
10/19/1988EP0286711A1 Sling for lifting loads
10/19/1988EP0286672A1 Memory for storing response patterns in an automatic testing instrument
10/19/1988EP0286660A1 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer.
10/19/1988EP0286648A1 System for diagnosing anomalies or breakdowns in a plurality of types of electronic control systems installed in motor vehicles.
10/19/1988CN88212141U Multifunctional tester on line
10/19/1988CN88101705A System and method for identifying phase conductor
10/19/1988CN86108787A Monitory circuit for electricity leakage
10/18/1988US4779273 Apparatus for self-testing a digital logic circuit
10/18/1988US4779221 Timing signal generator
10/18/1988US4779052 Multiconductor telephone cable test apparatus
10/18/1988US4779051 Coupling unit for the operative monitoring of the high-voltage wingings and the connected output leads in electric high-voltage machines and apparatus, by means of partial discharge determination and breakdown spark measurement
10/18/1988US4779050 Circuit arrangement for judging the lifetime of a battery in a no-break power supply system
10/18/1988US4779047 Burn-in apparatus for integrated circuits mounted on a carrier tape
10/18/1988US4779046 Electron beam integrated circuit tester
10/18/1988US4779043 Reversed IC test device and method
10/18/1988US4779042 Computer-aided probe with tri-state circuitry test capability
10/18/1988US4779041 Integrated circuit transfer test device system
10/18/1988US4779040 Method and apparatus for recognizing the polarity of polarized capacitors
10/18/1988CA1243418A1 Method and apparatus for optically determining defects in a semiconductor material
10/18/1988CA1243355A1 Probe having low battery detection/transmission feature
10/18/1988CA1243353A1 Data capture logic for vlsi chips
10/13/1988DE3737373A1 Method and circuit arrangement for the insulation testing of test pieces with large intrinsic capacitance and for the localisation of faults in power cables
10/13/1988DE3707171A1 Method for locating intermittent faults on power cables
10/12/1988EP0285896A2 Method for testing wire networks
10/12/1988EP0285799A2 Device for the functional electric testing of wiring arrays, in particular of circuit boards
10/12/1988EP0285798A2 Device for the functional electric testing of wiring arrays, in particular of circuit boards
10/12/1988CN87217214U Electronic pen for writing
10/12/1988CN87102003A Electronic acoustooptic test pencil
10/11/1988US4777616 Increased resolution logic analyzer using asynchronous sampling
10/11/1988US4777554 Method and apparatus for detecting charger abnormality
10/11/1988US4777446 Machine for the automatic testing of electric motor rotors
10/11/1988US4777445 Device for testing of cables provided with plugs
10/11/1988US4777434 Thermally testing microelectronic circuit comcponents
10/11/1988US4777432 Device for electrically checking printed circuit boards
10/11/1988US4777430 Circuit for determining the effective series resistance and Q-factor of capacitors
10/11/1988US4777429 Test arrangement
10/11/1988US4777364 Defect detection and thickness mapping of the passivation layer(s) of integrated circuits
10/11/1988US4777146 Fabrication process involving semi-insulating material
10/11/1988US4776747 High speed integrated circuit handler
10/11/1988US4776277 Method and arrangement for implementing an operational test on electrically-actuatable ignition circuits for ammunition
10/06/1988EP0276305A4 Apparatus and method for measuring battery condition.
10/05/1988EP0285320A1 Apparatus and method for determining the values of circuit elements in a three terminal equivalent circuit
10/05/1988EP0284862A1 Integrated circuit and process and apparatus for testing it
10/05/1988EP0284711A2 Device to measure the coil temperature of a direct-current motor without brushes
10/04/1988USH536 Method of detecting and locating an electrostatic discharge event
10/04/1988US4776022 System for printed circuit board defect detection
10/04/1988US4775977 Pattern generating apparatus
10/04/1988US4775954 Apparatus for generating timing signals used for testing ICs having two enable input terminals
10/04/1988US4775950 Logic simulation system