G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1987
10/27/1987	US4703306 Appliance system
10/27/1987	US4703260 Full chip integrated circuit tester
10/27/1987	US4703257 Logic circuit having a test data scan circuit
10/27/1987	US4703252 Apparatus and methods for resistivity testing
10/27/1987	US4702564 Electroconductive pattern and liquid crystal on substrate
10/27/1987	US4702563 Battery tester including textile substrate
10/27/1987	US4702553 Fiber-optical sensor for detecting electric arc-discharges
10/21/1987	EP0242255A2 Circuit testing system
10/21/1987	EP0242131A2 Graphical system for modelling a process and associated method
10/21/1987	EP0242107A2 Dynamic air gap measuring device for use with rotating electrical machinery
10/21/1987	EP0241903A2 Ground fault detector for high-voltage DC power supplies
10/21/1987	EP0241853A2 Apparatus for detecting abnormality of primary current for vector control
10/21/1987	EP0241843A2 High-pressure mixing equipment for two or more reactive plastic components
10/21/1987	EP0241764A1 Process and devices for detecting and localizing damages in electrical installations
10/21/1987	CN87102809A Device for detecting abnormal phenomenon of primary current in vector control
10/21/1987	CN86101321A Technical embodiment for a test equipment of solar cells using short pulse
10/20/1987	US4701922 Integrated circuit device
10/20/1987	US4701921 Modularized scan path for serially tested logic circuit
10/20/1987	US4701920 Built-in self-test system for VLSI circuit chips
10/20/1987	US4701919 Semiconductor device incorporating memory test pattern generating circuit
10/20/1987	US4701918 Logic analyzer
10/20/1987	US4701917 For exchanging test data with a plurality of registers
10/20/1987	US4701916 Digital integrated circuit with multi-mode register
10/20/1987	US4701870 Integrated circuit device testable by an external computer system
10/20/1987	US4701867 Electrical testing device for a vehicle combination instrument
10/20/1987	US4701781 Pre-testable semiconductor die package
10/20/1987	US4701779 Isolation diffusion process monitor
10/20/1987	US4701703 Bed-of-pins test fixture
10/20/1987	US4701701 Apparatus for measuring characteristics of circuit elements
10/20/1987	US4701700 Captivated, pre-loaded spring means for vacuum displaced circuit board testing
10/20/1987	US4701696 Retargetable buffer probe
10/20/1987	US4701628 Circuit for supervising contact for passenger protective device
10/14/1987	EP0241416A1 Process for the localization of a fault on at least one conductor of an electric cable, and apparatus for carrying out this process
10/14/1987	EP0241270A1 Self-testing monitoring circuit
10/14/1987	EP0241262A2 Acoustic monitor for rotary electrical machinery
10/14/1987	EP0241142A1 Probe body for an electrical measurement system
10/14/1987	EP0240932A1 X-Ray imaging system calibration and apparatus
10/14/1987	EP0240883A2 Method for obtaining a deep discharge protection for a rechargeable battery, and circuit arrangement to perform the method
10/14/1987	EP0240875A1 Testing device for measuring the contact resistance of an electrical connector between an energy source and an electrical apparatus
10/14/1987	EP0240783A1 Event counter for an overvoltage arrester
10/14/1987	EP0240780A2 Mixing valve air source
10/14/1987	EP0240719A2 Shift register latch arrangement for enhanced testability in differential cascode voltage switch circuit
10/14/1987	EP0240684A1 Arrangement for the managerial electronic processing of operational data of an electric motor
10/14/1987	EP0240669A2 Hybrid relay controller/driver in a signal distribution system
10/14/1987	EP0240668A2 A method for designation/sorting semiconductors wafers according to predicted oxygen precipitation behaviour
10/14/1987	EP0240617A1 Power failure indicator
10/14/1987	EP0240578A1 Arrangement and method for external test access to the chip-internal functional memory elements of large-scale integrated logical circuits
10/14/1987	EP0240519A1 Testing apparatus
10/13/1987	US4700225 Method and apparatus for testing pattern of a printed circuit board
10/13/1987	US4700132 Integrated circuit test site
10/13/1987	US4700126 Vehicular lamp circuit tester
10/13/1987	CA1228176A1 Electronic device measurement apparatus
10/13/1987	CA1228165A1 Integrated circuit device testable by an external computer
10/13/1987	CA1228164A1 Integrated circuit devices
10/07/1987	EP0240199A2 In-line scan control apparatus for data processor testing
10/07/1987	EP0239929A2 Integrated interface circuit for analogous-digital circuits
10/07/1987	EP0239922A2 Input voltage signal check circuit for a semiconductor integrated circuit
10/07/1987	EP0239731A2 Differential transceiver with line integrity detection
10/07/1987	EP0239725A2 Cable protection device and electrical cable therefor
10/07/1987	EP0239678A1 Process and apparatus for the detection and localization of localized overheating in fluid-cooled electric windings of electric machinery
10/07/1987	CN87100833A Method of measuring impedance, especially low-voltage capacity impedance
10/07/1987	CN86208729U Electric test pencil with music indication
10/06/1987	US4698830 Shift register latch arrangement for enhanced testability in differential cascode voltage switch circuit
10/06/1987	US4698756 Generator stator winding diagnostic system
10/06/1987	US4698589 Test circuitry for testing fuse link programmable memory devices
10/06/1987	US4698588 Transparent shift register latch for isolating peripheral ports during scan testing of a logic circuit
10/06/1987	US4698587 Method of characterizing critical timing paths and analyzing timing related failure modes in very large scale integrated circuits
10/06/1987	US4698585 Apparatus for identifying the connection position of a wire having two modes of operation
10/06/1987	US4698583 Method of monitoring a heater for faults
10/06/1987	US4697461 Method and apparatus for verifying the seismic integrity of an electronic component
10/03/1987	CN86206526U Test pencil with writing function
09/1987
09/30/1987	EP0239268A2 Fault point locating method, fault point resistance measuring method, and impedance to fault point measuring method, and apparatus therefor
09/30/1987	EP0239251A2 Method and apparatus for monitoring electromagnetic emission levels
09/30/1987	EP0238819A2 Terminal test plug
09/30/1987	CN87102192A Digital type apparatus for checking up lines
09/30/1987	CN86206053U Pencil type high/low voltage level tester with h or l display
09/29/1987	US4697279 Test/master/slave triple latch flip-flop
09/29/1987	US4697267 Scan control apparatus and method for data processing apparatus
09/29/1987	US4697234 Data processing module with serial test data paths
09/29/1987	US4697182 Method of and system for accumulating verifiable energy demand data from remote electricity meters
09/29/1987	US4697181 System for accumulating verifiable energy demand data from remote electricity meters
09/29/1987	US4697180 System for accumulating verifiable energy demand data from remote electricity meters
09/29/1987	US4697169 Device for detecting and localizing a fault in an aerial rope-way transport installation
09/29/1987	US4697151 Method and apparatus for testing operational amplifier leakage current
09/29/1987	US4697143 Wafer probe
09/29/1987	US4697142 Printed circuit conductor test system
09/29/1987	US4697141 Testing of RF diode phase shifters
09/29/1987	US4697140 Semiconductor integrated circuit having a test circuit for testing an internal circuit
09/29/1987	US4697139 Logic circuit having testability for defective via contacts
09/29/1987	US4697138 Logic analyzer having a plurality of sampling channels
09/29/1987	US4697137 Method of nondestructively establishing an earth gradient for cable fault locating
09/29/1987	US4697134 Apparatus and method for measuring battery condition
09/29/1987	US4697095 Chip-on-chip semiconductor device having selectable terminal connections
09/29/1987	US4697075 X-ray imaging system calibration using projection means
09/29/1987	US4696578 Single chip thermal tester
09/29/1987	US4696529 Card holder
09/24/1987	DE3709032A1 Grossschaltkreis-halbleitervorrichtung Gross circuit semiconductor device
09/23/1987	EP0238283A2 High voltage detecting circuit
09/23/1987	EP0238192A2 Circuit testers
09/23/1987	EP0237698A2 Electronic test head positioner for test systems

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