| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/11/1987 | US4686628 Electric device or circuit testing method and apparatus |
| 08/11/1987 | US4686627 Electrical test apparatus |
| 08/11/1987 | US4686478 Testing device for detecting contact chatter in electrical components with movable contacts, such as relays |
| 08/11/1987 | US4686468 Contact set for test apparatus for testing integrated circuit package |
| 08/11/1987 | US4686466 Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof |
| 08/11/1987 | US4686465 Probe assembly for circuit-board tester |
| 08/11/1987 | US4686462 Fast recovery power supply |
| 08/11/1987 | US4686456 Memory test circuit |
| 08/11/1987 | US4686455 Method for the localization of time-critical events within a clock electronic circuit |
| 08/11/1987 | US4686391 Fast-acting comparison circuit |
| 08/11/1987 | US4686389 Logic for a peak value store |
| 08/11/1987 | CA1225435A1 System for measuring carrier lifetime of semiconductor wafers |
| 08/11/1987 | CA1225256A1 Method for detecting and locating changes in ambient conditions |
| 08/06/1987 | DE3603104A1 Device for simultaneously and precisely making electrical contact with cylinder segments and laminates of armature commutators |
| 08/05/1987 | EP0230801A1 Process for localisation of a fault on an electrical line |
| 08/04/1987 | US4685018 Arc detector for gas insulated electrical apparatus |
| 08/04/1987 | US4684887 High voltage test confirmation apparatus |
| 08/04/1987 | US4684884 Universal test circuit for integrated circuit packages |
| 08/04/1987 | US4684883 Method of manufacturing high-quality semiconductor light-emitting devices |
| 08/04/1987 | CA1225153A1 Method and apparatus for checking the wall thickness of a layer |
| 08/04/1987 | CA1225119A1 Circuitry for testing generator output |
| 07/30/1987 | WO1987004526A1 Apparatus and methods for effecting a burn-in procedure on semiconductor devices |
| 07/30/1987 | DE3602078A1 Holding device, in particular for circuit boards |
| 07/30/1987 | DE3601934A1 Permanently monitored capacitor bushing arrangement for large transformers in three-phase networks (grids, mains power supplies) |
| 07/29/1987 | EP0230348A2 Test probe |
| 07/29/1987 | EP0230219A2 Apparatus for testing a data processing system |
| 07/29/1987 | EP0229975A2 Methods for the modeling and fault simulation of complementary metal oxide semiconductor circuits |
| 07/29/1987 | CN87100366A Non-dismantling method of detection of breakdown and implementation arrangement for silicon rectifier alternator |
| 07/28/1987 | US4683569 Diagnostic circuit utilizing bidirectional test data comparisons |
| 07/28/1987 | US4683424 Apparatus for use in testing circuit boards |
| 07/28/1987 | US4683422 Low voltage continuity tester |
| 07/28/1987 | US4683420 Acousto-optic system for testing high speed circuits |
| 07/28/1987 | US4683417 Method and apparatus for rapidly testing capacitors and dielectric materials |
| 07/28/1987 | US4683376 Opposing field spectrometer for electron beam mensuration technology |
| 07/28/1987 | US4683105 Testable, fault-tolerant power interface circuit for normally de-energized loads |
| 07/28/1987 | US4682857 Liquid crystal hot spot detection with infinitesimal temperature control |
| 07/28/1987 | US4682695 Automated keyboard testing |
| 07/28/1987 | CA1224845A1 Method of measuring a frequency domain characteristic |
| 07/23/1987 | DE3701070A1 Circuit arrangement for identifying electrical lines |
| 07/23/1987 | DE3602171A1 Test instrument for an electro-medical device |
| 07/23/1987 | DE3600814A1 Electrical measuring device |
| 07/22/1987 | EP0229719A2 Diagnostic apparatus for an electric generator seal oil system |
| 07/22/1987 | EP0229547A1 Process and device for pinpointing a faulty conductor in a multiple line |
| 07/22/1987 | EP0229505A1 A method of measuring a cable delay time |
| 07/22/1987 | EP0229486A2 Automatic circuit adjusting systems |
| 07/22/1987 | EP0229433A1 Combinational logic circuit test device |
| 07/22/1987 | CN86106191A Replacing ground wire by "reliable neutral wire" or "reliable safety wire" for safeguarding application of electricity |
| 07/21/1987 | US4682331 Logic circuit with self-test |
| 07/21/1987 | US4682330 Hierarchical test system architecture |
| 07/21/1987 | US4682329 Test system providing testing sites for logic circuits |
| 07/21/1987 | US4682169 Method of and system for accumulating verifiable energy demand data from remote electricity meters |
| 07/21/1987 | US4682103 Circuitry for testing generator output |
| 07/21/1987 | US4682040 Image pickup apparatus for a printed wiring board |
| 07/21/1987 | US4681449 High speed testing of electronic circuits by electro-optic sampling |
| 07/21/1987 | US4681421 Double-face flexible printed circuit board |
| 07/21/1987 | US4681221 Holder for plastic leaded chip carrier |
| 07/21/1987 | CA1224526A1 Reduced power consumption low battery alert device |
| 07/21/1987 | CA1224525A1 Open circuit voltage test device |
| 07/21/1987 | CA1224428A1 Pipe coating |
| 07/16/1987 | DE3700663A1 System fuer integrierte schaltungen tragende karten System for integrated circuits supporting cards |
| 07/15/1987 | EP0228946A1 Process for testing infrared photodiodes of a detection plate |
| 07/15/1987 | EP0228945A1 Process for testing a transistor control matrix, and matrix for this test |
| 07/15/1987 | EP0228741A1 Testing device for a leadless carrier provided with a high-frequency integrated circuit chip |
| 07/15/1987 | EP0228613A1 Process for the detection of partial discharges and for measuring arc disruption in dynamo-electrical high-voltage machines, and circuit for carrying it out |
| 07/15/1987 | EP0228502A1 Electron beam test apparatus for electronic device and method for using the same |
| 07/15/1987 | CN86207558U Safe current-limiting watt-hour meter |
| 07/15/1987 | CN86207372U Safe test pencil |
| 07/14/1987 | US4680761 Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VLSI |
| 07/14/1987 | US4680733 Device for serializing/deserializing bit configurations of variable length |
| 07/14/1987 | US4680635 Emission microscope |
| 07/14/1987 | US4680539 General linear shift register |
| 07/14/1987 | US4680537 Method and apparatus for testing a conductivity sensing circuit |
| 07/14/1987 | US4680527 Electrical battery including apparatus for current sensing |
| 07/14/1987 | CA1224271A1 Very large scale integrated circuit subdivided into isochronous regions, method for the machine-aided design of such a circuit, and method for the machine- aided testing of such a circuit |
| 07/09/1987 | DE3700251A1 Verfahren und vorrichtung zur diagnose logischer schaltungen Method and device for diagnosis of logical circuits |
| 07/08/1987 | EP0228333A2 Method and apparatus for measuring the thermal resistance of an element such as a high density integrated circuit fitting |
| 07/08/1987 | EP0228332A2 Automatic test system having a "true tester-per-pin" architecture |
| 07/08/1987 | EP0228279A2 Plug-in socket assembly for integrated circuit package |
| 07/08/1987 | EP0228207A2 Built-in test circuitry for combinatorial logic |
| 07/08/1987 | EP0228156A2 Test system for VLSI circuits |
| 07/08/1987 | EP0228153A1 Apparatus for detecting degradation of an arrester |
| 07/08/1987 | EP0228012A1 Internal armature current monitoring in large three-phase generator |
| 07/08/1987 | EP0227968A2 High speed integrated circuit handler |
| 07/08/1987 | EP0227696A1 On chip test system for configurable gate arrays |
| 07/08/1987 | CN86108255A Internal armature current monitoring in large three-phase generator |
| 07/07/1987 | US4679111 Resistance to ground checker |
| 07/07/1987 | US4678999 Charge depletion meter |
| 07/07/1987 | US4678998 Battery condition monitor and monitoring method |
| 07/07/1987 | US4678990 Motor monitor signal analysis system |
| 07/07/1987 | US4678989 Optical absorption spectroscopy for semiconductors |
| 07/07/1987 | US4678988 Method and apparatus for spectral analysis of a signal at a measuring point |
| 07/02/1987 | WO1987003975A1 Process for automatically monitoring control devices |
| 07/01/1987 | EP0227491A2 Test interface for a MOS technique integrated circuit |
| 07/01/1987 | EP0227329A2 Programmable logic device |
| 07/01/1987 | EP0227312A1 Retargetable buffer probe |
| 07/01/1987 | EP0227017A2 Method for detecting high resistance ground faults on a power transmission line |
| 07/01/1987 | EP0226995A2 Multiple lead probe for integrated circuits |
| 07/01/1987 | EP0226913A2 Method and device for situating and/or displaying probe points carrying a characteristic time-dependent signal |
| 07/01/1987 | EP0226887A1 Method and circuit arrangement for testing integrated circuits |
| 07/01/1987 | EP0226780A1 Testing device for vacuum switching chambers |