Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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07/11/1989 | US4847496 Nondestructive readout of a latent electrostatic image formed on an insulated material |
07/11/1989 | US4847491 Resonant loop current disturbing probe |
07/11/1989 | US4846704 Test socket with improved contact engagement |
07/11/1989 | US4845843 System for configuring, automating and controlling the test and repair of printed circuit boards |
07/11/1989 | CA1257330A1 Battery tester including textile substrate |
07/11/1989 | CA1257185A1 Gas decomposition detector for gas-insulated electrical apparatus |
07/06/1989 | EP0303662A4 Dynamic system for testing an equipment. |
07/05/1989 | EP0322856A2 Microcomputer |
07/05/1989 | EP0322607A2 Control device for an apparatus for testing electrical function of wiring patterns |
07/05/1989 | CN1033696A Automatic short circuit tester control device |
07/04/1989 | US4845475 Automatic testing of position sensing devices employing stored sensed position |
07/04/1989 | US4845435 Sensor fault detector |
07/04/1989 | US4845427 Arrangement for the measurement of electronic units |
07/04/1989 | US4845426 Temperature conditioner for tests of unpackaged semiconductors |
07/04/1989 | US4845425 Full chip integrated circuit tester |
07/04/1989 | US4845419 Automatic control means providing a low-power responsive signal, particularly for initiating data preservation operation |
07/04/1989 | US4845379 Sense circuit for detecting absence of a pulse train |
07/04/1989 | US4844038 Abnormality detecting method for exhaust gas concentration sensor for internal combustion engines |
07/04/1989 | CA1257012A1 Testing of combination of carrier and integrated circuits mounted thereon |
06/29/1989 | WO1989005769A1 Apparatus for inspecting wafers |
06/29/1989 | DE3742542A1 Measuring device for optical receivers in communications technology |
06/28/1989 | EP0322380A2 A method for incrementally increasing the collector area of a lateral PNP transistor during electrical testing of an integrated device on wafer |
06/28/1989 | EP0322308A2 Delay line control system for automatic test equipment |
06/28/1989 | EP0290444A4 Apparatus and methods for effecting a burn-in procedure on semiconductor devices. |
06/28/1989 | EP0225328A4 Apparatus and methods for effecting a burn-in procedure on semiconductor devices. |
06/28/1989 | CN2040255U Wire testing instrument |
06/28/1989 | CN1004673B Leakage and ground failure selecting circuit |
06/27/1989 | US4843608 Cross-coupled checking circuit |
06/27/1989 | US4843592 Microcomputer controlled apparatus provided with a battery voltage detection circuit |
06/27/1989 | US4843515 Surge undershoot eliminator |
06/27/1989 | US4843330 Electron beam contactless testing system with grid bias switching |
06/27/1989 | US4843329 Method for contactless testing for electrical opens and short circuits in conducting paths in a substrate |
06/27/1989 | US4843327 Branched sensor system |
06/27/1989 | US4843326 Electrical testing device for the power input to automobile telephone installations |
06/27/1989 | US4843315 Contact probe arrangement for electrically connecting a test system to the contact pads of a device to be tested |
06/27/1989 | US4843312 Test method for LCD elements |
06/27/1989 | US4842539 Strand-to-strand short circuit tester |
06/27/1989 | CA1256597A1 Apparatus for pulsing electron beams |
06/27/1989 | CA1256587A1 Electron beam test probe system for analyzing integrated circuits |
06/27/1989 | CA1256494A1 Method for partial discharge detection and breaking spark measurement in dynamo-electric high-voltage machines, and an apparatus for performing the method |
06/22/1989 | DE3741827A1 Device for connecting a plug base having several inner contact tags to a test set |
06/21/1989 | EP0321133A1 Semiconductor integrated circuit having a DC test function |
06/21/1989 | EP0321073A2 Liquid crystal display device |
06/21/1989 | EP0320829A1 Device for achieving a contact function in a protective relay test system |
06/21/1989 | EP0267271A4 In-system programmable logic device. |
06/21/1989 | CN2039857U Circuit connecting or breaking test pen |
06/21/1989 | CN2039856U Power failure analyser for high voltage line |
06/20/1989 | US4841525 Method and arrangement for testing mega-bit memory modules with arbitrary test patterns in a multi-bit test mode |
06/20/1989 | US4841500 Printed circuit board fabrication technique |
06/20/1989 | US4841497 Digital time base with corrected analog interpolation |
06/20/1989 | US4841456 Test system and method using artificial intelligence control |
06/20/1989 | US4841405 Protective relaying apparatus for providing fault-resistance correction |
06/20/1989 | US4841242 Method for testing conductor networks |
06/20/1989 | US4841240 Method and apparatus for verifying the continuity between a circuit board and a test fixture |
06/20/1989 | US4841239 Method and measuring instrument for identifying the diffusion length of the minority charge carriers for non-destructive detection of flaws and impurities in semiconductor crystal bodies |
06/20/1989 | US4841233 Semiconductor integrated circuit adapted to carry out operation test |
06/20/1989 | US4841232 Method and apparatus for testing three state drivers |
06/20/1989 | US4841231 Test probe accessibility method and tool |
06/20/1989 | US4841150 Reflection technique for thermal mapping of semiconductors |
06/20/1989 | US4840583 Automatic jumper cables |
06/20/1989 | US4840495 Method and apparatus for measuring the thermal resistance of an element such as large scale integrated circuit assemblies |
06/15/1989 | WO1989005535A1 Fault detection |
06/14/1989 | EP0320108A2 Optical fiber break detector |
06/14/1989 | EP0319602A1 Apparatus including a focused UV light source for non-contact measurement of electrical properties of conductors |
06/14/1989 | CN2039430U Universal physical-parameter monitoring instrument with alarm function for time-base ics |
06/14/1989 | CN2039429U Pocket multifunctional photoacoustic electricity tester |
06/14/1989 | CN2039428U 多功能验电器 Multifunctional electroscope |
06/13/1989 | US4839830 Apparatus and method for the processing of operating data of an electric motor |
06/13/1989 | US4839812 Method and system for testing internal combustion engine computerized control units |
06/13/1989 | US4839811 Automotive vehicle trouble checking apparatus |
06/13/1989 | US4839599 Multipiece cable testing device which functions as flashlight, continuity checker, and cable identifier |
06/13/1989 | US4839598 Method for testing underground electric cables |
06/13/1989 | US4839597 Battery condition monitoring system |
06/13/1989 | US4839587 Test fixture for tab circuits and devices |
06/13/1989 | US4839586 Apparatus for irradiating electronic circuits |
06/13/1989 | US4839520 Production of pulsed electron beams |
06/13/1989 | US4839248 System and method for depassivating a passivated lithium battery in a battery powered microprocessor controlled device |
06/13/1989 | US4838799 I.C. socket having conductive plastic contacts |
06/13/1989 | US4838664 Diagnostic overlay |
06/08/1989 | DE3813428C1 Circuit arrangement for overvoltage testing |
06/08/1989 | DE3739755A1 Automatic unit for the voltage testing of insulated tools (screwdrivers) |
06/07/1989 | EP0319187A2 Scan data path coupling |
06/07/1989 | EP0319125A2 Analogue circuit element and chain for testing an analogue circuit |
06/07/1989 | EP0319095A1 Inspection apparatus incorporating digital electron detection |
06/07/1989 | EP0318869A1 Substrate potential detecting circuit |
06/07/1989 | EP0318814A2 Digital circuit testing apparatus |
06/07/1989 | EP0318768A1 Logic analyser |
06/07/1989 | EP0318575A1 Programmable level shifting interface device |
06/07/1989 | EP0318549A1 Test meters. |
06/07/1989 | CN2039030U Storage battery capacity micro-computer detecting instrument |
06/07/1989 | CN2039029U Universal multifunctional combined acoustooptic logical pen |
06/07/1989 | CN2039028U Dynamic-characteristics tester for a thyristor |
06/07/1989 | CN2039027U Testing apparatus of shutoff characteristics of a gate shutable thyristor |
06/07/1989 | CN2039026U Double indicating lamps safety electricity-testing-pen |
06/07/1989 | CN2039025U Multifunctional line testing device |
06/07/1989 | CN2039024U Insulating eletronic electricity-testing-pen |
06/06/1989 | US4837765 Test control circuit for integrated circuit |
06/06/1989 | US4837581 Device for the EMI testing of electronic systems |
06/06/1989 | US4837521 Delay line control system for automatic test equipment |
06/06/1989 | US4837520 Fuse status detection circuit |