| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/06/1988 | EP0262867A2 Integrated circuit with memory self-test |
| 04/06/1988 | EP0262860A2 Digital signal analysis by transformation to vector domain |
| 04/06/1988 | EP0262855A2 Production of pulsed electron beams |
| 04/06/1988 | EP0262559A1 Testing system for digital circuits |
| 04/06/1988 | EP0262367A1 Mechanical probe for the measurement of time-dependent electrical signals |
| 04/06/1988 | EP0262365A2 Spectrometer-detector arrangement for quantitative potential measurements |
| 04/06/1988 | EP0262330A2 High performance clock system error detection and fault isolation |
| 04/06/1988 | EP0262268A1 Alarm circuit testing |
| 04/06/1988 | EP0136204B1 Control of signal timing apparatus in automatic test systems using minimal memory |
| 04/06/1988 | CN87210079U Liquid crystal test pen |
| 04/06/1988 | CN87206369U Portable and intelligent ic on-line or off-line tester |
| 04/06/1988 | CN87205164U Active device for leakage detecting and indicating |
| 04/06/1988 | CN86106781A Test pencil |
| 04/05/1988 | US4736395 Logic circuit having a test data loading function |
| 04/05/1988 | US4736375 Apparatus for fast generation of large quantities of test data words in a test facility |
| 04/05/1988 | US4736374 Automated test apparatus for use with multiple equipment |
| 04/05/1988 | US4736373 Memory tester having concurrent failure data readout and memory repair analysis |
| 04/05/1988 | US4736351 Precision semiconductor device timer |
| 04/05/1988 | US4736159 Laser probing for solid-state device |
| 04/05/1988 | US4736158 Wire identifying apparatus for identifying wires of a multiple wire electrical system |
| 04/05/1988 | US4734980 Printed circuit board wiring method |
| 04/05/1988 | CA1234927A1 Microwave measuring and apparatus for contactless non-destructive testing of photosensitive materials |
| 04/05/1988 | CA1234908A1 Method and apparatus for real-time high-speed inspection of objects for identifying defects |
| 03/30/1988 | EP0262056A1 Indicator for signalizing a short circuit in a lightning arrester |
| 03/30/1988 | EP0262019A1 Test apparatus for very high voltage supply |
| 03/30/1988 | EP0261335A2 Test method and apparatus for a distributed processing system |
| 03/30/1988 | EP0136207B1 Test period generator for automatic test equipment |
| 03/30/1988 | EP0136206B1 Method and apparatus for monitoring automated testing of electronic circuits |
| 03/30/1988 | CN87212309U Ballast verifier for fluorescent lamp |
| 03/30/1988 | CN87209205U Electric current leakage meter |
| 03/30/1988 | CN87203719U Trouble meter for refrigerator |
| 03/29/1988 | US4734921 Fully programmable linear feedback shift register |
| 03/29/1988 | US4734872 Temperature control for device under test |
| 03/29/1988 | US4734673 Apparatus for detecting a start of an engine for a motor vehicle |
| 03/29/1988 | US4734651 Electrical continuity and short circuit testing |
| 03/29/1988 | US4734641 Method for the thermal characterization of semiconductor packaging systems |
| 03/29/1988 | US4734638 Electric outlet and cable tracing method and apparatus |
| 03/29/1988 | US4734637 Apparatus for measuring the length of an electrical line |
| 03/29/1988 | US4733974 Transformer life consumption indicator |
| 03/29/1988 | CA1234599A1 Weighted random pattern testing apparatus and method |
| 03/24/1988 | WO1988002182A1 Method of manufacturing integrated circuits |
| 03/24/1988 | WO1988002146A1 Apparatus and method of stimulating an equipment |
| 03/24/1988 | WO1988002123A1 Integrated circuits |
| 03/24/1988 | WO1988002122A1 System for diagnosing anomalies or breakdowns in a plurality of types of electronic control systems installed in motor vehicles |
| 03/24/1988 | DE3738771A1 Amplifying device for unipolar pulse-shaped signals having a duty ratio of less than 0.5 |
| 03/23/1988 | EP0261043A1 Electronic circuit tester |
| 03/23/1988 | EP0261040A1 Localized etching process for a silicon oxide layer |
| 03/23/1988 | EP0260982A2 Test system for random access memory |
| 03/23/1988 | EP0260500A1 Device for testing three-phase coils used in electric high-tension supply networks |
| 03/23/1988 | CN87206361U Monitor for insulation of electric appliances |
| 03/22/1988 | US4733405 Digital integrated circuit |
| 03/22/1988 | US4733395 Digital word generator |
| 03/22/1988 | US4733392 Fail memory equipment in memory tester |
| 03/22/1988 | US4733225 Cooling medium temperature monitoring system for rotary electric machine |
| 03/22/1988 | US4733176 Method and apparatus for locating defects in an electrical circuit with a light beam |
| 03/22/1988 | US4733175 In current conducting devices |
| 03/22/1988 | US4733174 Circuit testing method and apparatus |
| 03/22/1988 | US4733172 Apparatus for testing I.C. chip |
| 03/22/1988 | US4733168 Test enabling circuit for enabling overhead test circuitry in programmable devices |
| 03/22/1988 | US4733167 Measurement circuit for digital to analog converter |
| 03/22/1988 | US4733075 Stroboscopic scanning electron microscope |
| 03/22/1988 | US4732473 Apparatus for, and methods of, determining the characteristics of semi-conductor wafers |
| 03/22/1988 | US4732469 Low noise optical time domain reflectometer |
| 03/22/1988 | EP0128946A4 High speed testing of complex circuits. |
| 03/17/1988 | DE3727723A1 Verfahren zur pruefung eines traegers mit mehreren integrierten digitalschaltungen, geeignete integrierte schaltung zum anbringen auf einem auf diese weise zu pruefenden traeger und traeger mit mehreren derartigen integrierten schaltungen Method for pruefung a carrier with several integrated digital circuits, integrated circuit suitable for attaching to a in this way to be tested traeger and traeger a plurality of such integrated circuits |
| 03/16/1988 | EP0260096A1 Integrated circuit probe station |
| 03/16/1988 | EP0260024A2 Integrated circuit probe parallelism establishing method and apparatus |
| 03/16/1988 | EP0259942A2 Piezoelectric pressure sensing apparatus for integrated circuit testing stations |
| 03/16/1988 | EP0259907A1 Electron detection with energy discrimination |
| 03/16/1988 | EP0259881A2 Switching apparatus |
| 03/16/1988 | EP0259667A2 Testing station for integrated circuits |
| 03/16/1988 | EP0259662A2 Method for generating a candidate list of faulty circuit elements and method for isolating faults in a digital logic circuit using said candidate list. |
| 03/15/1988 | USRE32625 Dynamic testing of electrical conductors |
| 03/15/1988 | US4731663 Method and apparatus for color identification |
| 03/15/1988 | US4731601 Cranking system performance indicator |
| 03/15/1988 | US4731586 Electrical noise detector for detecting power line gap defects |
| 03/15/1988 | US4731577 Coaxial probe card |
| 03/15/1988 | US4730749 For singulating integrated circuit devices; conveying to electronic testing |
| 03/15/1988 | CA1234233A1 Apparatus and method for testing and verifying the timing logic of a cathode ray tube display |
| 03/10/1988 | WO1988001748A1 Method and device for determination of the condition of the insulation of an object made of an electrically conducting material, coated with an electrical insulation and positioned in an electrically conducting medium |
| 03/10/1988 | DE3728676A1 Verfahren und vorrichtung zur messung der ankerueberhubstrecke eines magnetrelais Method and device for measuring the ankerueberhubstrecke a solenoid relay |
| 03/10/1988 | DE3727950A1 Device for carrying out voltage tests and measurements on a medium voltage or high voltage switching installation |
| 03/10/1988 | DE3726287A1 Device for determining internal malfunctions in electrical equipment |
| 03/09/1988 | EP0259162A2 Integrated circuit probe system |
| 03/09/1988 | EP0259161A2 Multiple lead probe for integrated circuits in wafer form |
| 03/09/1988 | EP0258517A1 Method and device for identifying the polarity of polarized capacitors |
| 03/09/1988 | EP0258516A1 Method and device for identifying the polarity of polarized capacitors |
| 03/09/1988 | CN87207463U Screw-driver with touchable or untouchable voltage tester |
| 03/09/1988 | CN87207140U Nondestructive testing device for nonlinear resistance |
| 03/09/1988 | CN87203693U Watch-type microcurrent electric detonator conductometer |
| 03/08/1988 | US4730319 Device for transforming the occurrence probability of logic vectors and for the generation of vector sequences with time variable probabilities |
| 03/08/1988 | US4730318 Modular organized storage tester |
| 03/08/1988 | US4730317 Digital integrated circuits |
| 03/08/1988 | US4730316 Digital integrated circuits |
| 03/08/1988 | US4730314 Logic analyzer |
| 03/08/1988 | US4730164 Device for detecting abnormal conditions in a stepping motor |
| 03/08/1988 | US4730163 Device for testing high-pressure lamps and components used therewith |
| 03/08/1988 | US4730159 Programmable bed-of-nails test access jigs |
| 03/08/1988 | US4730158 Electron-beam probing of photodiodes |
| 03/08/1988 | CA1233879A1 Bridge circuit system |