Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/1989
03/29/1989EP0308766A1 Proximity switch with testing and evaluating circuits
03/29/1989EP0308660A2 Device for producing a test-compatible, largely fault tolerant configuration of redundantly implemented VLSI systems
03/29/1989EP0308599A2 Digitizer effective resolution measurement system using estimated sinewave parameters
03/29/1989EP0294449A4 Computer-aided probe with tri-state circuitry test capability.
03/29/1989CN2035097U Cable short-circuit position tester
03/29/1989CN2035096U Flash-over colour indicator of insulator chain
03/29/1989CN2035095U Inductance electro-probe
03/29/1989CN2035091U Electric probe pen
03/29/1989CN2034892U Combined lighting electric probe screw driver
03/28/1989US4817093 Method of partitioning, testing and diagnosing a VLSI multichip package and associated structure
03/28/1989US4817033 Signal detecting circuit
03/28/1989US4817011 Automated modeling method for tuning transformers
03/28/1989US4816806 Diagnosis switch
03/28/1989US4816776 Integrated circuit configuration and method for monitoring a co-integrated oscillator
03/28/1989US4816768 Electronic battery testing device
03/28/1989US4816756 Circuit and method for statically testing rotating rectifiers in brushless alternators
03/28/1989US4816755 Method and apparatus for measuring photoresistivity and photo hall-effect of semiconductor wafers
03/28/1989US4816753 Method for reliability testing of integrated circuits
03/28/1989US4816751 Apparatus for inspecting the operation of integrated circuit device
03/28/1989US4816750 Automatic circuit tester control system
03/28/1989US4816746 Circuit tester for determining presence or absence of electrical power
03/28/1989US4816686 Method and apparatus for detecting wiring patterns
03/28/1989US4816666 Apparatus and methods for inspection of electrical materials and components
03/28/1989US4816656 IC card system
03/23/1989WO1989002604A1 System for printed circuit board testing
03/23/1989WO1989002603A1 Method and apparatus for isolating faults in an antenna system
03/22/1989EP0308347A1 Test head robot having a modified suspension
03/22/1989EP0308086A2 Multiplexed built-in test equipment
03/22/1989EP0307826A1 Protection device for high resistance ground faults
03/22/1989EP0307549A2 Memory test pattern generator
03/22/1989EP0307503A1 A grid-based, "cross-check" test structure for testing integrated circuits
03/22/1989CN2034696U 油杯 Oil Cup
03/21/1989US4815077 Test system for electronic devices with radio frequency signature extraction means
03/21/1989US4815022 Programmable logic array for carrying out logic operations of binary input signals
03/21/1989US4814937 Defect detector circuit for inductive load driving circuit
03/21/1989US4814930 Optical zero-phase current and zero phase voltage sensing arrangement
03/21/1989US4814872 Digital video probe system
03/21/1989US4814712 Test kit for a circuit breaker containing an electronic trip unit
03/21/1989US4814700 Field current measurement device
03/21/1989US4814699 Method for partial discharge detection and breaking spark measuring in dynamo-electric high-voltage machines, and an apparatus for performing the method
03/21/1989US4814693 Data cable test apparatus and method
03/21/1989US4814689 Method of measuring a cable delay time
03/21/1989US4814639 Super integration circuit device having a plurality of IC-chip equivalent regions formed on a single semiconductor substrate
03/21/1989US4814638 High speed digital driver with selectable level shifter
03/21/1989US4814621 Lead detection by variable pressure lead-contacting optical interposers
03/21/1989US4813115 Method for testing and repairing synchronous motors
03/21/1989CA1251575A1 Automatic test system having a "true tester-per-pin" architecture
03/21/1989CA1251569A1 Diagnostic circuit utilizing bidirectional test data comparisons
03/21/1989CA1251535A1 Device for detecting and localizing a fault in an aerial ropeway transport installation
03/16/1989EP0235250A4 Harmonic sampling logic analyzer.
03/16/1989DE3729500A1 Device for fault-finding in electronic circuits
03/15/1989EP0307117A2 Battery status indicating arrangement
03/15/1989EP0306656A1 Arrangement for testing IC components
03/15/1989EP0306653A1 Arrangement for positioning IC components on a substrate
03/15/1989EP0306552A1 Atto-amperemeter
03/15/1989CN2034282U Multifunction low-tension test pencil
03/15/1989CN2034281U Relay protection testing handcart
03/14/1989US4813043 Semiconductor test device
03/14/1989US4813005 Device for synchronizing the output pulses of a circuit with an input clock
03/14/1989US4812996 Signal viewing instrumentation control system
03/14/1989US4812756 Contactless technique for semicondutor wafer testing
03/14/1989US4812755 Base board for testing integrated circuits
03/14/1989US4812752 Detecting/locating open circuit faults in a cable bundle
03/14/1989US4812751 Apparatus for monitoring earth faults on the rotor winding of a generator
03/14/1989US4812750 Environmental stress screening apparatus
03/14/1989US4812748 Method and apparatus for operating a scanning microscope
03/14/1989US4812745 Probe for testing electronic components
03/14/1989US4812742 Integrated circuit package having a removable test region for testing for shorts and opens
03/14/1989US4812740 Coating detector for low emissivity glass
03/14/1989US4812680 High voltage detecting circuit
03/14/1989US4812678 Easily testable semiconductor LSI device
03/14/1989US4812651 Spectrometer objective for particle beam measuring instruments
03/14/1989US4812037 Method and apparatus for optically detecting circuit malfunctions
03/14/1989CA1251288A1 Piezoelectric pressure sensing apparatus for integrated circuit testing stations
03/14/1989CA1251282A1 Hierarchical test system architecture
03/14/1989CA1251256A1 Nondestructive readout of a latent electrostatic image formed on an insulating material
03/09/1989DE3729173A1 Automatic adjustment of the evaluation/measurement signal level in the case of corpuscular beam measuring methods
03/08/1989EP0306396A1 Temperature threshold detection circuit
03/08/1989EP0306393A1 A short-wire bed-of-nails test fixture
03/08/1989EP0306359A2 Device for testing a circuit
03/08/1989EP0306319A1 Method for statically testing rotating rectifiers in brushless alternators
03/08/1989EP0305951A1 Testing of integrated circuit devices on loaded printed circuit boards
03/08/1989EP0305644A2 Emission microscopy apparatus and method
03/08/1989EP0115543B1 Function diagnosis system
03/08/1989CN2033908U Safety pliers sleeve
03/08/1989CN2033727U Clamp with elements of auxiliary tools
03/08/1989CN1031496A Method for stopping casting work in a strip steel casting installation
03/07/1989US4811344 Device for the testing and checking of the operation of blocks within an integrated circuit
03/07/1989US4811343 On-chip on-line AC and DC clock tree error detection system
03/07/1989US4811299 Dynamic RAM device having a separate test mode capability
03/07/1989US4811154 Apparatus for rapid recognition of short-circuits
03/07/1989US4810972 Automatic short circuit tester control device
03/07/1989US4810971 Apparatus for dielectric testing of gloves
03/07/1989US4810956 Mounting bracket for test probes
03/07/1989US4809541 Electrical test connector and method for testing the Ford vehicle Speed Control System
03/07/1989CA1250958A1 Programmable lamp plug
03/07/1989CA1250957A1 Printed circuit board function testing system and method of using said system
03/02/1989DE3827502A1 Stoerungssuchsystem fuer kraftfahrzeuge Stoerungssuchsystem for motor vehicles
03/01/1989EP0305347A1 A method and an arrangement for the detection of ionizing current in the ignition system of an internal combustion engine
03/01/1989EP0305217A2 An automatic test process for logic devices
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