| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/11/1988 | EP0266873A2 Programmable logic array |
| 05/11/1988 | EP0266535A1 Electron beam contactless testing system with grid bias switching |
| 05/11/1988 | EP0090859B1 Keyboard actuator |
| 05/11/1988 | DE3706786C1 Device for monitoring at least two electrical loads in motor vehicles |
| 05/11/1988 | DE3637502A1 Micromechanical test device |
| 05/11/1988 | CN87203368U Electric indicator |
| 05/10/1988 | US4744049 Microcode testing of a cache in a data processor |
| 05/10/1988 | US4744047 Pattern test apparatus including a plurality of pattern generators |
| 05/10/1988 | US4744041 Method for testing DC motors |
| 05/10/1988 | US4743887 Fault locating system and method |
| 05/10/1988 | US4743886 Testing apparatus for intrusion detectors |
| 05/10/1988 | US4743855 Method of and apparatus for measuring the state of discharge of a battery |
| 05/10/1988 | US4743848 Method of testing a stepping motor |
| 05/10/1988 | US4743847 Printed circuit conductor test system |
| 05/10/1988 | US4743842 Tri-state circuit tester |
| 05/10/1988 | US4743841 Semiconductor integrated circuit including circuit elements evaluating the same and having means for testing the circuit elements |
| 05/10/1988 | US4743840 Diagnosing method for logic circuits |
| 05/10/1988 | US4743831 Apparatus and method for indicating remaining battery life in a battery powered device |
| 05/10/1988 | US4742980 Positioning device for test heads |
| 05/10/1988 | CA1236595A1 Apparatus and method for displaying hole-electron pair distributions induced by electron bombardment |
| 05/05/1988 | WO1988003291A2 Programmable logic array |
| 05/05/1988 | WO1988002553A3 Integrated circuit packaging configuration for rapid customized design and unique test capability |
| 05/05/1988 | DE3706393A1 Application of a self-diagnostic method |
| 05/04/1988 | EP0266264A1 Attack simulator by means of an electromagnetic pulse |
| 05/04/1988 | EP0265913A2 Semi-custom-made integrated circuit device |
| 05/04/1988 | EP0265873A2 Holder for plastic leaded chip carrier |
| 05/04/1988 | CN87202274U Multifunctional electricity leakage alarming socket |
| 05/03/1988 | US4742577 Device and method for signal transmission and optical communications |
| 05/03/1988 | US4742494 Device for reading a two-dimensional charge image |
| 05/03/1988 | US4742486 Semiconductor integrated circuit having function for switching operational mode of internal circuit |
| 05/03/1988 | US4742427 Electrostatic discharge simulation |
| 05/03/1988 | US4742331 Digital-to-time converter |
| 05/03/1988 | US4742293 Pseudo-memory circuit for testing for stuck open faults |
| 05/03/1988 | US4741385 Gas jet impingement means and method |
| 05/03/1988 | CA1236219A1 Analog signal verification circuit |
| 04/28/1988 | DE3700647A1 Circuit arrangement for testing the insulation of installed plastic cables |
| 04/28/1988 | DE3636367A1 Method and device for determining the distance of directions of earth faults in insulated and compensated power systems |
| 04/28/1988 | DE3635611A1 Partial-discharge measurement of a high-voltage transformer |
| 04/27/1988 | EP0265304A2 Testable semiconductor integrated circuit |
| 04/27/1988 | EP0265134A1 Method and apparatus for configuring a measurement instrument and configurable instrument itself |
| 04/27/1988 | EP0265073A1 Test arrangement |
| 04/27/1988 | EP0264947A2 Diagnostic system for a digital signal processor |
| 04/27/1988 | EP0264482A1 Method for contactless testing of integrated circuit packaging boards under atmospheric conditions |
| 04/27/1988 | EP0264481A1 Testing method for integrated circuit packaging boards using a laser in vacuum |
| 04/26/1988 | US4741023 On-line test and diagnostic system for power system stabilizer |
| 04/26/1988 | US4740970 Integrated circuit arrangement |
| 04/26/1988 | US4740919 Electrically programmable logic array |
| 04/26/1988 | US4740776 Apparatus for compensating digital to analog converter errors |
| 04/26/1988 | US4740757 Method and apparatus for locating leaks in a multiple layer geomembrane liner |
| 04/26/1988 | US4740756 Continuity test method and apparatus |
| 04/26/1988 | US4740745 Polarity and continuity tester for primary and secondary automotive circuits |
| 04/26/1988 | EP0204697A4 Amenable logic gate and method of testing. |
| 04/26/1988 | CA1235745A1 Circuit arrangement for monitoring a thyristor |
| 04/21/1988 | DE3634802A1 Arrangement for selective detection of a short to earth in the rotor circuit of an electric machine |
| 04/20/1988 | EP0264334A2 Synchronous array logic circuit |
| 04/20/1988 | EP0264199A1 Status driven menu system |
| 04/20/1988 | EP0263942A1 Spectrometer-detector arrangement for quantitative potential measurements |
| 04/20/1988 | CN87212183U Low-voltage and low-liquid-level automatic alarm for vehicle storage batteries |
| 04/19/1988 | US4739388 Integrated circuit structure for a quality check of a semiconductor substrate wafer |
| 04/19/1988 | US4739276 Method and apparatus for digital time domain reflectometry |
| 04/19/1988 | US4739275 DC ground fault detection |
| 04/19/1988 | US4739274 DC ground fault detection |
| 04/19/1988 | US4739259 Telescoping pin probe |
| 04/19/1988 | US4739258 Dynamic testing of thin-film conductor |
| 04/19/1988 | US4739257 Testsite system |
| 04/19/1988 | US4739256 Method and apparatus for testing and repairing synchronous motors |
| 04/19/1988 | US4739252 Current attenuator useful in a very low leakage current measuring device |
| 04/19/1988 | US4739250 Semiconductor integrated circuit device with test circuit |
| 04/19/1988 | US4739248 For determining the adequacy of size rating |
| 04/19/1988 | US4739184 Portable transducer simulator |
| 04/19/1988 | US4738133 Vehicular testing system |
| 04/19/1988 | CA1235527A1 Circuit testing apparatus |
| 04/19/1988 | CA1235458A1 Apparatus for monitoring circuit integrity |
| 04/14/1988 | DE3634880A1 Device for displaying the state of discharge and process for determining the state of discharge of an electric battery |
| 04/14/1988 | DE3634860A1 Device for sorting and simultaneously twisting (intrinsic rotation through 180@) of components in the form of parallelepipeds |
| 04/14/1988 | DE3633996A1 Contact-making device for automatic test equipment |
| 04/14/1988 | DE3621590C1 Circuit arrangement for supplying voltage to and monitoring an electrical module |
| 04/13/1988 | EP0263470A2 Method and arrangements for testing megabit memory modules with arbitrary test patterns in a multiple bit test mode |
| 04/13/1988 | EP0263420A2 Apparatus for testing electrical conductors in distribution frames for telecommunication exchanges |
| 04/13/1988 | EP0263307A2 Board fixturing system |
| 04/13/1988 | EP0263244A1 Apparatus for the electronic testing of printed circuits with contact points in an extremely fine raster (1/20th to 1/10th inch) |
| 04/12/1988 | US4737971 Synchronization detection circuit |
| 04/12/1988 | US4737784 Keyless entry system for automotive vehicle devices with weak-battery alarm |
| 04/12/1988 | US4737775 Insulation deterioration monitoring apparatus |
| 04/12/1988 | US4737708 Device for testing electrical or electronic systems with electromagnetic pulses |
| 04/12/1988 | US4737702 For controlling current flow to a load |
| 04/12/1988 | US4737671 Circuit for detecting the current flow of a triac |
| 04/12/1988 | US4737116 Impedance matching block |
| 04/12/1988 | US4737020 Method for making battery tester for two sizes of batteries |
| 04/12/1988 | US4736522 Process for loading test pins |
| 04/12/1988 | CA1235182A1 Probe search test light and continuity tester |
| 04/12/1988 | CA1235181A1 Method and apparatus for testing shielded cable assemblies |
| 04/07/1988 | WO1988002577A1 Timing signal delay circuit |
| 04/07/1988 | WO1988002553A2 Integrated circuit packaging configuration for rapid customized design and unique test capability |
| 04/07/1988 | WO1988002549A1 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer |
| 04/07/1988 | WO1988002492A1 Memory for storing response patterns in an automatic testing instrument |
| 04/07/1988 | WO1988002491A1 Process and device for automatically detecting the response voltage of an electromagnetic component, in particular an electrovalve |
| 04/07/1988 | WO1988002490A1 Automatic test equipment for integrated circuits |
| 04/07/1988 | DE3732163A1 Test circuit |
| 04/07/1988 | DE3640738C1 Method and device for testing accumulators |