Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
---|
05/02/1989 | US4827212 Noninvasive method and apparatus for characterization of semiconductors |
05/02/1989 | US4827211 Wafer probe |
05/02/1989 | US4827208 Circuit testers |
05/02/1989 | US4826445 Card reader holder |
05/02/1989 | US4826314 Echometer for locating defects which affect light conductors |
05/02/1989 | CA1253636A1 Spectrometer lens for particle beam metrology |
04/27/1989 | DE3734431A1 Method and device for monitoring the functional condition of output stage circuits for electromotor-driven or electromagnetic control elements |
04/26/1989 | EP0313430A1 Device for structural testing of an integrated circuit |
04/26/1989 | EP0313230A2 VLSI chip with test circuitry |
04/26/1989 | EP0313229A2 VSLI chip with ring oscillator |
04/26/1989 | EP0313228A2 Clock distribution on vlsi chip |
04/26/1989 | EP0313196A2 Control system |
04/26/1989 | EP0313195A2 Control system |
04/26/1989 | EP0313162A2 Control and remote control of a switchable battery-fed device by the approach to or the departure from the vicinity by a user |
04/26/1989 | EP0313001A2 Test adapter for integrated circuit carrier |
04/25/1989 | US4825439 Semiconductor logic integrated circuit device having first and second operation modes for testing |
04/25/1989 | US4825414 Semiconductor integrated circuit device having gate array and memory and input-output buffer |
04/25/1989 | US4825171 Testing device for voltage testing of cables and cable sets |
04/25/1989 | US4825170 Electronic battery testing device with automatic voltage scaling |
04/25/1989 | US4825155 X-band logic test jig |
04/25/1989 | US4825151 For coupling an aircraft controller to weapon system |
04/25/1989 | US4825150 Voltage and continuity tester |
04/24/1989 | EP0303633A4 Battery monitoring and condition indicator system for multi-battery pack. |
04/20/1989 | WO1989003614A1 Two-mode driver circuit |
04/19/1989 | EP0312048A2 Bipolar semiconductor device |
04/19/1989 | EP0312046A2 Apparatus and method for inspecting defect of mounted component with slit light |
04/19/1989 | EP0311682A1 Programmable tester with bubble memory |
04/19/1989 | EP0311671A1 Identity insert for electronic modules. |
04/19/1989 | CN2036277U Non-contact multipurpose electronic electricity measurer |
04/18/1989 | US4823283 Status driven menu system |
04/18/1989 | US4823132 Device for the simulation of radar targets in laboratory tests of radar seekers |
04/18/1989 | US4823089 Burglar alarm fault detector |
04/18/1989 | US4823088 Method of and apparatus for testing semiconductor device for electrostatic discharge damage |
04/18/1989 | US4823086 Battery monitoring and condition indicator system for multi-battery pack |
04/18/1989 | US4821562 Signal monitoring apparatus |
04/18/1989 | CA1252911A1 Integrated circuit with channel length indicator |
04/18/1989 | CA1252859A1 Signal distribution system switching module |
04/13/1989 | DE3832298A1 Method for measuring semiconductor surfaces |
04/13/1989 | DE3817642C1 Adaptor for the combined in-circuit and functional test of printed circuit boards |
04/13/1989 | DE3733111A1 Automatic frequency follow-up in corpuscular beam measuring methods, using an unmodulated primary beam |
04/13/1989 | DE3733040A1 Device and method for testing electrical conduction networks, especially printed circuit boards |
04/13/1989 | DE3732208A1 Test set for line transformers of visual display units |
04/12/1989 | EP0311410A2 Secondary battery |
04/12/1989 | EP0311376A2 Automatic short circuit tester control device |
04/12/1989 | EP0311237A2 Digital integrated circuit propagation delay regulator |
04/12/1989 | EP0311201A1 A system of measuring a state density in a semi-conductor element and a method using this system |
04/12/1989 | EP0310892A1 Slip measurement device for electric induction machine |
04/12/1989 | EP0310816A1 Automatic frequency following in a corpuscular beam-measuring method using a modulated primary beam |
04/12/1989 | CN2035889U Marking device for strand wire |
04/12/1989 | CN1003887B Measuring head for inductive measurement of thickness of insulating layer on electric conductor |
04/11/1989 | US4821271 Methods and circuits for checking integrated circuit chips having programmable outputs |
04/11/1989 | US4821269 Diagnostic system for a digital signal processor |
04/11/1989 | US4821266 Testable electronic device and method of testing such a device |
04/11/1989 | US4821138 Monitoring device for overhead power transmission system |
04/11/1989 | US4820991 Apparatus for determination of the location of a fault in communications wires |
04/11/1989 | US4820977 Method and apparatus for identifying points on a specimen having a defined time-dependent signal |
04/11/1989 | US4820975 Test apparatus for printed circuit boards |
04/11/1989 | US4820969 Polarity compensated apparatus for measuring the impedance of a polar device |
04/11/1989 | US4820966 Battery monitoring system |
04/11/1989 | US4820944 Method and apparatus for dynamically controlling the timing of signals in automatic test systems |
04/11/1989 | US4820222 Method of manufacturing flat panel backplanes including improved testing and yields thereof and displays made thereby |
04/11/1989 | CA1252543A1 Input/output-signal checker for an electronic control unit in an electronically controlled fuel injection system |
04/11/1989 | CA1252532A1 Flip status line |
04/06/1989 | WO1989003088A1 Electronic assembly with self-test circuit |
04/06/1989 | DE3732774A1 Arrangement for testing interturn faults and the insulation of inductor coils |
04/06/1989 | DE3732429A1 Elektronische baugruppe mit einem selbsttestschaltkreis Electronic module with a self-test circuitry |
04/05/1989 | EP0310302A2 Multipurpose socket |
04/05/1989 | EP0310266A2 Recalibration system for led array |
04/05/1989 | EP0310152A2 Test overlay circuit |
04/05/1989 | EP0310111A2 Memory incorporating logic LSI and method for testing the same LSI |
04/05/1989 | EP0310082A1 Evaluation method for semiconductor device |
04/05/1989 | EP0310069A2 Method of generating discretization grid for finite-difference simulation |
04/05/1989 | EP0309956A2 Method of testing semiconductor elements and apparatus for testing the same |
04/05/1989 | EP0309802A2 Interface circuit for connecting test instrumentation |
04/05/1989 | EP0309639A2 A method of automatically evaluating the quality of an audio-video program recorded on a recording medium |
04/05/1989 | CN2035491U Voltage and specific gravity table for accumlator |
04/05/1989 | CN2035490U Clip type pocket logic indicator |
04/05/1989 | CN2035489U Electronic working frequency detector |
04/05/1989 | CN2035488U Leakage indicator of electric appliance |
04/05/1989 | CN1032253A Information handling and control system, and method of testing condition of electrical loads in such system |
04/05/1989 | CN1032252A Information hadling and control system, and methods of testing the condition of electrical loads in such system |
04/05/1989 | CN1032239A Method and apparatus for detecting insulation conditions |
04/04/1989 | US4819178 Automatic circuit adjusting system and circuit adjusting tool therefor |
04/04/1989 | US4819166 Multimode scan apparatus |
04/04/1989 | US4819038 TFT array for liquid crystal displays allowing in-process testing |
04/04/1989 | US4818975 Generator stator core temperature monitor |
04/04/1989 | US4818934 Apparatus for measuring characteristics of electronic devices |
04/04/1989 | US4818933 Board fixturing system |
04/04/1989 | US4818381 Apparatus for supplying electronic parts having polarity |
04/04/1989 | US4817418 Failure diagnosis system for vehicle |
04/04/1989 | US4817273 Burn-in board loader and unloader |
04/04/1989 | CA1251937A1 Timer calibration method and apparatus |
03/30/1989 | DE3829955A1 Ortungsgeraet zur ortung von stoerungen eines elektrostrom-uebertragungssystems Ortungsgeraet for identification of faults of an electromagnetic flow-uebertragungssystems |
03/30/1989 | DE3820202A1 Circuit arrangement for monitoring the operation of heating or compensation components |
03/30/1989 | DE3731822A1 Arrangement for testing electrical circuits integrated into a semiconductor module |
03/30/1989 | DE3731537A1 Circuit arrangement for monitoring a conductor of a multicore cable for the occurrence of fault conditions |
03/29/1989 | EP0309116A2 Fixture for an integrated circuit chip |
03/29/1989 | EP0309109A2 Testing process for electronic devices |
03/29/1989 | EP0308953A1 Charged particle detector |
03/29/1989 | EP0308944A2 Malfunction diagnostic apparatus for vehicle control system |