| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/08/1992 | US5146161 Integrated circuit test system |
| 09/08/1992 | US5146160 Auxiliary power unit test kit |
| 09/08/1992 | US5146159 Pin driver for in-circuit test apparatus |
| 09/08/1992 | US5146089 Ion beam device and method for carrying out potential measurements by means of an ion beam |
| 09/06/1992 | WO1992015890A1 Serial testing of removable circuit boards on a backplane bus |
| 09/03/1992 | WO1992015142A1 A method and an apparatus for charging a rechargeable battery |
| 09/03/1992 | WO1992015141A1 Integrated battery cycle counter |
| 09/03/1992 | WO1992015074A1 Method of protecting an integrated circuit against fraudulent use |
| 09/03/1992 | WO1992015022A1 Testing heavy current batteries |
| 09/03/1992 | WO1992015021A1 Voltage imaging system using electro-optics |
| 09/03/1992 | WO1992015020A1 Instrument for measuring electrical resistance |
| 09/03/1992 | DE4206072A1 Fuse rupture indication circuit - has isolated signal coupler between fuse circuit and output stage providing blown condition signal |
| 09/03/1992 | DE4203854A1 Charging batteries rapidly and frequently, e.g. for electric vehicle - ascertaining battery charge, internal resistance and gas formation voltage in test cycle before charging from external current source |
| 09/03/1992 | DE4202623A1 Sensing path arrangement for test circuits, e.g. for testing RAM(s) - has two groups of registers in series with controller managing priority of shift operation of first gp. |
| 09/03/1992 | DE4106725A1 Ladezustandsanzeige einer batterie A battery charge indicator |
| 09/03/1992 | DE4106664A1 Battery charge indicator for all types of sizes of battery - has microencapsulated display crystal which undergoes colour change according to charge of connected battery |
| 09/03/1992 | DE4105769A1 Automatically charging accumulator, e.g. for remote control applications - applying rapid charge period followed by test cycle and further charging cycles with currents dependent on charge |
| 09/03/1992 | CA2104373A1 Method of protecting an integrated circuit against fraudulent use |
| 09/02/1992 | EP0501722A2 Transmission line length measurement method and apparatus |
| 09/02/1992 | EP0501609A1 Battery |
| 09/02/1992 | EP0501165A1 State of charge indicator for a battery or an accumulator in a remote control transmitter |
| 09/02/1992 | EP0500997A1 Switchgear influencing device |
| 09/02/1992 | EP0500706A1 Method for measuring mechanical torque. |
| 09/02/1992 | CN2114836U Pressure-resistant tester |
| 09/02/1992 | CN2114834U Multimeter with megaohm range |
| 09/02/1992 | CN1018091B Noise component analysis and measure system |
| 09/01/1992 | US5144627 Test mode switching system for lsi |
| 09/01/1992 | US5144430 Device and method for generating a video signal oscilloscope trigger signal |
| 09/01/1992 | US5144255 Multiple synchronized agile pulse generator |
| 09/01/1992 | US5144248 Load; nickel-cadmium battery; shunt resistor; current conditioner; voltage conditioner with reference voltage means, comparison signal means, signal integrating means, integrating time indicator; microprocessor; liquid crystal display |
| 09/01/1992 | US5144246 Vacuum tube characterization apparatus |
| 09/01/1992 | US5144232 Testing device for an electric generator |
| 09/01/1992 | US5144229 Method for selectively conditioning integrated circuit outputs for in-circuit test |
| 09/01/1992 | US5144225 Methods and apparatus for acquiring data from intermittently failing circuits |
| 09/01/1992 | US5144218 Device for determining the charge condition of a battery |
| 09/01/1992 | US5144172 Detection circuit of the current in an mos type power transistor |
| 09/01/1992 | US5143450 Apparatus for handling devices under varying temperatures |
| 09/01/1992 | CA1307057C Electron beam testing of electronic components |
| 09/01/1992 | CA1307028C Cable fault detector |
| 08/27/1992 | DE4113606C1 PCB functional control and monitoring system - feeds test signal to additional thin conductor track formed between PCB connectors as control loop |
| 08/27/1992 | DE4105440A1 Climatic tester for electronic components and modules - uses at least two thermostatically controlled humidity chambers contg. saturated salt solns. at characteristic relative moistness levels |
| 08/27/1992 | DE4105075A1 Electronic control system with selector for IC engine - has A=D converter in control unit for translating divided voltage into memory address signal |
| 08/26/1992 | EP0500310A1 Automatic circuit tester with separate instrument and scanner busses |
| 08/26/1992 | EP0500056A1 Monitored burn-in system |
| 08/26/1992 | EP0499671A1 Integrated circuit chip with built-in self-test for logic fault detection |
| 08/26/1992 | CN2114168U Pocket line-break detector electrocians |
| 08/26/1992 | CN2114167U Multi-functional transistor fault line selector |
| 08/26/1992 | CN2114166U Non-contact voltage sensor for power cables |
| 08/25/1992 | US5142688 Data processor test mode access method |
| 08/25/1992 | US5142677 Context switching devices, systems and methods |
| 08/25/1992 | US5142234 Particle beam accelerator electromagnetic arc detection system |
| 08/25/1992 | US5142233 Tuning device with battery condition display |
| 08/25/1992 | US5142224 Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals |
| 08/25/1992 | US5142223 Device for testing semiconductor device |
| 08/25/1992 | US5142222 Integrated circuit device having signal discrimination circuit and method of testing same |
| 08/25/1992 | US5142104 High voltage insulator testing system |
| 08/25/1992 | US5140825 Method of operating a transport refrigeration unit |
| 08/20/1992 | WO1992014216A1 Interactive diagnostic system for an automotive vehicle, and method |
| 08/20/1992 | WO1992014162A1 Method and device for contactless measurement of the voltage in an object with an insulating surface |
| 08/20/1992 | WO1991012532A3 Process and device for loading an adapter for a printed circuit tester |
| 08/20/1992 | DE4105135A1 Testing insulating films etc. for pores - by passing between high voltage DC electrode and earthed sleeved roller with netting type spacer wound round roller to prevent contact |
| 08/20/1992 | DE4105018A1 Semiconductor film analogue investigation method for duration wave HFETs mfr. - evaluating photoluminescence spectrum to identify high charge carrier density component rates |
| 08/20/1992 | DE4104475A1 Test arrangement for electrical supply network - passes test current through network to detects current in or between neutral and earth lines |
| 08/19/1992 | EP0499429A2 Superconductor quench measuring system |
| 08/19/1992 | EP0499169A1 System for evaluating the characteristics of an electrical filter |
| 08/19/1992 | CN2113496U Relay checking box |
| 08/19/1992 | CN1063769A Battery charge monitor for personal computer |
| 08/18/1992 | US5140276 Armature connection resistance measuring method and apparatus |
| 08/18/1992 | US5140273 Electrode system to facilitate dielectric measurement of materials |
| 08/18/1992 | US5140272 Method of semiconductor surface measurment and an apparatus for realizing the same |
| 08/18/1992 | US5140269 Electronic tester for assessing battery/cell capacity |
| 08/18/1992 | US5140266 Apparatus and method for the non-destructive evaluation of a bifilar superconducting winding |
| 08/18/1992 | US5140176 Sequential logic circuit device |
| 08/18/1992 | US5140164 Ic modification with focused ion beam system |
| 08/18/1992 | US5139437 Socket |
| 08/18/1992 | CA1306496C Method and apparatus for high accuracy measurement of vlsi components |
| 08/13/1992 | DE4203234A1 Real=time bit error rate detector for A=D converter - has test wave generator coupled to A=D converter, sampling test waveform for comparison with theoretical data |
| 08/13/1992 | DE4122415C1 In-circuit test method for application specific programmable logic components - using all freely programmable connections as inputs and one application specific output as test output for evaluation of test signal |
| 08/13/1992 | DE4104376A1 Measuring thermal resistance and transient heat impedance of thyristors - detecting breakdown voltage produced by regulated measuring current as temp.-dependent electrical value at gate and auxiliary cathode terminals |
| 08/13/1992 | DE4104375A1 System for ensuring reproducible thermal test conditions in loading tests - carried out on power semiconductors using cooling body with closed cooling system also fixings and contacts between semiconductors and cooling body |
| 08/13/1992 | DE4104371A1 Method for insulation test of voltage supply lines laid in underground mine - compares test voltage level at disconnected voltage supply lines with operating voltage and uptake and reaction time of test voltage is controlled |
| 08/12/1992 | EP0498534A1 Artificial random-number pattern generating circuit |
| 08/12/1992 | EP0498449A2 Semiconductor integrated circuit device having dynamic burn-in circuit |
| 08/12/1992 | EP0498191A1 Delay test coverage enhancement for logic circuitry employing level sensitive scan design |
| 08/12/1992 | EP0498007A1 Method and apparatus for contactless testing |
| 08/12/1992 | EP0497909A1 Cryogenic probe station |
| 08/12/1992 | CN2112834U Alarm device for leakage of electricity |
| 08/12/1992 | CN2112833U Cable theft-proof alarm device |
| 08/12/1992 | CN2112832U Digital communication cable connection tester |
| 08/12/1992 | CN2112831U Discharging test box |
| 08/12/1992 | CN2112830U Multi-function code relay time proporty tester |
| 08/12/1992 | CN1063558A Property measuring instrument for semiconductor devices |
| 08/12/1992 | CN1063557A Measuring system for transient charges |
| 08/12/1992 | CN1017829B Method and apparatus for determining deterioration of electric power line |
| 08/12/1992 | CA2060921A1 Superconductor quench measuring system |
| 08/11/1992 | US5138427 Semiconductor device having a particular structure allowing for voltage stress test application |
| 08/11/1992 | US5138266 Single-probe charge measurement testing method |
| 08/11/1992 | US5138265 Apparatus and system for locating thunderstruck point and faulty point of transmission line |
| 08/11/1992 | US5138257 Circuit for testing internal data bus of integrated circuit |
| 08/11/1992 | US5138256 Method and apparatus for determining the thickness of an interfacial polysilicon/silicon oxide film |