| Patents for G01Q 20 - Monitoring the movement or position of the probe (1,663) |
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| 02/24/2011 | US20110047662 Apparatus and method for investigating surface properties of different materials |
| 02/24/2011 | US20110047661 Microprobe, measurement system and method |
| 02/24/2011 | US20110043229 Quantum tunnelling sensor device and method |
| 02/23/2011 | EP2287624A2 Scanning Probe System |
| 02/17/2011 | US20110041223 Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy |
| 02/16/2011 | CN101975873A Microscopic white light interferometry-based nano probe device |
| 02/15/2011 | US7891016 Automatic landing method and apparatus for scanning probe microscope using the same |
| 02/10/2011 | US20110035849 SPM Imaging Apparatus, Probe and Method |
| 02/03/2011 | US20110030109 Surface state measuring device, and surface state measuring method using the device |
| 01/26/2011 | EP2278264A1 Probe microscope |
| 01/26/2011 | CN101960287A Fast-scanning spm and method of operating same |
| 01/20/2011 | US20110014378 Leveling devices and methods |
| 01/19/2011 | CN101952706A Scanning type probe microscope |
| 01/18/2011 | US7874016 Scanning probe microscope and scanning method |
| 12/29/2010 | WO2010150756A1 Scanning probe microscope and probe proximity detection method therefor |
| 12/14/2010 | US7854016 Process for manufacturing probes intended to interact with a storage medium and probe obtained thereby |
| 12/09/2010 | US20100313311 Scanning probe in pulsed-force mode, digital and in real time |
| 12/08/2010 | EP2259009A1 Arrangement and method for measuring relative movement |
| 12/02/2010 | US20100306885 Cantilevers with Integrated Actuators for Probe Microscopy |
| 12/02/2010 | DE19721112B4 Autofokussierverfahren Autofocusing |
| 10/05/2010 | US7810166 Device and method for scanning probe microscopy |
| 10/05/2010 | US7808656 Probe sensor with multi-dimensional optical grating |
| 10/05/2010 | US7806008 Sample analysis using cantilever probe |
| 09/30/2010 | US20100251437 Method and Apparatus for Characterizing a Sample with Two or More Optical Traps |
| 09/16/2010 | US20100235955 Vibration compensation in probe microscopy |
| 09/16/2010 | US20100235954 Dual-tip cantilever |
| 09/14/2010 | US7797757 Cantilevers with integrated actuators for probe microscopy |
| 09/09/2010 | US20100229262 Apparatus and method for examining a specimen by means of probe microscopy |
| 09/07/2010 | US7791050 Method and apparatus for specimen fabrication |
| 09/01/2010 | EP2223036A1 Microprobe, measurement system and method |
| 08/31/2010 | US7787133 Optical displacement-detecting mechanism and probe microscope using the same |
| 08/26/2010 | US20100218287 Scanning probe microscope and method of observing sample using the same |
| 08/26/2010 | US20100218286 Modulated microwave microscopy and probes used therewith |
| 08/26/2010 | US20100218284 Method for examining a test sample using a scanning probe micrscope, measurement system and a measuring probe system |
| 08/19/2010 | US20100207039 Probe Microscopy and Probe Position Monitoring Apparatus |
| 08/18/2010 | EP2218075A1 Device and method for an atomic force microscope for the study and modification of surface properties |
| 08/12/2010 | US20100205698 Atomic force microscopy probe |
| 08/05/2010 | US20100199393 Probe microscope |
| 08/05/2010 | DE102010001467A1 Sondenmikroskop Probe microscope |
| 08/03/2010 | US7770231 Fast-scanning SPM and method of operating same |
| 07/20/2010 | US7757544 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 07/15/2010 | US20100180355 Probe Sensor with Multi-Dimensional Optical Grating |
| 07/08/2010 | US20100175155 Measurement and Mapping of Molecular Stretching and Rupture Forces |
| 06/23/2010 | EP2199769A2 Force measuring device |
| 06/17/2010 | WO2010067570A1 Method for processing output of scanning type probe microscope, and scanning type probe microscope |
| 06/17/2010 | WO2010067129A1 Dynamic probe detection system |
| 06/17/2010 | US20100149545 Apparatus and Method for Measuring Deformation of a Cantilever Using Interferometry |
| 06/17/2010 | CA2746147A1 Dynamic probe detection system |
| 06/10/2010 | US20100146673 Apparatus and Method for Investigating Biological Systems and Solid Systems |
| 05/27/2010 | US20100132075 Self displacement sensing cantilever and scanning probe microscope |
| 05/20/2010 | DE112008001611T5 Positionssteuerung für die Rastersondenspektroskopie Position control for scanning probe spectroscopy |
| 05/18/2010 | US7719663 Heterodyne laser doppler probe and measurement system using the same |
| 05/18/2010 | US7716970 Scanning probe microscope and sample observation method using the same |
| 05/13/2010 | US20100122385 Method and apparatus of operating a scanning probe microscope |
| 05/12/2010 | EP2183569A2 Fast-scanning spm and method of operating same |
| 05/12/2010 | EP2183568A2 Heterodyne detection device for imaging an object by re-injection |
| 04/29/2010 | US20100107284 Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever |
| 04/28/2010 | EP2179266A1 Miniaturized spring element and method for producing the latter |
| 04/27/2010 | US7705999 Probe sensor with multi-dimensional optical grating |
| 04/22/2010 | US20100100989 Piezoresistor height sensing cantilever |
| 04/08/2010 | US20100088787 Pump probe measuring device and scanning probe microscope apparatus using the device |
| 04/07/2010 | EP2171425A1 Apparatus and method for investigating surface properties of different materials |
| 04/06/2010 | US7694347 Measuring device with daisy type cantilever wheel |
| 03/23/2010 | US7681439 Measuring apparatus |
| 03/17/2010 | EP2163906A1 Method of detecting a movement of a measuring probe and measuring instrument |
| 02/18/2010 | US20100038535 Sample dimension measuring method and scanning electron microscope |
| 02/10/2010 | EP2150799A1 Atomic force microscopy probe |
| 01/28/2010 | US20100024082 Atomic force microscope |
| 01/26/2010 | CA2428218C Apparatus for parallel detection of the behaviour of mechanical micro-oscillators |
| 01/21/2010 | US20100017921 Device and method for the micromechanical positioning and handling of an object |
| 01/21/2010 | US20100013456 Arrangement for Detecting Resonance Frequency Shifts |
| 01/13/2010 | EP2142906A1 Probe microscopy and probe position monitoring apparatus |
| 01/12/2010 | US7646494 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers |
| 12/30/2009 | EP2137737A2 Fast scanning spm scanner and method of operating same |
| 12/30/2009 | EP2137566A1 Driving scanning fiber devices with variable frequency drive signals |
| 12/29/2009 | US7637149 Integrated displacement sensors for probe microscopy and force spectroscopy |
| 12/17/2009 | US20090313729 Scan type probe microscope and cantilever drive device |
| 12/15/2009 | US7631547 Scanning probe apparatus and drive stage therefor |
| 12/15/2009 | US7631546 Method and apparatus for monitoring of a SPM actuator |
| 12/10/2009 | WO2009147452A1 Method of probe alignment |
| 12/10/2009 | WO2009147450A1 Probe detection system |
| 12/10/2009 | CA2727118A1 Probe detection system |
| 12/02/2009 | EP1451848B1 Device and method for reducing the impact of distortions in a microscope |
| 11/19/2009 | US20090286172 Surface shape measurement apparatus and exposure apparatus |
| 11/18/2009 | EP0847590B1 A scanning probe microscope having automatic probe exchange and alignment |
| 11/10/2009 | US7615738 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
| 11/10/2009 | US7614287 Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same |
| 10/27/2009 | US7608842 Driving scanning fiber devices with variable frequency drive signals |
| 10/27/2009 | US7607343 System for nano position sensing in scanning probe microscopes using an estimator |
| 10/21/2009 | CN100552421C Detection method for photon crystal surface periodic structure |
| 09/17/2009 | US20090235396 Integrated optical scanning image acquisition and display |
| 09/09/2009 | CN100538913C Sensor with suspending arm and optical resonator |
| 09/03/2009 | US20090219506 Heterodyne laser doppler probe and measurement system using the same |
| 08/20/2009 | US20090207404 System and Method for Surface Inspection of Micro- and Nanomechanical Structures |
| 08/19/2009 | EP2090877A2 Microlever containing a magneto-impedance stress sensor |
| 08/06/2009 | DE102008006697A1 Movable measuring sensor's position and/or movement detecting device for e.g. scanning force microscope, has light guiding units with beam guides provided for guiding light reflected by measuring sensors to light sensitive detector unit |
| 08/04/2009 | US7569077 Probe positional error from comparising image sequence of scans to identify differences between positions of a portion of a reference specimen characteristic in the images; probe moved to target location for spectroscopic analysis, as a function of the determined probe positional error; nanotechnolgy |
| 07/30/2009 | WO2009093284A1 Scanning type probe microscope |
| 07/16/2009 | WO2009063145A3 Heterodyne detection device for imaging an object by re-injection |
| 07/14/2009 | US7560921 Method and device for analyzing distribution of coercive force in vertical magnetic recording medium using magnetic force microscope |