Patents
Sitemap › G01 - Measuring; Testing › G01Q - Scanning-probe techniques or apparatus; Applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm] › G01Q 20 - Monitoring the movement or position of the probe
Patents for G01Q 20 - Monitoring the movement or position of the probe (1,663)
02/2015
02/26/2015US20150059026 Measuring surface curvature
02/17/2015US8959661 Atomic force microscope probe, method for preparing same, and uses thereof
02/11/2015EP2835652A1 Scanning mechanism and scanning probe microscope
01/2015
01/22/2015WO2015008402A1 Scanning probe microscope prober employing self-sensing cantilever
01/15/2015US20150020244 Beam scanning system
12/2014
12/30/2014US8925111 Scanning probe microscope and method of operating the same
11/2014
11/18/2014US8893311 Three-dimensional imaging and manipulation
11/18/2014US8887584 Load measuring apparatus
11/13/2014US20140338074 Microscope probe and method for use of same
11/11/2014US8887311 Scanning probe microscope
11/06/2014US20140331367 Motion sensor integrated nano-probe n/mems apparatus, method, and applications
10/2014
10/28/2014US8875311 Scanning probe microscopy cantilever comprising an electromagnetic sensor
10/28/2014US8869602 High frequency deflection measurement of IR absorption
10/23/2014US20140317790 Optical beam positioning unit for atomic force microscope
10/21/2014US8869311 Displacement detection mechanism and scanning probe microscope using the same
10/14/2014US8857248 Piezoelectric microcantilevers and uses in atomic force microscopy
10/02/2014US20140297222 Actuator Position Calculation Device, Actuator Position Calculation Method, and Actuator Position Calculation Program
09/2014
09/25/2014US20140289911 Method of investigating a sample surface
09/18/2014WO2014144496A1 Chemical nano-identification of a sample using normalized near-field spectroscopy
09/18/2014US20140283229 Method and Apparatus of Operating a Scanning Probe Microscope
09/09/2014US8832859 Probe alignment tool for the scanning probe microscope
08/2014
08/19/2014US8810110 Micro-mechanical component with cantilever integrated electrical functional element
08/14/2014US20140230103 Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample
08/07/2014US20140223615 Method and Apparatus of Operating a Scanning Probe Microscope
08/05/2014US8796651 Method and apparatus for specimen fabrication
07/2014
07/08/2014US8776261 Tool tips with scanning probe microscopy and/or atomic force microscopy applications
07/03/2014WO2014104892A1 A micromechanical system with a composite beam having an adjustable stiffness
07/02/2014EP2749890A1 A composite beam having an adjustable stiffness.
07/02/2014CN102084431B 探针检测系统 Probe Detection System
07/01/2014US8769710 Atomic force microscope system using selective active damping
06/2014
06/05/2014WO2014083358A1 Probe calibration or measurement routine
05/2014
05/29/2014US20140150139 Method of controlling frequency modulated-atomic force microscope
05/27/2014US8739309 Method and apparatus of operating a scanning probe microscope
05/13/2014US8726411 Charged probe and electric fields measurement method thereof
05/13/2014US8726409 Method for driving a scanning probe microscope at elevated scan frequencies
05/01/2014US20140123347 Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring
04/2014
04/17/2014WO2014057268A1 Multiple probe actuation
04/10/2014WO2014055046A1 Method for performing the local charge transient analysis
04/01/2014US8689359 Apparatus and method for investigating surface properties of different materials
04/01/2014US8689358 Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers
04/01/2014CA2631179C Optical device comprising a cantilever and method of fabrication and use thereof
03/2014
03/20/2014US20140082775 Modular UHV Compatible Angle Physical Contact Fiber Connection for Transferable Fiber Interferometer Type Dynamic Force Microscope Head
03/18/2014US8677511 Apparatus for charged particle lithography system
03/06/2014WO2014033452A1 Multiple probe actuation
03/06/2014WO2014033451A1 Multiple probe detection and actuation
03/06/2014WO2014033430A1 Photothermal actuation of a probe for scanning probe microscopy
03/04/2014US8667611 Method and apparatus for measuring cantilever deflection in constrained spaces
03/04/2014US8666165 Scanning electron microscope
02/2014
02/18/2014US8654340 Heterodyne detection device for imaging an object by re-injection
02/13/2014WO2014024685A1 Scanning mechanism and scanning probe microscope
02/11/2014US8650660 Method and apparatus of using peak force tapping mode to measure physical properties of a sample
01/2014
01/07/2014US8627511 Electronic control and amplification device for a local piezoelectric force measurement probe under a particle beam
12/2013
12/24/2013US8615811 Method of measuring vibration characteristics of cantilever
12/19/2013US20130340125 Band excitation method applicable to scanning probe microscopy
12/18/2013CN103454454A Laser force measuring system for double-probe atomic force microscope
11/2013
11/21/2013US20130312142 System and method for high-speed atomic force microscopy
11/07/2013US20130298294 System and method for imaging soft materials
10/2013
10/30/2013EP2656085A1 Atomic force microscope probe, method for preparing same, and uses thereof
10/29/2013US8569719 Method and apparatus for specimen fabrication
10/24/2013US20130278937 Integrated Displacement Sensors for Probe Microscopy and Force Spectroscopy
10/17/2013US20130276174 Method and Apparatus of Electrical Property Measurement Using an AFM Operating in Peak Force Tapping Mode
10/17/2013DE102010012701B4 Mikrokraftsensor Micro force sensor
10/10/2013WO2013150624A1 Scanning mechanism and scanning probe microscope
10/02/2013CN102507984B Scanning probe microscopy and motion detection device thereof
10/01/2013US8544324 Quantum tunnelling sensor device and method
09/2013
09/03/2013US8528110 Probe detection system
09/03/2013US8524488 Methods and devices for determining a cell characteristic, and applications employing the same
08/2013
08/22/2013DE10110933B4 Mikrosonde und Abtastsondenvorrichtung mit der Mikrosonde Microprobe and Abtastsondenvorrichtung with the microprobe
08/08/2013WO2013114100A1 Beam scanning system
08/08/2013WO2013114099A1 Probe actuation
08/06/2013US8499621 Scanning probe microscopy inspection and modification system
07/2013
07/16/2013US8490209 Surface state measuring device, and surface state measuring method using the device
07/09/2013US8484755 Microprobe, measurement system and method
07/02/2013US8479311 Device and method for an atomic force microscope for the study and modification of surface properties
07/02/2013US8479310 Dynamic probe detection system
06/2013
06/27/2013US20130167272 Electrical-mechanical complex sensor for nanomaterials
06/13/2013WO2013085278A1 Monitoring device using selective attention model and method for monitoring same
05/2013
05/14/2013US8443459 Fast-scanning SPM scanner and method of operating same
05/08/2013CN103097281A Micro optical device
05/02/2013US20130111635 Probe head scanning probe microscope including the same
05/02/2013DE102012217192A1 Automatische Abstimmung eines Atomkraftmikroskops Automatic tuning of an atomic force microscope
04/2013
04/18/2013US20130097739 Cantilever of Scanning Probe Microscope and Method for Manufacturing the Same, Method for Inspecting Thermal Assist Type Magnetic Head Device and its Apparatus
04/18/2013DE102010052037B4 Sensor und Verfahren zum berührungslosen Abtasten einer Oberfläche Sensor and method for the contactless scanning a surface
03/2013
03/26/2013US8405053 Method and apparatus for specimen fabrication
03/12/2013US8396535 Integrated optical scanning image acquisition and display
03/05/2013US8393010 Near-field scanning optical microscope
02/2013
02/28/2013US20130055473 Device and method for differentiating target cell
02/26/2013US8387158 Laser guided tip approach with 3D registration to a surface
02/21/2013US20130047302 Processes for surface measurement and modification by scanning probe microscopy functioning in continuous curvilinear mode, scanning probe microscope and device permitting their implementation of said methods
02/14/2013DE102012214181A1 Rastersondenmikroskop-Hebelarm mit einem elektromagnetischen Sensor Scanning probe microscope arm with an electromagnetic sensor
12/2012
12/11/2012US8332960 Device for scanning a sample surface covered with a liquid
11/2012
11/29/2012US20120304341 Electronic control and amplification device for a local piezoelectric force measurement probe under a particle beam
11/27/2012US8321960 Scanning probe microscope
11/27/2012US8321959 Cantilevers with integrated piezoelectric actuators for probe microscopy
11/22/2012DE102011050493A1 Vorrichtung und Verfahren zur Detektion der Auslenkung elastischer Elemente Apparatus and method for detecting the deflection of elastic members
11/14/2012CN101379383B Miniaturized spring element and method for producing the spring element
10/2012
10/25/2012US20120272411 Nanoindenter
10/16/2012US8288154 Motion sensor for monitoring migration, vibrational movement, oscillations and fluctuation in semen, ear cilia, bacteria and kinesins
10/09/2012US8286261 Scanning probe in pulsed-force mode, digital and in real time
09/2012
09/27/2012US20120246768 Method of measuring vibration characteristics of cantilever
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