| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 10/24/2001 | EP1148333A1 Automatic casting defects recognition in specimens |
| 10/24/2001 | EP1147482A1 Apparatus and method for detecting concealed objects in computed tomography data |
| 10/24/2001 | EP1147481A1 Apparatus and method for processing objects in computed tomography data using object projections |
| 10/24/2001 | EP1147407A1 X-ray fluorescent emission analysis to determine material concentration |
| 10/24/2001 | EP1147406A1 Unilateral hand-held x-ray inspection apparatus |
| 10/24/2001 | EP1146819A1 Progressive correction of computed tomography ring artifacts |
| 10/24/2001 | EP0770258B1 X-ray apparatus for applying a predetermined flux to an interior surface of a body cavity |
| 10/24/2001 | CN1318503A In-site non-destructive container inspection equipment |
| 10/23/2001 | US6307917 Soller slit and X-ray apparatus |
| 10/23/2001 | US6307910 Methods and apparatus for reduced radiation coronary computed tomography imaging |
| 10/23/2001 | US6307909 Method for image reconstruction in a computed tomography device |
| 10/18/2001 | WO2001077654A1 Digital imaging apparatus |
| 10/18/2001 | WO2001077653A1 X-ray inspection system |
| 10/18/2001 | WO2001025748A3 Methods for identification and verification |
| 10/18/2001 | WO2000040952A3 Device for the precision rotation of samples |
| 10/18/2001 | US20010030300 Method of inspecting pattern and apparatus thereof |
| 10/18/2001 | US20010030294 Method and an apparatus of an inspection system using an electron beam |
| 10/18/2001 | US20010030287 Method of observing image and scanning electron microscope |
| 10/18/2001 | US20010030286 Scanning probe microscope |
| 10/18/2001 | EP1144988A3 Device for the precision rotation of samples |
| 10/18/2001 | DE10064073A1 Process for determining the crystallographic orientation of semiconductor single crystals comprises measuring an X-ray auxiliary reflex on a planar region of the surface of the crystals |
| 10/18/2001 | DE10018982A1 Device for measuring optical properties of object surfaces, e.g. painted vehicle surfaces, for quality assurance following painting during production or after repair, has a mechanism that ensures it is correctly aligned |
| 10/18/2001 | DE10017611A1 Spin-polarized particle beam analyzer, has superconducting guides with critical transition temperature higher than irradiation low temperature, critical field strength above stray field strength |
| 10/18/2001 | DE10017345A1 Fourth generation computer tomography equipment |
| 10/18/2001 | DE10016678A1 Method for irradiation of material in object containing materials with extremely different absorption properties by controlling projection position of irradiating beam |
| 10/17/2001 | EP1145194A2 Computerized tomography for non-destructive testing |
| 10/17/2001 | EP1144989A1 Nanotomography |
| 10/17/2001 | EP1144988A2 Device for the precision rotation of samples |
| 10/17/2001 | EP1144987A1 Method of determining the charge carrier concentration in materials, notably semiconductors |
| 10/17/2001 | EP1144986A2 Energy dispersion x-ray fluorescence analysis of chemical substances |
| 10/17/2001 | EP0809912B1 X-ray examination apparatus including an image sensor matrix with a correction unit |
| 10/17/2001 | CN1317802A Device for recording off-axis X-ray hologram |
| 10/17/2001 | CN1317689A Atomic beam interferometer |
| 10/16/2001 | US6304629 Compact scanner apparatus and method |
| 10/16/2001 | US6304626 Two-dimensional array type of X-ray detector and computerized tomography apparatus |
| 10/16/2001 | US6304625 Dose instrumentation methods and apparatus for collimated CT imaging systems |
| 10/16/2001 | US6303931 Method for determining a profile quality grade of an inspected feature |
| 10/16/2001 | US6303930 Coordinating optical type observing apparatus and laser marking method |
| 10/16/2001 | US6302579 Multiple examination arrangement with a number of imaging systems |
| 10/11/2001 | WO2001076327A2 Method for operating a radiation examination device |
| 10/11/2001 | WO2001075934A2 Integrated full wavelength spectrometer for wafer processing |
| 10/11/2001 | WO2001075426A1 Analyzing method for non-uniform-density sample and device and system therefor |
| 10/11/2001 | WO2000050867A9 Programmable active microwave ultrafine resonance spectrometer (pamurs) method and systems |
| 10/11/2001 | US20010028698 Open chamber-type X-ray analysis apparatus |
| 10/11/2001 | US20010028697 Multi-slice detector array |
| 10/11/2001 | US20010028033 Microprobe and sample surface measuring apparatus |
| 10/11/2001 | DE10113966A1 Sondenelektronenmikroskop Electron probe |
| 10/11/2001 | DE10016679A1 Interference suppression method for tomosynthetic image reconstruction used in medical diagnosis, involves performing tomosynthetic image reconstruction on marked bad segments |
| 10/11/2001 | DE10015824A1 Image data set generating system for medical X-ray system |
| 10/11/2001 | DE10015815A1 Image data set generating system for medical diagnostics - superimposes or merges image data obtained from X-ray and ultrasound systems, whose position was determined using navigation system |
| 10/10/2001 | EP1141683A2 A nonintrusive inspection system |
| 10/10/2001 | EP1141253A1 Crystalline form of activated trap and use thereof for structure-based drug design |
| 10/10/2001 | CN2453436Y Online analysing device for components in coal fed into furnace of power plant |
| 10/09/2001 | US6301330 Apparatus and method for texture analysis on semiconductor wafers |
| 10/09/2001 | US6301327 Method and apparatus for examining luggage by x-ray scanning |
| 10/09/2001 | US6301326 Sheet detection system |
| 10/09/2001 | US6300634 Method and apparatus for measuring the condition of degradable components |
| 10/09/2001 | US6300631 Method of thinning an electron transparent thin film membrane on a TEM grid using a focused ion beam |
| 10/09/2001 | US6300629 Defect review SEM with automatically switchable detector |
| 10/09/2001 | US6300026 Radius of vacancy type defects in photosensitive layer and undercoating measured by positron annihilation |
| 10/04/2001 | WO2001073415A2 Detection of fissile material |
| 10/04/2001 | US20010025938 Image storage medium and method of manufacturing the same |
| 10/04/2001 | US20010025929 Secondary electron filtering method, defect detection method and device manufacturing method using the same method |
| 10/04/2001 | US20010025925 Charged particle beam system and pattern slant observing method |
| 10/04/2001 | EP1139091A1 Electron spectrometer with deflection unit |
| 10/04/2001 | EP1137937A1 Using hair to screen for breast cancer |
| 10/04/2001 | EP1137930A1 Methods for identification and verification |
| 10/04/2001 | EP0746938B1 Composing an image from sub-images |
| 10/04/2001 | DE10015385A1 Mossbauer spectroscopy, comprises measuring the intensity of radiation emitted from a sample, taking into account its energy and the relative movement between sample and radiation source |
| 10/03/2001 | CN2452022Y Analyzer for water percentage of high-precision curde oil |
| 10/03/2001 | CN1316094A Image display, method for disassembling same, and method for recovering part |
| 10/02/2001 | US6298111 X-ray computed tomography apparatus |
| 10/02/2001 | US6297021 Detecting ligand that binds to polypeptide; mix polypeptide and ligands, crystallize, obtain diffraction pattern, detect bound ligand/polypeptide complex |
| 09/27/2001 | WO2001071384A1 A method and a device for radiography and a radiation detector |
| 09/27/2001 | WO2001071325A2 Calibration and alignment of x-ray reflectometric systems |
| 09/27/2001 | US20010024484 Method and a device for radiography and a radiation detector |
| 09/27/2001 | DE10011115A1 Analysis method using X-ray fluorescence uses unfiltered X-ray radiation generated using acceleration voltage of between 5 and 60 kV |
| 09/26/2001 | EP1137045A2 Method of producing a broad-band signal for an ion trap mass spectrometer |
| 09/26/2001 | EP1136816A2 X-ray spectroscopic analyzer having sample surface observation mechanism |
| 09/26/2001 | EP1135700A1 Fan and pencil beams from a common source for x-ray inspection |
| 09/26/2001 | EP1029340A4 Apparatus and method for secondary electron emission microscope |
| 09/26/2001 | CN1314589A Shear wave resonant absorption spectrum instrument of liquid film |
| 09/26/2001 | CN1314588A Shear wave vibrative energy absorption spectrum instrument |
| 09/26/2001 | CN1314580A Method for setting measured object position in measuring thin layer thickness by x-ray fluorescent light |
| 09/25/2001 | US6295335 Radiographic control of an object having a crystal lattice |
| 09/25/2001 | US6295333 Fluorescent X-ray analyzer |
| 09/20/2001 | WO2001069215A2 Apparatus for analyzing samples using combined thermal wave and x-ray reflectance measurements |
| 09/20/2001 | WO2001068861A2 THREE-DIMENSIONAL MODEL OF A Fc REGION OF AN IgE ANTIBODY AND USES THEREOF |
| 09/20/2001 | US20010022830 High speed materials sorting using x-ray fluorescence |
| 09/20/2001 | US20010022829 Method of setting a position of an object of measurement in layer thickness measurement by x-ray fluorescence |
| 09/20/2001 | US20010022345 Method of inspecting holes using charged-particle beam |
| 09/20/2001 | DE10013048A1 Position adjusting method for layer thickness measurement involves varying space between surface of measurement object and collimator to change brightness of pixels on measurement plane |
| 09/20/2001 | DE10012314A1 Detektorsystem für ein Korpuskularstrahlgerät und Korpuskularstrahlgerät mit einem solchen Detektorsystem Detector system for a particle beam apparatus and particle beam device with such a detector system |
| 09/20/2001 | DE10011877A1 Collimator for X-ray computer tomograph - comprises recording arrangement from two shell halves which include side slots for recording collimator sheets in two parallel sides, whereby side slots are directed on X-ray source located outside collimator |
| 09/20/2001 | DE10009746A1 Reducing line artefacts in computer tomography image |
| 09/20/2001 | CA2400825A1 Three-dimensional model of a fc region of an ige antibody and uses thereof |
| 09/19/2001 | EP1134772A1 Detector system for a corpuscular beam apparatus and corpuscular beam apparatus with such a detector system |
| 09/19/2001 | EP1133785A2 Detector configuration for efficient secondary electron collection in microcolumns |
| 09/19/2001 | EP1090310A4 Multi-density and multi-atomic number detector media for applications |
| 09/18/2001 | US6292533 Mobile X-ray inspection system for large objects |