Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
06/2001
06/19/2001US6249564 Method and system for body composition analysis using x-ray attenuation
06/19/2001US6249563 X-ray detector array maintained in isothermal condition
06/19/2001US6248603 Method of measuring dielectric layer thickness using SIMS
06/14/2001WO2001025820A3 Methods for identification and verification
06/13/2001EP1105921A1 Process for mapping metal contaminant concentration on a silicon wafer surface
06/13/2001EP1105814A1 Method of determining an intrinsic spectrum from a measured spectrum
06/13/2001EP1105742A1 Method for measuring two-dimensional potential distribution in cmos semiconductor components
06/13/2001EP1105717A1 Digital radiographic weld inspection system
06/13/2001EP1017986B1 A method of determining the density profile
06/13/2001DE19959092A1 Obtaining three-dimensional images of objects involves combining reconstruction images using weighted addition; each image is weighted using noise and/or artifact distribution function
06/13/2001DE19950794A1 Radiological device e.g. for radiological imaging for computer tomography
06/13/2001DE10060946A1 X-ray detector for computer tomography imaging system, transfers heat between two specified locations bidirectionally for maintaining isothermal state for detection cells near channel segment
06/13/2001CN2434672Y Radiation detector for container
06/13/2001CN2434671Y Radiation detector for container
06/13/2001CN2434670Y Radiation detector for container
06/13/2001CN1299467A Ligand screening and design by x-ray crystallography
06/13/2001CN1299051A Intelligent stack control method for uniformly mixed ores
06/12/2001US6246747 Multi-energy x-ray machine with reduced tube loading
06/12/2001US6246745 Method and apparatus for determining bone mineral density
06/12/2001US6244118 Sampling apparatus
06/07/2001WO2001041067A1 Method for extracting objective image
06/07/2001WO2001040876A1 Method and apparatus for aligning a crystalline substrate
06/07/2001WO2001040781A1 X-ray tester
06/07/2001WO2001040735A1 Analyzer/observer
06/07/2001WO2001025821A3 Methods for identification and verification
06/07/2001DE19954664A1 Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien eines Gegenstandes Apparatus for determining of crystalline and polycrystalline materials of an object
06/07/2001DE19954663A1 Verfahren und Vorrichtung zur Bestimmung eines Materials eines detektierten Gegenstandes Method and apparatus for determination of a material of a detected object
06/07/2001DE19954662A1 Vorrichtung und Verfahren zum Detektieren von unzulässigen Reisegepäckgegenständen Apparatus and method for detecting improper luggage articles
06/07/2001DE10030145A1 Semiconductor wafer testing method involves irradiating charged particle on small region of wafer containing maximum opening defect, based on position data
06/07/2001CA2392710A1 Method and apparatus for aligning a crystalline substrate
06/06/2001EP1104546A2 Device and process for investigating chemical interactions
06/06/2001CN2433620Y X-ray fluorescent direct digital imaging device
06/06/2001CN1298203A Mask detecting apparatus and method
06/06/2001CN1298099A One-step mass spectrographic analysis process to measure the ratio and contents of neodymium isotopes
06/05/2001US6243438 Multi-slice detector array
06/05/2001US6242392 Grinding aids for X-ray fluorescence analysis
06/05/2001CA2233074C Container fill level and pressurization inspection using multi-dimensional images
05/2001
05/31/2001WO2001039211A1 Doubly curved optical device with graded atomic planes
05/31/2001WO2001039105A1 Weighted inverse topography method for digital x-ray image data processing
05/31/2001WO2001038861A2 X-ray fluorescence apparatus
05/31/2001WO2001009925A3 Apparatus and method for texture analysis on semiconductor wafers
05/31/2001WO2000046592A3 Method and apparatus for examination of bodies by penetrating radiation
05/31/2001WO1999024553A9 X-ray crystal comprising hiv-1 gp120
05/31/2001DE19954661A1 Radiographic installation collimator adjuster has two detectors to position collimator in line with primary ray
05/31/2001DE10059016A1 Method for testing for holes in semiconductor component using charged particle beam
05/31/2001CA2391034A1 Weighted inverse topography method for digital x-ray image data processing
05/30/2001EP1103806A2 Method of rapidly screening x-ray powder diffraction patterns
05/30/2001EP1102980A1 Sample changer for transferring radioactive samples between a hot cell and a measuring apparatus
05/30/2001CN2432581Y Needle-hole back scattering imaging device
05/30/2001CN2432185Y Automatic platform car circulating transfer machine of fixed container inspecting system
05/30/2001CN1297251A Electronic beam exposure method and used mask, and electronic beam exposure system
05/30/2001CN1297150A Method for expressing checked object using cross-section image
05/30/2001CN1297149A Device and method for detecting drug hidden in human body
05/29/2001US6240160 System for inspection of pipelines
05/29/2001US6240159 Fluorescent X-ray analyzer with path switching device
05/29/2001US6239448 Radiation image read-out method and apparatus
05/29/2001US6238941 Rather than trying to adjust a measured curve, a distinct model is used.
05/29/2001CA2243629C A method of determining the density profile
05/29/2001CA2204756C Hybrid multiplier tube with ion deflection
05/25/2001WO2001037287A1 Rotatable cylinder dual beam modulator
05/25/2001WO2001036997A1 Gamma-ray imaging
05/25/2001WO2001036966A2 An apparatus for machine fluid analysis
05/23/2001EP1102061A1 Combinatorial x-ray diffractor
05/23/2001EP1102060A1 Imaging plate x-ray diffraction apparatus
05/23/2001EP1102031A2 A pattern dimension measuring method and apparatus
05/23/2001EP1062555A4 Computed tomography apparatus and method for classifying objects
05/23/2001DE19955937A1 Computer tomography method for contact free testing of motor vehicle components that allows components on a conveyor belt to be rapidly inspected for internal defects at key weak points of the component
05/23/2001DE10048398A1 X-ray fluorescence spectrometer for X-ray sample analysis has correction calculator that corrects numerical value of pulses based on fixed counting time in response to generated selection signal
05/23/2001CN2431560Y Harmless flaw platform
05/23/2001CN1296287A Device for checking semiconductor device
05/23/2001CN1296178A X-ray guiding device
05/22/2001US6236709 Continuous high speed tomographic imaging system and method
05/22/2001US6236704 Method and apparatus using a virtual detector for three-dimensional reconstruction from x-ray images
05/22/2001US6236058 Image recording and reading system
05/22/2001US6236057 Method of inspecting pattern and apparatus thereof with a differential brightness image detection
05/18/2001CA2326062A1 Method of rapidly screening x-ray powder diffraction patterns
05/17/2001WO2001035085A1 Digital image orientation marker
05/17/2001WO2001035051A2 X-ray tomography bga (ball grid array) inspections
05/17/2001WO2000031769A9 Detector configuration for efficient secondary electron collection in microcolumns
05/17/2001DE19954520A1 Vorrichtung zur Führung von Röntgenstrahlen Device for guiding X-rays
05/17/2001DE19953613A1 Computer tomography apparatus
05/17/2001CA2390538A1 Digital image orientation marker
05/17/2001CA2390068A1 Inspection method utilizing vertical slice imaging
05/16/2001EP1100111A1 Deflection arrangement for separating two particle beams
05/16/2001EP1100092A2 X-ray guiding device
05/16/2001CN2430683Y Oil, water and gas three phase medium tester
05/16/2001CN1295248A Two-truck mobile container inspecting system with accelerator as radiation source
05/16/2001CN1295247A Foldable detector scanning-arm mechanism for mobile container inspecting system
05/16/2001CN1065958C Three-phase flow meter for oil, gas and water and measuring method thereof
05/15/2001US6233307 Compact X-ray spectrometer
05/15/2001US6233306 X-ray irradiation apparatus including an x-ray source provided with a capillary optical system
05/15/2001US6233305 Method, apparatus and their use in tomographic imaging
05/15/2001US6233096 Pseudo-spherical stepped diffractor constructed under constant step width conditions (multi-stepped monochromator)
05/15/2001US6232600 Analysis of semiconductor surfaces by secondary ion mass spectrometry
05/10/2001WO2001033920A1 Nondestructive inspection apparatus
05/10/2001WO2001033603A1 Electron beam apparatus
05/10/2001WO2001033252A1 Multi-energy x-ray machine with reduced tube loading
05/10/2001US20010001010 High resolution x-ray imaging of very small objects
05/10/2001DE10053178A1 Processing projection data for computer tomography system by solving ultra-hyperbolic equations in defined coordinate system
05/10/2001DE10049822A1 Displaying image information in sectional images for computer tomography