Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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02/14/2002 | US20020018542 Nonintrusive inspection system |
02/14/2002 | US20020018541 X-ray fluorescence analyzer |
02/14/2002 | US20020018540 "X-ray computed tomography apparatus with correction for beam hardening" |
02/14/2002 | US20020017610 Plane type radiation detector unit and x-ray image taking apparatus |
02/13/2002 | EP1179217A1 Secondary electron spectroscopy method and system |
02/13/2002 | CN2476814Y Coal ash content investigating device |
02/13/2002 | CN2476813Y Alpha ray investigating instrument |
02/13/2002 | CN1335497A Computer chromatographical X-ray photographic apparatus |
02/13/2002 | CN1079159C Measuring device for laser plasma parameters and its measuirng method |
02/12/2002 | US6347132 High energy X-ray inspection system for detecting nuclear weapons materials |
02/07/2002 | US20020016006 Forming a layout of powder samples; provide monolithic multicompartment block, insert sample, form flat surface, retain samples in position, test and monitor sample |
02/07/2002 | US20020015520 Automatic X-ray determination of solder joint and view delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography |
02/07/2002 | US20020015518 Semiconductor wafer pattern shape evaluation method and device |
02/07/2002 | US20020015475 A grid holding frame, which provides grid information to-ray image processing apparatus |
02/07/2002 | US20020015471 X-ray fluorescence analyzer |
02/07/2002 | US20020015469 Apparatus for optically transmitting data between rotor and stator and x-ray CT apparatus having the apparatus incorporated therein |
02/07/2002 | US20020014589 Three-dimensional atom microscope, three-dimensional observation method of atomic arrangemment, and stereoscopic measuring method of atomic arrangement |
02/07/2002 | DE10017611C2 Analysevorrichtung für spinpolarisierte Teilchenstrahlung Analysis device for spin polarized particle |
02/06/2002 | CN2476014Y Carbon. oxygen isotope analysis laser micro sampler |
02/06/2002 | CN1334459A Multi-source multi-direction ray source of single body |
02/06/2002 | CN1334458A Nondestructive tomographic imaging detection system and method for large object |
02/06/2002 | CN1334457A Method for detecting and checking liquid holding ratio of multi-phase tubular stream |
02/05/2002 | US6345113 Apparatus and method for processing object data in computed tomography data using object projections |
02/05/2002 | US6345086 X-ray fluorescence system and method |
02/05/2002 | US6345080 Measurement device for determining boron concentration |
02/05/2002 | US6344750 Voltage contrast method for semiconductor inspection using low voltage particle beam |
02/05/2002 | US6344649 Scintillator for a multi-slice computed tomograph system |
01/31/2002 | WO2002009142A1 Electronic microscope observation system and observation method |
01/31/2002 | WO2002008858A2 A method for ab initio determination of macromolecular crystallographic phases using bessel function |
01/31/2002 | WO2002008774A1 Probe driving method, and probe apparatus |
01/31/2002 | WO2002008739A1 Apparatus and method for in-situ measurement of residual surface stresses |
01/31/2002 | WO2002008738A1 On-line x-ray diffraction analyser |
01/31/2002 | US20020012420 Apparatus for superimposition of x-ray and video images |
01/31/2002 | US20020012419 Analysis of samples |
01/31/2002 | US20020012418 X-ray fluorescence thickness measurement device |
01/31/2002 | US20020012417 Method for reducing line artifacts in a CT image and device for implementing the method |
01/31/2002 | US20020012379 Thermal analysis apparatus |
01/31/2002 | US20020011565 Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system |
01/31/2002 | DE10035984C1 X-ray computer tomography apparatus, determines the attenuation correction function appropriate to patient, from measurements on filter and reference materials |
01/31/2002 | DE10034810A1 Borehole geophysical density measurement involves using unit with gamma source in lead screen with outlet window and gamma detector in lead screen with radiation backscatter inlet window |
01/31/2002 | DE10033497A1 X-ray image resolution improving method for medical diagnosis, involves using microfocus X-ray tube with exchangeable anode or anticathode material |
01/31/2002 | CA2416517A1 A method for ab initio determination of macromolecular crystallographic phases using bessel function |
01/30/2002 | CN2475029Y Closed joint straight grid focusing detection collimation apparatus |
01/30/2002 | CN1333899A Apparatus and method for detecting concealed objects in computed tomography data |
01/30/2002 | CN1333466A Semiconductor device test method and apparatus |
01/30/2002 | CN1333462A Equipment of cobalt 60 gamma ray source-cesium iodide or cadmium tungstate detector for checking container |
01/29/2002 | US6343110 Methods and apparatus for submillimeter CT slices with increased coverage |
01/29/2002 | US6343109 CT apparatus with reduced data transmission rate from the detector system to the image reconstruction computer |
01/29/2002 | US6342265 Apparatus and method for in-situ thickness and stoichiometry measurement of thin films |
01/24/2002 | WO2002006802A2 Screening crystallisation conditions of organic compounds |
01/24/2002 | WO2002006800A2 Radio frequency coupling apparatus and method for measuring minority carrier lifetimes in semiconductor materials |
01/24/2002 | WO2002006792A2 Process of parallel sample preparation |
01/24/2002 | WO2001046677A3 Irradiating device with highly flexible membrane bellows |
01/24/2002 | US20020009592 Evaluating method of hydrophobic process, forming method of resist pattern, and forming system of resist pattern |
01/24/2002 | US20020009177 Energy dispersive X-ray analyzer |
01/24/2002 | US20020009174 Gantry of an x-ray computer tomography apparatus |
01/24/2002 | US20020008200 Correction method of scanning electron microscope |
01/24/2002 | DE10134240A1 Evaluation of semiconductor wafer structure form uses CAD and SEM line segment data |
01/24/2002 | DE10028970C1 Röntgenoptische Anordnung zur Erzeugung einer parallelen Röntgenstrahlung X-ray optical arrangement for generating a parallel X-ray |
01/24/2002 | CA2416165A1 Radio frequency coupling apparatus and method for measuring minority carrier lifetimes in semiconductor materials |
01/24/2002 | CA2415561A1 Screening crystallisation conditions of organic compounds |
01/23/2002 | EP1175108A2 Method for testing display devices und computer programm therefor, and method for operating medical devices |
01/23/2002 | EP1173973A1 Self triggered imaging device for imaging radiation |
01/23/2002 | EP1173751A1 X-ray diffraction apparatus and method |
01/23/2002 | EP1173750A2 Computer tomography (ct) device |
01/23/2002 | CN2473620Y Fixer for fault detector in furnace |
01/23/2002 | CN1332372A Non-destructive gamma back-scattering imaging detection method and detector |
01/22/2002 | US6341156 X-ray diagnostic apparatus with relatively moved x-ray source and detector |
01/22/2002 | US6341153 System and method for portable nondestructive examination with realtime three-dimensional tomography |
01/17/2002 | WO2002005213A2 Method and apparatus for digital image defect correction and noise filtering |
01/17/2002 | WO2002004932A1 X-ray measuring apparatus |
01/17/2002 | WO2001022071A3 A non-destructive inspection apparatus for food and non-food products |
01/17/2002 | US20020006669 System for describing the physical distribution of an agent in a patient |
01/17/2002 | US20020005954 Device and method for measuring transmission and reflection properties of objects and surfaces |
01/17/2002 | US20020005490 Radiographic apparatus |
01/17/2002 | US20020005484 Apparatus and method for defect detection using charged particle beam |
01/17/2002 | DE19943866A1 Multi-channel analyzer for use in neutron research and as a detector for CCD cameras has programmable electronic unit and histogram memory |
01/17/2002 | DE10037294A1 X-ray machine, especially for medical use, has contact free data and power connections so that cumbersome and weighty cable unit is not required |
01/16/2002 | EP1172646A1 Screening crystallisation conditions of organic compounds |
01/16/2002 | EP1172069A1 CT with dose optimisation through control of the optimal value of the tube current in real time (exposure automation), the tube current modulation (dose minimizing) and by a consecutive analysis of the data using 3D adaptative filters (noise reduction) |
01/16/2002 | EP0720737B1 Analysing a material sample |
01/16/2002 | CN1331798A X-ray fluorescent emission analysis to determine material concentration |
01/15/2002 | US6339636 Radiation image recording method and apparatus |
01/10/2002 | WO2002003055A2 Apparatus and method for gamma-ray determination of bulk density of samples |
01/10/2002 | WO2002002188A1 Roentgen device for localization and radiation therapy of cancellation cancers |
01/10/2002 | WO2001005685A3 Method and device for x-raying items, especially items of luggage during conveyance on a conveyor belt |
01/10/2002 | US20020003860 Gaseous-based radiation detector and apparatus for radiography |
01/10/2002 | US20020003859 X-ray analysis apparatus provided with a multilayer mirror and an exit collimator |
01/10/2002 | US20020003858 Optical sample X-ray testing apparatus and method for testing optical sample with X-rays |
01/10/2002 | US20020003857 X-ray diffraction apparatus and method |
01/10/2002 | US20020003213 Electron spin analyzer |
01/10/2002 | US20020003212 Scattering target-holding mechanism and an electron spin analyzer |
01/10/2002 | CA2384171A1 X-ray means for determining a location of malignant neoplasm and its radiotherapy |
01/09/2002 | EP1170778A2 Scanning and high resolution electron spectroscopy and imaging |
01/09/2002 | EP1170755A1 Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography |
01/09/2002 | EP0916086B1 Detection of water constituents |
01/09/2002 | CN1330173A Evaluation method for polysilicon |
01/08/2002 | US6337897 Fluorescent X-ray analyzer |
01/03/2002 | WO2002001597A1 Charged particle beam inspection apparatus and method for fabricating device using that inspection apparatus |
01/03/2002 | WO2002001596A1 Charged particle beam inspection apparatus and method for fabricating device using that inspection apparatus |